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8156396 |
Method and system for correcting timing errors in high data rate automated test equipment
A system and method for reducing timing errors in automated test equipment (ATE) offering increased data rates for the testing of higher-speed integrated circuits. Embodiments provide an effective...
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8134383 |
LSI test apparatus, LSI test method, and computer product
An LSI test apparatus includes a test circuit synthesizing unit that synthesizes a test circuit and inserts the test circuit in a pre-test-synthesis net list; a test pattern generating unit that,...
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8111389 |
Method of inspecting defects in circuit pattern of substrate
Disclosed herein is a method of inspecting defects in a circuit pattern of a substrate. At least one laser beam radiation unit for radiating a laser beam onto an inspection target circuit pattern...
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8093901 |
Switching unit adapted for communicating with a processing unit
An intelligent switching unit to be connected with a processing unit is disclosed. The intelligent switching unit includes a switching unit to be actuated by a user, a detection module connected to...
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8072232 |
Test apparatus that tests a device under test having a test function for sequentially outputting signals
Provided is a test apparatus that tests a device under test having a test function for sequentially outputting, from a single test terminal, signals that would be output from a plurality of...
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8063626 |
Method for the precise measurement of dependency on amplitude and phase of plurality of high frequency signals and device for carrying out said method
The present invention refers to a method for the precise measurement of dependency on amplitude and phase of a plurality of high frequency signals, preferably in the synchrotron accelerator of...
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8014968 |
Self-test circuit for high-definition multimedia interface integrated circuits
A high-definition multimedia interface circuit uses a high-definition multimedia interface encoder to produce a plurality of channels of data. An output circuit, connected to the high-definition...
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8005637 |
Method and apparatus for measuring characteristics of an electrical device
An arrangement to determine at least one electrical feature of an electrical device including a signal injection unit configured to inject first and second test signals into the electrical device,...
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7969168 |
Integrated circuit with built-in self test circuit
An embodiment of the invention provides an integrated circuit. The integrated circuit has an analog device-under-test (DUT), a memory receiving and storing a test program and a processor. The...
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7962110 |
Driver circuit and test apparatus
Provided is a driver circuit that outputs a transmission signal according to a reception signal received from outside, including a first driver that outputs a voltage according to an input first...
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7962271 |
Vehicle diagnostic tool providing information on the operating condition of a power plant utilizing voltage data
An analysis tool which extracts all the available parameter identifications (i.e. PIDS) from a vehicle's power train control module for diagnostic decisions. This is done by checking these PIDS and...
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7953530 |
Vehicle diagnostic tool
An analysis tool which extracts all the available parameter identifications (i.e. PIDS) from a vehicle's power train control module for diagnostic decisions. This is done by checking these PIDS and...
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7944226 |
Test apparatus and transmission apparatus
A test apparatus for testing a device under test includes a test signal generating section that generates a test signal to be supplied to the device under test, a main driving section that outputs...
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7936172 |
Automatic test equipment self test
A self test adapter (STA) for automatic test equipment (ATE) is provided. The STA includes an enclosure. A backplane is housed by the enclosure. A dual data bus is integrated into the backplane. At...
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7929303 |
Storage device testing system cooling
A storage device testing system that includes at least one rack, test slots housed by each rack, and at least one air mover in pneumatic communication with the test slots. Each test slot includes a...
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7915884 |
Importation of virtual signals into electronic test equipment to facilitate testing of an electronic component
Electronic component validation testing is facilitated by a method, system and program product which allows the importation of virtual signals derived from simulation verification testing of the...
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7908108 |
Circuit testing apparatus
A circuit testing apparatus for testing a device under test is disclosed. The device under test comprises a first output end and second output end for generating a first output signal and a second...
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7908100 |
Power consumption analyzing apparatus and power consumption analyzing method
A power consumption analyzing apparatus has a clock gating cell detector configured to detect a clock gating cell which is not present in RTL data but present in a gate-level netlist, a test bench...
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7903746 |
Calibrating parameters in a storage subsystem with wide ports
A mechanism uses in-situ bidirectional cable wrapping for determining different cable lengths. A calibration mechanism calibrates the high speed transmitter/receiver pair characteristics, and,...
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7888960 |
Method of testing a power supply controller and structure therefor
In one embodiment, a power supply controller is configured to operate in a test mode that facilitates measuring the value of an output signal of an error amplifier of the power supply controller.
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7884626 |
Cathodic protection monitor
A cathodic protection monitor to be electrically connected to a cathodic protection rectifier that is adapted to prevent rust, corrosion and possible leakage in an underground pipe or storage tank...
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7853425 |
Parallel testing in a per-pin hardware architecture platform
Provided is a method and system for testing a DUT. The system includes a plurality of testing devices for interacting with the DUT and conducting a plurality of different tests on the DUT, and a...
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7839157 |
Surface mount testing system
Embodiments may include a method and an apparatus for inducing degradation through temperature cycling of a solder joint or a component on a surface mount printed wiring board (SMPWB) coupon. The...
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7839135 |
System for and method of analyzing printed board carrying chassis, printed board carrying chassis structure, program, and recording medium
A structure has a printed board carried by a metal chassis. A printed board carrying chassis analyzing system, a printed board carrying chassis analyzing method, a printed board carrying chassis...
