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7394280 |
Method of electro migration testing
A method of determining the time to failure of parallel electro migration test structures is described. The method generally includes the steps of: measuring the resistance of the complete...
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7394276 |
Active cancellation matrix for process parameter measurements
An active cancellation matrix for process parameter measurements provides feedback paths for each test location wherein each feedback path is used to sense the applied voltage and the sensed...
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7394273 |
On-chip electromigration monitoring system
A packaged semiconductor chip is provided which includes a semiconductor chip and a package element. The semiconductor chip includes a plurality of semiconductor devices and a plurality of...
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7394279 |
Method of measuring a surface voltage of an insulating layer
In a method of measuring a surface voltage of an insulating layer, the number of times that surface voltages are measured in a depletion region increases so that precise data about the depletion...
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7394275 |
Systems and methods for generating and evaluating high frequency, low voltage swing signals at in-circuit testing
Systems and methods for testing components of printed circuit assemblies (PCA) that generate high frequency, low voltage swing signals or that operate using such signals are disclosed. High...
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7392444 |
Non-volatile memory evaluating method and non-volatile memory
The present method generates a greater number of hot holes than those generated by normal write/erase operations, thereby making it possible to evaluate an operation of a non-volatile memory with...
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7391228 |
***WITHDRAWN PATENT AS PER THE LATEST USPTO WITHDRAWN LIST***
On-die heating circuit and control loop for rapid heating of the die
An integrated circuit includes a heating circuit configured to heat the integrated circuit under the control of a controller. A transfer function with adjustable pole, zero and overall gain is...
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7389581 |
Method of forming compliant contact structures
A compliant contact structure and contactor card for operably coupling with a semiconductor device to be tested includes a substantially planar substrate with a compliant contact formed therein....
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7388393 |
Semiconductor test apparatus
A semiconductor test apparatus is provided that has a function for picking a device as a non-defective device with a limited function (i.e., class B device) even if that device includes one or more...
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7388394 |
Multiple layer printed circuit board having misregistration testing pattern
A method of testing for misregistration in a multiple layer printed circuit board includes providing an electrical test pattern on one or more layers of the board, testing for an electrical signal...
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7388395 |
Test semiconductor device and method for determining Joule heating effects in such a device
Method and test structures for determining heating effects in a test semiconductor device ( 10 ) are provided. The test device may include a first conductive metal structure ( 15 1 - 15 6 ) for...
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7388396 |
Strip test method
A strip test method includes the following steps. First, an assembly strip is provided, wherein the assembly strip includes a plurality of semiconductor devices, each having a plurality of leads. A...
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7385410 |
Method of and apparatus for testing for integrated circuit contact defects
Various tester configurations are provided that injects test signals into nets (e.g. 24 ). Non-linear characteristics of the response are detected (e.g. harmonics, do offset) and used to assess...
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7385385 |
System for testing DUT and tester for use therewith
A tester configured to stack with at least one other tester to provide a test system for simultaneously testing a number of devices in parallel on different testers, or testing a device having more...
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7385412 |
Systems and methods for testing microfeature devices
Systems and methods for testing microelectronic imagers and microfeature devices are disclosed herein. In one embodiment, a method includes providing a microfeature workpiece including a substrate...
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7382117 |
Delay circuit and test apparatus using delay element and buffer
There is provided a delay circuit that delays an input signal to output the delayed signal. The delay circuit includes a first delay element operable to receive the input signal and delay the input...
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7382141 |
Testing a batch of electrical components
The invention relates a method for testing a batch of electrical components like Integrated Circuits, the method involving applying a first test ( 6 ) on each electrical component from the batch;...
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7378864 |
Test apparatus having multiple test sites at one handler and its test method
A test apparatus includes one handler connected to a tester and one test board divided into two or more sites or two or more test boards. Since only the sites on the test board (or test boards)...
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7378859 |
System and method for estimation of integrated circuit signal characteristics using optical measurements
Systems and methods for making electrical measurements using optical emissions include positioning a sensor/photodetector to measure radiation emissions from devices to be tested. Radiation...
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7379836 |
Method of using automated test equipment to screen for leakage inducing defects after calibration to intrinsic leakage
The present invention is directed to a method of identifying test devices having excessive leakage current and also includes computer program products that enable the same. The method obtaining...
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7379395 |
Precise time measurement apparatus and method
A time measurement system that uses two signals generated by direct digital synthesis. The generated signals have the same frequency but different phase. One signal is used to identify the start of...
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7378863 |
Synchronous semiconductor device, and inspection system and method for the same
The present invention provides a synchronous semiconductor device suitable for improving the efficiency of application of electrical stresses to the device, an inspection system and an inspection...
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7375541 |
Testing method utilizing at least one signal between integrated circuits, and integrated circuit and testing system thereof
A testing method utilizing at least one signal between ICs includes: coupling at least one testing device to a plurality of ICs that are capable of being tested by the testing device, the ICs...
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7375543 |
Electrostatic discharge testing
The present invention provides a system and method for electrostatic discharge (ESD) testing. The system includes a circuit that has a switch coupled to an input/output (I/O) circuit of a device...
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7375505 |
Method and apparatus for testing function of active microstructural elements and method for producing microstructural elements using the test method
A method and an apparatus for testing the function of a plurality of microstructural elements by irradiation with particle radiation. All of the microstructural elements detected as malfunctioning...
