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4851764 |
High temperature environmental testing apparatus for a semiconductor device having an improved holding device and operation method of the same
An improved holding device for holding a semiconductor device, particularly a microwave semiconductor device, in a high temperature environmental testing apparatus. The holding device includes a...
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4841241 |
Testing device for both-sided contacting of component-equipped printed circuit boards
A lower needle adapter has lower, resilient contact needles and an upper needle adapter has upper, resilient contact needles which are provided for contacting of both sides of component equipped...
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4839587 |
Test fixture for tab circuits and devices
A test fixture for TAB (Tap Automated Bonding) circuits includes circuit boards for maintaining a characteristic impedance to inner lead bond areas of a circuit under test. A plurality of...
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4833402 |
Connector assembly for a circuit board testing machine, a circuit board testing machine, and a method of testing a circuit board by means of a circuit board testing machine
A machine for testing a circuit board of an electrically insulating material includes circuit tracks of an electrically conductive material arranged on one or opposite side surfaces. At least one...
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4833404 |
Test probe for surface mounted leadless chip carrier
A test probe for a surface mounted leadless chip carrier is disclosed. The probed includes specially designed connector pins which allow size reductions in the probe. A thermoplastic housing...
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4816754 |
Contactor and probe assembly for electrical test apparatus
Substrates are tested by conductive, individually plug replaceable, buckling beam probes in a probe pattern to engage the circuitry on the substrate. When probes engage the substrate, they buckle...
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4814697 |
Testing adapter
A testing adapter for the contacting of conductor plates for the purpose of their testing includes a plurality of metallic resilient contact pins. Each of these pins includes a cylinder in which a...
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4806856 |
Adjustable quick-mount test probe assembly
An adjustable quick-mount test probe assembly for use in circuit testing. The test probe assembly provides a convenient means for testing printed circuit boards containing Very Large Scale...
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4803424 |
Short-wire bed-of-nails test fixture
A test fixture for automatic testing equipment including short wire interface assembly which permits the interface assembly to be hard wired to a test head assembly with relative short interconnect...
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4801876 |
Printed wiring board tester
A printed wiring board tester which comprises first and second fixture members disposed in spaced-apart, substantially parallel relationship with respect to each other, a plurality of probe pins...
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4795977 |
Interface system for interfacing a device tester to a device under test
A device tester, such as a memory tester, is electrically interfaced to a device under test, such as a memory die, by means of an improved interface system. The interface system includes an array...
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4782289 |
Positioning fixture for integrated circuit chip testing board
A fixture for clamping an integrated circuit chip testing board having a plurality of contact points to a testing platform having a plurality of corresponding protruding metal pins. The fixture...
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4773877 |
Contactor for an electronic tester
The contactor is used for an electronic tester for testing of electronic items such as printed circuit boards, integrated circuits or the like. It has at least one resilient contact pin which has a...
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4774462 |
Automatic test system
An automatic fixturing system for printed circuit board testing including a magazine for temporarily storing probes, and a test head adapted to receive selected ones of the probes and position the...
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4771234 |
Vacuum actuated test fixture
A fixture is disclosed for connecting circuit cards having electronic components to a board test system. The fixture is vacuum actuated. The test fixture comprises a fixture base and a support...
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4749945 |
Test equipment for printed circuit boards
Test equipment for printed circuit boards including a spring-loaded contact fingers arranged in pre-determined distribution on a contact bearing plate. The contact fingers can be elevated above a...
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4746861 |
Test fixture for printed circuit board assembly
A test fixture for testing a printed circuit board assembly on a computerized test system includes a vacuum-actuated base which is receivable and securable in electrically connected relation on the...
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4740746 |
Controlled impedance microcircuit probe
A probe for coupling electrical test equipment to a selected point of an electrical device has a resiliently supported rigid pin for contacting the selected point and a wave guide of substantially...
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4739259 |
Telescoping pin probe
A probe for use in electrical circuit test equipment, in which a contact element is longitudinally slidable in an insulator sleeve which also contains an R-C attenuator circuit connected...
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4721908 |
Apparatus for electronically testing printed cirucit boards or the like
An apparatus for electronically testing printed circuit boards or the like includes a plurality of substantially parallel test pins for making electrical contact between resilient contact elements...
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4716365 |
Circuit tester
A circuit tester is described herein and includes a housing closed by a removable cap member. An electrode, or wire contact, extends through the cap member and electrically interconnects with a...
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4714879 |
Holding and testing device for electronic modules within flat carriers
A holding and testing device for electronic modules includes a receptacle depression in a perforate plate that is held by two guide rods. A movable plate carries contact spring pins, fixing pins,...
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4709207 |
Loading system
Loading system for loading of test pins into printed circuit board test fixtures. Test pins are loaded into a loader body, and locked thereto by a sliding locking plate through frictional...
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4705333 |
Test probe for leadless devices
An electrical test probe assembly for use with a leadless surface mounted device is provided which includes an array of resilient spring contacts in a pattern corresponding to the contacts of a...
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4701702 |
Contact pin having a spring under tension
A spring-loaded contact pin for testing a plurality of closely spaced contacts of a test sample includes a casing in which a plunger is movably guided and under the influence of a spring in...
