Matches 1 - 50 out of 439 1 2 3 4 5 6 7 8 9 >


Match Document Document Title
9041422 Circuit arrangement with a plurality of on-chip monitor circuits and a control circuit and corresponding methods  
Implementations are presented herein that include a plurality of on-chip monitor circuits and a controller. Each of the plurality of on-chip monitor circuits is configured to measure a parameter...
9039275 Methods of preventing freezing of relays in electrical components  
Disclosed herein are methods of preventing freezing of relays in electrical components operated in specific atmospheric conditions. One such method described herein comprises monitoring a...
9041185 Semiconductor device and connection checking method for semiconductor device  
A semiconductor device includes a substrate, a first land formed in a first surface of the substrate, a second land formed in a second surface of the substrate, a first terminal coupled to the...
9030218 Method for thermal stabilization of probe card and inspection apparatus  
In a method for thermal stabilization of a probe card, a probe card is adjusted to a prescribed temperature in a short time by making a heat source directly contact the probe card and is...
9013198 Systems and methods for testing components of a hard disk drive system  
A hard disk drive system including a controller and a plurality of slave testing modules located in respective components of the hard disk drive system. The controller is arranged on a printed...
9007079 System and method for compensating measured IDDQ values  
An IDDQ test system and method that, in one embodiment, includes 1) an empirical extraction subsystem operable to generate an IDDQ versus temperature model for a given semiconductor device design,...
9007080 Systems and methods for conforming device testers to integrated circuit device profiles with feedback temperature control  
An integrated circuit (IC) device tester maintains a set point temperature on an IC device under test (DUT) having a die attached to a substrate. The tester includes a thermal control unit and a...
8981802 Systems and methods for conforming device testers to integrated circuit device profiles  
A device tester for an IC device under test (DUT), the DUT having a substrate and an attached die. The device tester includes a thermal control unit and a test socket assembly which conforms to...
8970234 Threshold-based temperature-dependent power/thermal management with temperature sensor calibration  
A method and apparatus for temperature sensor calibration is disclosed. In one embodiment, an integrated circuit (IC) is tested at a first known temperature corresponding to a first temperature...
8963566 Thermally adaptive in-system allocation  
An integrated circuit device includes component devices (that include primary and alternate devices) and storage elements connected to the component devices. The storage elements store different...
8928342 System and method for analyzing electronic devices having opposing thermal components  
A system for analyzing electronic devices includes an input station, a transport apparatus, an electric machine interface station, an electric machine interface, a support structure and first and...
8922227 Systems and methods for detecting surface charge  
Systems and methods are provided for detecting surface charge on a semiconductor substrate having a sensing arrangement formed thereon. An exemplary sensing system includes the semiconductor...
8922221 Method and system for detecting a short circuit affecting a sensor  
A method of detecting a short circuit affecting a sensor, at least one terminal of the sensor being connected to a bias resistor, includes: applying to at least one bias resistor at least one test...
8896337 Apparatus and method for measurement of radiation intensity for testing reliability of solar cell, and method for testing reliability of solar cell  
An apparatus and method for measurement of radiation intensity for testing reliability of a solar cell, and a method for testing the reliability of the solar cell. The apparatus includes a first...
8890555 Method for measuring transistor  
An object is to provide a measuring method with high reproducibility in a bias-temperature stress test of a transistor in which an oxide semiconductor is used for a semiconductor layer. Provided...
8890554 Current control device for electric load  
Initial calibration is performed only under normal-temperature environment, and accurate current control is performed under practical use temperature environment. A temperature sensor 171 is...
8890556 Real-time on-chip EM performance monitoring  
An integrated circuit, testing structure, and method for monitoring electro-migration (EM) performance. A method is described that includes method for measuring on-chip electro-migration (EM)...
8836354 Apparatus for thermal testing of a printed circuit board  
An apparatus for thermal testing of a printed circuit board being electrically energized and being unpopulated or populated with electrical or electronic components is disclosed. The apparatus...
8831529 Wireless communications circuitry with temperature compensation  
A test system for calibrating wireless electronic devices is provided. The test system may include a test host, a radio communication tester, and a temperature chamber in which an electronic...
8823404 Evaluation device and evaluation method for substrate mounting apparatus and evaluation substrate used for the same  
There are provided an evaluation device and an evaluation method for a substrate mounting apparatus capable of simply evaluating a temperature control function of the substrate mounting apparatus...
8810266 Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis  
A micro-spray cooling system beneficial for use in testers of electrically stimulated integrated circuit chips is disclosed. The system includes micro-spray heads disposed about a probe head. The...
8803537 Solar module test control  
A method for conditioning a photovoltaic module for testing includes setting an effective irradiance of a continuous light source at a target plane, configuring a test photovoltaic module to...
8797054 Thermal and stress gradient based RC extraction, timing and power analysis  
Timing, power and SPICE analysis are performed on a circuit layout, based on temperature and stress variations or gradient across the circuit layout. Specifically, the temperature and stress...
8797053 Positioning and socketing for semiconductor dice  
Devices and methods useful for testing bare and packaged semiconductor dice are provided. As integrated circuit chips become smaller and increasingly complex, the interface presented by a chip for...
8797052 System and method for gradient thermal analysis by induced stimulus  
A thermal gradient is induced in a device-under-test (DUT) and used to determine the location of a defect. In one embodiment, a laser creates a moving thermal gradient from a test site on the DUT...
