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7619435 |
Method and system for derivation of breakdown voltage for MOS integrated circuit devices
A method and system for multi-point (e.g., double-point) GOI test that can efficiently judge failure modes by testing only two points. We can measure leakage currents at only two voltages, which...
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7619434 |
System for multiple layer printed circuit board misregistration testing
A test apparatus for determining layer-to-layer misregistration of a multiple layer printed circuit board having an electrical test pattern formed on an inner layer and an electrical test reference...
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7619433 |
Test circuit for a semiconductor integrated circuit
A test circuit includes an output control section for generating a plurality of output buffer control signals in response to a plurality of data masking signals when a test mode signal is activated...
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7616021 |
Method and device for determining an operational lifetime of an integrated circuit device
An integrated circuit device includes a degradable test structure, a first external interface pin and a second external interface pin, a first conductive path coupling a first node of the...
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7616017 |
Probe station thermal chuck with shielding for capacitive current
To reduce the time to make measurements and the noise in measurements obtained by probing a device supported on surface of a thermal chuck in a probe station, a conductive member is arranged to...
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7615781 |
Semiconductor wafer and semiconductor device, and method for manufacturing same
There is a room for improvement in conventional semiconductor devices in terms of reducing the chip area. A semiconductor device 1 comprises an evaluation transistor 10 (first characteristic...
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7614147 |
Method of creating contour structures to highlight inspection region
An integrated circuit has a wiring layer below an insulator layer. A pad comprises a conductive material that is on the insulator layer. The pad has a wirebond connection region and a probe pad...
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7613916 |
Method for burning chips
A method for burning a BIOS chip ( 108 ) and a network card chip ( 107 ) that are attached on a motherboard ( 106 ), includes the steps of: storing a plurality of MAC addresses in a burning device...
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7612575 |
Electronic device test apparatus for successively testing electronic devices
An apparatus having a plurality of test units ( 520 ), a loading transport unit ( 510 ) transporting a plurality of electronic devices from a customer tray ( 4 C) to a test tray ( 4 T) before being...
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7612571 |
System and method for estimation of integrated circuit signal characteristics using optical measurements
Systems and methods for making electrical measurements using optical emissions include positioning a sensor/photodetector to measure radiation emissions from devices to be tested. Radiation...
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7610538 |
Test apparatus and performance board for diagnosis
A test apparatus being capable of replacing a test module with the other kind of test module that tests device under tests by using the test module is provided. The test apparatus includes a...
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7610532 |
Serializer/de-serializer bus controller interface
An application specific integrated circuit (ASIC) uses a dedicated interface between core logic and an independent Serializer/De-serializer bus (SBus) to provide SBus capabilities to the core...
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7609082 |
System for measuring signal path resistance for an integrated circuit tester interconnect structure
Resistances of signal paths within a interconnect structure for linking input/output (I/O) ports of an integrated circuit (IC) tester to test points of an IC are measured by the IC tester itself....
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7609081 |
Testing system and method for testing an electronic device
A testing system for measuring an electronic device includes a main controller for generating a control signal, a signal generator for outputting a predetermined test input signal according to the...
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7609080 |
Voltage fault detection and protection
A fault detection and protection circuit can include a comparing circuit (e.g., a comparator or a detector) that can be connected to a power line supplying power to an electronic device being...
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7609078 |
Contact alignment verification/adjustment fixture
In an electronic testing machine including at least one test module having a plurality of contacts for testing electronic components, the improvement of a contact alignment tool for aligning the...
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7607056 |
Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices
Disclosed herein is a semiconductor test apparatus for simultaneously testing a plurality of semiconductor devices. The semiconductor test apparatus includes a plurality of pattern generation...
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7605596 |
Probe card, apparatus and method for inspecting an object
A probe card, an apparatus and a method of inspecting an object. In the example method, a first inspection current may be divided into a plurality of first divided inspection currents. Each of the...
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7603603 |
Configurable memory architecture with built-in testing mechanism
A configurable memory architecture includes a built-in testing mechanism integrated in said memory to support very efficient built-in self-test in Random Access Memories (RAMs) with greatly reduced...
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7603598 |
Semiconductor device for testing semiconductor process and method thereof
A semiconductor device for testing a semiconductor process applied to manufacturing the semiconductor device is disclosed. The semiconductor device includes at least a testing group. The testing...
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7603248 |
Testing circuit and testing method for semiconductor device and semiconductor chip
A testing circuit for a semiconductor device having a test mode in which the information about built-in memory cannot be read after conducting a test on a semiconductor device, and cutting a pad...
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7602206 |
Method of forming a transistor diagnostic circuit
In one embodiment, a diagnostic circuit is used to test the on-resistance of a transistor.
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7602205 |
Electromigration tester for high capacity and high current
An electronic device under test (DUT) may be incorporated into a circuit having a voltage limiter connected in parallel with the DUT. The circuit includes a controlled current source having an...
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7602199 |
Mini-prober for TFT-LCD testing
An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays. The apparatus...
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7602172 |
Test apparatus having multiple head boards at one handler and its test method
A test apparatus includes one handler connected to a tester and one test board divided into two or more sites or two or more test boards. Since only the sites on the test board (or test boards)...
