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7620931 |
Method of adding fabrication monitors to integrated circuit chips
An integrated circuit, a method and a system for designing and a method fabricating the integrated circuit. The method including: (a) generating a photomask level design of an integrated circuit...
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7619430 |
Electrical testing probe assembly having nonparallel facing surfaces and slots formed thereon for receiving probes
Disclosed is a probe assembly for use in electrical testing of a test object. The probe assembly has a probe supporter body elongated in a first direction. The probe supporter has a first side...
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7619425 |
Electrical connecting apparatus
An electrical connecting apparatus comprises a plurality of plate-shaped probes. Each probe has a cut-off portion opening on its inside surface side and both sides in the thickness direction of the...
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7619424 |
Probe needle, method for manufacturing the probe needle and method for constructing a three-dimensional structure
A method for manufacturing a probe needle having beams and a contactor placed on tips of the beams comprises preparing a Si wafer 20 , forming a seed layer 21 on the Si wafer 20 , and forming...
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7619419 |
Wideband active-passive differential signal probe
A wideband differential signal probe includes separate paths to convert a lower frequency component and a higher frequency component of a differential signal to a lower frequency single ended...
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7618465 |
Near-field antenna
The invention relates to a near-field antenna comprising a dielectric shaped body having a tip. The shaped body is characterized in that at least the surface of the tip is metallized, thereby...
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7616019 |
Low profile electronic assembly test fixtures
Low profile printed circuit board assembly test fixtures and methods are disclosed, the fixtures mountable at a tester having a plurality of conductive interface contacts. The fixture includes a...
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7616016 |
Probe card assembly and kit
In a probe card assembly, a series of probe elements can be arrayed on a silicon space transformer. The silicon space transformer can be fabricated with an array of primary contacts in a very tight...
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7616015 |
Wafer type probe card, method for fabricating the same, and semiconductor test apparatus having the same
Example embodiments may provide a wafer type probe card, a method of fabricating a wafer type probe card, and/or a semiconductor test apparatus having the wafer type probe card. The wafer type...
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7609080 |
Voltage fault detection and protection
A fault detection and protection circuit can include a comparing circuit (e.g., a comparator or a detector) that can be connected to a power line supplying power to an electronic device being...
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7609078 |
Contact alignment verification/adjustment fixture
In an electronic testing machine including at least one test module having a plurality of contacts for testing electronic components, the improvement of a contact alignment tool for aligning the...
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7609077 |
Differential signal probe with integral balun
A probe with integral balun enables connecting a device utilizing differential signals to a source or a sink of single ended signals.
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7609048 |
Probe microscope and measuring method using probe microscope
Provided is a probe microscope for measuring a surface potential of a sample, including a contact electrification mechanism (circuit (C)) for bringing an electroconductive probe device into contact...
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7607056 |
Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices
Disclosed herein is a semiconductor test apparatus for simultaneously testing a plurality of semiconductor devices. The semiconductor test apparatus includes a plurality of pattern generation...
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7605596 |
Probe card, apparatus and method for inspecting an object
A probe card, an apparatus and a method of inspecting an object. In the example method, a first inspection current may be divided into a plurality of first divided inspection currents. Each of the...
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7605582 |
Modular interface
An apparatus for interfacing a test head to a peripheral system is provided. The apparatus includes a first unit having a first connection member for providing electrical communication with the...
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7602200 |
Probe for electrical test comprising a positioning mark and probe assembly
A probe for electrical test provided with positioning marks parallel to a plane where tips are provided and at a height position lower than the plane on a plane directed in the same direction as...
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7602199 |
Mini-prober for TFT-LCD testing
An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays. The apparatus...
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7598763 |
Probe contacting electrode and electronic device
A probe contacting electrode that is formed on a surface of a package of an electronic device and to which a probe of a probe device is contacted, including a lower layer part and an upper layer...
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7598759 |
Routing engine, method of routing a test probe and testing system employing the same
Embodiments of the present disclosure provide a routing engine, a method of routing a test probe and a testing system employing the router or the method. In one embodiment, the routing engine is...
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7598758 |
MP3 micro probe
Described are methods of using probes, for making electrical contact to high-density chips or similar electronic devices. Two groups of probes are covered. The first group includes probes that are...
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7598757 |
Double ended contact probe
It is an object of the present invention to provide a double-ended contact probe that can be improved in productivity to ensure that the contact members are stably movable with respect to each...
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7598756 |
Inspection device and inspection method
A first conductive contact connecting a first electrode of an inspection circuit board and one external electrode of a semiconductor integrated circuit is arranged in a fixed member. A second...
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7598755 |
Probe navigation method and device and defect inspection device
A probe navigation method, a navigation device, and a defect inspection device wherein in a charged particle beam system provided with probes for electrical characteristics evaluation, probing can...
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7595651 |
Cantilever-type probe card for high frequency application
A cantilever-type probe card includes a circuit board, a grounding block electrically connected to a zero potential, signal probes, and at least one grounding probe connected to the grounding...
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7595650 |
Magnetic field probe apparatus and a method for measuring magnetic field
A magnetic field probe apparatus includes a loop-like conductor and feeder lines spaced at a distance from the loop-like conductor. The shape of the loop-like conductor and the arrangement of the...
