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7477065 |
Method for fabricating a plurality of elastic probes in a row
A method of forming a plurality of elastic probes in a row is disclosed. Firstly, a substrate is provided, then, a shaping layer is formed on the substrate so as to offer two flat surfaces in...
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7477066 |
Universal grid composite circuit board testing tool
The present invention discloses a universal grid composite circuit board testing tool having a probe station, a clamp base and a conducting wire base. The probe station and clamp base separately...
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7474113 |
Flexible head probe for sort interface units
Embodiments of the invention provide a flexible probe head that improves contact force and uniform mechanical contact pressure between the probe feature and an engaged bond pad. Flexible probe head...
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7471097 |
Test probe with planar ground tip extending transversely from the ground barrel for a semiconductor package
An embodiment may comprise a test probe to measure electrical properties of a semiconductor package having ball-shaped terminals. The probe may include a signal tip and a ground tip. The signal tip...
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7468612 |
Dermal phase meter with improved replaceable probe tips
A probe for a dermal phase meter includes a handle with a removable extension that terminates with a displaceable center conductor. A replaceable tip attaches to the distal end of the extension and...
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7463038 |
Slant detection device
A slant detection device is used for detecting whether the to-be-tested pin of a connector is slanted. The connector has a socket. The to-be-tested pin is disposed in the socket. The detection...
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7463041 |
High-density electroconductive contact probe with uncompressed springs
A holder 1 is formed by laminating support members 3, 4 and 5 and passing holder holes 2 through them. A pair of needle members 9 and 10 are provided on either end of the coil spring 8...
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7463045 |
Method for pushing a contact probe against object to be measured
A contact probe includes a probe tip and a damper. The probe tip includes a first barrel, a probe pin, and a first spring. The first barrel has a cavity with a bottom, an opening being disposed in...
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7463046 |
Arcuate blade probe with means for aligning the barrel and the shaft
An arcuate blade probe is disclosed. The arcuate blade probe includes a shaft with a pair of faces that converge towards each other along a probe axis and terminate at a single edge that includes...
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7459925 |
Probe card
A PCB of a probe card includes a first region, a second region, a third region and a fourth region arranged clockwise. The circuit pattern of the first region corresponds to the circuit pattern of...
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7458818 |
Electric connector and electrical connecting apparatus using the same
An electrical connecting device is disposed between a circuit board and a probe board opposing each other and used for connection between electrical connection terminals provided on the underside...
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7459923 |
Probe interposers and methods of fabricating probe interposers
The invention includes probe interposers and methods of fabricating pose interposers. In one implementation, a method of fabricating a probe interposer includes providing a substrate having a...
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7459922 |
Microcontactor probe assembly having a plunger and electric probe unit using the same
A microcontactor probe has an insulator ( 6, 7 ) formed with a support hole ( 8, 9 ) having an open end and a close end, a lead conductor ( 11 ) exposed inside the support hole ( 8, 9 ) at the...
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7456640 |
Structure for coupling probes of probe device to corresponding electrical contacts on product substrate
An apparatus for testing integrated circuit devices includes a probe device having a plurality of probes, a first substrate including a product substrate having a first surface and an array of...
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7456645 |
Inspection coaxial probe and inspection unit incorporating the same
A conductive block is formed with a first face, a second face and a through hole connecting the first face and the second face. A contact probe is provided with a conductive pipe and a conductive...
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7453275 |
Probe card
The board of a probe card of the present invention comprises a first substrate having a first inclined surface at the side surfaces and a second substrate having a second inclined surface. The...
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7453278 |
Methods of using a blade probe for probing a node of a circuit
A method of using a blade probe for probing a node of a circuit where the node includes a pad surface surrounding a node hole is disclosed. A probe having a longitudinal probe axis, a shaft, and a...
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7449907 |
Test unit to test a board having an area array package mounted thereon
A test unit to test a board having an area array package mounted therein includes the board, the area array package having an electronic component, a plurality of package pins including a plurality...
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7449906 |
Probe for testing an electrical device
A probe having a first and a second arm portion extending between first and second connecting portions connecting the first and second arm portions respectively at their front end portion and base...
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7449899 |
Probe for high frequency signals
A high frequency probe has contact tips located within the periphery of a terminal section of a coaxial cable and shielded by a ground conductor of the coaxial cable.
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7449902 |
Probe system
A probe apparatus and a probe system are provided. The probe apparatus uses a larger printed circuit board to dispose a plurality of testers. The layout of each of the testers on the circuit board...
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7446548 |
Elastic micro probe and method of making same
An elastic micro probe includes an electrically conductive and stretchable spring, which has a first end, a second end opposite to the first end, and connection points disposed adjacent to the...
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7443182 |
Coordinate transformation device for electrical signal connection
There is disclosed a coordinate transformation device for electrical signal connection used for a probe card applicable to narrow pitch pads, which particularly simplifies wiring from the terminal...
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7436192 |
Probe skates for electrical testing of convex pad topologies
A probe for engaging a conductive pad is provided. The probe includes a probe contact end for receiving a test current, a probe retention portion below the contact end, a block for holding the...
