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7429864 |
Systems and methods for rectifying and detecting signals
A first device has a surface and includes a plurality of at largest micrometer-scale geometry structures extending along its surface. The structures have a first portion and a second portion. A...
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7429867 |
Circuit for and method of detecting a defect in a component formed in a substrate of an integrated circuit
Various embodiments of the present invention describe circuits for and methods of detecting a defect in a component formed in a substrate of an integrated circuit. According to one embodiment, a...
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7429868 |
Socket assembly for testing semiconductor device
A socket assembly for testing semiconductor devices includes a socket board electrically connected to an outside testing device, and a socket guide which covers the socket board. The socket guide...
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7427768 |
Apparatus, unit and method for testing image sensor packages
The present invention relates to an apparatus, unit and method for testing image sensor packages, which can automatically test whether the image sensor packages are defective before they are...
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7427870 |
Test system for testing integrated circuits and a method for configuring a test system
The invention relates to a test system for testing connectable integrated circuits. A particular test system may have switching devices via which a respective assigned one of the integrated...
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7425840 |
Semiconductor device with multipurpose pad
It is provided a semiconductor device with an ability to receive various test signals and check test results in spite of a limited number of pads. The semiconductor device includes a signal...
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7425457 |
Method and apparatus for irradiating simulated solar radiation
In a method of irradiating an object with simulated solar radiation using a plurality of light sources, the object is irradiated with simulated solar radiation resulting from superimposed light...
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7424417 |
System and method for clock domain grouping using data path relationships
A method and system are disclosed, in a simulation of a design of a digital integrated circuit chip, to limit a number of scan test clocks and chip ports used for testing the chip. Clock domains...
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7423443 |
Method of performing parallel test on semiconductor devices by dividing voltage supply unit
Provided is a method of performing a parallel test on semiconductor devices, the method including coupling a power signal line to a set of at least two semiconductor devices through a switching...
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7423444 |
Digital test apparatus for testing analog semiconductor device(s)
A digital test apparatus for testing an analog semiconductor device includes a low pass filter which passes only a low frequency analog signal from among analog signals output from the analog...
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7423442 |
System and method for early qualification of semiconductor devices
According to one embodiment of the invention, a method for early qualification of semiconductor device includes performing initial testing on a semiconductor device, receiving fail data on the...
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7423446 |
Characterization array and method for determining threshold voltage variation
A method for determining threshold voltage variation rapidly provides accurate threshold voltage distribution values for process verification and improvement. The method operates a characterization...
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7423445 |
Method and system for trimming voltage or current references
Trim codes are determined for semiconductor devices under test (DUTs), wherein the trim codes correspond to voltage or current reference value adjustments that cause the DUTs to generate desired...
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7422366 |
Current mirror methodology quantifying time dependent thermal instability accurately in SOI BJT circuitry
A current mirror method is provided that can be utilized to evaluate thermal issues is silicon-on-insulator (SOI) bipolar junction transistors (BJTs). The method significantly improves safe...
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7420382 |
Apparatus and method for testing semiconductor chip
An apparatus includes a test board for testing electrical characteristics of the semiconductor chip; socket pins vertically disposed on the test board to electrically connect the test board, and...
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7420385 |
System-on-a-chip pipeline tester and method
A pipeline tester is disclosed that is capable of testing systems-on-a-chip (SOCs) or Devices Under Test (DUTs) in pipeline fashion. The tester provides faster, more economical testing of such SOCs...
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7420381 |
Double sided probing structures
A test configuration for double sided probing of a device under test includes a holder to secure the device under test in a first orientation, a calibration substrate secured in a second...
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7420379 |
Semiconductor device test method and semiconductor device tester
A defective position of a sample to be tested is detected by irradiating the test sample and another test sample with electron beam while scanning the test samples, storing values of current...
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7414422 |
System in-package test inspection apparatus and test inspection method
A system in-package test inspection apparatus for measuring and evaluating the high-speed/high frequency characteristic of a system in-package through an electrode pad in which I/O terminals are...
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7414409 |
Non-contact method and apparatus for measurement of leakage current of p-n junctions in IC product wafers
A non-contact apparatus and method for measuring of the leakage current and capacitance of p-n junctions in test structures within scribe lanes of IC product wafers is disclosed. The apparatus has...
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7415646 |
Page—EXE erase algorithm for flash memory
Methods of performing a sector erase of flash memory devices incorporating built-in self test circuitry are provided. The present invention employs an interactive verification and sector erase...
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7414423 |
Wafer-level test module for testing image sensor chips, the related test method and fabrication
A wafer-level test module is disclosed to include a base layer having multiple first apertures spaced from one another at a pitch corresponding to the pitch of the image sensor chips of an...
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7411409 |
Digital leakage detector that detects transistor leakage current in an integrated circuit
In one embodiment, an integrated circuit includes at least one digital leakage detector that includes digital circuitry configured to detect an approximation of a magnitude of the leakage current...
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7412053 |
Cryptographic device with stored key data and method for using stored key data to perform an authentication exchange or self test
In preferred embodiments, a cryptographic device in which two key sets are stored: a normal key set (typically unique to the device) and a test key set (typically used by each of a relatively large...
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7408367 |
Micro Kelvin probes and micro Kelvin probe methodology with concentric pad structures
A micro Kelvin probe assembly and method of accomplishing a micro Kelvin measurement that determines the resistance or impedance of a device under test (DUT) that has two spaced contacts. An...
