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7466157 |
Contactless interfacing of test signals with a device under test
An interface device receives test data from a tester. A signal representing the test data is transmitted to a device under test through electromagnetically coupled structures on the interface...
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7466158 |
Multilayer semiconductor device
The present invention is applied to a multilayer semiconductor device including a plurality of layered semiconductor chips. At least one of the plurality of layered semiconductor chips comprises a...
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7466259 |
Methods and apparatus to measure a voltage on an integrated circuit
Methods and apparatus to measure a voltage on an integrated circuit are disclosed. An example method to measure a voltage on an integrated circuit provides a reference signal to a first input of an...
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7466160 |
Shared memory bus architecture for system with processor and memory units
A system is provided for testing a first integrated circuit associated with at least a second integrated circuit in a semiconductor device, wherein at least some external terminals for the...
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7463049 |
Inspection method for semiconductor device
The present invention provides an inspection system of ID chips that can supply a signal or power supply voltage to an ID chip without contact, and can increase throughput of an inspection process...
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7463047 |
Increase productivity at wafer test using probe retest data analysis
Disclosed is a method of wafer/probe testing of integrated circuit devices after manufacture. The invention begins by testing an initial group of devices (e.g., integrated circuit chips) to produce...
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7460963 |
Device and method for health monitoring of an area of a structural element, and structure adapted for health monitoring of an area of a structural element of said structure
Device for health monitoring of a structure comprising a dielectric material of permittivity ε r , comprising a source of electromagnetic radiation, generating an electric field in the structure a...
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7459926 |
Scan distributor loading scan paths simultaneous with loading test data
An integrated circuit ( 70 ) having parallel scan paths ( 824 - 842, 924 - 942 ) includes a pair or pairs of scan distributor ( 800,900 ) and scan collector ( 844,944 ) circuits. The scan paths...
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7456643 |
Methods for multi-modal wafer testing using edge-extended wafer translator
Access to integrated circuits of a wafer for concurrently performing two or more types of testing, is provided by bringing a wafer and an edge-extended wafer translator into an attached state. The...
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7457455 |
Pattern defect inspection method and apparatus
The pattern defect inspection apparatus is operable to detect defects by comparing a detection image, which is obtained through scanning by an image sensor those patterns that have the identical...
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7456636 |
Test structures and method of defect detection using voltage contrast inspection
Test structures and a method for voltage contrast (VC) inspection are disclosed. In one embodiment, the test structure includes: a gate stack that is grounded by a ground to maintain the gate stack...
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7453280 |
Method for testing semiconductor devices
A method for testing a batch of semiconductor devices in wafer level is provided. The method includes the following steps: (a) obtaining a breakdown voltage of gate dielectric of each semiconductor...
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7452733 |
Method of increasing reliability of packaged semiconductor integrated circuit dice
Semiconductor dice are electrically tested prior to final assembly. Dice failing the test are identified and not packaged. However, “good dice” (i.e., those dice that passed testing) in...
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7453932 |
Test device and setting method
A testing apparatus for testing a device under test is provided, wherein the testing apparatus includes: a comparator for receiving a signal output from the device under test and converting the...
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7453260 |
Testing circuits on substrate
The invention provides a method of testing a circuit on a substrate. Generally speaking, a substrate is located in a transfer chuck, a surface of a test chuck is moved into contact with a...
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7453272 |
Electrical open/short contact alignment structure for active region vs. gate region
A method is disclosed for measuring alignment of polysilicon shapes relative to a silicon area wherein the presence of an electrical coupling is used to determine the presence of bias or...
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7454305 |
Method and apparatus for storing circuit calibration information
A method for altering circuit characteristics to make them independent of processing parameters of devices within an integrated circuit is disclosed. A process parameter is measured by a kerf or...
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7454301 |
Method and apparatus for predicting system noise
A jitter calculator engine that includes a core effects module, an input/output (I/O) module, and a phase lock loop (PLL) module is provided. The core effects module estimates core jitter caused by...
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7449910 |
Test system for semiconductor components having conductive spring contacts
An interconnect for testing a semiconductor component includes a substrate, and interconnect contacts on the substrate configured to electrically engage component contacts on a semiconductor...
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7451053 |
On die thermal sensor of semiconductor memory device and method thereof
An on die thermal sensor (ODTS) includes a thermal sensor for outputting a first comparing voltage by detecting a temperature of the semiconductor memory device; a comparing unit for outputting a...
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7449909 |
System and method for testing one or more dies on a semiconductor wafer
A testing system or method compares read data from one or more dies in a semiconductor wafer with the original data written onto the one or more dies. The testing system includes one or more write...
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7449902 |
Probe system
A probe apparatus and a probe system are provided. The probe apparatus uses a larger printed circuit board to dispose a plurality of testers. The layout of each of the testers on the circuit board...
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7449911 |
Method for determining electro-migration failure mode
A method for testing integrated circuits includes forming a plurality of substantially identical first test structures, each comprising a first via structure connected to a first metal line, stress...
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7446551 |
Integrated circuit testing module including address generator
Systems and methods of testing integrated circuits are disclosed. The systems include a test module configured to operate between an automated testing equipment and an integrated circuit to be...
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7446277 |
Method for sorting integrated circuit devices
A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, including automatically reading the ID code of each of...
