|
Match
|
Document |
Document Title |
|
|
7616007 |
Device, method, program, and recording medium for error factor measurement, and output correction device and reflection coefficient measurement device provided with the device for error factor measurement
There is provided an error factor measurement device for measuring an error factor in a switch branch signal source including a signal source and a switch, and the error factor measurement device...
|
|
|
7595645 |
Calibration circuit and semiconductor device incorporating the same
Impedance adjusting transistors are once inactivated on every occasion of changing an impedance adjusting code. After restoring the potential to an initially set potential by once inactivating the...
|
|
|
7552023 |
Parameter correction circuit and parameter correction method
In a parameter correction circuit in an LSI, a reference resistor element with high precision having a resistance value set to a target value is connected to an external terminal of the LSI. A...
|
|
|
7545152 |
Transmission line pulse measurement system for measuring the response of a device under test
A Transmission Line Pulse (“TLP”) measurement system for testing devices such as integrated circuits (“ICs”), and especially for testing the electrostatic discharge (“ESD”) protection...
|
|
|
7545151 |
Characterizing test fixtures
Provided herein are techniques for characterizing a test fixture that is used for connecting a device under test (DUT) to a vector network analyzer (VNA), e.g., to thereby enable de-embedding of...
|
|
|
7545150 |
Differential vector network analyzer
A measurement and correction method provides for a complete full correction of a true-mode system using only the single ended error matrix developed for 4 port correction of single ended...
|
|
|
7532014 |
LRL vector calibration to the end of the probe needles for non-standard probe cards for ATE RF testers
A method and apparatus for radio frequency vector calibration of s-parameter measurements to the tips of the wafer probe needles of an automatic test equipment production tester. The method...
|
|
|
7521938 |
Modeling and calibrating a three-port time-domain reflectometry system
A three-port TDR front end includes numerous components. An exemplary three-port TDR front-end is a DSL modem. Information-bearing TDR signals are distorted as they pass through these components....
|
|
|
7519509 |
Network analyzer, transmission tracking error measuring method, network analyzing method, program, and recording medium
There is reduced labor to directly connect two ports selected from ports of a network analyzer in order to measure transmission tracking errors. A network analyzer, to which a test set which...
|
|
|
7518378 |
Cable compensation for pulsed I-V measurements
The errors related to the resistance of test conductors and sense/load resistances for a pulse I-V measurement system are determined by making open circuit and through circuit measurements using a...
|
|
|
7518353 |
Vector network analysis system and method using offset stimulus signals
A vector network analysis system and a method of measuring use offset stimulus signals to stimulate a balanced device under test (DUT) to determine performance parameters. The system includes an...
|
|
|
7511508 |
Fixture characteristic measuring device, method, program, recording medium, network analyzer, and semiconductor test device
There are measured characteristics of a jig (fixture) used to calculate and measure circuit parameters of a device under test. There is provided a jig characteristic measuring device which measures...
|
|
|
7498799 |
Communicating with an implanted wireless sensor
The present invention determines the resonant frequency of a sensor by adjusting the phase and frequency of an energizing signal until the frequency of the energizing signal matches the resonant...
|
|
|
7495454 |
Device for measurement of electrical properties in materials
A device for measuring electrical properties, including permittivity, of a material is disclosed. The device includes a first conduit and second conduit terminating at open ends and respectively...
|
|
|
7495453 |
Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuit
To decrease the circuit scale necessary for the calibration of the output circuit and to decrease the time required for the calibration operation. The invention includes a first output buffer and a...
|
|
|
7489145 |
Plasma processing system
A high-frequency measurement unit includes a signal detector for detecting a high-frequency signal, and a calibration coefficient storage for storing calibration coefficients Cmin and Cmax used to...
|
|
|
7486085 |
Calibration circuit for resistance component
A calibration circuit including a plurality of first resistance components, a plurality of second resistance components, and a first feedback system is provided. The first feedback system selects M...
|
|
|
7479776 |
Hand-held tester and method for local area network cabling
A LAN tester has display and remote units each having a connector jack attached to an adapter board for connection to the plug of a patch cord. Both the display and remote units have circuits which...
|
|
|
7474975 |
Method to verify the outcome of calibration with a network analyzer
Making use of the values of error items quantified during full n-port calibration, an indicator of whether or not all calibration steps have been uniformly conducted (calibration consistency) is...
|
|
|
7466120 |
Communicating with an implanted wireless sensor
Aspects of the present invention determine the resonant frequency of a sensor by obtaining sensor signals in response to three energizing signals, measuring the phase of each sensor signal, and...
|
|
|
7463140 |
Systems and methods for testing wireless devices
Systems and methods are disclosed for parallel testing one or more wireless devices using a single wireless command, each device including a processor and memory coupled to the processor. The...
|
|
|
7444268 |
Method and apparatus for identifying a drift in a quantized signal in a computer system
One embodiment of the present invention provides a system that identifies a drift in a signal in a computer system. During operation, the system receives a sequence of quantized signal values of...
|
|
|
7439748 |
Method and apparatus for measuring high-frequency electrical characteristics of electronic device, and method for calibrating apparatus for measuring high-frequency electrical characteristics
A signal conductor whose first end is an open end, and a ground conductor are connected to associated measurement ports of a network analyzer. A short standard is connected between the signal...
|
|
|
7429866 |
System and method for resistance measurement
A method for improved cable resistance measuring is provided including coupling a measurement test device including a master unit and a remote unit, via at least one connector, to at least one...
|
|
|
7427866 |
Calibration method and system that generates an error signal for adjusting the time constant of circuit to be calibrated
A system and method of calibration develops a function from which is generated a monotonic time response; a gating period is defined from the monotonic time response and any error in the frequency...
