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7616019 |
Low profile electronic assembly test fixtures
Low profile printed circuit board assembly test fixtures and methods are disclosed, the fixtures mountable at a tester having a plurality of conductive interface contacts. The fixture includes a...
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7616016 |
Probe card assembly and kit
In a probe card assembly, a series of probe elements can be arrayed on a silicon space transformer. The silicon space transformer can be fabricated with an array of primary contacts in a very tight...
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7616015 |
Wafer type probe card, method for fabricating the same, and semiconductor test apparatus having the same
Example embodiments may provide a wafer type probe card, a method of fabricating a wafer type probe card, and/or a semiconductor test apparatus having the wafer type probe card. The wafer type...
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7612572 |
Probe and method of manufacturing a probe
A probe 10 to be used when inspecting characteristics of an object of inspection includes: a bar-shaped base member 3 forming a main body; a nickel plating layer 4 constituting a ground layer...
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7605582 |
Modular interface
An apparatus for interfacing a test head to a peripheral system is provided. The apparatus includes a first unit having a first connection member for providing electrical communication with the...
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7602203 |
Probe and probe card
An object of the present invention is to make it possible that a probe for testing electrical characteristics of an object to be tested is easily attached to a support member such as a contactor. A...
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7602199 |
Mini-prober for TFT-LCD testing
An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays. The apparatus...
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7598757 |
Double ended contact probe
It is an object of the present invention to provide a double-ended contact probe that can be improved in productivity to ensure that the contact members are stably movable with respect to each...
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7598756 |
Inspection device and inspection method
A first conductive contact connecting a first electrode of an inspection circuit board and one external electrode of a semiconductor integrated circuit is arranged in a fixed member. A second...
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7593872 |
Method and system for designing a probe card
A method and system for designing a probe card from data provided by prospective customers via the Internet is provided. Design specifications are entered into the system by prospective customers...
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7592822 |
Probing adapter for a signal acquisition probe having pivoting, compliant, variable spacing probing tips
A probing adapter has a support member receiving a probing tip assembly having probing arms. The probing tip assembly is mounted to the support member via a rotational joint having elastomeric...
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7592821 |
Apparatus and method for managing thermally induced motion of a probe card assembly
A probe card assembly can include a probe head assembly having probes for contacting an electronic device to be tested. The probe head assembly can be electrically connected to a wiring substrate...
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7586320 |
Plunger and chip-testing module applying the same
A plunger is suitable for a chip-testing module having a probe card, which has a circuit board and a membrane. The membrane has a circuit layer disposed on a first membrane surface of the membrane,...
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7586318 |
Differential measurement probe having a ground clip system for the probing tips
A differential measurement probe has a ground clip system for electrically coupling outer shielding conductors of differential probing tips together. In one embodiment, the probing tips...
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7586316 |
Probe board mounting apparatus
A mounting apparatus that does not compromise the strength of a probe board. The apparatus comprises a probe board spaced from a support member by a spacer. A fixed portion with a female screw hole...
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7585548 |
Integrated compound nano probe card and method of making same
An integrated compound nano probe card is disclosed to include a substrate layer having a front side and a back side, and compound probe pins arranged in the substrate layer. Each compound probe...
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7579855 |
Method for manufacturing electrical contact element for testing electronic device and electrical contact element manufactured thereby
Disclosed is an electrical contact element used to test an electronic device. The electrical contact element has a beam portion and a tip portion attached to an end of the beam portion. In...
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7570069 |
Resilient contact probes
Carriers comprising a carrier body having a plurality of openings holding a plurality of resilient contact probes are disclosed. A number of different embodiments for the resilient contact probes...
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7567089 |
Two-part microprobes for contacting electronic components and methods for making such probes
Embodiments disclosed herein are directed to compliant probe structures for making temporary or permanent contact with electronic circuits and the like. In particular, embodiments are directed to...
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7564252 |
Semiconductor inspection apparatus
A semiconductor inspection apparatus includes a force probe applying voltage to a semiconductor device, and a sense probe detecting voltage of the semiconductor device, in which the force probe is...
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7557595 |
Cantilever microprobes for contacting electronic components and methods for making such probes
Embodiments disclosed herein are directed to compliant probe structures for making temporary or permanent contact with electronic circuits and the like. In particular, embodiments are directed to...
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7546670 |
Method for producing thermally matched probe assembly
A method to fabricate a high density, minimal pitch, thermally matched contactor assembly to maintain electrical contact with contact regions on fully processed semiconductors, preferably while...
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7545159 |
Electrical test probes with a contact element, methods of making and using the same
Disclosed herein are electrical test probes and methods for making the same. In one embodiment, an electrical test probe comprises: a barrel, a plunger, a contact element, and a spring. The barrel...
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7538568 |
Spring loaded probe pin
A conductive plunger 3 is received inside a cylindrical conductive barrel 2 so as to be capable of moving backward and forward, an urging coil spring 4 for pushing a rear end 3 b of the...
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7538567 |
Probe card with balanced lateral force
A novel method and structure for counter-balancing a lateral force exerted by a probe card onto a device under test (“DUT”) is disclosed. Many DUTs (particularly memory devices) are tested in...