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4701700 |
Captivated, pre-loaded spring means for vacuum displaced circuit board testing
Circuit board testing apparatus includes combination comprising structure including two generally parallel plates defining a space therebetween to which vacuum is applicable, there being circuit...
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4700132 |
Integrated circuit test site
An integrated circuit test site assembly for testing pin grid array (PGA) packaged integrated circuits having removable contact pins. The removable contact pins, which are preferably spring-loaded...
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4686464 |
Buckling beam test probe assembly
The buckling beam probe contactor assembly comprises a number of square test probe arrays each containing a plurality of buckling beams in the form of continuous wires extending from the probe tips...
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4677375 |
Apparatus for testing integrated circuit
An apparatus for testing plug-in type integrated circuits by applying a potential across their input and output terminals, utilizing a socket board with a plurality of sockets bored therein to...
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4675673 |
Programmable pin driver system
Programmable pin drivers allow PROM pins to be individually programmed and regulated to specified voltages and currents. Each pin is assigned a voltage multiplexer to select a regulated voltage and...
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4659986 |
Electrical test connector for simultaneous testing of a plurality of electrical components
To permit testing of electrical connectors mounted on a strip, a pair of jaws, similarly to substantially transversely extended clothespin jaws, are provided, the inside surface of one (A) of the...
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4659987 |
Electrical circuit test probe and connector
An improvement to electrical circuit test probes of the type wherein a socket tube having a cylindrical spring loaded plunger therein is mounted in a test fixture. Electrical contact is assured...
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4647852 |
Contact probe assembly
The present disclosure describes an assembly which has particular application in the testing of printed circuit boards. More specifically, the assembly is comprised of an apertured holding plate...
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4626776 |
Programmable test fixture
A circuit board testing apparatus is disclosed which effectively provides two vacuum chambers. A plurality of test probes casings are mounted in a bottom wall, which casings extend upwardly through...
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4622514 |
Multiple mode buckling beam probe assembly
A multiple mode buckling beam probe is formed by top and bottom mating locating guides interposed between a space transformer die bearing exposed wire contact ends and an underlying substrate...
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4618820 |
Probe support for test fixture of printed circuit artworks
A probe support for a test fixture of printed circuit artworks comprising a base plate defining a supporting plane for connecting pins of a plurality of probes, a corresponding plurality of...
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4574236 |
High frequency test fixture
A high frequency test fixture (90) comprises a plurality of double-sided spring-loaded backdriving pins (99) positioned between a circuit board under test (41) and a stripline board (91) connected...
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4573009 |
Printed circuit board test fixture with flexion means for providing registration between the test probes and the circuit board
A printed circuit board "bed-of-nails" test fixture, of the type in which the circuit board is moved into electrical contact with the test probes, is provided with a means of ensuring accurate...
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4571540 |
Electrical contact probe
An electrical contact probe is produced by four passes of a profiled machining cutter across the longitudinal axis of the probe at circumferentially equidistantly spaced points and with the...
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4560926 |
Contact device for use in the testing of printed circuits and a removable contact head for use in such a device
The contact device for testing printed circuits comprises a contact head (15) mounted for axial sliding motion in a guide tube (9) against the action of a coiled compression spring housed in the...
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4554506 |
Modular test probe
A test probe employing a buckling beam array for testing integrated circuits. A pair of identical sets of guides are positioned on either side of a centerpost to align the buckling beams. In one...
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4518910 |
Buckling beam twist probe contactor assembly with spring biased stripper plate
The buckling beam probe contactor assembly utilizing buckling beams in the form of continuous wires from the probe tips to remote source connectors includes at least one post terminating in a...
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4508405 |
Electronic socket having spring probe contacts
An electronic component socket for leadless or leaded electronic component packages in which the package is clamped within the socket and to which positive electrical contact is made by spring...
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4506938 |
Integrated circuit chip carrier mounting arrangement
An arrangement for the solderless mounting of an integrated circuit chip carrier (13) on a printed wiring board (10). A socket (16), cemented to the board, is provided within which a leadless chip...
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4506215 |
Modular test probe
A test probe employing a buckling beam array for testing integrated circuits. A pair of identical sets of guides are positioned on either side of a centerpost to align the buckling beams. In one...
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4504780 |
Test probe
A test probe has a housing that releasably receives a plunger that is normally urged out of the housing by a spring, and which has a probe contact end normally lying external of the housing. The...
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4496903 |
Circuit board test fixture
A test fixture having a planar array of spring-loaded contact probes of sufficient number and arrangement to accommodate circuit boards having different patterns of test points. A personalizing...
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4481467 |
Break-away test probe
A test probe for the testing of electrical circuits and circuit boards comprises a probe head (52) breakably coupled to an elongated probe arm (51). The breakable coupling is achieved by securing a...
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4476433 |
Electronic test fixture
A continuity testing fixture for simultaneously probing of microelectronic chip site pads having a cluster of probe pins extending from a top plate in the same precise orientation as the pads. The...
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4465972 |
Connection arrangement for printed circuit board testing apparatus
Printed Circuit Board Testing Apparatus is disclosed which utilizes a "bed of nails" of contacts with conductive probes mounted in an insulating plate on a grid of 0.050 inch spacing to make a...
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