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9035672 Digital communications test system for multiple input, multiple output (MIMO) systems  
A digital communications test system and method for testing a plurality of devices under test (DUTs) in which multiple sets of a single vector signal analyzer (VSA) and single vector signal...
8994390 Test systems with a probe apparatus and index mechanism  
A probe apparatus has probe wires with a contact pattern on one side. The contact pattern is for contacting a respective contact pattern on another test equipment or component, such as a circuit...
8994394 Test carrier  
A test carrier includes a film-shaped base film which has first bumps which contact test pads of a die; and a cover film which is superposed over the base film, and the test carrier holds the die...
8952383 Test carrier  
A test carrier which can suppress the occurrence of contact defects while securing positional precision of the terminals is provided. A test carrier 10 comprises: a base film 40 which has one main...
8947116 System for testing an integrated circuit of a device and its method of use  
A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator...
8933718 Signal distribution structure and method for distributing a signal  
A signal distribution structure for distributing a signal to a plurality of devices includes a first signal guiding structure including a first characteristic impedance. The signal distribution...
8928345 Measuring coupler using strip conductor technology  
A test coupler for supplying a device under test with test signals contains a first coaxial connector, a waveguide port, and a first strip conductor. Test signals of a lower frequency range are...
8922229 Method for measurement of a power device  
A method is disclosed for the measurement of a power device in a prober, which serves the examination and testing of such components. In the process, a power device is held by a chuck, and at...
8922222 Systems and methods for determining electrical connectivity  
A system (10) and method (200) are disclosed for detecting electrical connectivity. The system includes at least one power distribution conductor (18) and at least one electrical power pad (20)...
8917107 Circuit board having bypass pad  
An electronic device having a printed circuit board is provided. In one embodiment, the printed circuit board includes a plurality of external pads to be coupled with an external device and a...
8907697 Electrical characterization for a semiconductor device pin  
Embodiments related to electrically characterizing a semiconductor device are provided. In one example, a method for characterizing a pin of a semiconductor device is provided, the method...
8907694 Wiring board for testing loaded printed circuit board  
A wiring board for transmission of test signals between test point locations on a circuit board under test and an external analyzer having compliant contacts making electrical contact with a pad...
8890559 Connector and interface apparatus comprising connector  
[Problems] In a connector to which unbalanced-type lines are connected, providing a connector which prevents crosstalk in the connector and an interface apparatus including the connector....
8872535 Connector attaching/detaching apparatus and test head  
The connector attaching/detaching apparatus includes a plurality of fitting members that causes connectors to fit with or separate from one another by sliding, guiding members that sequentially...
8860453 Test adapter configuration for testing a communication device  
The invention provides a base plate for a test adapter for use in testing devices in a production line. The base plate comprises a first interface configured to connect to a product-specific part...
8847618 Circuit board testing device for uneven circuit boards  
A circuit board tester and method that precisely aligns the probe plate and circuit board is disclosed. With a circuit board and probe plate mounting within a housing having a top and bottom,...
8823407 Test assembly for verifying heat spreader grounding in a production test  
A test assembly (12) for testing a device (10) having a heat spreader (20), a package substrate (18) having a substrate ground (18G), and a grounding conductive segment (44A), includes (i) an...
8774729 System and method for synchronized triggering of test equipment for testing MIMO transceivers  
A system and method for testing multiple-input-multiple-output (MIMO) devices under test (DUTs) with multiple radio frequency (RF) signal testers. Each tester receives one or more RF signals from...
8749255 Electronic device test apparatus  
An electronic device test apparatus which can optimize throughput and costs is provided. An electronic device test apparatus 1 comprises: a test cell cluster 10 having cell groups 11A to 11H each...
8749261 Interfaces having a plurality of connector assemblies  
Embodiments of interfaces are disclosed. One such interface has a plurality of connector assemblies, each connector assembly in a single opening of a plurality of openings passing completely...
8749260 Test wafer unit and test system  
Provided is a test wafer unit that tests a plurality of devices under test formed on a wafer under test, the test wafer unit comprising a plurality of test circuits that are formed on the same...
8736261 Sensor module  
A sensor module includes a sensor, a cover, and a wiring unit. The cover holds the sensor and includes a connector configured to make a connection with an external device. The wiring unit is held...
8729918 Test apparatus, circuit module and manufacturing method  
An apparatus comprising a test circuit that is provided on a test substrate and tests the device under test; a sealing section that covers a region of the test substrate on which the test circuit...
8704545 Determination of properties of an electrical device  
A device and method of determining the electrical properties of an electrical device, including taking of at least one measurement of an electrical measured quantity at one or more brought-out...
8705231 Extension device and information processing system including the same  
An information processing system includes: a main device including first and second engagement portions in a principal surface and a third engagement portion in a surface on the main-device side...
