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Match Document Document Title
8174282 Leak current detection circuit, body bias control circuit, semiconductor device, and semiconductor device testing method  
A leak current detection circuit that improves the accuracy for detecting a leak current in a MOS transistor without enlarging the circuit scale. The leak current detection circuit includes at...
8174277 Compensation for voltage drop in automatic test equipment  
Providing reliable testing of a device under test (DUT) by compensating for a reduced voltage inside the device without changing the internal circuitry of the device. The DUT has multiple...
8169228 Chip testing circuit  
A chip testing circuit is disclosed. The chip testing circuit uses a judging circuit to switch the connection of the data compressing circuit between data compressing base units which compresses 4...
8164356 Testing apparatus and method for testing a semiconductor devices array  
A testing apparatus and a method for testing a semiconductor devices array, which includes a plurality of rows and a plurality of columns, are provided. The testing apparatus includes a first...
8159257 Element substrate, inspecting method, and manufacturing method of semiconductor device  
A substrate including a semiconductor layer, where characteristics of an element can be evaluated with high reliability, and an evaluating method thereof are provided. A substrate including a...
8154317 Integrated circuit device to support inductive sensing  
An integrated circuit device inductive touch analog front end (AFE) excites selected ones of a plurality of inductive touch sensors, measures voltages across the coils of the plurality of inductive...
8140277 Enhanced characterization of electrical connection degradation  
One embodiment provides a system that analyzes an electrical connection in a computer system. During operation, the system monitors a reflection coefficient associated with the electrical...
8134378 Reconfigurable connections for stacked semiconductor devices  
Some embodiments include apparatus, systems, and methods comprising semiconductor dice arranged in a stack, a number of connections configured to provide communication among the dice, at least a...
8125233 Parametric testline with increased test pattern areas  
An integrated circuit parametric testline providing increased test pattern areas is disclosed. The testline comprises a dielectric layer over a substrate, a plurality of probe pads over the...
8127191 Control method for semiconductor integrated circuit and semiconductor integrated circuit  
A semiconductor integrated circuit includes a self-test circuit, wherein, when a operation mode of the self-test circuit has been switched from a low-speed operation mode to a high-speed operation...
8120377 Integrated circuit having secure access to test modes  
Methods for enabling a secure test mode, and integrated circuits (IC's) implementing the same are disclosed. An IC may include a secure functional unit that is protected from access from test...
8114265 Efficiency optimization and damage detection of electrolysis cells  
There is described a method and a system for evaluating damage of a plurality of cells in an electrolyser. The method comprises acquiring a voltage for each one of the cells; comparing the voltage...
8103400 Sensor apparatus  
A sensor apparatus of the present invention includes a first output terminal for outputting a sense signal, and a failure diagnosis circuit for determining whether a failure diagnosis object...
8098075 Testing method for electronic apparatus  
An electronic apparatus includes a first power contact, a second power contact, and a control unit. The first power contact is electrically connected with an anode of a power supply source, and the...
8093918 Electronic device identifying method and electronic device comprising identification means  
An electronic device that includes an actual operation circuit that operates during an actual operation of the electronic device, a second test circuit and a third test circuit that operate during...
8079246 Integrated MEMS metrology device using complementary measuring combs  
The present invention provides a device for in-situ monitoring of material, process and dynamic properties of a MEMS device. The monitoring device includes a pair of comb drives, a cantilever...
8072233 Method and apparatus for monitoring via's in a semiconductor fab  
A method for monitoring a semiconductor fabrication process creates a wafer of semiconductor chips. Each chip has a one or more diodes. Each diode is addressable as part of an array, corresponds to...
8067950 Semiconductor device including chip  
A semiconductor device in which a chip 10 is mounted on a board, includes: a pad group A provided on the chip 10 and electrically connected to an internal circuit in the chip 10; and a test pad...
8069386 Semiconductor device  
A semiconductor device includes a CPU, a memory, a memory BIST circuit, a first selector that selects and outputs an address and control signal from the memory BIST circuit, when performing a test...
8063650 Testing fuse configurations in semiconductor devices  
Methods, systems, and apparatus for testing semiconductor devices. A semiconductor device includes one or more external terminals configured to receive fuse configuration data from an external...
8058893 Frequency trimming for internal oscillator for test-time reduction  
An internal precision oscillator (IPO) is trimmed within a microcontroller integrated circuit. The microcontroller integrated circuit receives a test program into flash memory on the...
8055404 Sensor apparatus  
A sensor apparatus of the present invention includes a first output terminal for outputting a sense signal, and a failure diagnosis circuit for determining whether a failure diagnosis object...
8054005 Driving circuit for display device, and test circuit and test method for driving circuits  
A driving circuit, which drives a display panel in a voltage range between a high negative voltage and a high positive voltage, includes: an electric charge discharging circuit; and a test external...
8049513 Method for the adjustment of a device under test  
A method for adjusting an output signal produced by a device under test from an input variable by: a) positioning the device under test at a first test device with a physical disturbance variable...
8049527 Process, voltage, and temperature sensor  
An integrated circuit includes a process sensor, a temperature sensor, and a voltage sensor. The process sensor is configured to sense a process parameter indicative of a semiconductor process by...
