|
Match
|
Document |
Document Title |
|
|
7616014 |
Pulsed I-V measurement method and apparatus
A method and apparatus for measuring a pulsed I-V characteristic of a DUT that has a signal terminal and a return terminal includes connecting a pulse unit between the signal and return terminals,...
|
|
|
7602196 |
Method to detect and locate a breach in a roof membrane
A defect in a roof membrane is detected by applying a DC voltage between the roof deck and a perimeter conductor and using a detection probe pair to provide a signal indicative of the differences...
|
|
|
7525324 |
Inspection method, inspection apparatus, and polarization method for piezoelectric element
A method for inspecting a piezoelectric element includes first-inspection-signal application step of applying to the piezoelectric element a first inspection signal Vp( 1 ) having a first...
|
|
|
7479237 |
Method of fabricating vertical probe head
The present invention relates to a method of fabricating a vertical probe head, whereas the vertical probe head is formed by the combination of at least a probe, a bottom guide plate and a top...
|
|
|
7319418 |
Sensor with multiplex data output
A method of transmitting data from a sensor ( 1 ) to a receiver ( 4 ) in which each original data word is split in positional fashion into at least two separate short data words (MSN, LSN). The...
|
|
|
7317308 |
System and method for measuring electric current in a pipeline
A system for measuring a voltage differential in a current-carrying pipe using a propulsion vehicle for conveying the system inside the pipe. The system includes a first contact for maintaining...
|
|
|
7292054 |
Impedance measuring apparatus of package substrate and method for the same
An impedance measuring apparatus includes a plurality of RF (radio frequency) probes; a plurality of rotation mechanisms coupled to the plurality of RF probes, respectively; a processing unit, and...
|
|
|
7274194 |
Apparatuses and methods for repairing defects in a circuit
Methods and apparatuses to repair defects in a circuit, such as during or subsequent to the manufacture of the circuit. Defects may be detected through, for example, optical processing of an...
|
|
|
7242201 |
Apparatus and method for detecting state of heat exchanger tube
Provided is an apparatus for concurrently detecting a defect occurring in a heat exchanger tube and a geometric transition of the heat exchanger tube. The apparatus for detecting the state of a...
|
|
|
7186484 |
Method for determining the relative positional accuracy of two structure elements on a wafer
A measurement mark ( 3 ) for determining the relative positional accuracy of a progressive projection onto a wafer ( 5 ), the projection being performed with two masks ( 3, 4 ), comprising two...
|
|
|
7185545 |
Instrumentation and method for monitoring change in electric potential to detect crack growth
Instrumentation for monitoring crack growth using a change in electric potential across a starter crack as the crack propagates is disclosed. The instrumentation includes a specimen of a material...
|
|
|
7164277 |
Method for circuit inspection
A method for inspecting an electronic circuit formed on a board with a peripheral circuit includes steps of providing a terminal for inputting and outputting an electronic signal, providing an...
|
|
|
7157920 |
Non-destructive monitoring of material integrity
A component which is known to have particular degradation characteristics is instrumented to provide an electrical potential across a section in which a degradation is likely to occur. The...
|
|
|
7154276 |
Method and apparatus for measuring a parameter of a vehicle electrical system
An apparatus for measuring electrical parameters for an electrical system measures a first and second parameters of the electrical system between connections to the electrical system. A processor...
|
|
|
7129719 |
Apparatus for detecting defect in circuit pattern and defect detecting system having the same
Provided is an apparatus for detecting a defect of a circuit pattern which includes a resonator, a first power supply unit connected to one end of the resonator to apply power to the resonator, a...
|
|
|
7106077 |
Device and method for testing a membrane electrode assembly
In order to create a device for testing a membrane electrode assembly, by means of which fabricated membrane electrode assemblies can be tested in a non-destructive manner, a first contact device...
|
|
|
7104147 |
System and method for measuring electric current in a pipeline
A system and method for measuring a voltage differential in a current-carrying pipe using a propulsion vehicle. The system may be adapted for use with a pipeline pig or other propulsion device,...
