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7386086 |
Printed circuit card
A nuclear reactor plant protection system printed circuit card comprises a first logic device having a number of basic logic circuits, and a second logic device operatively connected with the first...
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7382141 |
Testing a batch of electrical components
The invention relates a method for testing a batch of electrical components like Integrated Circuits, the method involving applying a first test ( 6 ) on each electrical component from the batch;...
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7380184 |
Sequential scan technique providing enhanced fault coverage in an integrated circuit
According to an aspect of the present invention, multiple scan enable signals (controlling corresponding scan chains) are used in an integrated circuit, and the scan chains are placed in evaluation...
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7378864 |
Test apparatus having multiple test sites at one handler and its test method
A test apparatus includes one handler connected to a tester and one test board divided into two or more sites or two or more test boards. Since only the sites on the test board (or test boards)...
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7373574 |
Semiconductor testing apparatus and method of testing semiconductor
A semiconductor testing apparatus, includes a test signal generating unit that generates a test signal corresponding to a test pattern to output the generated test signal to a device under test...
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7372248 |
Electronic circuit, system with an electronic circuit and method for testing an electronic circuit
An electronic circuit having an input, an output with an input filter for delaying a change of an input signal and a control component for supplying an output signal and evaluating the input...
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7368932 |
Testing device for printed circuit board
A testing device for testing a printed circuit board includes a testing signal converting module for receiving testing signals from the printed circuit board and outputting the testing signals and...
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7368901 |
Sequential control circuit
A sequential control circuit operates according to an input signal. When the input signal is determined at a first state, the sequential control circuit asserts a plurality of control signals in a...
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7362092 |
Isolation buffers with controlled equal time delays
A system is provided for controlling the delay in an isolation buffer. Multiple such isolation buffers are used to connect a single signal channel to multiple lines and controlled to provide an...
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7359822 |
Testing device
A testing device that tests an electronic device includes a test pattern outputting unit operable to output a test pattern to the electronic device, a deciding unit operable to decide whether an...
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7358715 |
Semiconductor integrated circuit
By mounting, on a semiconductor integrated circuit, a clock stability waiting circuit 4 for deciding whether a clock signal generated by a high speed clock generating circuit 2 is stable or...
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7358714 |
Testing method and testing apparatus
A testing method of a semiconductor integrated circuit device includes a testing step of conducting a functional test by supplying test pattern data to a semiconductor integrated circuit device...
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7321233 |
System for evaluating probing networks
An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a...
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7319315 |
Voltage verification unit
A voltage verification unit and method for determining the absence of potentially dangerous potentials within a power supply enclosure without Mode 2 work is disclosed. With this device and...
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7317323 |
Signal test procedure for testing semi-conductor components and a test apparatus for testing semi-conductor components
The invention relates to a test apparatus for testing semi-conductor components, and to a signal testing procedure, to be used especially during the testing of semi-conductor components. A signal...
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7301325 |
Method and apparatus for creating performance limits from parametric measurements
A measurement device includes a measurement circuit that generates a parametric measurement data signal including parametric characteristics of an input signal. In an exemplary embodiment, the...
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7296195 |
Bit synchronization for high-speed serial device testing
An apparatus for testing electronic devices employs a programmable device to adjust the timing of the strobes such that the strobes sample the bit stream from a device under test at or near the...
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7272528 |
Reloadable word recognizer for logic analyzer
A test and measurement instrument such as a Logic Analyzer, or the like, has at least one Reloadable Word Recognizer whose reference value can be loaded by a trigger machine with a current acquired...
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7271576 |
Hand held antenna/network impedance analyzer
A handheld portable battery powered digital antenna and/or network analyzer which derives complex impedance values at a given frequency includes an internal direct digital synthesis generator and...
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7265570 |
Integrated circuit testing module
Systems and methods of testing integrated circuits are disclosed. The systems include a test module configured to operate between an automated testing equipment and an integrated circuit to be...
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7256600 |
Method and system for testing semiconductor devices
A semiconductor device tester includes a parametric measurement unit (PMU) stage for producing a DC test signal and a pin electronics (PE) stage for producing an AC test signal to test a...
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7248986 |
Programmable system for device testing and control
A programmable system for testing relays and controlling systems is provided. In one embodiment the present disclosure provides a programmable device capable of, for example, testing relays. The...
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7248035 |
Automatic test equipment pin channel with T-coil compensation
A passive matching network is connected to an input/output line for an automatic test equipment drive channel to compensate for capacitances associated with a receiver circuit connected to the...
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7243283 |
Semiconductor device with self-test circuits and test method thereof
A semiconductor device having a plurality of circuits with the same configuration, wherein since expected values in the number corresponding to the number of circuits are not required, operation...
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7239126 |
System bench wireless mapping board
A system for testing electronic modules comprising at least one mapping board box, and at least one harness operably attached to the mapping board box with a harness port is disclosed. The mapping...
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7235996 |
Functionality test method
A functionality test method for a technical system having at least one technical component to be regularly tested. The method including the steps of defining a test interval by setting a minimum...
