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7245139 |
Tester channel to multiple IC terminals
A probe card provides signal paths between integrated circuit (IC) tester channels and probes accessing input and output pads of ICs to be tested. When a single tester channel is to access multiple...
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7245136 |
Methods of processing a workpiece, methods of communicating signals with respect to a wafer, and methods of communicating signals within a workpiece processing apparatus
An electronic device workpiece processing apparatus and method of communicating signals within an electronic device workpiece processing apparatus are provided. One embodiment of an electronic...
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7245140 |
Parameter measurement of semiconductor device from pin with on die termination circuit
A semiconductor device includes an ODT (on die termination) pin coupled to a tester that applies a tester termination control signal thereon. The semiconductor device also includes a measure path...
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7246290 |
Determining the health of a desired node in a multi-level system
A method and apparatus are provided for determining the health of a desired node in a multi-level system. The method includes defining a first fault model associated with a first node of a first...
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7242257 |
Calibration-associated systems and methods
The present invention relates to test systems for testing integrated circuit devices and to calibration associated systems and methods. One embodiment of the invention provides an auto-calibration...
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7242209 |
System and method for testing integrated circuits
A module ( 236, 236 ′) containing an integrated testing system ( 108 ) that includes one or more measurement engines ( 200, 202 ) tightly coupled with a compute engine ( 208 ). The one or more...
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7242211 |
Hierarchical link instruction register core/embedded core wrapper enable signals
A test architecture accesses IP core test wrappers within an IC using a Link Instruction Register (LIR). An IEEE P1500 standard is in development for providing test access to these individual cores...
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7242210 |
Method and apparatus for circuit board inspection capable of monitoring inspection signals by using a signal monitor incorporated in the apparatus
An inspection apparatus includes an interface connector, an inspection mechanism, and a monitor. The interface connector connects the inspection apparatus with an external device. The inspection...
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7239166 |
Portable multi-purpose toolkit for testing computing device hardware and software
A testing device for determining the condition of hardware and/or software components of a computing (target) device is disclosed. The testing device includes a memory component, at least one...
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7239163 |
Die-level process monitor and method
A die-level process monitor (DLPM) provides a means for independently determining whether an IC malfunction is a result of the design or the manufacturing processing and further for gathering data...
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7239152 |
Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
Apparatus and methods are provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network analyzer in conjunction with a...
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7239165 |
Pulse transport apparatus, systems, and methods
Apparatus and systems, as well as methods and articles, may operate to transmit an initial pulse to a directional coupler, where the initial pulse has an initial amplitude and a timed overshoot of...
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7239126 |
System bench wireless mapping board
A system for testing electronic modules comprising at least one mapping board box, and at least one harness operably attached to the mapping board box with a harness port is disclosed. The mapping...
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7235995 |
Test apparatus and testing method
A test apparatus that tests a device under test, including a main memory having an expectation pattern storing region storing an expectation pattern sequence to be sequentially compared with output...
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7235990 |
Probe station comprising a bellows with EMI shielding capabilities
A probe station allows for effective EMI shielding of the passage of the probe through the wall of the housing of such probe station. The probe is freely movable in the X, Y and Z directions. The...
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7235996 |
Functionality test method
A functionality test method for a technical system having at least one technical component to be regularly tested. The method including the steps of defining a test interval by setting a minimum...
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7235994 |
Defect monitor for semiconductor manufacturing capable of performing analog resistance measurements
A mechanism is provided to address a structure under test and to identify a point of failure. A test open line carries a signal that indicates whether a structure under test is open or closed. A...
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7235997 |
CMOS leakage current meter
A leakage current detection circuit includes a first field effect transistor, the transistor configured to be biased to provide a leakage current, and a first current mirror in communication with...
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7233161 |
Integrated circuit and associated packaged integrated circuit having an integrated marking apparatus
An integrated circuit and an associated packaged integrated circuit are provided which improve testability and reduce the test costs. The integrated circuit contains an integrated functional...
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7233152 |
Short detection circuit and short detection method
A circuit and method for judging a latent short-circuit defect, also known as a short-circuit defect with time passing, in the case of a high voltage system. A detection-dedicated wiring for...
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7233162 |
Arrangements having IC voltage and thermal resistance designated on a per IC basis
Systems for testing a plurality of integrated circuits at a plurality of frequencies and voltages is disclosed. In one embodiment, a plurality of integrated circuits is tested at least once within...
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7231336 |
Glitch and metastability checks using signal characteristics
In accordance with the present invention there is provided a method for performing a glitch check in simulating a circuit. Current maximum and minimum values for optimization parameters of the...
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7230443 |
Non-contact mobile charge measurement with leakage band-bending and dipole correction
Corona charges are used to bias a wafer to push down mobile charges and then pull them up during temperature cycles. Mobile charge is measured from the drops in the corona voltage due to the mobile...
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7230441 |
Wafer staging platform for a wafer inspection system
A wafer staging platform for a wafer inspection system for inspecting of semiconductors or like substrates and method of handling wafers. The platform and related method is designed to reduce the...