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7822567 |
Method and apparatus for implementing scaled device tests
A method includes defining a hierarchy of test routines in a test program for testing integrated circuit devices. A first device is tested at a first screening level in the hierarchy. The first...
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7810005 |
Method and system for correcting timing errors in high data rate automated test equipment
A system and method for reducing timing errors in automated test equipment (ATE) offering increased data rates for the testing of higher-speed integrated circuits. Embodiments provide an effective...
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7786475 |
In-line test circuit and method for determining interconnect electrical properties and integrated circuit incorporating the same
A test circuit for, and method of, determining electrical properties of an underlying interconnect layer and an overlying interconnect layer of an integrated circuit (IC) and an IC incorporating...
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RE41496 |
Boundary-scan input circuit for a reset pin
A boundary-scan circuit method and apparatus for asserting an internal reset signal connected to core logic circuits of an electronic device in order to assure that testing will begin and end in a...
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7768279 |
Control method and control program for prober
To provide a control method and a control program of a prober that are capable of enhancing throughput. Chips are tested in step S2. In step S3, when the counted number Y of conforming chips has...
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7755375 |
Test apparatus, probe card, and test method
There is provided a test apparatus for testing a device under test. The test apparatus includes a plurality of drivers that respectively output a plurality of test signals to a same terminal of the...
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7746183 |
Measurement apparatus for improving performance of standard cell library
Disclosed herein is a measurement apparatus for improving performances of standard cells in a standard cell library when verifying performance of the standard cell library through a ring oscillator...
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7733116 |
Method of testing a power supply controller and structure therefor
A power supply controller (20) is configured to operate in a test mode that facilitates measuring the value of an output signal of an error amplifier (36) of the power supply controller (20).
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7733113 |
Semiconductor test device
A semiconductor test device of the present invention for conducting a test on a device under test, includes: a plurality of comparison units which compare a signal obtained from the device under...
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7727004 |
Testing a high speed serial bus within a printed circuit board
An apparatus and associated method for analyzing a communications link between two components on a common PCB. The communications link has a pair of through-board conductors connected by a first...
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7724015 |
Data processing device and methods thereof
A data processing device includes a first memory for use during normal operation of the device and a second memory for use during testing. The second memory stores a set of test patterns for...
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7724000 |
Method of automatically testing an electronic circuit with a capacitive sensor and electronic circuit for the implementation of the same
A method for automatically testing an electronic circuit with a capacitive sensor having two capacitors is provided, wherein the common electrode of the capacitors moves relative to each fixed...
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7716004 |
Method and apparatus for matching test equipment calibration
A method includes collecting trace data associated with a plurality of device testers. Tester health metrics are generated for each of the device testers. The tester health metrics are analyzed to...
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7710100 |
Motherboard testing apparatus
A motherboard testing apparatus for automatically turning on or off a motherboard includes a pulse signal generating circuit for outputting a pulse signal, a first control circuit for outputting a...
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7710142 |
Semiconductor integrated circuit
A semiconductor integrated circuit includes power supply pads of two or more kinds, switches each of which is connected between adjacent two of the power supply pads to allow short-circuiting them,...
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7696815 |
Electronic device having multi-power source integrated circuit
An electronic device includes: an integrated circuit having a first circuit part, a second circuit part, a first power source line of the first circuit part, a second power source line of the...
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7698087 |
Semiconductor integrated circuit and testing method of same
A program circuit activates a pass signal when a first program unit is programmed. The first program unit is programmed when a test of an internal circuit is passed. A mode setting circuit switches...
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7692441 |
Test apparatus and pin electronics card
There is provided a test apparatus including a driver that outputs a test signal to a device under test, a first switch that switches whether to connect the driver to the device under test, a...
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7688101 |
Semiconductor chip test apparatus and testing method
A semiconductor chip test apparatus includes a plurality of power supply units, each supplying power to a semiconductor chip having a power input terminal, and a tester configured to measure an...
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7688099 |
Sequential semiconductor device tester
A sequential semiconductor device tester, and in particular to a sequential semiconductor device tester is disclosed. In accordance with the sequential semiconductor device tester, a function of...
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7684949 |
Apparatus and method for determining reliability of an integrated circuit
In an embodiment, an integrated circuit or chip is supplied to its intended application and a measurement quantity representing the state of one or a plurality of electrical connections in the chip...
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7679372 |
Test apparatus
A driver for supplying a test signal to a device under test is shared by a plurality of terminals. In this way, the cost and time required for the test of the device under test can be reduced. A...
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7680621 |
Test instrument network
A test instrument network for testing a plurality of DUTs includes a plurality of communicating script processors, the script processors being adapted to execute computer code; and a plurality of...
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7642551 |
Wafer-level package having test terminal
A wafer-level package includes a semiconductor wafer having at least one semiconductor chip circuit forming region each including a semiconductor chip circuit each provided with test chip terminals...
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7642797 |
Power supply stabilizing circuit, an electronic device and a test apparatus
There is provided a power supply stabilizing circuit provided in a chip of an electronic device. The power supply stabilizing circuit stabilizes a power supply voltage supplied to an operational...
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7626398 |
System for isolating faults between electrical equipment
A system is disclosed that can be inserted between cable runs of electrical equipment so as to provide access to signal/data lines associated with the electrical equipment. The system includes a...
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