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7164280 |
Electrical test device
An electrical test device, in particular for testing wafers, having a contact head, which is associated with the test object and is provided with pin-shaped contact elements that are arrayed to...
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7161369 |
Method and apparatus for a wobble fixture probe for probing test access point structures
A method and apparatus for a wiping fixture probe for cleaning oxides, residues or other contaminants from the surface of a solder bead probe and probing a solder bead probe on a printed circuit...
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7161366 |
Method and apparatus for probe tip contact
The invention is a method and apparatus for a probe tip contact for electrically coupling a substrate to a probe tip. The apparatus, in one embodiment, comprises a wrap-around contact that is...
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7157922 |
Planar electroconductive contact probe holder
An opening 5 a is formed in a part of a high strength base plate 5 for providing electroconductive contact units, and a holder hole forming member 7 made of plastic material is filled into...
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7154285 |
Method and apparatus for providing PCB layout for probe card
An effective and easy to fabricate method to test multiple integrated circuit device designs using a single, probe card design is provided. A universal, probe card design is disclosed herein to...
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7154286 |
Dual tapered spring probe
A contact spring probe includes a plunger and a spring with a pair of opposed closed coils separated by an open coil. The plunger is secured at one end to one set of closed coils with a shoulder,...
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7148713 |
Algoristic spring as probe
A contact probe including a length of wire with head, coil and tail sections. The head and tail sections may be lengthened and offset from the longitudinal axis of the coil section to allow the...
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7148709 |
Freely deflecting knee probe with controlled scrub motion
A rigid column and a suspension knee are combined in a probe held in assembly via its column. The suspension knee has a base arm laterally connecting at and propagating away from the column. The...
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7148710 |
Probe tile for probing semiconductor wafer
A tile used to hold one or more probes for testing a semiconductor wafer. The tile has one or more sites for inserting one or more probes to test the semiconductor wafer. Each site has one or more...
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7145351 |
Electrical inspection apparatus
An electrical inspection apparatus performs highly accurate electrical inspection using an inspection probe on any type of printed board without changing an instrument therefor. It comprises a...
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7145352 |
Apparatus, method, and kit for probing a pattern of points on a printed circuit board
An apparatus, method, and kit for probing a pattern of points on a first printed circuit board are disclosed. In one exemplary embodiment, the apparatus includes a probe having i) a plurality of...
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7141996 |
Flip chip test structure
A flip chip test structure is disclosed. The flip chip test structure utilizes a substrate used in flip chip package to replace the conventional transformer of a flip chip wafer probe card. The...
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7138812 |
Probe card
Provided is a probe card including: a printed circuit board comprising a ground electrode; at least one dielectric disposed below the ground electrode; and a plurality of needles, each of which...
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7132839 |
Ultra-short low-force vertical probe test head and method
A method and apparatus for making a probe head that is very short (in the direction vertical) and exerts low force on the contacts of the circuit being tested, and on its own pins. The probe head...
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7129728 |
LSI test socket for BGA
There is provided an LSI socket containing a pogo-pin type decoupling capacitor for reducing the potential fluctuation of power supplies and GNDs at the time of testing LSI incorporated in a BGA...
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7126364 |
Interface comprising a thin PCB with protrusions for testing an integrated circuit
The invention relates to a test device for testing an integrated circuit called test circuit, comprising a plurality of housings intended to be tested in a printed circuit called main circuit. The...
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7123034 |
Contactor assembly for common grid array devices
A contactor apparatus used in automatic testing of integrated circuits is provided. The invented apparatus, or assembly, enables the rapid automated test transition from testing a plurality of...
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7119562 |
Contact-type film probe
A contact-type film probe including a plastic substrate and multiple signal lines arranged on one face of the substrate. A contact conductive layer is disposed at one end of each signal line. A...
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7119557 |
Hollow microprobe using a MEMS technique and a method of manufacturing the same
The present invention relates to a hollow microprobe using an MEMS technique and a method of manufacturing the same. A method of manufacturing a hollow microprobe using an MEMS technique according...
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7119558 |
Test probe for finger tester and corresponding finger tester
A test probe for a finger tester for the testing of non-componented circuit boards has a test needle with a probe tip which may be brought into contact with a circuit board test point, and which...
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7116123 |
Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured
A contact probe includes a probe tip and a damper. The probe tip includes a first barrel, a probe pin, and a first spring. The first barrel has a cavity with a bottom, an opening being disposed in...
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7112976 |
Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested
Two resilient sections are connected to a tip end which is to be brought into contact with an external connection terminal of a contact belonging to a test socket of an electronic device or...
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7109700 |
Multimeter having off-device display device and selection device
Electronic testing devices such as multimeters, and probes therefor. The probes may have off-device display devices attached thereto. The display devices may be non-detachably attached to the...
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7109732 |
Electronic component test apparatus
A test apparatus and method in which a compressible housing is used to retain an electronic component having conductors thereon. The compressible housing is lowered onto a suitable base member...
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7106080 |
Probe card and contactor of the same
The probe card to be used for the measurement of the electrical characteristics of a semiconductor device such as an LSI chip and comprising the contactor mounting substrate on which a plurality of...