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7595632 |
Wafer probe station having environment control enclosure
A wafer probe station is equipped with an integrated environment control enclosure substantially surrounding a supporting surface for holding a test device, such enclosure limiting fluid...
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7595631 |
Wafer level assemble chip multi-site testing solution
A chip test system including a probe card, a chip tray and a cover plate fastened on the chip tray. The chip tray comprises a socket, a chip contact area, an extension contact area, and an...
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7595629 |
Method and apparatus for calibrating and/or deskewing communications channels
A series of pulses may be driven down each drive channel, which creates a series of composite pulses at the output of the buffer. Each composite pulse is a composition of the individual pulses...
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7595628 |
Probing apparatus for illuminating an electrical device under test
A probe for probing an electrical device under test is provided. The probe comprises a selectively positionable door defining a recessed compartment and a light source positioned within the...
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7592823 |
Electrical component handler having self-cleaning lower contact
An electrical component handler that tests electrical circuit components and includes a self-cleaning lower contact offers reduced yield loss and mean time between assists. A preferred embodiment...
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7592822 |
Probing adapter for a signal acquisition probe having pivoting, compliant, variable spacing probing tips
A probing adapter has a support member receiving a probing tip assembly having probing arms. The probing tip assembly is mounted to the support member via a rotational joint having elastomeric...
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7592821 |
Apparatus and method for managing thermally induced motion of a probe card assembly
A probe card assembly can include a probe head assembly having probes for contacting an electronic device to be tested. The probe head assembly can be electrically connected to a wiring substrate...
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7589544 |
Probe test apparatus
The present invention provides a probe test apparatus capable of easily correcting a probe needle of a probe card. A pad image by which the position of an electrode pad P can be specified is...
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7589543 |
Probe card having a conductive thin film on the surface of an insulating film behind each of the alignment marks each marks comprises a plurality of second bumps
A probe card for a wafer level test of electrical characteristics of a plurality of semiconductor integrated circuit devices formed on a semiconductor wafer. The card has a thin film with bumps on...
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7589542 |
Hybrid probe for testing semiconductor devices
A hybrid probe design is presented that includes a torsion element and a bending element. These elements allow the probe to store the displacement energy as torsion or as bending. The probe...
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7589541 |
Method and apparatus for inspecting solid-state image pick-up device
Provided is a method for inspecting a solid-state image pickup device by irradiating a solid-state image pickup device with measuring light emitted from a light source. The light source is a...
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7589518 |
Wafer probe station having a skirting component
A probe station includes a fully guarded chuck assembly and connector mechanism for increasing sensitivity to low-level currents while reducing settling times. The chuck assembly includes a...
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7586321 |
Electrical test probe and electrical test probe assembly
An electrical test probe comprises a probe tip portion and a probe main body portion having a pedestal portion on which the probe tip portion is formed to be protruded. The probe main body portion...
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7586318 |
Differential measurement probe having a ground clip system for the probing tips
A differential measurement probe has a ground clip system for electrically coupling outer shielding conductors of differential probing tips together. In one embodiment, the probing tips...
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7586317 |
Inspection apparatus, probe card and inspection method
By allowing an electrical conduction between a probe and an electrode by a fritting phenomenon before inspection, simplification of circuit configuration and shortening of inspection time is...
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7586316 |
Probe board mounting apparatus
A mounting apparatus that does not compromise the strength of a probe board. The apparatus comprises a probe board spaced from a support member by a spacer. A fixed portion with a female screw hole...
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7583101 |
Probing structure with fine pitch probes
A microelectronic resilient structure can comprise a support member and a platform attached to the support member. The platform can comprise a non-conductive, resilient beam that extends away from...
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7583100 |
Test head for testing electrical components
A test head for testing electronic parts including a base having radial slots for receiving contact mounting assemblies. The contact mounting assemblies are removably mounted to the base and are...
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7583096 |
Probing apparatus and probing method
There is provided a probing apparatus capable of modifying an existing probing apparatus having a single loading port to one having dual loading ports while saving the space without increasing a...
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7583095 |
High-density probe array
A probe array may be fabricated by forming probes arranged on a sacrificial substrate, forming a probe substrate above the probes, and removing the sacrificial substrate. In one embodiment, first...
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7579857 |
Electrical contact device of probe card
An electrical contact device of a probe card includes a base and probes on the base. The base has a top side with a cavity thereon, and the cavity has sidewalls connected to the top side. Anchored...
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7579856 |
Probe structures with physically suspended electronic components
A probe apparatus can include a substrate, a contact structure attached to the substrate, and an electronic component electrically connected to the contact structure. The electronic component can...
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7579855 |
Method for manufacturing electrical contact element for testing electronic device and electrical contact element manufactured thereby
Disclosed is an electrical contact element used to test an electronic device. The electrical contact element has a beam portion and a tip portion attached to an end of the beam portion. In...
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7579853 |
Apparatus for obtaining planarity measurements with respect to a probe card analysis system
A system and method of mitigating the effects of component deflections in a probe card analyzer system may implement three-dimensional comparative optical metrology techniques to model deflection...
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