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7436194 |
Shielded probe with low contact resistance for testing a device under test
A probe measurement system having low, stable contact resistance for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
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7436191 |
Differential measurement probe having a ground clip system for the probing tips
A differential measurement probe has a ground clip system for electrically coupling outer shielding conductors of differential probing tips together. In one embodiment, the probing tips...
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7427869 |
Resilient contact probe apparatus
Carriers comprising a carrier body having a plurality of openings holding a plurality of resilient contact probes are disclosed. A number of different embodiments for the resilient contact probes...
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7424775 |
Captive wired test fixture
A method for wiring a test fixture comprised of two parallel fixture plates wherein the wires are wired randomly from locations on one plate to locations on a second plate using a system of...
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7420381 |
Double sided probing structures
A test configuration for double sided probing of a device under test includes a holder to secure the device under test in a first orientation, a calibration substrate secured in a second...
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7414419 |
Micro-electromechanical probe circuit substrate
A MEMPCS having high stiffness against bending deformation or distortion is formed by integrating the probe, electronic circuit, circuit connecting pad and dielectric material into a complete unit...
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7414423 |
Wafer-level test module for testing image sensor chips, the related test method and fabrication
A wafer-level test module is disclosed to include a base layer having multiple first apertures spaced from one another at a pitch corresponding to the pitch of the image sensor chips of an...
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7405584 |
Prober and probe contact method
A prober that has improved positional precision of probing without reducing throughput is disclosed. The prober comprises a probe card having a probe, a wafer stage, a stage temperature adjustment...
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7403024 |
Contactor having contact electrodes of metal springs embedded in a plate-like structure
A contactor has contact electrodes elastically deformable in a direction of thickness of the contactor so that the contactor can make a contact with a semiconductor device with an appropriate...
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7400159 |
Integrated complex nano probe card and method of making same
An integrated complex nano probe card is disclosed to include a substrate layer having a front side and a back side, and complex probe pins arranged in the substrate layer. Each complex probe pin...
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7400156 |
Vertical probe device
A vertical probe device includes two guide members arranged in a stack manner and defining therebetween an accommodation chamber, a probe holder plate disposed between the guide members, and a...
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7385410 |
Method of and apparatus for testing for integrated circuit contact defects
Various tester configurations are provided that injects test signals into nets (e.g. 24 ). Non-linear characteristics of the response are detected (e.g. harmonics, do offset) and used to assess...
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7385411 |
Method of designing a probe card apparatus with desired compliance characteristics
A probe card apparatus is configured to have a desired overall amount of compliance. The compliance of the probes of the probe card apparatus is determined, and an additional, predetermined amount...
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7382144 |
Test fixture for holding signal terminals or pins and related method for assembling the test fixture
A test fixture has a socket, a plurality of signal terminals, and a fixing module. A plurality of holes are formed in the socket for installing the signal terminals. The fixing module is installed...
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7374293 |
Apparatus, system and method for testing electronic elements
An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side,...
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7368928 |
Vertical type high frequency probe card
A vertical-type probe card includes a circuit board, which has signal circuits and grounding circuits arranged in such a manner that each signal circuit is disposed in parallel and adjacent to one...
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7368924 |
Probe structure having a plurality of discrete insulated probe tips projecting from a support surface, apparatus for use thereof and methods of fabrication thereof
The present invention is directed to structures having a plurality of discrete insulated elongated electrical conductors projecting from a support surface which are useful as probes for testing of...
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7368925 |
Probe station with two platens
A probe station for testing a device under test. A first platen supporting an electrical probe. A chuck supporting the device under test. A second platen supporting an optical probe. The first...
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7363705 |
Method of making a contact
Embodiments of the present invention are directed to the formation of microprobe tips elements having a variety of configurations. In some embodiments tips are formed from the same building...
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7362118 |
Probe with contact ring
A spring probe having a barrel, plunger, spring and contact ring is provided in which the contact ring provides electrical contact between the plunger and the barrel. Two or more contact rings may...
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7358751 |
Contact pin assembly and contactor card
A compliant contact pin assembly and a contactor card system are provided. The compliant contact pin assembly includes a contact pin formed from a portion of a substrate with the contact pin...
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7358752 |
Signal launch for high speed differential signals
A differential signal probe-differential signal launch structure wherein the conductive outer housing of the differential signal probe is disposed on and electrically connected to a conductive...
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7352196 |
Probe card assembly and kit
In a probe card assembly, a series of probe elements can be arrayed on a silicon space transformer. The silicon space transformer can be fabricated with an array of primary contacts in a very tight...
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7345494 |
Probe tile for probing semiconductor wafer
A tile used to hold one or more probes for testing a semiconductor wafer. The tile has one or more sites for inserting one or more probes to test the semiconductor wafer. Each site has one or more...
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7339385 |
Semiconductor test apparatus and interface plate
There is provided a semiconductor testing apparatus having a test head body having signal modules for processing the test signals, a plurality of connection cables electrically connected with the...
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7336087 |
Circuit board test device comprising contact needles which are driven in diagonally protruding manner
The invention relates to printed circuit board test devices ( 1 ) comprising a support ( 4 ) receiving a circuit board ( 5 ) by said board's edges, said board being designed to be fitted as needed...
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