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7375542 |
Automated test equipment with DIB mounted three dimensional tester electronics bricks
Automated test equipment is provided which includes a test head having a tester electronics bricks mounted to a device interface board. In some embodiments, support circuitry is positioned adjacent...
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7375633 |
Methods and systems for in-line RFID transponder testing
Methods and apparatus for testing the health of each of a plurality of RFID transponders is provided. The apparatus includes an antenna support assembly including an antenna support body and an...
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7375540 |
Process monitor for monitoring and compensating circuit performance
A method and system for monitoring and compensating the performance of an operational circuit is provided. The system includes one or more integrated circuit chips and a controller. Each integrated...
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7372285 |
Socket-less test board and clamp for electrical testing of integrated circuits
A socket-less test board and a clamp for clamping an integrated circuit to the socket-less test board is disclosed. The test board includes a recess region for receiving an integrated circuit to be...
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7372288 |
Test apparatus for testing multiple electronic devices
There is disclosed a test apparatus including a driver that outputs a test signal, a first switch that is provided between the driver and a terminal of the first device under test, a second switch...
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7372248 |
Electronic circuit, system with an electronic circuit and method for testing an electronic circuit
An electronic circuit having an input, an output with an input filter for delaying a change of an input signal and a control component for supplying an output signal and evaluating the input...
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7372028 |
Sample electrification measurement method and charged particle beam apparatus
The present invention has the object of providing a charged particle beam irradiation method ideal for reducing the focus offset, magnification fluctuation and measurement length error in charged...
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7373263 |
Analog-type measurements for a logic analyzer
A logic analyzer that performs analog-type measurements on digital data includes circuitry in its acquisition system that is programmable to search through acquired data to detect analog-type...
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7373574 |
Semiconductor testing apparatus and method of testing semiconductor
A semiconductor testing apparatus, includes a test signal generating unit that generates a test signal corresponding to a test pattern to output the generated test signal to a device under test...
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7368933 |
Method for testing standby current of semiconductor package
A system and method for testing standby current of a semiconductor package is provided. The method includes testing semiconductor chips formed on a wafer having a predetermined wafer run number,...
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7368934 |
Avalanche testing at final test of top and bottom FETs of a buck converter
An avalanche test circuit for applying an avalanche test signal to a device under test, comprising a series combination of a voltage source and an inductance; a switching device connected in...
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7363694 |
Method of testing using compliant contact structures, contactor cards and test system
A compliant contact structure and contactor card for operably coupling with a semiconductor device to be tested includes a substantially planar substrate with a compliant contact formed therein....
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7365554 |
Integrated circuit for determining a voltage
An integrated circuit includes a current generator circuit with a first input terminal for applying a reference voltage and a second input terminal for applying an input voltage, which is generated...
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7365562 |
Display device and method of testing sensing unit thereof
A display device includes first and second display signal lines, pixels, first and second sensing signal lines, first through fourth test lines for transmitting first through fourth test signals, a...
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7365558 |
In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing trays
A burn-in board for burn-in and electrical testing of a plurality of integrated circuit devices that is disposed in one or more processing trays may include a substrate having an interface surface...
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7362148 |
Device for controlling a semiconductor element
A control device for controlling a load drive semiconductor element for driving a load has a test operation mode for measuring a leak current of the load drive semiconductor element. In the test...
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7362108 |
Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe
By using techniques for near field probes to measure dielectric values of blanket films, the measure of the sidewall damage of the patterned structure is calculated. The interaction between the...
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7362120 |
Method and apparatus for die testing on wafer
An integrated circuit includes switching means for selectively connecting the bond pads to functional core logic and isolating the bond pads from second conductors, and the switch means for...
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7362121 |
Self-heating mechanism for duplicating microbump failure conditions in FPGAs and for logging failures
A system replicates the rapid temperature increases that are believed to cause microbump failures in certain applications of programmable logic devices (PLDs). The system configures a PLD under...
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7363560 |
Circuit for and method of determining the location of a defect in an integrated circuit
According to one aspect of the invention, a circuit for determining the location of a defect in an integrated circuit is described. The circuit comprises a conductor extending from a first node to...
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7358755 |
Ring oscillator system
Testing devices at various locations on a die may be used to determine one or more properties of the locations. For example, a testing device including an oscillator such as a ring oscillator at a...
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7358714 |
Testing method and testing apparatus
A testing method of a semiconductor integrated circuit device includes a testing step of conducting a functional test by supplying test pattern data to a semiconductor integrated circuit device...
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7358718 |
Semiconductor device and electronics device
A plurality of switch circuits are disposed so as to correspond to a plurality of circuit blocks, respectively. Each of the plurality of switch circuits is connected between a power supply terminal...
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7355430 |
Parallel scan distributors and collectors and process of testing integrated circuits
An integrated circuit ( 70 ) having parallel scan paths ( 824 - 842, 924 - 942 ) includes a pair or pairs of scan distributor ( 800,900 ) and scan collector ( 844,944 ) circuits. The scan paths...
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7355417 |
Techniques for obtaining electromagnetic data from a circuit board
A system is configured to obtain electromagnetic data from a circuit board. A set of sensing locations resides in a plane which is substantially parallel to the circuit board. The system includes a...
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