Matches 1 - 43 out of 43


Match Document Document Title
8159247 Yield enhancement for stacked chips through rotationally-connecting-interposer  
A set of first substrate and second substrate are manufactured with a built-in N-fold rotational symmetry around the center axis of each substrate, wherein N is an integer greater than 1. A set of...
8058888 Test apparatus for electronic device package and method for testing electronic device package  
A test apparatus for an electronic device package is provided, which includes a test socket having a first portion with a recess for receiving an electronic device package having external terminals...
8022719 Carrier tray for use with prober  
A carrier tray for use with a prober is arranged to allow the prober to measure or test not only semiconductor wafers but also semiconductor packages and accurately position each of...
7969175 Separate test electronics and blower modules in an apparatus for testing an integrated circuit  
The invention relates to an apparatus for testing an integrated circuit of an electronic device.
7872484 Chip pin test apparatus  
A test apparatus includes a printed circuit board, a chip carrier socket, and a display circuit. The chip carrier socket includes a space to receive a chip including a plurality of pins, a...
7768283 Universal socketless test fixture  
A universal socketless integrated circuit (IC) electrical test fixture is provided. The test fixture is made up of a probing platform to accept and heatsink an IC. The IC has electrical contacts...
7764073 Electrical connecting apparatus  
The electrical connecting apparatus comprises: a wiring base plate having a first surface provided with a plurality of first conductive portions; a probe base plate having a second surface provided...
7755365 Electronic element testing and supporting apparatus  
An electronic element testing and supporting apparatus includes a circuit board, an outer frame, an inner frame, a plate and two locking devices. The outer frame is assembled on a second surface of...
7728611 Compressive conductors for semiconductor testing  
An interconnect assembly electrically connecting two circuit members, which include respective arrays of electrical contacts for engagement with the interconnect assembly. The interconnect assembly...
7683647 Instrument per pin test head  
A test head for testing a DUT includes a probe card having a plurality of DUT probes, the probes being in contact with the DUT during the testing; an instrument carrier, the instrument carrier...
7663393 Mobility measurements of inversion charge carriers  
A method and device for determining the quality of the interface surface between a layer of a dielectric material and the top surface of the semiconductor substrate are disclosed. In one aspect,...
7514947 Method of and system for functionally testing multiple devices in parallel in a burn-in-environment  
A method of and a system for testing semiconductor devices heat a plurality of devices to a burn-in temperature, and perform functional tests in parallel on the plurality of devices at the burn-in...
7471096 Contactor for electronic parts and a contact method  
A contactor for electronic parts can provide an appropriate and uniform contact with respect to a plurality of electrode terminals in an electronic part such as an IC. Each of a plurality of...
7278079 Test head utilized in a test system to perform automated at-speed testing of multiple gigabit per second high serial pin count devices  
A portion of a test head utilized to perform simultaneous automated at-speed testing of a plurality of devices that generate serial data signals having gigabit per second baud rates. The portion of...
7248036 Method and apparatus to probe bus signals using repeaters  
An assembly including a processor socket having a cut region. The assemble further including a probe board having a repeater positioned in alignment with the cut region. The repeater is to receive...
7162670 IBIST interconnect and bridge fault detection scheme  
A method and mechanism for detecting interconnect and bridge defects. Contact points in a chip are assigned placement designation such that no two adjacent points have the same designation. A...
7053641 Interconnect having spring contacts  
An interconnect for testing a semiconductor component includes a substrate, and interconnect contacts on the substrate configured to electrically engage component contacts on the component. The...
6903562 Integrated micromachine relay for automated test equipment applications  
A method and apparatus for a micromachine relay is provided. A pin controller comprises at least one spring pin designed to movably couple the pin controller to a device under test (DUT) to provide...
6819124 Detection of electromigration in integrated circuits  
A method and apparatus for detecting electromigration at its outset includes a pair of conductive traces deposited on a substrate in an integrated circuit. A multiplicity of conductors are...
6750672 Semiconductor inspecting system for inspecting a semiconductor integrated circuit device, and semiconductor inspecting method using the same  
An apparatus to be inspected is mounted on one surface of a socket board. An auxiliary inspecting apparatus for adjusting timing of write signals transmitted from a semiconductor inspecting...
6727685 Work transfer apparatus  
A work transfer apparatus includes a turn table with a plurality of work-storing pockets for storing works at the outer periphery of the turn table and a base slidably supporting the works stored...
