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Match Document Document Title
7622941 Liquid crystal display panel and testing and manufacturing methods thereof  
A liquid crystal display (LCD) panel simplifying its testing and manufacturing. The LCD panel includes (formed on a substrate) gate lines, data lines, and pixels including pixel transistors. The...
7622940 Semiconductor device having contact failure detector  
A semiconductor device having a circuit for detecting a defective connection to the semiconductor device. A semiconductor device including multiple internal circuits; multiple pads respectively...
7619433 Test circuit for a semiconductor integrated circuit  
A test circuit includes an output control section for generating a plurality of output buffer control signals in response to a plurality of data masking signals when a test mode signal is activated...
7619432 Tandem handler system and method for reduced index time  
A system for testing with an automated test equipment (ATE) includes a tester having at least one test resource, a tandem handler, and a mux relay that switchably connects the test resource, via...
7619431 High sensitivity magnetic built-in current sensor  
A sensor for contactlessly detecting currents, has a sensor element having a magnetic tunnel junction (MTJ), and detection circuitry, the sensor element having a resistance which varies with the...
7619184 Multi-parameter process and control method  
A method and system for generating control settings for a multi-parameter control system. The interdependencies of processing tools and the related effect on semiconductor wafers within a...
7617064 Self-test circuit for high-definition multimedia interface integrated circuits  
A high-definition multimedia interface circuit uses a high-definition multimedia interface encoder to produce a plurality of channels of data. An output circuit, connected to the high-definition...
7616020 Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device  
In an embodiment, a semiconductor device is tested using a probe pad that includes a probing region with which a probe needle makes contact, and a sensing region bordering an edge of the probing...
7613237 Built-in test feature to facilitate system level stress testing of a high-speed serial link that uses a forwarding clock  
A method of ensuring robust operation of a differential serial link is provided. The method provides a first integrated circuit having 1) a phase generator constructed and arranged to provide a...
7612574 Systems and methods for defect testing of externally accessible integrated circuit interconnects  
Apparatus and methods provide built-in testing enhancements in integrated circuits. These testing enhancements permit, for example, continuity testing to pads and/or leakage current testing for...
7612573 Probe sensing pads and methods of detecting positions of probe needles relative to probe sensing pads  
A probe sensing pad used to detect a position of a probe needle includes a probe area, at least two sensing regions contacting peripheral portions of the probe area, sensing elements of different...
7609758 Method of phase shifting bits in a digital signal pattern  
A method of phase shifting bits in a digital signal pattern combines a bit-wise phase-shift signal with an external clock signal to produce a perturbed clock signal. The perturbed clock signal is...
7609079 Probeless DC testing of CMOS I/O circuits  
A method and implementation is described by which I/O input and output circuitry of a CMOS chip are measured without the need to probe the chip. Output driver transistors are used to provide...
7609076 Method of measuring characteristic impedance of electrostatic discharge protecting circuit and apparatus for realizing the same  
A method of quickly measuring a characteristic impedance of an ESD protecting circuit by applying a discharge voltage to the ESD protecting circuit, includes the steps of measuring a variation in...
7605597 Intra-chip power and test signal generation for use with test structures on wafers  
The fabrication of the wafer may be analyzed starting from when the wafer is in a partially fabricated state. The value of a specified performance parameter may be determined at a plurality of...
7605584 Voltage generating apparatus, current generating apparatus, and test apparatus  
There is provided a voltage generating apparatus that outputs a power source voltage from a voltage outputting terminal. The apparatus includes a voltage outputting section that outputs the power...
7602205 Electromigration tester for high capacity and high current  
An electronic device under test (DUT) may be incorporated into a circuit having a voltage limiter connected in parallel with the DUT. The circuit includes a controlled current source having an...
7598761 Semiconductor integrated circuit having a degradation notice signal generation circuit  
It is made possible to detect degradation in a circuit before an operation fault will occur. A semiconductor integrated circuit includes: a circuit to be tested; a plurality of logical circuits...
7598731 Systems and methods for adjusting threshold voltage  
Systems and methods for adjusting threshold voltage. A threshold voltage of a transistor of an integrated circuit is measured. A bias voltage, which when applied to a body well of the transistor...
7595654 Methods and apparatus for inline variability measurement of integrated circuit components  
An integrated circuit device is provided including at least one first array configuration of integrated circuit components comprising a m×n array of FETs, without specified internal connections...
7592824 Method and apparatus for test and characterization of semiconductor components  
A method and apparatus for testing and characterizing circuits is provided. In one embodiment, a high-speed interface of a semiconductor component includes high-speed test circuitry. The high-speed...
7592797 Semiconductor device and electronics device  
A plurality of switch circuits are disposed so as to correspond to a plurality of circuit blocks, respectively. Each of the plurality of switch circuits is connected between a power supply terminal...
7589551 On-wafer AC stress test circuit  
To make an alternating current (AC) stress test easier to perform in a wafer, an AC stress test circuit for performing the AC stress test on a test device fabricated in a test region of the wafer...
7580020 Semiconductor device and liquid crystal panel driver device  
A semiconductor device carries out a test utilizing contact with a probe needle without being affected by narrowing of the pitch at which output pads are arranged. The device is equipped with test...
7577926 Security-sensitive semiconductor product, particularly a smart-card chip  
To provide a security-sensitive semiconductor product, particularly a smartcard chip, in which are produced not only electrically active structures ( 2, 3, 4, 5, 6 ) envisaged by the chip design in...
