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8049526 |
Enhanced speed sorting of microprocessors at wafer test
A method and apparatus are provided for implementing optimized speed sorting of microprocessors at wafer test. A combination of speed-predicting metrics are measured early in the manufacturing...
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7915903 |
Batch-test method using a chip tray
A chip test method is disclosed and includes: loading chips on a chip tray and fastening a cover plate on the chip tray; loading the chip tray with the cover plate in a chip test device; aligning a...
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7876089 |
Test handler, method for loading and manufacturing packaged chips, and method for transferring test trays
A test handler, a packaged chip loading method, a test tray transferring method, and a packaged chip manufacturing method are provided. The test handler may include a loading unit, a chamber...
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7851721 |
Electronic device sorter comprising dual buffers
A device handler for testing and sorting electronic devices has a testing station operative to test the electronic devices and to classify them according to different binning characteristics. A...
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7786722 |
Automated tray transfer device for prevention of mixing post and pre-test dies, and method of using same
A method of sorting automated tray transfer trays includes detecting if a die remains in the tray. The method includes the ability to interrupt the automated tray transfer process to prevent mixing...
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7755376 |
Camera based pin grid array (PGA) inspection system with pin base mask and low angle lighting
An inspection system, for inspecting pin grid arrays on integrated circuit devices includes a pin base mask configured to receive a device having a pin grid array. A dark-field, low-angle lighting...
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7739573 |
Voltage identifier sorting
A voltage identifier (VID) sorting system is provided that optimizes processor power and operating voltage guardband at a constant processor frequency. The VID sorting system determines a voltage...
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7714310 |
Apparatus, unit and method for testing image sensor packages
The present invention relates to an apparatus, unit and method for testing image sensor packages, which can automatically test whether the image sensor packages are defective before they are...
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7692433 |
Sawing tile corners on probe card substrates
A composite substrate for testing semiconductor devices is formed by selecting a plurality of substantially identical individual substrates, cutting a corner from at least some of the individual...
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7557565 |
Handler for sorting packaged chips
A handler for sorting semiconductor chips after they have been tested includes a loading unit for loading chips to be tested and an unloading unit for unloading chips that have been already tested....
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7554321 |
Counter balanced vertical docking motion in a driven vertical axis test head manipulator
A positioner, such as a test head carrier for a semiconductor wafer and device tester, includes a vertical support and a main arm for supporting a test head. The main arm is suspended for vernier...
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7554349 |
Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environments
A semiconductor device test handler for maintaining stable temperature in a test environment may include a loading unit that loads a plurality of semiconductor devices mounted on a test tray; a...
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7541828 |
Burn-in sorter and sorting method using the same
Provided is an apparatus for sorting burn-in tested packaged chips, including a DC test unit performing a DC test on packaged chips, a DC failure/loading head moving in a first direction to load...
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7492179 |
Systems and methods for reducing testing times on integrated circuit dies
Disclosed herein are various embodiments of systems and method for testing dies on semiconductor wafers that reduce testing times on future wafers. The disclosed systems and methods may be employed...
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7456643 |
Methods for multi-modal wafer testing using edge-extended wafer translator
Access to integrated circuits of a wafer for concurrently performing two or more types of testing, is provided by bringing a wafer and an edge-extended wafer translator into an attached state. The...
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7397264 |
Method for testing power MOSFET devices
Characteristics of a power MOSFET gate charge test waveform are evaluated to yield a highly reliable and uniform testing methodology that replaces the inconsistent and inefficient dv/dt immunity...
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7394272 |
Built-in self test for system in package
A SIP (system in package) with a chip and a memory mode, capable of performing integration test on the memory module even if the memory module does not include any scan chain is provided. The chip...
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7388393 |
Semiconductor test apparatus
A semiconductor test apparatus is provided that has a function for picking a device as a non-defective device with a limited function (i.e., class B device) even if that device includes one or more...
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7378864 |
Test apparatus having multiple test sites at one handler and its test method
A test apparatus includes one handler connected to a tester and one test board divided into two or more sites or two or more test boards. Since only the sites on the test board (or test boards)...
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7317310 |
Embedded PCB identification
A method of tracking a printed circuit board is described. An embedded identification device is utilized. The embedded identification device is placed in a layer of the printed circuit board. An...
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7268570 |
Apparatus and method for customized burn-in of cores on a multicore microprocessor integrated circuit chip
An apparatus and method for providing a multi-core integrated circuit chip that reduces the cost of the package and board while optimizing performance of the cores for use with a single voltage...
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7233162 |
Arrangements having IC voltage and thermal resistance designated on a per IC basis
Systems for testing a plurality of integrated circuits at a plurality of frequencies and voltages is disclosed. In one embodiment, a plurality of integrated circuits is tested at least once within...
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7227372 |
Voltage monitoring apparatus in a semiconductor probe station
An Electrical Die Sorting (EDS) process system for testing semiconductor chips comprises a probe station, a power supply unit configured in the probe station, and a voltage apparatus for measuring...
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7221180 |
Device and method for testing electronic components
A test device includes first and second testers each having at least one testing contact for making contact with at least one external contact of an electronic component; and a conveying device...
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7212024 |
Inspection apparatus for liquid crystal drive substrates
The object of the present invention is to provide an inspection apparatus for liquid crystal drive substrates that improves the inspection accuracy of liquid crystal drive substrates, judges defect...
