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7629807 |
Electrical test probe
A probe for electrical test comprises a plate-shaped main portion having a base end to be attached to a support board and a tip end opposite the base end, and a probe tip portion arranged at the...
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7629803 |
Probe card assembly and test probes therein
Disclosed are a probe card assembly and test probes used therein. The probe card assembly includes a main body, a probe base provided at a center of the main body, and a plurality of test probes...
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7629806 |
Method for forming connection pin, probe, connection pin, probe card and method for manufacturing probe card
A probe which can be easily formed, is not limited in a mounting position and number, and capable of sufficiently securing a space allowing a contact to move is provided. The probe has a contact to...
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RE41016 |
Probe card having groups of probe needles in a probing test apparatus for testing semiconductor integrated circuits
A probe card which can help to enhance the productivity of semiconductor integrated circuits manufacturing and to reduce the manufacturing cost thereof, and a method of probe-testing semiconductor...
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7619429 |
Integrated probe module for LCD panel light inspection
A probe module which is particularly suitable for testing an LCD panel. The probe module includes a probe base, a plurality of probe pins provided on the probe base, and a high-density circuit...
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7619430 |
Electrical testing probe assembly having nonparallel facing surfaces and slots formed thereon for receiving probes
Disclosed is a probe assembly for use in electrical testing of a test object. The probe assembly has a probe supporter body elongated in a first direction. The probe supporter has a first side...
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7616016 |
Probe card assembly and kit
In a probe card assembly, a series of probe elements can be arrayed on a silicon space transformer. The silicon space transformer can be fabricated with an array of primary contacts in a very tight...
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7605368 |
Vibration-type cantilever holder and scanning probe microscope
A vibration-type cantilever holder holds a cantilever opposed to a sample. The holder supports a main body part of the cantilever at only its base end so that a probe at the free end of the...
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7602204 |
Probe card manufacturing method including sensing probe and the probe card, probe card inspection system
There is provided a method of manufacturing a probe card. A first passivation pattern for implementing a tip portion of an electrical inspection probe and a tip portion of a planarity sensing probe...
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7602202 |
Semiconductor probe with high resolution resistive tip having doping control layer and method of fabricating the same
A semiconductor probe and a method of fabricating the same are provided. The semiconductor probe includes a cantilever doped with first impurities, a resistive tip which protrudes from an end of...
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7589547 |
Forked probe for testing semiconductor devices
A novel forked probe design for use in a novel probe card is presented that comprises a forked bending element that more efficiently stores displacement energy. Specifically, the novel probe card...
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7589542 |
Hybrid probe for testing semiconductor devices
A hybrid probe design is presented that includes a torsion element and a bending element. These elements allow the probe to store the displacement energy as torsion or as bending. The probe...
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7586316 |
Probe board mounting apparatus
A mounting apparatus that does not compromise the strength of a probe board. The apparatus comprises a probe board spaced from a support member by a spacer. A fixed portion with a female screw hole...
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7586321 |
Electrical test probe and electrical test probe assembly
An electrical test probe comprises a probe tip portion and a probe main body portion having a pedestal portion on which the probe tip portion is formed to be protruded. The probe main body portion...
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7583100 |
Test head for testing electrical components
A test head for testing electronic parts including a base having radial slots for receiving contact mounting assemblies. The contact mounting assemblies are removably mounted to the base and are...
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7583101 |
Probing structure with fine pitch probes
A microelectronic resilient structure can comprise a support member and a platform attached to the support member. The platform can comprise a non-conductive, resilient beam that extends away from...
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7579855 |
Method for manufacturing electrical contact element for testing electronic device and electrical contact element manufactured thereby
Disclosed is an electrical contact element used to test an electronic device. The electrical contact element has a beam portion and a tip portion attached to an end of the beam portion. In...
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7579856 |
Probe structures with physically suspended electronic components
A probe apparatus can include a substrate, a contact structure attached to the substrate, and an electronic component electrically connected to the contact structure. The electronic component can...
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7579850 |
Probe card and method for assembling the same
A probe card and a method for assembling the same, the probe card has a base plate, a plurality of probes, a fixing ring, and a fixing member. The fixing ring is provided with a hole and the outer...
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7579857 |
Electrical contact device of probe card
An electrical contact device of a probe card includes a base and probes on the base. The base has a top side with a cavity thereon, and the cavity has sidewalls connected to the top side. Anchored...
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7573281 |
Probe for inspecting one or more semiconductor chips
A probe available for a narrow pitch pad without the need of cleaning is realized by providing a z deformed portion that is elastically deformed in a vertical direction, and a zθ deformed portion...
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7570061 |
Cantilever control device
A cantilever control device is provided that can prevent, in an atomic force microscope, self-excited oscillation of a cantilever from stopping and prevent a probe of the cantilever from coming...
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7567089 |
Two-part microprobes for contacting electronic components and methods for making such probes
Embodiments disclosed herein are directed to compliant probe structures for making temporary or permanent contact with electronic circuits and the like. In particular, embodiments are directed to...
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7560943 |
Alignment features in a probing device
An image of an array of probes is searched for alignment features. The alignment features are then used to bring contact targets and the probes into contact with one another. The alignment features...