8653846 Electronic device mounting apparatus and method of mounting electronic device  
The electronic device mounting apparatus 1 comprises: a first camera 123 for imaging a flexible board 74 of a base member 70 of a test carrier 60 to generate a first image information; an image...
8648617 Semiconductor device and method of testing semiconductor device  
According to the following disclosure, disclosed is a semiconductor device including: an internal circuit configured to receive and output a signal current; a current mirror unit outputting a...
8638116 Probe card having configurable structure for exchanging or swapping electronic components for impedance matching and impedance matching method therefore  
A probe card having a configurable structure for exchanging/swapping electronic components for impedance matching and an impedance method therefore are provided. In the probe card, an applied...
8633724 Probe-unit base member and probe unit  
A probe-unit base member having high rigidity and requiring no troublesome operations for its manufacture and a probe unit are provided. To achieve the purpose, the probe-unit base member includes...
8604818 Apparatus for contacting a T/R module with a test device  
An apparatus for making contact between a T/R module and a test device, the apparatus including a mechanically guided contact-making unit having a plurality of contact elements for contacting the...
8575953 Interconnect system  
A test contact may include a first portion having an open-ended rounded shape. The first portion may define an opening therethrough. The test contact may include a second portion having a curved...
8547129 Connector test system  
A connector test system includes a number of adapters, a number of testers, and a motherboard. Each tester is connected to a corresponding one of the adapters. The motherboard is configured for...
8525525 Conductivity test jig, conductivity test apparatus having conductivity test jig, and a method of testing conductivity  
The conductivity test jig includes: a jig main body; a holding member; a conductivity test unit; a conductivity member; an air cylinder; a jig main body; and a second air cylinder. The jig main...
8525539 Electrical connecting apparatus and testing system using the same  
An embodiment of an electrical connecting apparatus includes a chip unit having a plurality of electronic components arranged on the upper side of a chip supporting body, a probe unit having a...
8482308 Connecting unit to test semiconductor chips and apparatus to test semiconductor chips having the same  
A connecting unit to test a semiconductor chip and an apparatus to test the semiconductor chip having the same include a plurality of connectors, on which a semiconductor chip having a certain...
8461856 Interface test device and method for using the interface  
A monitored test block for use in medium and high voltage electrical monitoring circuits such as found in substation facilities that signals via a communication protocol the operational status of...
8441273 Testing card and testing system for USB port  
A testing card for a USB port includes first USB contacting pins, a second USB contacting pin, a transmitting circuits, a voltage converting circuit, and a testing portion. The first USB...
8427171 Battery connection failure detection system  
A system and method of detecting battery connection failures relies upon measuring battery cell body temperature and battery connector temperature at a measured current. The difference between...
8400176 Wafer level contactor  
A probe card assembly can include a plurality of probes disposed on a substrate and arranged to contact terminals of a semiconductor wafer. Switches can be disposed on the probe card assembly and...
8379403 Spacer-connector and circuit board assembly  
A spacer-connector and connection arrangements between daughter boards and motherboards are disclosed. Assemblies may include a daughter board one or more spacer-connectors spacing the daughter...
8373432 Automated test equipment employing test signal transmission channel with embedded series isolation resistors  
Automated test equipment for high-speed testing of devices under test (DUTs) includes a tester channel circuit generating a high-speed electrical test signal applied to the signal input terminal...
8362791 Test apparatus additional module and test method  
A test apparatus includes: test modules that communicate with the device under test to test the device under test; additional modules connected between the device under test and the test modules,...
8314630 Test section unit, test head and electronic device testing apparatus  
A test section unit provided to a test head body includes a plurality of sockets to be attached with electronic devices to be tested and a performance board as a main substrate. All of the sockets...
8310260 Connecting device  
A connecting device for connecting pins of a DIP chip to a test device comprises two each of half frames, columns of testing pins, connecting screws, fixing screws, and four holding plates. The...
8269507 Device for testing surface mounted connectors  
This invention describes a device for testing a surface mounted connector using a test probe assembly that utilizes a vacuum to force the test wires and the test probe's wire array into intimate...
8248093 Circuit board having bypass pad  
An electronic device having a printed circuit board is provided. In one embodiment, the printed circuit board includes a plurality of external pads to be coupled with an external device and a...
RE43503 Probe skates for electrical testing of convex pad topologies  
A probe for engaging a conductive pad is provided. The probe includes a probe contact end for receiving a test current, a probe retention portion below the contact end, a block for holding the...
8203355 Circuit board having bypass pad  
An electronic device having a printed circuit board is provided. In one embodiment, the printed circuit board includes a plurality of external pads to be coupled with an external device and a...
8203354 System for testing electronic components  
An improved efficiency system for testing electronic components in a motherboard/daughterboard assembly in which the daughterboard is mounted in spaced parallel relationship the to motherboard...
8198909 Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion  
The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on...