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7204008 |
Method of making an electronics module
An electronics module is assembled by demountably attaching integrated circuits to a module substrate. The module is then tested at a particular operating speed. If the module fails to operate...
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7202684 |
Thermal stratification test apparatus and method providing cyclical and steady-state stratified environments
A method and apparatus for a thermal stratification test providing cyclical and steady-state stratified environments. In order to test an electronic device, for example one having one or more...
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7112981 |
Method of debugging a 3D packaged IC
In a method of testing a 3D packaged IC, the dies are tested under power by mounting on a specifically designed printed circuit board with a window in it for testing the die sequentially from below...
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7106086 |
Method of dynamically switching voltage screen test levels based on initial device parameter measurements
A method of dynamically switching the voltage screen test parameters without falsely rejecting over stressing short channel length devices. Protection to more vulnerable devices is provided by...
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7031791 |
Method and system for a reject management protocol within a back-end integrated circuit manufacturing process
A method and system for a reject management protocol within a back-end IC manufacturing process. In one method embodiment, the present invention implements a tracking process for a die-strip. The...
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7005878 |
Method for in-line testing of flip-chip semiconductor assemblies
Flip-chip semiconductor assemblies, each including integrated circuit (IC) dice and an associated substrate, are electrically tested before encapsulation using an in-line or in situ test socket or...
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6970008 |
Chip testing machine with rotary conveying disk set for receiving and conveying the chips for testing
A chip testing machine includes a testing mechanism for acquiring data of chips and sorting same into several different groups according to outcome of testing operation, a feeding mechanism for...
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6957005 |
Pogo contactor assembly for testing of and/or other operations on ceramic surface mount devices and other electronic components
A contactor assembly useable on a component testing system for electrically contacting a terminal on a device under test (DUT) for parametric testing and eventual sorting as part of component batch...
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6927595 |
Dynamically switched voltage screen
This invention teaches an apparatus and method for determining a more efficient quality assurance or reliability test screen without falsely rejecting, i.e., over stressing, short channel length...
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6922050 |
Method for testing a remnant batch of semiconductor devices
A method for testing semiconductor devices includes loading a customer tray with semiconductor devices to be tested. Groups of devices are transferred from the customer tray to buffer trays for...
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6917214 |
Method for testing a plurality of devices disposed on a wafer and connected by a common data line
In a method for testing a plurality of devices, which are arranged on a wafer and connected to a common data line, wherein the devices are connectable to a test unit via the common data line, a...
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6911815 |
Semiconductor test system and method of operating the same
A semiconductor test system and method for the same. A handler is capable of moving and classifying semiconductor packages, a logic tester is capable of receiving a semiconductor package from the...
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6873172 |
Automated laser diode test system
An automated laser diode testing and burn-in system is disclosed. Initial device data is obtained by applying current to the device at room temperature and measuring the device parameters. The...
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6844717 |
Test handler
The present invention discloses a test handler comprising a main body, a stocker including a user tray supplier and a user tray deliverer for loading plurality of user trays carrying the...
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6825678 |
Wafer level interposer
An apparatus and method for manufacture and testing of semiconductor chips (14) is disclosed. The invention comprises the use of an interposer (22) having a plurality of electrical contact pads...
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6822469 |
Method for testing multiple semiconductor wafers
The present invention provides a system, method and apparatus for testing multiple semiconductor wafers. The method includes the steps of attaching two or more wafer-interposer assemblies to a...
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6812692 |
Inspection terminal for inspecting electronic chip component, and inspection method and inspection apparatus using the same
An inspection terminal for accurately measuring a characteristic of an electronic chip component without causing an inner electrode layer constituting an external electrode of the electronic chip...
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6781363 |
Memory sorting method and apparatus
A method and apparatus performs testing, sorting, and packaging of partially defective semiconductor memory devices in order to construct usable memory chip or module packages that meet the...
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6782500 |
Statistical decision system
A method for testing integrated circuits, where a predetermined set of input vectors is introduced as test input into the integrated circuits. The output from the integrated circuits in response to...
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6775000 |
Method and apparatus for wafer-level testing of semiconductor laser
A system and method for manufacturing and wafer-level testing properties of a wafer comprises a chuck receiving a wafer to be tested and a pump light source directing an output beam toward selected...
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6769963 |
IC handler and contact cleaning method
The invention can be easily applied to various contacts irrespective of the length of time needed for replacing ICs with other ICs relative to the contact. An IC handler comprises contact cleaning...
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6768297 |
High speed VLSI digital tester architecture for real-time output timing acquisition, results accumulation, and analysis
A tester for testing a digital device. The tester includes a plurality of time measurement units to measure transition timing values of output data of each output pin of the digital device in each...
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6756796 |
Method of search and identify reference die
An improved method for pick and place equipment operation is provided by an improved method for identifying the reference die on a wafer. A recording of good die, partial die, mirror die, and...
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6731127 |
Parallel integrated circuit test apparatus and test method
A test apparatus (300) comprising a single handler (304) is coupled to a first tester (336) and second tester (308). A first test procedure is performed on a set of second IC's using the first...
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6681361 |
Semiconductor device inspection apparatus and semiconductor device inspection method
A semiconductor device handler includes a handler section and a measurement section. A reference sample is mounted into a plurality of DUT sections provided in the measurement section. A prescribed...
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