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7100273 |
Interconnect validation instruments
Interconnect validation instruments and methods are provided. In one embodiment, an interconnect validation instrument has a shell with an opening at first end thereof and a second end opposite the...
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7102375 |
Pin electronics with high voltage functionality
In one aspect, the invention is an integrated circuit (IC) for use in testing a device. The IC includes a pin electronics (PE) driver having an output and a pin. The IC also includes a buffer...
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7102373 |
Inspection unit
A conductive member has a first face adapted to be mounted on a board on which an inspection circuit is arranged and a second face adapted to be opposed to a device to be inspected. The conductive...
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7102370 |
Compliant micro-browser for a hand held probe
A micro-browser has pair of rods each rod entering a corresponding bore in a sleeve that retains them, and that may itself be carried by a grip shaped to be rotated between a thumb and a finger....
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7098679 |
Circuit tester interface
A printed circuit board comprises a plurality of inner and outer holes. An electrically conductive barrel may be disposed in each outer hole, and an electrically conductive barrel and a probe may...
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7091735 |
Testing probe and testing jig
A testing probe includes a first sleeve, a first springy component, a first movable rod, a second springy component, and at least one second movable rod. The first sleeve has a first containing...
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7092902 |
Automated system for designing and testing a probe card
A method and system for designing a probe card from data provided by prospective customers via the Internet is provided. Design specifications are entered into the system by prospective customers...
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7091729 |
Cantilever probe with dual plane fixture and probe apparatus therewith
A cantilever probe has an elbow for bonding to a dual plane fixture plate for a highly stiff and precise angled fixture of the bonded cantilever probe with minimal real estate consumption. The...
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7091734 |
Electroconductive contact unit
In the electroconductive contact unit of the present invention, an electroconductive needle member 2 is made of a noble metal alloy having a high hardness and wear resistance, and formed with a...
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7091415 |
Low profile mass interconnect device
A scalable mass interconnect device having a receiver assembly with module mounting members positioned in the receiver frame in a direction parallel to a plane of movement of the engagement cams in...
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7088118 |
Modularized probe card for high frequency probing
A modularized probe head for high frequency probing is provided. The probe head mainly includes a probe head, a mounting board and an interposer between the probe head and the mounting board. The...
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7084659 |
Power supply arrangement for integrated circuit tester
A test head for a semiconductor integrated circuit tester, the test head includes a power supply board mounted to a power distribution board and positioned between the power distribution board and...
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7084650 |
Apparatus and method for limiting over travel in a probe card assembly
Methods and apparatuses for testing semiconductor devices are disclosed. Over travel stops limit over travel of a device to be tested with respect to probes of a probe card assembly. Feedback...
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7082676 |
Electrostatic discharge (ESD) tool for electronic device under test (DUT) boards
An anti-electrostatic discharge (ESD) tool for engaging electronic device under test (DUT) boards whereby ESD damage to the tested devices is prevented. The tool includes an aluminum support frame,...
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7081767 |
Electroconductive contact unit
In the electroconductive contact unit of the present invention, a gold plated layer 8 is formed over the surface of an electroconductive needle member 2 via a Ni under layer 7 a , and a layer...
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7081766 |
Probe card for examining semiconductor devices on semiconductor wafers
Probe card for examining semiconductor devices on semiconductor wafers that allows the members configuring the probe card to be easily separated and assembled, prevents the occurrence of electrical...
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7081768 |
Device for testing printed circuit boards
A device for testing printed circuit boards ( 1 ) that have contact points ( 3 ) arranged in a pattern. The device includes a needle plate ( 4 ) that is parallel to the printed circuit board ( 1 )...
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7081869 |
Test fixture for assembled wireless devices
A fixture for radio frequency (“RF”) testing of an assembled wireless device, the wireless device having a removable casing concealing one or more RF spring connectors, the fixture comprising:...
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7078921 |
Contact probe
A contact probe comprises a tip portion for making contact with a subject surface, a supporting portion, and a spring portion for connecting the other two members. The tip portion has a corner...
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7071722 |
Anisotropic, conductive sheet and impedance measuring probe
An anisotropically conductive sheet of the invention formed by containing conductive particles exhibiting magnetism in a sheet base composed of an elastic polymeric substance in a state dispersed...
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7071715 |
Probe card configuration for low mechanical flexural strength electrical routing substrates
A mechanical support configuration for a probe card of a wafer test system is provided to increase support for a very low flexural strength substrate that supports spring probes. Increased...
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7061258 |
Testing integrated circuits
A flexible membrane test apparatus and test method for high-speed IC chips. The method and apparatus rely on locating the reference components of the test circuit very close to the contact pads of...
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7061261 |
Semiconductor inspection device and method for manufacturing contact probe
A semiconductor inspection device for inspecting an electronic device is disclosed. The semiconductor inspection device includes a contact probe including a plurality of column parts disposed in...
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7061257 |
Probe card assembly
In a probe card assembly, a series of probe elements can be arrayed on a silicon space transformer. The silicon space transformer can be fabricated with an array of primary contacts in a very tight...
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7057403 |
Microcontactor probe having a contact needle
In order for a conduction path to have a reduced number of sliding portions for conduction, without increase in inductance nor resistance, thereby permitting an enhanced accuracy of inspection, a...
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