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6081124 |
Testing unit for connector testing
A testing unit is provided for mounting on a connector testing device for testing a connector which includes a plurality of metal terminals fastened to the connector by a lance system. A probe pin...
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6079989 |
Electrical connection device having electrical connection members with a tubular body and a sliding tip
An electrical connection device for electrically connecting an electronic component of the type having electrical connection points. The electrical connection device includes electrical connection...
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6078187 |
Hemispherical test head for integrated circuit tester employing radially distributed circuit cards
A test head for an integrated circuit tester includes a set of wedge-shaped node cards, one for each terminal of the integrated circuit device under test (DUT). Each node card holds circuits for...
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6069481 |
Socket for measuring a ball grid array semiconductor
A ball grid array semiconductor measuring socket is provided in which a contact pressure force to a solder ball is generated in the direction substantially orthogonal to the longitudinal direction...
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6066957 |
Floating spring probe wireless test fixture
A test fixture for a printed circuit board having a pattern of test probes and a fixed probe plate and a top plate adapted for movement toward and away from the probe plate. The probe plate and the...
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6054869 |
Bi-level test fixture for testing printed circuit boards
A bi-level test fixture for testing printed circuit boards is provided. A series of guide pins emanate downwardly from the diaphragm board through corresponding guide pin apertures present through...
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6051982 |
Electronic component test apparatus with rotational probe and conductive spaced apart means
A test apparatus including at least one probe member precisely aligned using two spaced apart means (e.g., thin layers) such that the probe can effectively engage a conductor (e.g., solder ball) on...
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6050829 |
Making discrete power connections to a space transformer of a probe card assembly
By segregating at least a substantial portion of the power connections to the space transformer component (506, 700, 800) from the signal connections thereto, constraints on the interposer...
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6049217 |
Thermally enhanced test contactor
A test contactor having a heat slug for removing heat from an electronic device engaging the contactor. The heat slug is positioned in the test contactor so that a thermally conductive surface of...
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6043667 |
Substrate tester location clamping, sensing, and contacting method and apparatus
A substrate tester and method of testing are disclosed in which the tester moves a substrate to be tested into a precise location within the tester prior to making contact with fragile tester pins....
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6043669 |
Wireless test fixture
A printed circuit board test fixture includes a plurality of flexible printed circuits having circuit traces on one side for interconnecting the test probe pin assemblies of the fixture with the...
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6040701 |
Thin profile vertically oriented probe adapter
An apparatus for providing a probing interface for a circuit under test exhibits a relatively narrow profile and a vertical orientation so that it does not block access to connectors in adjacent...
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6037787 |
High performance probe interface for automatic test equipment
A probe interface device is disclosed that includes a plurality of coaxial contact probe assemblies disposed in an insulative base. Each coaxial contact probe assembly includes a solid tubular...
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6034532 |
Resilient connector having a tubular spring
A resilient connector uses a spring made from a cylindrical tube. The wall of the tube is cut in a helix along the central portion of the tube to form the spring. One or more plungers within the...
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6031383 |
Probe station for low current, low voltage parametric measurements using multiple probes
A probe station has probe manipulators with probe supports disposed around a cover assembly with an inspection opening. Each probe support has a vertical tube extending through an opening in the...
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6025732 |
Reusable die carrier for burn-in and burn-in process
A reusable carrier 10 for temporarily holding an integrated circuit 12 during burn-in and electrical test includes a base 14 and a lid 16 attached to the base 14 by hinges 18. A flexible substrate...
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6020747 |
Electrical contact probe
The present invention is directed to an electrical contact probe, comprising at least one fiber mounted in a holder, the at least one fiber having high electrical conductivity and high mechanical...
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6005405 |
Probe plate assembly for high-node-count circuit board test fixtures
A probe plate assembly for use in a circuit board test fixture is disclosed. First and second plates are mounted substantially parallel to one another and with a space between them. Probe pins are...
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5990696 |
Test fixture with self contained shorting means for testing small scale test packs
A printed circuit board tester has a pattern of test probes on a base upon which a translator fixture is mounted. The translator fixture includes a plurality of essentially parallel and vertically...
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5990697 |
Electroconductive contact unit having compression spring with normally and coarsely wound segments
In an electroconductive contact unit including a pair of needle members projecting from either end of a holder arrangement, and an electroconductive compression coil spring interposed therebetween...
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5982186 |
Contactor for test applications including membrane carrier having contacts for an integrated circuit and pins connecting contacts to test board
A method and apparatus are provided for integrated circuit testing applications. One aspect of the invention is a contactor (10) for test applications. The contactor (10) comprises a membrane...
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5977783 |
Multilayer probe for measuring electrical characteristics
A probe structure containing a contact part (2) formed on one side (1a) of an insulating substrate (1), a conductive circuit (3) formed on the other side (1b) of the insulating substrate (1),...
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5974662 |
Method of planarizing tips of probe elements of a probe card assembly
A probe card assembly includes a probe card, a space transformer having resilient contact structures (probe elements) mounted directly to (i.e., without the need for additional connecting wires or...
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5977787 |
Large area multiple-chip probe assembly and method of making the same
A multiple-chip probe assembly suitable for wafer testing over a wide temperature range includes a plurality of individual buckling beam probe elements. A support structure supports the plurality...