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7447606 |
Method of separating the process variation in threshold voltage and effective channel length by electrical measurements
A IC wafer is fabricated using a process of interest to have a plurality of FET devices with different channel lengths (Leff) form a plurality of channel length groups. The threshold voltage (VT)...
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7445945 |
Method and apparatus for dynamic adjustment of a sampling plan based on wafer electrical test data
The present invention provides a method and apparatus for dynamic adjustment of a sampling plan. The method includes accessing wafer electrical test data associated with at least one workpiece that...
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7446554 |
Direct current measuring apparatus and limiting circuit
A direct current measuring apparatus includes a voltage generating part generating a voltage to be applied to a load being a measuring object; a current limiting part limiting a current flowing in...
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7447610 |
Method and system for reliability similarity of semiconductor devices
A method and system for reliability similarity of semiconductor devices. The method includes providing a first plurality of semiconductor devices, providing a second plurality of semiconductor...
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7446553 |
Semiconductor device testing
An apparatus and method to test components in a semiconductor test structure. On a semiconductor wafer, a test module implemented in one or more scribe lines between a plurality of semiconductor...
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7443189 |
Method to detect and predict metal silicide defects in a microelectronic device during the manufacture of an integrated circuit
The present teachings provide methods for detection of metal silicide defects in a microelectronic device. In an exemplary embodiment, a portion of a semiconductor substrate may be positioned in a...
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7443183 |
Motherboard test machine
A test machine for testing a printed circuit board (PCB) ( 50 ) includes a base box ( 10 ), a top test device ( 70 ), a raising board ( 41 ), and a control system. The top test device is pivotably...
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7443186 |
On-wafer test structures for differential signals
A test structure for characterizing integrated circuits on a wafer includes a differential cell outputting a differential mode signal in response to a differential mode input signal. The probe pads...
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7443182 |
Coordinate transformation device for electrical signal connection
There is disclosed a coordinate transformation device for electrical signal connection used for a probe card applicable to narrow pitch pads, which particularly simplifies wiring from the terminal...
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7443187 |
On-chip power supply noise detector
Techniques for on-chip detection of integrated circuit power supply noise are disclosed. By way of example, a technique for monitoring a power supply line in an integrated circuit includes the...
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7443180 |
On-chip probing apparatus
The invention is directed to an on-chip probing apparatus. In accordance with an embodiment of the present invention, the on-chip probing apparatus includes: a plurality of switches on a chip; a...
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7443188 |
Electronic device having an interface supported testing mode
A system is provided for testing a logic device and an integrated circuit disposed within a semiconductor device package. The logic device may be configured to operate in at least a normal mode and...
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7439753 |
Inverter test device and a method thereof
The present invention discloses an inverter test device and a method thereof, which provides a single-load environment or a multi-load test environment to test electrical performance of an inverter...
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7439754 |
Semiconductor integrated circuit and device and method for testing the circuit
An accelerated test for transistors included in inverter circuits of a semiconductor integrated circuit is to be improved in efficiency. Output terminals 30 A, 30 B of inverter circuits 11, 12 ,...
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7436197 |
Virtual test head for IC
In a test system for a semiconductor device, the device under test (DUT) is remotely located relative to the tester that generates the test vector signals. The tester and remotely located DUT are...
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7436198 |
Test pattern of semiconductor device and test method using the same
There are provided a test pattern of a semiconductor device and a test method using the same. The test pattern of the semiconductor device includes a conductive pattern disposed on a semiconductor...
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7437271 |
Methods and apparatus for data analysis
A method and apparatus for testing semiconductors according to various aspects of the present invention comprises a test system comprising composite data analysis element configured to analyze data...
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7436222 |
Circuit and method for trimming integrated circuits
A programmable after-package, on-chip reference voltage trim circuit for an integrated circuit having a plurality of programmable trim cells generating a programmed sequence. A converter is...
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7436199 |
Stack-type semiconductor package sockets and stack-type semiconductor package test systems
A stack-type semiconductor package socket may include: a first package connection portion for connection with leads of a lowermost package of a stack-type semiconductor package; a second package...
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7436168 |
Test error detection method and system
According to one embodiment, a method of test error detection for a wafer having a plurality of rows of integrated circuit (IC) chips is provided. The method includes determining that a first...
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7433793 |
Error detection apparatus and method and signal extractor
A modulated voltage signal modulated at a predetermined frequency f 0 is supplied to an integrated circuit under test to be tested set at an arbitrary stationary point, and an observation signal...
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7432115 |
Test circuit, semiconductor product wafer having the test circuit, and method of monitoring manufacturing process using the test circuit
A test circuit and a method of monitoring a manufacturing process of a semiconductor integrated circuit using the test circuit are provided. The test circuit comprises elements to be tested; a...
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7429864 |
Systems and methods for rectifying and detecting signals
A first device has a surface and includes a plurality of at largest micrometer-scale geometry structures extending along its surface. The structures have a first portion and a second portion. A...
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7429867 |
Circuit for and method of detecting a defect in a component formed in a substrate of an integrated circuit
Various embodiments of the present invention describe circuits for and methods of detecting a defect in a component formed in a substrate of an integrated circuit. According to one embodiment, a...
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7429868 |
Socket assembly for testing semiconductor device
A socket assembly for testing semiconductor devices includes a socket board electrically connected to an outside testing device, and a socket guide which covers the socket board. The socket guide...
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