6707064 Test element group structure  
A semiconductor wafer includes a plurality of chip areas having circuit elements, a scribe line area for defining the chip areas, and a plurality of test element group (TEG) modules. The TEG...
6647526 Modular/re-configurable test platform  
A system and method is provided for testing industrial control modules. Input and output stimulus signals, communication lines, measurement device lines and relay contacts are provided at a tester...
6445200 Semiconductor element testing carrier using a membrane contactor and a semiconductor element testing method and apparatus using such a carrier  
A semiconductor element testing carrier prevents a semiconductor element from being displaced relative to a membrane contactor during a testing operation and an attaching operation of the...
6229319 Chip carrier to allow electron beam probing and fib modifications  
Disclosed are a die carrier and associated method for conducting probe beam tests on chips designed to be packaged in flip-chip packages. The die carrier is a specially modified membrane type...
6114866 Semiconductor device test board and method for evaluating semiconductor devices  
A semiconductor device test board solves a problem with conventional test boards in that test results obtained through a burn-in procedure could be identified only before the test board is taken...
6005402 Translator fixture for use in circuit board testing  
A translator fixture for use in testing a printed circuit board including a plurality of translator plates for containing and supporting translator pins extending through the translator plates for...
5883522 Apparatus and method for retaining a semiconductor wafer during testing  
A retaining apparatus for retaining a semiconductor wafer on the surface of a chuck. The retaining apparatus includes elongate shafts each positioned adjacent to a perimeter of the surface of the...
5744948 Printed circuit board handling device  
A test fixture assembly releasably retains a printed circuit board on a test fixture and facilitates transfer of the board to and removal of the board from the fixture during a sequential test...
5548525 Method and apparatus for pin assignment in automatic circuit testers  
The wiring of system contacts (18) to board probes (20) on a fixture (16) that is used to connect nodes of a board under test to system pins (14) of a multiplexed circuit tester (10) is performed...
5534787 High-frequency coaxial interface test fixture  
A test fixture for use in the testing of integrated circuit devices includes a metal conductive base plate mounted on a printed circuit wiring board. The base plate has holes extending through it...
5488292 Wafer inspecting system  
A wafer inspecting system is provided, in which the inspecting time for one cassette stocking plurality of wafers are shortened. The wafer, which is stored in the cassette among four cassettes...
5208529 Electric device contact assembly  
A contact assembly for use in testing electric devices such as integrated circuits (IC's) and the like is comprised of a test socket and a corresponding carrier module for positioning the electric...
5206582 Control system for automated parametric test equipment  
Disclosed is a control system and methodology used for defining and executing parametric test sequences using automated test equipment. The control system is divided into components which separate...
5192907 Electronic module handling device for an automatic test apparatus  
A device in cludes two mechanisms mounted beside the two longitudinal sides of an adapter supporting the customary feelers of a test apparatus. Each mechanism is adustable transversely on the...
5180976 Integrated circuit carrier having built-in circuit verification  
Integrated circuit (IC) packages mounted on a loaded printed circuit board (PCB) are tested by a translator module by first placing a corresponding module over each package. Each module has rows of...
5034685 Test device for testing integrated circuits  
Each transistor or logic unit on an integrated circuit wafer is tested prior to interconnect metallization. By CAD, the transistor or logic units placement net list is revised to substitute...
4970454 Packaged semiconductor device with test circuits for determining fabrication parameters  
A test circuit (40) fabricated in an integrated circuit and connected to an I/O pin (36) of the packaged device (32) for providing information indicative of substrate process parameters. The test...
4544889 Robot precision probe positioner with guidance optics  
This precision probe uses optical feedback in the X and Y dimensions to locate a microprobe in the airspace over a test pad, and uses pressure feedback in the Z dimension to control Z approach and...
4500836 Automatic wafer prober with programmable tester interface  
An automatic wafer prober is interfaced with any one of a number of different die testers by storing in memory associated with the wafer prober a plurality of sets of data there being one set of...
3460037 TRAVELLING PROBE ARRANGEMENT FOR TESTING ADVANCING ARTICLES  
3458807 TEST APPARATUS FOR DETERMINING RESISTANCE AND OVERLOAD CAPABILITY OF THIN FILM RESISTORS CARRIED ON A SUBSTRATE  
3422354 TEST FIXTURE FOR PELLET-LIKE ELECTRICAL ELEMENTS  
Matches 1 - 43 out of 43