8044674 Semiconductor device with thermal fault detection  
A semiconductor device with a thermal fault detection is disclosed. According to one example of the invention such a semiconductor device includes a semiconductor chip including an active area. It...
8046647 TAP sampling at double rate  
An integrated circuit comprising: at least one test input for receiving test data; test control circuitry between the at least one test input and circuitry to be tested; wherein the test data is...
8037385 Scan chain circuit and method  
A scan chain circuit is disclosed. The scan chain circuit includes a chain of serially coupled clocked circuits. In a first mode of operation, each of the clocked circuits toggles in response to a...
8037089 Test system  
A test system for testing a plurality of devices under test is disclosed. The test system includes a tester and a plurality of processors. The tester is used for providing a plurality of control...
8035407 Bist DDR memory interface circuit and method for testing the same  
An apparatus and method for self-testing a DDR memory interface are disclosed. In one aspect, a built-in-self-test (BIST) memory interface circuit includes a signal multiplier for receiving a first...
8036846 Variable impedance sense architecture and method  
A variable impedance sense (VIS) circuit (400) can detect a drift in the impedance of variable impedance circuits due to changes in operating conditions. Adjustments to binary impedance setting...
8030959 Device-under-test power management  
One embodiment of the present invention includes a system for managing power to a plurality of devices-under-test (DUTs). The system comprises a DUT test system configured to perform at least one...
8030956 Method of on-chip current measurement and semiconductor IC  
A semiconductor integrated circuit that includes a circuit block having a predetermined function, a power switch capable of supplying an operating power to the circuit block, and a current...
8018240 Apparatus, circuit and method of monitoring leakage current characteristics  
An apparatus includes a current source, a current monitor circuit which monitors a current amount of the current source, and outputs a current amount signal corresponding to the current amount...
8018241 Logic applying different bit positions to respective scan paths  
An integrated circuit (70) having parallel scan paths (824-842, 924-942) includes a pair or pairs of scan distributor (800,900) and scan collector (844,944) circuits. The scan paths apply stimulus...
8008941 Polishing head testing with movable pedestal  
A polishing head is tested in a test station having a pedestal for supporting a test wafer and a controllable pedestal actuator to move a pedestal central wafer support surface and a test wafer...
8008935 Tester and a method for testing an integrated circuit  
A method for testing an integrated circuit, that includes: (a) providing a first signal to a first path that starts within the integrated circuit and ends at a first memory element that is followed...
8004302 Semiconductor device including switch for coupling power line  
A semiconductor device whose operational state is switched between a test state and a normal operational state according to a logical value of a signal input from the outside is provided. The...
8004298 IC with first and second distributors collectors and scan paths  
An integrated circuit (70) having parallel scan paths (824-842, 924-942) includes a pair or pairs of scan distributor (800,900) and scan collector (844,944) circuits. The scan paths apply stimulus...
8004297 Isolation circuit  
The present disclosure includes various method, device, and system embodiments for isolation circuits. One such isolation circuit embodiment includes: a first transistor configured for connection...
7999566 Wafer level testing  
A wafer comprises a kerf region and a test chip. The kerf is a region in a wafer designated to be destroyed by chip dicing. The test chip is located within the kerf region and is configured to...
7994807 Built-in test circuit for testing AC transfer characteristic of high-speed analog circuit  
An analog device under test circuit and a built-in test circuit for testing an AC transfer characteristic of the analog device under test are fabricated on an integrated circuit. The built-in test...
7994811 Test device and semiconductor integrated circuit device  
Test devices and integrated circuits with improved productivity are provided. In accordance with example embodiments, a test device may include a first test region with a first test element and a...
7994806 System and method for testing embedded circuits with test islands  
Embodiments of the present disclosure relate to a system and method for testing an embedded circuit in a semiconductor arrangement as part of an overall circuit that is located on a semiconductor...
7990163 Systems and methods for defect testing of externally accessible integrated circuit interconnects  
Apparatus and methods provide built-in testing enhancements in integrated circuits. These testing enhancements permit, for example, continuity testing to pads and/or leakage current testing for...
7986156 Semiconductor device including address signal generating protion and digital-to-analog converter  
An exemplary aspect of an embodiment of the present invention is a semiconductor device including a plurality of test elements formed in an array on a semiconductor substrate, an address signal...
7984350 Logic circuitry and recording medium  
Logic circuitry has a test point to detect a signal about a delay fault propagating on a logic path between an input terminal and an output terminal, the test point being coupled to the logic path,...
7984331 TAM with scan frame copy register coupled with serial output  
Testing of an electrical device is achieved by providing a test access mechanism within the device that can receive scan frames from an external tester. The received scan frames contain stimulus...
7973549 Method and apparatus for calibrating internal pulses in an integrated circuit  
A method and circuit for measuring internal pulses includes an enable circuit configured to receive a control signal from an on-chip built-in tester to enable measurement of internal circuits. A...
7969169 Semiconductor integrated circuit wafer, semiconductor integrated circuit chip, and method of testing semiconductor integrated circuit wafer  
A semiconductor integrated circuit wafer includes: a plurality of semiconductor integrated circuit regions each of which includes a semiconductor integrated circuit formed thereon; a scribe region...
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