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7227351 |
Apparatus and method for performing parallel test on integrated circuit devices
Embodiments of the invention connect a plurality of devices under test (DUTS) in a parallel manner and a high test current is selectively applied to each DUT. The apparatus to test a plurality of...
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7227349 |
Method and apparatus for the digital and analog triggering of a signal analysis device
A method and apparatus enabling the analog and digital triggering of a signal analysis device such as a Logic Analyzer, wherein separate analog and digital signal paths provide separate analog and...
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7213183 |
Integrated circuit
The invention is directed to an integrated circuit that includes a plurality of functional circuit blocks. Respective associated multiplexers are used to change over between a normal mode and a...
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7173446 |
Mechanism to stabilize power delivered to a device under test
According to one embodiment a system is disclosed. The system includes a tester having a power supply, an integrated circuit device under test (DUT) and a transient compressor (TC) coupled between...
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7164579 |
Mounting device for a disk drive unit, releasable fastener and method of testing a disk drive unit
A disk drive unit mounting device is adapted to carry one or plural disk drive units. The mounting device includes a temperature control module and a carrier module secured together y a releasable...
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7164264 |
Dynamic silicon characterization observability using functional clocks for system or run-time process characterization
A method and system for dynamic characterization observability using functional clocks for system or run-time process characterization. Silicon characterization circuitry may be read after silicon...
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7154288 |
Method and an apparatus for testing transmitter and receiver
A method and an apparatus for testing transmitter and receiver have been disclosed. One embodiment of the apparatus includes a plurality of multiplexers to select one of a positive and a negative...
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7154260 |
Precision measurement unit having voltage and/or current clamp power down upon setting reversal
A precision measurement unit (PMU) includes a force amplifier selectively providing either a forcing voltage or a forcing current to a device under test via an output force terminal. A low limit...
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7151389 |
Dual channel source measurement unit for semiconductor device testing
A dual channel source measurement unit for reliability testing of electrical devices provides a voltage stress stimulus to a device under test and monitors degradation to the device under test...
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7151387 |
Analysis module, integrated circuit, system and method for testing an integrated circuit
A system ( 5 ) for testing and failure analysis of an integrated circuit ( 10 ) is provided using failure analysis tools ( 40, 50, 60 ). An analysis module ( 30 ) having a number of submodule test...
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7149654 |
Sensor measurement method and system with universal data concentrators
A measurement method and system in which a plurality of sensors are scattered about the system. One or more universal data concentrators are deployed in the areas where the sensors are...
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7142003 |
Test apparatus
There is provided a test apparatus that tests an electronic device. The test apparatus includes: a plurality of test modules operable to supply test patterns used for a test of the electronic...
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7135882 |
Semiconductor integrated circuit device and control method for the semiconductor integrated circuit device
It is intended to provide a semiconductor integrated circuit device permitting reading of information specific to chips within the mounted chips while restraining the increase in the total number...
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7135881 |
Method and system for producing signals to test semiconductor devices
A method of and system for producing signals to test semiconductor devices includes a pin electronic (PE) stage for providing a parametric measurement unit (PMU) current test signal to a...
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7133797 |
Method, apparatus, system, program and medium for inspecting a circuit board and an apparatus incorporating the circuit board
A method, apparatus, system, computer program and medium, for inspecting a wide variety of circuit boards. A controller generates test data and reference data according to characteristic...
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7129695 |
Electrical test circuit with an active-load and an output sampling capability
An electrical test circuit includes a bridge configuration having two paths between two nodes, a buffer, and a capacitor. An output of the buffer is coupled to one of the paths, the buffer is...
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7106083 |
Testing system and testing method for DUTs
A device characteristic testing system for testing a first DUT (device under test), a second DUT, a third DUT and a fourth DUT on a wafer, each of the DUTs includes a first end and a second end,...
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7096139 |
Testing apparatus
A testing apparatus having testing module slots onto which different types of testing modules are selectively mounted includes controlling modules for supplying control signals to the testing...
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7093177 |
Low-jitter clock for test system
Generating test signals for a device under test (DUT) involves generating a master reference signal, using a vernier technique to generate test pattern signals based on the master reference signal,...
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7076391 |
Methods and systems for asynchronously testing a plurality of disk drives
An asynchronous system for testing disk drives includes a test platform that includes a plurality of slots for receiving and for providing communication with drives. The slots are segregated into a...
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7071487 |
Wafer-level package having test terminal
A wafer-level package includes a semiconductor wafer having at least one semiconductor chip circuit forming region each including a semiconductor chip circuit each provided with test chip terminals...
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7053648 |
Distributed, load sharing power supply system for IC tester
An integrated circuit (IC) tester includes a set of power modules mounted in a test head, each contacting a device interface board (DIB). The DIB provides power paths for delivering an output...
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7053624 |
Protective relay test device having a hand-held controller
A system for testing a relay is provided. The system includes a plurality of signal generators to generate signals to test relays. The system includes a controller to provide at least some inputs...
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7046027 |
Interface apparatus for semiconductor device tester
A signal interface to connect a semiconductor tester to a device under test. The Interface includes a generic component and customized component. The generic component includes multiple copies of...
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