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6229330 |
Contactor floor that holds an IC package to contactor pins within an IC package testing system with minimized solder flaking
A mechanism for positioning and coupling an integrated circuit package to a system for testing the integrated circuit package with minimized solder flaking. A contactor floor holds the integrated...
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6229325 |
Method and apparatus for burn-in and test of field emission displays
A method and apparatus which provides for continual monitoring of the electrical and optical performance of one or more field emission display devices while the devices are burned-in is for the...
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6222377 |
Circuit board probe device
A probe is provided for electrically testing high-density printed circuit boards on a bed of nails test fixture. An elongated probe is provided with a fixed contact point interfacing with the PCB...
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6218852 |
Automated circuit board testing apparatus
An automated handling apparatus for testing and labeling a printed circuit board. The apparatus comprises a housing having at least one tray exchanger assembly attached thereto. Disposed on the...
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6218848 |
Semiconductor probe card having resistance measuring circuitry and method of fabrication
A probe card for testing semiconductor wafers, and a method for fabricating the probe card are provided. The probe card is adapted for use with a wafer probe handler, and a tester containing test...
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6218851 |
Method and apparatus for testing a printed circuit
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6211690 |
Apparatus for electrically testing bare printed circuits
A testing fixture for microelectronic elements is in the nature of an interposer which is operative for receiving a plurality of test probes. The interposer enables the simultaneous testing of...
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6208158 |
Zero static force assembly for wireless test fixtures
A wireless assembly for communicating electrical signals between test equipment and a unit under test using contact probes having at a first end a head electrically connected to a test point on the...
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6204681 |
IC device contactor
An IC device contactor for electrically connecting IC devices each having a large number of spherical electrodes on one side of a substrate to an IC tester head for a test of electrical properties...
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6204680 |
Test socket
A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity...
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6198297 |
Microcircuit testing device
A microcircuit testing device, comprising an element for supporting a plurality of probes which are meant to make contact with pads of microcircuits to be tested which are formed on a wafer, the...
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6194906 |
Inspection adapter board for printed board, method for inspecting printed board, and method and apparatus for producing information for fabricating the inspection adapter board
The invention provides an inspection adapter board for printed board, which has inspection electrodes of a pitch wider than electrodes to be inspected, permits carrying out the necessary inspection...
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6194908 |
Test fixture for testing backplanes or populated circuit boards
A test fixture for testing backplanes of a printed circuit board having at least one shrouded connector including a translator fixture having a plurality of spaced apart translator plates adapted...
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6191597 |
Printed circuit board test device with test adapter and method for adjusting the latter
Method and apparatus for setting the contact elements (test pins) of a printed circuit board test device, which are accommodated in one or two test adapters, to the contact points, provided on one...
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6191601 |
Test fixture for matched impedance testing
A test fixture for matched impedance testing of a printed circuit board having a top plate for supporting the printed circuit board having matched impedance circuit traces extending from test site...
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6191600 |
Scan test apparatus for continuity testing of bare printed circuit boards
A scan test apparatus for continuity testing of bare printed circuit boards having a first shorting layer and a second shorting layer positioned adjacent a unit under test to electrically short the...
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6181149 |
Grid array package test contactor
A contactor apparatus used in automatic testing in a manufacturing line includes a site for receiving an electrical device with an array of input/output elements on a surface of the electrical...
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6175243 |
Apparatus and method for assembling test fixtures
A test fixture assembly apparatus includes a removable loading plate with attached loading towers. The loading towers have guide plate shoulders oriented in a stair step fashion. The test fixture...
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6172514 |
Test probe retainer
A retainer for a circuit board test probe includes a unitary member in which the test probe is inserted. The retainer may then be plugged into a desired opening in a test fixture plate, with a...
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6163160 |
Adjustable tooling pin
A tooling pin assembly used with a receiver in a printed circuit board tester is disclosed. The tooling pin assembly includes a locating pin with a core threaded to receive a screw, and a bushing...
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6160409 |
Inspection method of conductive patterns
An inspection apparatus inspects an electronic circuit board on which a plurality of bonding pads and a plurality of pin pads are connected to each other through conductive patterns. A probe having...
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6160412 |
Impedance-matched interconnection device for connecting a vertical-pin integrated circuit probing device to integrated circuit test equipment
An interconnection device used with test probe equipment for connecting a vertical-pin integrated circuit probing device to external test equipment. The interconnection device comprises a probe...
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6160408 |
Thin profile vertically oriented probe adapter with code disassembly capability
An apparatus for providing a probing interface for a circuit under test exhibits a relatively narrow profile and a vertical orientation so that it does not block access to connectors in adjacent...
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6157197 |
Auto-lock type continuity check unit
A connector receiving member and a test area are provided in a relatively shiftable manner from an engaged state in which a test area engages in a continuity testable manner to a separated state in...
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6150830 |
Test head for microstructures with interface
A test head for making contact with test points arranged close to one another of an electric component. The test head having a plurality of contact elements which can be connected to a connecting...
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6150829 |
Three-dimensional programmable connector
A three dimensional programmable connector used in a burn-in test system for manufactured integrated circuits is provided with a plurality of planar electrodes which are selectively connectable to...