8749254 Power cycling test arrangement  
A device instructs a power supply to provide a current to a power cycling test structure that includes a heat source interconnected with a package, via a first level interconnect mechanism, and a...
8749255 Electronic device test apparatus  
An electronic device test apparatus which can optimize throughput and costs is provided. An electronic device test apparatus 1 comprises: a test cell cluster 10 having cell groups 11A to 11H each...
8736288 Liquid cooling during testing  
A system includes electronics for testing a device, a reservoir to store coolant, where the reservoir includes a bellows that is compressible, a pump system to move coolant out of the reservoir to...
8723537 Probe inspecting method and curable resin composition  
Disclosed are a probe inspecting method for confirming the state of a probe for inspecting electric characteristics of an object to be inspected; and a curable resin composition for use in the...
8717051 Method and apparatus for accurately measuring currents using on chip sense resistors  
Systems and methods for managing process and temperature variations for on-chip sense resistors are disclosed. The system includes a circuit that can leverage a linear gm circuit in order to...
8704543 Test head moving apparatus and electronic component testing apparatus  
A test head moving apparatus includes elevating arms that move a test head up and down, a frame that horizontally moves the test head, and an interlock mechanism that prohibits the horizontal...
8704542 Thermal chamber for IC chip testing  
A thermal chamber and system for influencing the temperature of an IC chip under test including a thermal block that receives a chip socket, the thermal block adapted to be disposed between a...
8698484 Over-voltage and over-temperature detecting circuit  
An over-voltage and over-temperature detecting circuit includes a voltage-limiting circuit, a temperature sensing circuit, a current source, a first comparing circuit and a second comparing...
8692567 Method for verifying a test substrate in a prober under defined thermal conditions  
A method and an apparatus for verifying or testing test substrates, i.e. wafers and other electronic semiconductor components, in a prober under defined thermal conditions. Such a verifying...
8692568 Electronic apparatus having IC temperature control  
The use of a power sink function in IC testing results in a simple and rapid method for testing ICs, and assembled modules, at elevated temperature profiles without the use of environmental ovens....
8694276 Built-in self-test methods, circuits and apparatus for concurrent test of RF modules with a dynamically configurable test structure  
A testable integrated circuit chip (80, 100) includes a functional circuit (80) having modules (IP.i), a storage circuit (110) operable to hold a table representing sets of compatible tests that...
8680879 Chuck for supporting and retaining a test substrate and a calibration substrate  
A chuck for supporting and retaining a test substrate includes a device for supporting and retaining a calibration substrate. The chuck comprises a first support surface for supporting a test...
8653824 Delta temperature test method and system  
A method for quasi-static testing a magnetic recording head read sensor is described. The method includes applying a first voltage to a heater in the magnetic recording head and measuring an...
8653842 Systems and methods for thermal control of integrated circuits during testing  
Thermal control units (TCU) for maintaining a set point temperature on an IC device under test (DUT) are provided. The units include a pedestal assembly comprising a heat-conductive pedestal, a...
8624613 Integrated systems testing  
A printed circuit board of a hard disk drive system includes a first component and a plurality of second components of the hard disk drive system. The first component is configured to transmit...
8586982 Semiconductor test chip device to mimic field thermal mini-cycles to assess reliability  
A semiconductor test device including a plurality of conductive layers, each of the layers comprising integrated circuit devices, a plurality of insulating layers between the conductive layers, a...
8581533 Motor driver and method of controlling the same  
A controller controls switching of IGBT devices of an inverter according to the desired output of the permanent magnet motor. The controller includes: a magnet temperature detection device that...
8558553 Methods and apparatus for selecting settings for circuits  
Methods and apparatus selecting settings for circuits according to various aspects of the present invention may operate in conjunction with a measurement element connected to the circuit. The...
8552754 Method of testing reliability of semiconductor device  
The invention provides a method of testing reliability of a semiconductor device, wherein the semiconductor device has negative bias temperature instability NBTI. The method comprises steps of:...
8547122 Temperature measurement of active device under test on strip tester  
A plurality of devices under test (DUT) are arranged in a strip tester having a temperature controlled heater block. Each DUT has a respective set of electrical test probes and a thermally...
8547123 Storage device testing system with a conductive heating assembly  
A test slot assembly is provided for testing a storage device. The test slot assembly is configured to receive and support a storage device, or a storage device supported by a storage device...
8508245 Thermal control unit used to maintain the temperature of IC devices under test  
Thermal control units (TCU) for maintaining a set point temperature on an IC device under test (DUT) are provided. The units include a pedestal assembly comprising a heat-conductive pedestal, a...
8497693 Method for testing a test substrate under defined thermal conditions and thermally conditionable prober  
In a method and a device for testing a test substrate under defined thermal conditions, a substrate that is to be tested is held by a temperature-controllable chuck and is set to a defined...
8493733 Mobile measurement device  
A mobile measurement device, particularly for temporary use in or on vehicles, on stationary engines, or on test benches, consists of individual components (2) that might have different working...
8476914 Concentrator photovoltaic measuring device  
A concentrator photovoltaic measuring device includes a platform, an enclosing mask, a converging lens, a concentration unit, a first temperature regulation unit, a second temperature regulation...

Matches 1 - 50 out of 439 1 2 3 4 5 6 7 8 9 >