|
|
|
7414411 |
Signal analysis system and calibration method for multiple signal probes
A method and apparatus adapted to calibrate signal path of a signal analysis system such that loading effects of additional probes are substantially removed from the measurement. A signal under...
|
|
|
7400671 |
Periodic calibration for communication channels by drift tracking
A method and system that provides for execution of a first calibration sequence, such as upon initialization of a system, to establish an operation value, which utilizes an algorithm intended to be...
|
|
|
7391221 |
On-die impedance calibration
One exemplary device has a plurality of leads with termination impedances, and a standard impedance. Among the termination impedances are master impedances arranged to be calibrated by comparison...
|
|
|
7368902 |
Impedance calibration for source series terminated serial link transmitter
Substantially-accurate calibration of output impedance of a device-under-test (DUT) to within a predetermined range of allowable impedance. The DUT is part of a source series terminated (SST)...
|
|
|
7362108 |
Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe
By using techniques for near field probes to measure dielectric values of blanket films, the measure of the sidewall damage of the patterned structure is calculated. The interaction between the...
|
|
|
7362107 |
Systems and methods for automatically eliminating imbalance between signals
A calibrating system for automatically eliminating or reducing imbalance between a first signal and a second signal is disclosed. The calibrating system includes: a programmable delay module,...
|
|
|
7359814 |
Multi-port analysis apparatus and method and calibration method thereof
A multi-port device analysis apparatus is capable of analyzing a multi-port device having three or more with improved efficiency and accuracy. The multi-port device analysis apparatus includes: a...
|
|
|
7348784 |
Error factor acquisition device, method, program, and recording medium
A measurement system for circuit parameters of a device under test (DUT) that reduces the number of attachments and detachments of calibration kits. An error factor acquisition device includes a...
|
|
|
7336084 |
Delay lock circuit having self-calibrating loop
A delay lock circuit includes a measuring path, a forward path, and a feedback path. The measuring path samples a pulse with a reference signal in a measurement to obtain a measured delay. The...
|
|
|
7332904 |
On-chip resistor calibration apparatus and method
An on-chip resistor is calibrated with a sense circuit that compares a resistance associated with an off-chip resistor to the on-chip resistor via a current-mirror circuit and a comparator. A...
|
|
|
7323861 |
Contact plate for use in standardizing tester channels of a tester system and a standardization system having such a contact plate
One embodiment of the invention provides a standardization module for use in standardizing tester channels of a tester unit using a standardization unit for making contact with contact faces which...
|
|
|
7315170 |
Calibration apparatus and method using pulse for frequency, phase, and delay characteristic
In a device for measuring the properties of a device under test connected by a signal transmission path having reciprocity, a terminal on the device under test side of the signal transmission path...
|
|
|
7312615 |
System and method for communicating calibration data
A Force/Torque (FT) sensor includes memory for storing calibration data associated with the FT sensor. Force and torque analog signals are output to a data acquisition (DAQ) system. The digital...
|
|
|
7305310 |
System and method for compensating for potential and current transformers in energy meters
A meter device for measuring electrical energy is provided. The meter device includes circuitry for measuring at least one parameter of electrical energy provided to the meter device. A storage...
|
|
|
7285963 |
Method and system for measurement of dielectric constant of thin films using a near field microwave probe
A measurement technique based on a microwave near-field scanning probe is developed for non-contact measurement of dielectric constant of low-k films. The technique is non-destructive, non-invasive...
|
|
|
7262628 |
Digital calibration with lossless current sensing in a multiphase switched power converter
Disclosed is a multi-phase power regulator that accurately senses current at a load in a lossless manner and adjusts the power supplied to the load based on the sensed current. Also disclosed is a...
|
|
|
7259569 |
Calibration circuit and method thereof
A calibration circuit and method thereof. In the example method, a common-mode voltage may be detected at an output port of a mixer. At least one common-mode feedback voltage may be generated...
|
|
|
7256585 |
Match-corrected power measurements with a vector network analyzer
A network analysis system and methods facilitate a match-corrected signal power measurement using a vector network analyzer (VNA). The network analysis system includes the VNA and a computer...
|
|
|
7254511 |
Method and apparatus for calibrating a frequency domain reflectometer
A calibration system is provided for calibrating frequency domain reflectometers in the field by using both the scattering parameters of the multi-port junction determined at the factory and...
|
|
|
7248058 |
Testing and calibration device with diagnostics
A testing device for determines values of various electrical variables associated with a device within a process system. The testing device provides bi-directional electrical communication with a...
|
|
|
7245117 |
Communicating with implanted wireless sensor
The present invention determines the resonant frequency of a sensor by adjusting the phase and frequency of an energizing signal until the frequency of the energizing signal matches the resonant...
|
|
|
7235982 |
Re-calculating S-parameter error terms after modification of a calibrated port
A two-port S-parameter calibration between a first port and a second port of a test system having a multi-port vector network analyzer is performed to provide a first S-parameter calibration of the...
|
|
|
7233464 |
Apparatus for and method of ground fault detection
A ground fault detection system is provided where one current sensor is used to calibrate a second sensor in order to provide automatic zeroing of the difference measurement. The calibration is...
|
|
|
7228464 |
PICA system timing measurement and calibration
PICA probe system apparatus is described, including apparatus for calibrating an event timer having a coarse measurement capability in which time intervals defined by clock boundaries are counted...
|
|
|
7227366 |
Device and a method for biasing a transistor that is connected to a power converter
Biasing a transistor connected to a voltage converter, the method includes: (i) providing at least one bias voltage to at least one well of at least one transistor of a test circuitry; (ii)...
|