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6150827 |
Automatic adjustment method for elimination of the centering error during the electrical test on printed circuit boards
An automatic adjustment method is described for elimination of the centering error during the electrical test on printed circuit boards, in particular SMT (surface mounting technology) printed...
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6144212 |
Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card
A main object of the present invention is to provide a vertical needle type probe card which is improved so that necessary needle pressure is obtained even if variation of the probe needles in the...
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6140830 |
Adapter system for component assembly circuit boards, for use in a test device
The invention relates to a test device for component assembly circuit boards (31), in which this test device includes a plurality of test channels which are contact-connected with respective test...
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6137296 |
Probe card for testing semiconductor devices
A probe card, used for testing the electric characteristics of semiconductor devices, is disclosed. The probe card has main and subsidiary cards. The main card has a main circuit used for testing...
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6129575 |
Testing system for a connector with a self-sealing connector housing
A connector testing system includes a bridge clip having a body and at least one test lead having a fixed end connected to the body, a connector having a top portion and a housing having at least...
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6130546 |
Area array (flip chip) probe card
A method and apparatus for testing an integrated circuit die including a probe card (10) having a plurality of surface mount pads (45) arranged in a pattern (50) substantially corresponding to an...
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6129577 |
Connector testing system having connector latching
A connector testing system includes a bridge clip having a body and at least one test lead having a fixed end connected to the body and a free end having a projection formed thereon, and a...
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6130547 |
Test apparatus for printed circuit board and assembly kit therefor
An apparatus for testing integrity of a printed circuit board is provided which employs a probe with moveable and/or fixed needle portions at its ends and a flange, probe retention boards having...
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6124722 |
Universal apparatus for testing printed circuit boards utilizing independently movable needle boards
A machine for the electric testing a printed circuit board. The machine having a plurality of adjacent coplanar needle board pairs, wherein each of the plurality of coplanar needle board pairs has...
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6118289 |
Cleaning method and cleaning device and cleaning tool for board electrical-test probes, and board electrical-test device and method
To securely clean dirty material deposited on ends of board electrical-test probes used in a board test device for executing tests including an incircuit test by a cleaning job executed once, the...
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6118292 |
Method and device for correcting misalignment between test needles and test points during electrical testing of printed circuit boards
A method for correcting misalignment between test needles and test points during multiple electrical tests on printed circuit boards, in which setting up the machine to carry out the test on a...
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6111418 |
Method for building and a structure of a contact end in a contact probe
In the contact probe 1 having an array of leads 3 densely attached to a surface of an insulative film 2, pressure contact ends are formed by one end of the leads 3 being arranged in an array along...
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6104205 |
Probe with tab retainer
An electrical contact test probe for use in providing electrical continuity between diagnostic equipment and a test point of an electrical circuit under test is provided. The test probe includes an...
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6100707 |
Apparatus for testing multi-terminal electronic components
To facilitate the testing of small electronic components, an improved test probe and transport wheel assembly are disclosed. The basic form of the probe features a fixed support body onto which a...
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6100709 |
Silicon wafer testing rig and a method for testing a silicon wafer wherein the silicon wafer is bent into a dome shape
A wafer testing rig includes a stand, a first contact component, a second contact component and a biasing device. The first contact component is mounted to the stand. The second contact component...
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6100708 |
Probe card and wafer testing method using the same
A probe needle has one end and the other end. Probe needle has its one end fixed to the bottom surface of a substrate, and extending at a prescribed angle to substrate. A portion of probe needle...
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6100815 |
Compound switching matrix for probing and interconnecting devices under test to measurement equipment
A compound switching matrix (30) operates in cooperation with a resistance measuring system (20) and a laser (22) to quickly and accurately trim resistors (12) to predetermined values while they...
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6097202 |
Circuit board inspection apparatus and method
The present invention provides an inexpensive and reliable circuit-board inspection apparatus and method applicable to a densely wired circuit board. A sensor module 50 is disposed on a pad section...
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6094061 |
Automated testing method for electronic circuitry
A method for testing printed circuit boards (PCBs). The PCBs are initially transported to a reorienting apparatus that aligns the PCBs to accommodate automated test equipment (ATE). The ATE...
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6091253 |
Jig for electrically bridging between a circuit board and a tester during testing of the circuit board
A jig for testing the printed circuit boards utilizes the adjustable guide members to easily position different sizes of circuit boards on a working plate, wherein the working plate can smoothly...
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6087839 |
Apparatus for testing printed circuit board
An in-circuit test machine testing a printed circuit board (PCB). The test machine is placed in contact with soldered terminals of circuit components mounted on the printed circuit board and...
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6087838 |
Signal processing circuit for electro-optic probe
A signal processing circuit is provided for an electro-optic probe, which is used to perform testing of a printed-circuit board of high-speed processing. When laser beams are incident on the...
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6087840 |
Probe card with vertical needle for enabling improved wafer testing and method of manufacturing the same
An improved probe card with a vertical needle is provided which ensures required needle pressure even when there is a significant variation of probe needles in a height direction. Upper and lower...
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6084422 |
Printed circuit board testing device
An improved device for testing electrical circuit tracings on a printed circuit board is provided. The device includes a first plate, a second plate and connecting elements for connecting the first...
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