|
|
|
7095222 |
Leak detection method and system in nonmetallic underground pipes
A method for locating leaks in nonmetallic pipes on the principal of measuring and graphing the intensity of electric fields. Leaks are located by creating a closed circuit with a negatively...
|
|
|
7088115 |
Electrochemical impedance spectroscopy system and methods for determining spatial locations of defects
A method and apparatus for determining spatial locations of defects in a material are described. The method includes providing a plurality of electrodes in contact with a material, applying a...
|
|
|
6970003 |
Electronics board life prediction of microprocessor-based transmitters
A field device includes circuitry to successively measure a parameter related to current drawn by electronics of the field device. The measurements are provided to a prediction engine which...
|
|
|
6943570 |
Device for detecting a crack on a turbine blade of an aircraft engine
An apparatus for inspecting a turbine blade of an aircraft engine may include a shaft having a proximate end and a distal end, an attachment device coupled to the distal end of the shaft and...
|
|
|
6815959 |
Systems and methods for measuring properties of conductive layers
A pin configured to be disposed within a probe is provided. The probe may be configured to measure a property of a conductive layer. The pin may include a contact surface which may be substantially...
|
|
|
6753692 |
METHOD AND APPARATUS FOR TESTING SOLAR PANEL, MANUFACTURING METHOD FOR MANUFACTURING THE SOLAR PANEL, METHOD AND APPARATUS FOR INSPECTING SOLAR PANEL GENERATING SYSTEM, INSULATION RESISTANCE MEASURING APPARATUS, AND WITHSTAND VOLTAGE TESTER
A manufacturing method for manufacturing a solar panel including a solar cell and an outer housing and an inspection method for inspecting a solar panel generating system, include a step of...
|
|
|
6642724 |
Valve seating with electrodes, especially for <> type control device
A valve seating ( 23 ) is made from a fluoridated polymer, for example, solid glass-coated PTFE or reinforced PFA. At least one electrode ( 24 ) is attached to or integral with the valve seating...
|
|
|
6636055 |
Multifrequency equipment for sensing the state of electrodes in electric-arc furnaces
Apparatus and method for sensing the state of electrodes during baking to obtain an indication of the internal condition of the electrodes where changes of phase are being produced. The apparatus...
|
|
|
6593759 |
Apparatuses and methods for determining if protective coatings on semiconductor substrate holding devices have been compromised
In one aspect, the invention includes an apparatus having a semiconductor substrate receiving device with at least one extension configured to hold a semiconductor substrate within a liquid bath....
|
|
|
6577144 |
Electrical voltages and resistances measured to inspect metallic cased wells and pipelines
A cased well in the earth is electrically energized with A.C. current. Voltages are measured from three voltage measurement electrodes in electrical contact with the interior of the casing while...
|
|
|
6476624 |
Crack monitoring method and apparatus
A method and apparatus for monitoring crack inside piping suitable for high temperature environment including an electrode attachment process for attaching a pair of heat resistant current...
|
|
|
6469535 |
Method for examining semiconductor substrate, and method for controlling fabrication process of semiconductor devices
A particular portion of a damaged layer within a semiconductor substrate, which is likely to affect the performance of resulting semiconductor devices, is distinguished from the other negligible...
|
|
|
6365825 |
Reverse biasing apparatus for solar battery module
A reverse biasing apparatus is used to remove short-circuited portions in a solar battery module having multiple strings of solar cells each including a first electrode layer, a photovoltaic...
|
|
|
6331778 |
Methods for detecting and locating leaks in containment facilities using electrical potential data and electrical resistance tomographic imaging techniques
Methods are provided for detecting and locating leaks in liners used as barriers in the construction of landfills, surface impoundments, water reservoirs, tanks, and the like. Electrodes are placed...
|
|
|
6320391 |
Interconnection device for low and high current stress electromigration and correlation study
An interconnection test structure for evaluating more accurately and reliably electromigration characteristics is provided. The test structure includes an elongated metal test conductor having a...