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5977786 |
Adapter including solid body
An adapter for adapting a uniform contact grid of an electrical testing device for testing printed circuit boards to an irregular contact configuration of connection points on a printed circuit...
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5968282 |
Mechanism and method for cleaning probe needles
A cleaning mechanism and method for cleaning the probe needles of a probe card used for the inspection of the electric characteristics of a wafer W. This mechanism is provided with a soft cleaner...
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5969533 |
Probe card and LSI test method using probe card
A probe card which solves a problem involved in conventional probe cards in that the yield of the LSIs is reduced because non-defectives can be misjudged as defectives, which is due to failure of...
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5966023 |
Rapid action engagement interface connection system
A rapid action engagement interface connection system includes a receiver electrically connected to the device under test and including at least one receiver electrical connector. The receiver...
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5963039 |
Testing attachment reliability of devices
An apparatus for testing the attachment reliability of a device mounted at least by an electrically conducting joint to a surface of a circuit board is provided. The apparatus includes an...
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5955888 |
Apparatus and method for testing ball grid array packaged integrated circuits
An apparatus and method for testing ball grid array integrated circuits (BGA ICs) including a nesting member resiliently supported on a contactor body via guide shafts. The nesting member includes...
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5952843 |
Variable contact pressure probe
A wafer probe system includes a plurality of vertical-parallel probe pins having a spring formed in a center portion thereof to provide a contact force control area. The spring being formed...
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5945838 |
Apparatus for testing circuit boards
Apparatus for electrically testing a connector includes a plurality of contact posts (i.e., connector pins) partially surrounded by a sidewall defining an opening adjacent ends of the posts. In one...
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5945837 |
Interface structure for an integrated circuit device tester
An interface structure for providing connections between integrated circuit (IC) devices and a device tester. The interface structure includes a printed circuit board having one or more groups of...
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5942906 |
Interface system utilizing engagement mechanism
A connection interface system positions and electrically connects a testing device to a device under test. The testing device exercises and tests the device under test. The connection interface...
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5939893 |
Contact probe arrangement for functional electrical testing
A contact probe arrangement for electrical functional testing, including a first stack of perforated plates, a second stack of perforated plates and a plurality of contact probes. The probes are in...
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5939892 |
Circuit board testing fixture
A circuit board testing fixture is provided having a top plate spaced apart from a bottom plate and each of the plates having an array of holes for receiving test probes and support rails...
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5936421 |
Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith
An electrical test probe assembly for loaded board testing includes a housing having a hollow interior, and first and second opposite shields positioned and axially slidable in the housing and...
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5933019 |
Circuit board testing switch
An electro-mechanical reed relay in-circuit test fixture switch is inserted onto a wrapped wire pin extending from the bottom of a socket holding a spring-loaded nail inside a bed-of-nails or...
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5929649 |
Method and apparatus for electrical parasitic measurement of pin grid array
The present method and apparatus for electrically characterizing a pin grid array includes a plurality of conductive caps which may be removably fitted over chosen pins of the pin grid array, and a...
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5926028 |
Probe card having separated upper and lower probe needle groups
A probe card comprises a base having a frame portion to define an opening portion therein and having a lower surface, and first and second resin fixing portions mounted on the lower surface of the...
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5923176 |
High speed test fixture
A high speed test fixture for testing printed circuit board (PCB)-mounted high speed pin grid array (PGA) chips attaches to the solder side (underside) of the PCB to eliminate the need for...
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5917329 |
Substrate tester having shorting pad actuator method and apparatus
An electrical contacting apparatus for testing a substrate (54) and having a principal axis includes an electrical contact pad, a guide plate (106), a supporting bridge (132), and a mechanism for...
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5909124 |
Apparatus and method for testing a circuit board
Apparatus for testing an electrical circuit having: a base for receiving a printed circuit board carrying the electrical circuit, wherein the base section includes a plurality of test pins for...
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5903161 |
Electrically conductive rod-shaped single crystal product and assembly for measuring electrical properties employing such product, as well as processes for their production
An electrically conductive rod-shaped single crystal product, which is a rod-shaped single crystal having an aspect ratio of from 1 to 500, formed by a vapor-liquid-solid method or such a...
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5900738 |
Contact structure device for interconnections, interposer, semiconductor assembly and package using the same and method
An interconnection contact structure assembly including an electronic component having a surface and a conductive contact carried by the electronic component and accessible at the surface. The...
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5898314 |
Translator fixture with force applying blind pins
A translator fixture for a printed circuit board tester has a pattern of test probes on a base upon which the translator fixture is mounted. The translator fixture includes a plurality of...
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5898313 |
Test fixture for two sided circuit boards
A test interface between a two sided circuit board to be tested and a test controller and it generally includes an upper and a lower test fixture each including personality plates having bores for...
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5889407 |
Press assembly for electrically testing a printed circuit board having an exchangeable lower adapter
A press assembly for electrically testing at least one side of a printed circuit board has an upper part and a lower part, a constant gauge grid with spring contacts, an exchangeable lower adapter...
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5883519 |
Deflection device
A deflection device having a longitudinal configuration is fixed at one of its ends to a base supporting structure and is responsive to a first electrical signal from a control network to move the...
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5883520 |
Retention of test probes in translator fixtures
A printed circuit board testing fixture employs a preformed plastic screen for retaining the test fixture translator pins.
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