7576554 Semiconductor devices and methods of testing the same  
A semiconductor device may include a plurality of output electrodes configured to provide electrical coupling for a respective plurality of output signals outside the semiconductor device. A signal...
7574318 I/O port tester  
An I/O port tester includes a first relay, a second relay, a first resistor, a second resistor, a plurality of serial plugs, a water sensor plug, a direct current (DC) voltage plug, and two data...
7573937 Phase rotator control test scheme  
Techniques and apparatus for testing phase rotators for detecting defective tap weights are provided. Phase rotator test logic may include a master phase rotator to cycle the phase of a clock...
7573285 Multiple point gate oxide integrity test method and system for the manufacture of semiconductor integrated circuits  
A method for testing a semiconductor wafer using an in-line process control, e.g., within one or more manufacturing processes in a wafer fabrication facility and/or test/sort operation. The method...
7571365 Wafer scale testing using a 2 signal JTAG interface  
Testing of die on wafer is achieved by; (1) providing a tester with the capability of externally communicating JTAG test signals using simultaneously bidirectional transceiver circuitry, (2)...
7567882 Method for evaluating semiconductor device  
The present invention provides a method for evaluating an intended element or a parameter. In addition, the invention provides an evaluation method for obtaining a more precise result rapidly....
7567091 Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer  
A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are interconnected with the short-circuited...
7564254 Semiconductor device and test method thereof  
A semiconductor device includes: a command control circuit for decoding a command signal to output a test signal and a normal control signal; a normal circuit for performing a predetermined...
7560946 Method of acceptance for semiconductor devices  
A method of accepting semiconductor chips is provided using on-chip parametric measurements. An on-chip parametric measurement structure is determined for each parameter in a set of parametric...
7560945 Integrated circuit failure prediction  
An integrated circuit having a frequency generator connected to a constant reference voltage source located on the integrated circuit and a monitor connected to monitor the frequency signal and...
7557598 Method of inspecting quiescent power supply current in semiconductor integrated circuit and device for executing the method  
A method of inspecting a quiescent power supply current in a semiconductor integrated circuit, includes an ID information acquisition process for acquiring ID information of the semiconductor...
7557597 Stacked chip security  
The present invention is directed to an integrated circuit module device. The device includes a first semiconductor chip having a first circuit layer and at least one first interconnection element...
7557596 Test assembly including a test die for testing a semiconductor product die  
One embodiment of the present invention concerns a test assembly for testing product circuitry of a product die. In one embodiment, the test assembly includes at test die and an interconnection...
7557587 Control apparatus, semiconductor integrated circuit apparatus, and source voltage supply control system  
An excluding unit is controlled by a control signal received from a control unit, and based on the control signal a determination is made for each of circuit blocks as to whether either a voltage...
7554335 Production test technique for RF circuits using embedded test sensors  
A single test stimulus and a simple test configuration with embedded envelope detectors are used to estimate all the specification values of interest for an RF circuit under test in an integrated...
7550987 Method and circuit for measuring operating and leakage current of individual blocks within an array of test circuit blocks  
A method and circuits for measuring operating and leakage current of individual blocks within an array of test circuit blocks provides measurement free of error due to leakage currents through...
7550986 Semiconductor wafer having a dielectric reliability test structure, integrated circuit product and test method  
A semiconductor wafer includes a dielectric test structure including a voltage line, a control line, and a plurality of test devices connected in parallel to the voltage line and the control line....
7550976 Apparatus/method for measuring the switching time of output signals of a DUT  
A measurement apparatus is provided for measuring at least one of the switching times of the output signals output from a device under test. The measurement apparatus comprises: a first...
7548828 Automatic test equipment platform architecture using parallel user computers  
The present invention provides a system of testing semiconductor devices. The system comprises a central host computer, an array of user computers (the array), and a HU (Host-User) network as the...
7548055 Testing an electronic device using test data from a plurality of testers  
A method and apparatus for testing a set of electronic devices can comprise placing electronic devices into a test station. A plurality of testers can provide test data to the test station. The...
7545161 Method and apparatus to measure threshold shifting of a MOSFET device and voltage difference between nodes  
An on-chip circuit to quantitatively measure threshold voltage shifts of a MOSFET. The circuit includes a programmable Vt reference sensor; a programmable Vt monitoring sensor; and a comparator for...
7543507 Failure analysis system for printed circuit board and method using the same  
A failure analysis system ( 900 ) for printed circuit board ( 600 ) includes testing equipment ( 100 ) and a monitor ( 200 ). The testing equipment includes a base ( 120 ), a fixing body ( 180 ), a...
7543198 Test data reporting and analyzing using data array and related data analysis  
Reporting and/or analyzing test data from a plurality of tests of an array structure using a data array. One method includes obtaining the test data, and reporting the test data in a data array,...
7543196 Apparatus for testing integrated circuit  
An apparatus for testing integrated circuits is disclosed. The apparatus for testing integrated circuits comprises an integrated circuit and a tester. The integrated circuit undergoing testing...
7541829 Method for correcting for asymmetry of threshold voltage shifts  
A method for correcting of asymmetric shifts in threshold voltage of transistors caused by effects such as negative-bias temperature instability (NBTI) during burn-in. The method may include...
Matches 1 - 50 out of 849 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 >