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7600167 |
Flip-flop, shift register, and scan test circuit
A flip-flop has a first latch and a second latch. The first latch has a first feedback circuit and a first selecting circuit which selects one of a first data input signal and an output signal of...
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7598763 |
Probe contacting electrode and electronic device
A probe contacting electrode that is formed on a surface of a package of an electronic device and to which a probe of a probe device is contacted, including a lower layer part and an upper layer...
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7598762 |
Semiconductor driver circuit with signal swing balance and enhanced testing
A semiconductor driver circuit includes impedance units for generating impedances at data pads, independently of each-other. Thus, signal swing widths of data signals generated at the data pads may...
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7598759 |
Routing engine, method of routing a test probe and testing system employing the same
Embodiments of the present disclosure provide a routing engine, a method of routing a test probe and a testing system employing the router or the method. In one embodiment, the routing engine is...
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7598731 |
Systems and methods for adjusting threshold voltage
Systems and methods for adjusting threshold voltage. A threshold voltage of a transistor of an integrated circuit is measured. A bias voltage, which when applied to a body well of the transistor...
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7598730 |
Semiconductor wafer examination method and semiconductor chip manufacturing method
A semiconductor wafer examination method that includes: preparing a wafer formed with a chip area for use as a semiconductor chip; firstly examining the wafer by probing; pressing an electrode of...
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7598728 |
System and method for utilizing an automatic circuit tester system having multiple automatic circuit tester platforms
The ATE system includes a system computer. A plurality of platform computers is in communication with the system computer. A plurality of test instrument boards is provided. Each of the platform...
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7596731 |
Test time reduction algorithm
Exemplary embodiments provide a method and system for reducing test time for electronic devices. The method and system aspects include receiving a test data file containing results from a set of...
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7595654 |
Methods and apparatus for inline variability measurement of integrated circuit components
An integrated circuit device is provided including at least one first array configuration of integrated circuit components comprising a m×n array of FETs, without specified internal connections...
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7595653 |
Pressure testing apparatus and method for pressure testing
A pressure testing apparatus for chips on a wafer has a pressure chamber, a support plate arranged between the upper and lower parts of the housing, a wafer chuck, a testing device and a...
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7592828 |
Method and device of measuring interface trap density in semiconductor device
A method is provided for measuring interface trap density in a semiconductor device. In the method, measurement parameters are input to a host computer. A pulse condition is set at a pulse...
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7592827 |
Apparatus and method for electrical detection and localization of shorts in metal interconnect lines
A test structure for localizing shorts in an integrated circuit and method of testing is described. A first comb structure is formed from a first busbar and a first plurality of fingers extending...
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7592826 |
Method and apparatus for detecting EM energy using surface plasmon polaritons
An apparatus and method are disclosed for detecting electromagnetic (EM) energy. An exemplary apparatus includes a dielectric layer for receiving incident EM energy, a metal film and a circuit. The...
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7592825 |
Methods and systems for semiconductor diode junction screening and lifetime estimation
Screening methods and systems that can detect semiconductor junction devices that may exhibit sudden failure.
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7592817 |
Alignment correction system and method of use
A system and method for correcting alignment of a product on a tool and, more particularly, to a system and method for correcting alignment of a wafer on a chuck of a tool. The system is a tool...
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7592797 |
Semiconductor device and electronics device
A plurality of switch circuits are disposed so as to correspond to a plurality of circuit blocks, respectively. Each of the plurality of switch circuits is connected between a power supply terminal...
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7589549 |
Driver circuit and test apparatus
Provided is a driver circuit that includes a first operational mode and a second operational mode and outputs an output signal according to an input signal, including a first driver section that,...
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7589548 |
Design-for-test micro probe
Systems and techniques for testing a device having first and second interconnected chips that are internal to the device include selecting a site on a communication pathway along which an internal...
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7589546 |
Inspection apparatus and method for semiconductor IC
The connection between a PTC element 22 a corresponding to each semiconductor IC 11 a and a power-supply line 25 a is performed via a relay, a high voltage is supplied to the power-supply...
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7589545 |
Device for final inspection
A device is provided for subjecting a plurality of singulated semiconductor components to functional verification, which includes contact pins that are integrated in a test socket and establish a...
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7587298 |
Diagnostic method for root-cause analysis of FET performance variation
A diagnostic method of and computer system for root-cause analysis of performance variations of FETs in integrated circuits and a method and computer system for monitoring a field effect transistor...
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7586315 |
System and method for testing voltage endurance
A method for testing voltage endurance of a electronic component, includes: generating an oscillating signal; amplifying the oscillating signal; transforming the amplified oscillating signal to...
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7586314 |
Multi-pin CV measurement
A method for measuring electrical parameters of a DUT having at least three terminals includes applying a first AC voltage to a first terminal; separately driving a second and a third terminal each...
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7586300 |
Isolation buffers with controlled equal time delays
A system is provided for controlling the delay in an isolation buffer. Multiple such isolation buffers are used to connect a single signal channel to multiple lines and controlled to provide an...
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7583094 |
Method for fabricating light-emitting device through inspection
A light-emitting device is produced at a decreased cost by inspecting defects in the pixels in the step of fabrication. TFTs possessed by the pixels on the element substrate and TFTs possessed by...
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