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7408373 |
Device for probe card power bus voltage drop reduction
Noise reduction for application of structural test patterns to a Device Under Test (DUT) is accomplished with a capacitor “booster” bypass network on the probe card in which the capacitors are...
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7409612 |
Testing of integrated circuits
An integrated circuit with a test interface contains a boundary scan chain with cells ( 14 ) coupled between a test data input (TDI) and output (TDO) in a shift register structure. Each cell ( 14 )...
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7408375 |
Method and testing apparatus for testing integrated circuits
A method for testing integrated circuits comprises: generation of a change in an input signal of the integrated circuit, detection of a change in the output signal of the integrated circuit, the...
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7408371 |
Apparatus for measuring on-chip characteristics in semiconductor circuits and related methods
An apparatus for measuring on-chip characteristics in a semiconductor circuit is provided. The apparatus for measuring the on-chip characteristics includes an oscillation unit, a timing test unit,...
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7408369 |
System and method for determining thermal shutdown characteristics
Systems and methods are disclosed to enable determining thermal protection characteristics of an integrated circuit. In one embodiment, an integrated circuit includes a proportional to absolute...
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7408370 |
Lighting device
A lighting device includes a light-guiding rod and a light-emitting unit. The light-guiding rod includes a transparent hollow housing, the housing has two open ends and two insulating plugs for...
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7408372 |
Method and apparatus for measuring device mismatches
A test structure for statistical characterization of local device mismatches contains densely populated SRAM devices arranged in a row/column addressable array that enables resource sharing of many...
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7405580 |
Self-calibration in non-contact surface photovoltage measurement of depletion capacitance and dopant concentration
The surface photovoltage dopant concentration measurement of a semiconductor wafer is calibrated by biasing the semiconductor wafer into an avalanche breakdown condition in a surface depletion...
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7405582 |
Measurement board for electronic device test apparatus
A performance board able to secure low loss, low reflection, stable transmission characteristics even when using a high frequency signal to test an electronic device and able to suppress signal...
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7405586 |
Ultra low pin count interface for die testing
An apparatus, a method and a system to test a device. An input/output (I/O) block communicates with an external tester to receive test data and to send test result using first and second...
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7405585 |
Versatile semiconductor test structure array
This invention discloses a semiconductor test structure array comprising a plurality of unit cells for containing devices under test (DUT) arranged in an addressable array, and an access-control...
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7403031 |
Measurement apparatus for FET characteristics
A measurement apparatus for FET characteristics comprises a divider connected to a pulse generator for dividing pulses from the pulse generator into first and second pulses; a first SMU; a first...
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7404117 |
Component testing and recovery
Disclosed are systems and methods of producing electronic devices. These electronic devices include excess circuits to be used as replacements for circuits that are found to be defective within the...
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7402995 |
Jig device for transporting and testing integrated circuit chip
A novel jig device useful for transporting and testing an IC chip is disclosed. The jig device comprises a main jig body, having a holding part onto which the IC chip to be tested is attracted and...
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7403026 |
Electronic switching circuit, switching circuit test arrangement and method for determining the operativeness of an electronic switching circuit
The invention relates to an electronic switching circuit in which a plurality of test circuit blocks is provided, whereby every test circuit block comprises a first sub-circuit block and at least...
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7403030 |
Using parametric measurement units as a source of power for a device under test
An apparatus for providing current to a device under test includes a first parametric measurement unit configured to provide current to the device, and a second parametric measurement unit...
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7400255 |
Wireless functional testing of RFID tag
Wirelessly testing an RFID tag before it is packaged or otherwise entered into a process reserved for “working” RFID tags is described. Various processes that employ such wireless testing as...
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7399990 |
Wafer-level package having test terminal
A wafer-level package includes a semiconductor wafer having at least one semiconductor chip circuit forming region each including a semiconductor chip circuit each provided with test chip terminals...
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7400157 |
Composite wiring structure having a wiring block and an insulating layer with electrical connections to probes
A method of designing and manufacturing a probe card assembly includes prefabricating one or more elements of the probe card assembly to one or more predefined designs. Thereafter, design data...
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7400161 |
Electronic device test system
An electronic device testing apparatus for conducting a test by pressing input/output terminals of an IC to be tested against sockets ( 50 ), comprising a pusher ( 30 ) provided at least with a...
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7400160 |
Semiconductor integrated circuit device, measurement method therefore and measurement system for measuring AC characteristics thereof
Disclosed is an AC characteristics measurement system that includes a flip-flop arranged in a loop of a ring oscillator; a clock generating circuit that receives a signal propagated in said loop of...
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7397289 |
Skew adjusting method, skew adjusting apparatus, and test apparatus
There is provided a skew adjusting apparatus for adjusting a skew between a positive-side differential signal and a negative-side differential signal in differential signals inputted from an...
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7397253 |
Transmission line pulse (TLP) system calibration technique
A transmission Line Pulse (TLP) device calibration method wherein the TLP device includes a pulse generator for generating a pulse, a cable having an input terminal coupled to said pulse generator,...
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7397255 |
Micro Kelvin probes and micro Kelvin probe methodology
A micro Kelvin probe assembly and method of accomplishing a micro Kelvin measurement that determines the resistance or impedance of a device under test (DUT) that has two spaced contacts. An...
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7397263 |
Sensor differentiated fault isolation
Disclosed is an apparatus and method for diagnostically testing circuitry within a device. The apparatus and method incorporate the use of energy (e.g., light, heat, magnetic, electric, etc.)...
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