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7560942 |
Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatus
To arrange a probe needle in a reproducible manner, ensure reliable contact-connection of the probe needle and ensure that the probe needle is held securely even at high temperatures or test...
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7559139 |
Method for manufacturing a probe unit
A method for manufacturing a probe unit includes: (a) preparing a substrate; (b) forming a hollow part in the substrate; (c) forming a sacrificial layer that buries the hollow part on the...
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7557595 |
Cantilever microprobes for contacting electronic components and methods for making such probes
Embodiments disclosed herein are directed to compliant probe structures for making temporary or permanent contact with electronic circuits and the like. In particular, embodiments are directed to...
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7550855 |
Vertically spaced plural microsprings
A plurality of vertically spaced-apart microsprings are provided to increase microspring contact force, contact area, contact reliability, and contact yield. The microspring material is deposited,...
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7548082 |
Inspection probe
A conventional inspection probe has posed such problems that, when a pitch is as fine as up to 40 μm, a positional accuracy is difficult to ensure depending on constituting materials and a...
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7545160 |
Probe chip and probe card
The present invention provides a probe chip and a probe card in which when troubles such as breakage etc. occur in a probe of a contact portion of a probe card, the contact portion can be easily...
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7541821 |
Membrane probing system with local contact scrub
A membrane probing assembly includes a support element having an incompressible forward support tiltably coupled to a rearward base and a membrane assembly, formed of polyimide layers, with its...
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7538567 |
Probe card with balanced lateral force
A novel method and structure for counter-balancing a lateral force exerted by a probe card onto a device under test (“DUT”) is disclosed. Many DUTs (particularly memory devices) are tested in...
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7528618 |
Extended probe tips
Probe tips, methods for making probe tips, and method for using such probe trips are described. The probe tips can include a pedestal portion connected to a beam of a cantilever structure and a...
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7525328 |
Cap at resistors of electrical test probe
A lossy dielectric device dissipates, absorbs, and/or dampens electric fields. The lossy dielectric device may be used with any transmission path, such as a transmission line or resistor in a probe...
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7523539 |
Method of manufacturing a probe
In a probe manufacturing method, after a metal material for a probe is deposited on a base table, the probe can be detached from the base table relatively easily without damaging the probe. A...
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7518387 |
Shielded probe for testing a device under test
A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
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7514948 |
Vertical probe array arranged to provide space transformation
Improved probing of closely spaced contact pads is provided by an array of vertical probes having all of the probe tips aligned along a single contact line, while the probe bases are arranged in an...
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7511524 |
Contact tip structure of a connecting element
The present invention relates to a contact tip structure of a connecting element designed for electric testing of electronic components. The connecting element comprises a fixing post coupled to a...
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7504842 |
Probe holder for testing of a test device
A system for low-current testing of a test device includes a probing device for probing a probing site on the test device. The probing device includes a dielectric substrate having first and second...
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7504840 |
Electrochemically fabricated microprobes
Multilayer test probe structures are electrochemically fabricated via depositions of one or more materials in a plurality of overlaying and adhered layers. In some embodiments each probe structure...
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7501840 |
Probe assembly comprising a parallelogram link vertical probe made of a metal foil attached to the surface of a resin film
A probe assembly for performing circuit inspection of semiconductor chips according to which a resin film with copper foil attached thereto is used to form a conductive portion including a vertical...
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7501838 |
Contact assembly and LSI chip inspecting device using the same
A contact assembly and an LSI chip inspecting device using the same are disclosed. The contact assembly is mounted between an electronic device to be tested and a circuit inspecting device to...
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7495461 |
Wafer probe
The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.
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7492177 |
Bendable conductive connector
A conductive connector includes a bendable, shape retainable extension having a first end and a second end. The first end is integral with the probing head. The test point connector is integral...
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7482826 |
Probe for scanning over a substrate and a data storage device
A data storage device comprises a storage medium for storing data in the form of marks and at least one probe for scanning the storage medium. The storage medium may be comprised in a substrate....
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7482822 |
Apparatus and method for limiting over travel in a probe card assembly
Methods and apparatuses for testing semiconductor devices are disclosed. Over travel stops limit over travel of a device to be tested with respect to probes of a probe card assembly. Feedback...
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7477061 |
Probe card
A probe card mainly includes a circuit board, a probe assembly, an elastic support assembly, a plurality of level maintaining assemblies and a turning secure assembly. The circuit board has pads...
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7477062 |
LSI test socket for BGA
There is provided an LSI socket containing a pogo-pin type decoupling capacitor for reducing the potential fluctuation of power supplies and GNDs at the time of testing LSI incorporated in a BGA...
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7459925 |
Probe card
A PCB of a probe card includes a first region, a second region, a third region and a fourth region arranged clockwise. The circuit pattern of the first region corresponds to the circuit pattern of...
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7456641 |
Probe card that controls a temperature of a probe needle, test apparatus having the probe card, and test method using the test apparatus
Provided are a probe card, a test apparatus having the probe card, and a test method using the test apparatus. The probe card includes a probe substrate having a signal line, a probe needle...
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