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7538566 |
Electrical test system including coaxial cables
An electrical test system includes a test head, a performance board, a probe card and coaxial cables. The performance board includes a first side and an opposite second side, where the first side...
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7538565 |
High density integrated circuit apparatus, test probe and methods of use thereof
A high density test probe which provides an apparatus for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense...
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7535241 |
Test probe with hollow tubular contact with bullet-nosed configuration at one end and crimped configuration on other end
An electrical test probe for a connector assembly includes an elongated contact, an elongated helical coil spring, and an elongated, electrically conductive tubular member disposed about the...
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7525328 |
Cap at resistors of electrical test probe
A lossy dielectric device dissipates, absorbs, and/or dampens electric fields. The lossy dielectric device may be used with any transmission path, such as a transmission line or resistor in a probe...
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7525299 |
Apparatus for accessing and probing the connections between a chip package and a printed circuit board
A device to access and/or verify connections between a chip package and a printed circuit board (“PCB”), specifically within packages lacking back-side measurement access, includes a housing...
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7521949 |
Test pin, method of manufacturing same, and system containing same
A test pin includes a compression element ( 110 ), a first tip ( 120 ) physically coupled to a first end ( 111 ) of the compression element, a second tip ( 130 ) physically coupled to a second end...
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7514948 |
Vertical probe array arranged to provide space transformation
Improved probing of closely spaced contact pads is provided by an array of vertical probes having all of the probe tips aligned along a single contact line, while the probe bases are arranged in an...
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7514943 |
Coordinate transforming apparatus for electrical signal connection
Vertical contactors regularly arrayed over a film is brought into vertical contact with the end faces of wiring terminals formed at one end of a flexible flat cable, and signal lines from a...
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7511518 |
Method of making an interposer
A method of making an interposer in which at least two dielectric layers are bonded to each other to sandwich a plurality of conductors there-between. The conductors each electrically couple a...
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7502963 |
Optimization by using output drivers for discrete input interface
The invention relates to design optimization of microprocessors using spare driver outputs for discrete input interfaces. An output driver or pre-FET driver is used to interface a discrete input...
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7501841 |
Probe assembly with multi-directional freedom of motion and mounting assembly therefor
An improved test probe assembly has an improved mounting assembly which provides the test probe multi-directional freedom of movement with respect to a base in order to resist damage frequently...
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7501839 |
Interposer and test assembly for testing electronic devices
A test apparatus which uses a pair of substrates and housing to interconnect a host substrate (e.g., PCB) to an electronic device (e.g., semiconductor chip) to accomplish testing of the device. The...
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7501838 |
Contact assembly and LSI chip inspecting device using the same
A contact assembly and an LSI chip inspecting device using the same are disclosed. The contact assembly is mounted between an electronic device to be tested and a circuit inspecting device to...
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7492177 |
Bendable conductive connector
A conductive connector includes a bendable, shape retainable extension having a first end and a second end. The first end is integral with the probing head. The test point connector is integral...
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7492174 |
Testing apparatus for surface mounted connectors
This invention describes a device for testing a surface mounted connector using a test probe assembly that utilizes a vacuum to force the test wires and the test probe's wire array into intimate...
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7492172 |
Chuck for holding a device under test
A chuck that includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is...
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7482822 |
Apparatus and method for limiting over travel in a probe card assembly
Methods and apparatuses for testing semiconductor devices are disclosed. Over travel stops limit over travel of a device to be tested with respect to probes of a probe card assembly. Feedback...
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7479780 |
Tester for in-circuit testing bed of nails fixture and testing circuit thereof
In one preferred embodiment, a tester for testing an In-Circuit Testing (ICT) bed of nails fixture includes an interface for connecting a cable, wherein the cable is connected to the ICT bed of...
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7477066 |
Universal grid composite circuit board testing tool
The present invention discloses a universal grid composite circuit board testing tool having a probe station, a clamp base and a conducting wire base. The probe station and clamp base separately...
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7477065 |
Method for fabricating a plurality of elastic probes in a row
A method of forming a plurality of elastic probes in a row is disclosed. Firstly, a substrate is provided, then, a shaping layer is formed on the substrate so as to offer two flat surfaces in...
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7477062 |
LSI test socket for BGA
There is provided an LSI socket containing a pogo-pin type decoupling capacitor for reducing the potential fluctuation of power supplies and GNDs at the time of testing LSI incorporated in a BGA...
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7477061 |
Probe card
A probe card mainly includes a circuit board, a probe assembly, an elastic support assembly, a plurality of level maintaining assemblies and a turning secure assembly. The circuit board has pads...
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7474113 |
Flexible head probe for sort interface units
Embodiments of the invention provide a flexible probe head that improves contact force and uniform mechanical contact pressure between the probe feature and an engaged bond pad. Flexible probe head...
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7471097 |
Test probe with planar ground tip extending transversely from the ground barrel for a semiconductor package
An embodiment may comprise a test probe to measure electrical properties of a semiconductor package having ball-shaped terminals. The probe may include a signal tip and a ground tip. The signal tip...
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7468612 |
Dermal phase meter with improved replaceable probe tips
A probe for a dermal phase meter includes a handle with a removable extension that terminates with a displaceable center conductor. A replaceable tip attaches to the distal end of the extension and...
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