|
|
|
6301954 |
Segemented measuring probe for sewage pipes
A method and apparatus for determining leaks in sewage pipes. The apparatus includes a measuring probe having several radially arranged measuring electrode segments, the measuring probe being...
|
|
|
6288553 |
Method for determining the loop resistance of a power supply network
The invention relates to a method for determining the loop resistance of a power supply network with a neutral conductor (called N), a phase or external conductor (called L1), a ground or...
|
|
|
6288528 |
Method and system for evaluating a condition of a combustion vessel
There is provided a method and system for evaluating a condition of a surface of a combustion vessel exposed to deposition thereon of a material released during a combustion of a fuel in the...
|
|
|
6265881 |
Method and apparatus for measuring ground impedance
A method and apparatus for measuring impedance of grounding system wherein a transient electric current is injected at the ground system under test while measuring the a transient ground potential...
|
|
|
6218846 |
Multi-probe impedance measurement system and method for detection of flaws in conductive articles
An innovative multi-dimensional, low frequency, impedance measurement probe array, measurement system, and method are disclosed for detecting flaws in conductive articles. The device and method...
|
|
|
6208151 |
Method and apparatus for measurement of microscopic electrical characteristics
The improved method for microscopic measurement of electrical characteristics comprises a standard atomic force microscope (AFM). The AFM includes a pointed, conductively coated tip attached to one...
|
|
|
6140825 |
Method and apparatus for evaluating quality of resistance welds
A method for evaluating quality of a resistance weld is provided, in which a nugget generation state during a welding process is evaluated by observable numerical values based on physical...
|
|
|
6039429 |
Misprint detection techniques
Disclosed is a combined "streak-detector" and "ink-lever flow detector" on opposite sides of a single printed circuit board; each detector comprising a pair of parallel printed circuit segments...
|
|
|
5952836 |
Device and method for detecting workpiece fractures
A device for detecting fractures or corrosion in a workpiece having a non-conductive outer surface. A thin film layer of metallic material comprising a plurality of separate crack detection wires...
|
|
|
5912561 |
Method and apparatus for package wall testing
Any voids in the divider walls of multichamber packages, and in particular, multichamber tubes, can be detected by applying a potential difference across the divider walls of the package. If there...
|
|
|
5811979 |
Protective grounding jumper cable tester
A protective grounding jumper cable tester is provided which includes a housing; a pair of jumper attachment terminals on the housing for attachment of a jumper cable therebetween; a dc voltage...
|
|
|
5801723 |
Streak detector for ink jet printer
Disclosed is a combined "streak-detector" and "ink-lever flow detector" on opposite sides of a single printed circuit board; each detector comprising a pair of parallel printed circuit segments...
|
|
|
5771556 |
Acoustic wave device and manufacturing method
A method for making an acoustic wave device. The method has steps of providing a substrate suitable for acoustic wave devices and processing the substrate to provide a patterned metallization...
|
|
|
5763879 |
Diamond probe tip
A probe for electrical contact with a metal layer of an integrated circuit wherein the probe features a polycrystalline diamond layer coating a fine conductive wire. The diamond coating has exposed...
|
|
|
5758970 |
Device and process for the simultaneous measurement of the extent and the temperature of a crack at the surface of an electrically conductive solid body
Two electrical wires are connected to the surface of an electrically conductive solid body at two measurement points located on either side of a crack in the surface of the body. The two wires form...
|
|
|
5712571 |
Apparatus and method for detecting defects arising as a result of integrated circuit processing
A probe card tester for detecting defects occurring as a result of integrated circuit processing of a substrate having a plurality of space to conductors with a contact at each end of each...
|
|
|
5698988 |
Method and device of detecting a deterioration
A method and device of readily detecting deterioration of a sample at low cost, which do not require any maintenance and monitoring of the sensor properties, and accordingly can decrease a load...
|
|
|
5684408 |
Protective grounding jumper cable testing method
A protective grounding jumper cable tester basically includes a housing, a direct current power supply, a pair of jumper attachment terminals, a pair of test probe terminals, a current applying...
|