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7230442 |
Semi-conductor component testing process and system for testing semi-conductor components
The invention involves a semi-conductor component testing process, and a system for testing semi-conductor components, in which a central computer device, in particular a central test apparatus is...
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7230447 |
Fault tolerant selection of die on wafer
Integrated circuit die on wafer are electronically selected for testing using circuitry ( 161, 201 , PA 1– PA 4 ) provided on the wafer.
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7230830 |
Semiconductor device socket
In a state wherein front ends of latch members 18 A and 18 B are apart from each other so that the upper surface of an alignment plate/positioning member 24 is outside, a pressing section 12...
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7227351 |
Apparatus and method for performing parallel test on integrated circuit devices
Embodiments of the invention connect a plurality of devices under test (DUTS) in a parallel manner and a high test current is selectively applied to each DUT. The apparatus to test a plurality of...
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7228410 |
Network interface sharing methods and apparatuses that support kernel mode data traffic and user mode data traffic
Methods and apparatuses are provided that allow kernel mode data traffic and user mode data traffic to share a common network communication port. One apparatus includes user mode logic, kernel mode...
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7228409 |
Networking interface sharing methods and apparatuses that support kernel mode data traffic and user mode data traffic
Methods and apparatuses are provided that allow kernel mode data traffic and user mode data traffic to share a common network communication port. One apparatus includes user mode logic, kernel mode...
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7225531 |
Index head in semicondcutor device test handler
An index head assembly for a semiconductor device test handler is provided which allows for precise positioning of a device in a test socket, as well as accurate testing of the device once properly...
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7227372 |
Voltage monitoring apparatus in a semiconductor probe station
An Electrical Die Sorting (EDS) process system for testing semiconductor chips comprises a probe station, a power supply unit configured in the probe station, and a voltage apparatus for measuring...
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7225097 |
Methods and apparatus for memory calibration
In a first aspect, a first method is provided for adjusting memory system calibration. The first method includes the steps of (1) while in a first operating state, calibrating the memory system...
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7224829 |
Bonding pattern discrimination method, bonding pattern discrimination device and bonding pattern discrimination program
Determination of inclination of positioning patterns used in bonding being made by: imaging a positioning pattern of reference chip and taking such image as reference-image; specifying a polar...
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7225357 |
SDIO card development system
An SDIO card development supporting system for development of SDIO cards, an SDIO controller reference board, and a method for running the system are disclosed. The SDIO card development supporting...
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7221170 |
Semiconductor test circuit
A semiconductor test circuit is installed inside a semiconductor device to measure the state of at least one electrical signal of the semiconductor device, and includes first, second, and Nth...
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7221147 |
Method and socket assembly for testing ball grid array package in real system
A method for testing a ball grid array package includes the following steps. Firstly, a printed circuit board having a plurality of contact pads thereon is provided. Then, a ball grid array test...
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7221180 |
Device and method for testing electronic components
A test device includes first and second testers each having at least one testing contact for making contact with at least one external contact of an electronic component; and a conveying device...
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7219286 |
Built off self test (BOST) in the kerf
A semiconductor device includes an integrated main circuit and an auxiliary circuit on a semiconductor substrate. The auxiliary circuit is configured to output and/or for receive electrical signals...
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7217579 |
Voltage contrast test structure
A method for electrically testing a semiconductor wafer during integrated-circuit fabrication process, the method including: (i) providing a scanning charged-particle microscope (SCPM), having a...
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7218093 |
Reduced chip testing scheme at wafer level
The present invention relates to production testing of semiconductor devices, more specifically to production testing of such devices at wafer level. A method according to the present invention...
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7215134 |
Apparatus for determining burn-in reliability from wafer level burn-in
A method, circuit and system for determining burn-in reliability from wafer level burn-in are disclosed. The method according to the present invention includes recording the number of failures in...
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7215131 |
Segmented contactor
A method of fabricating a large area, multi-element contactor. A segmented contactor is provided for testing semiconductor devices on a wafer that comprises a plurality of contactor units mounted...
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7215132 |
Integrated circuit and circuit board
In an integrated circuit implemented on a circuit board, output lines of an output circuit that outputs a logic signal are connected to the circuit board by soldering of a leadless terminal that...
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7215590 |
Semiconductor die with process variation compensated operating voltage
A semiconductor die includes at least one process monitoring circuit for evaluating at least one process parameter of the semiconductor die. The at least one process monitoring circuit can include...
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7215133 |
Contactless circuit testing for adaptive wafer processing
A system and method for measuring circuits on an integrated circuit substrate includes a measurement circuit formed on the integrated circuit substrate that measures at least one characteristic of...
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7212020 |
Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are interconnected with the short-circuited...
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7213183 |
Integrated circuit
The invention is directed to an integrated circuit that includes a plurality of functional circuit blocks. Respective associated multiplexers are used to change over between a normal mode and a...
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7212021 |
Manufacturing integrated circuits and testing on-die power supplies using distributed programmable digital current sinks
A method for designing and testing on-die power supply, power distribution, and noise suppression techniques for integrated circuits such as microprocessors is described. A network of time varying...
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7208935 |
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
Apparatus and methods are provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network analyzer in conjunction with a...
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