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7617064 |
Self-test circuit for high-definition multimedia interface integrated circuits
A high-definition multimedia interface circuit uses a high-definition multimedia interface encoder to produce a plurality of channels of data. An output circuit, connected to the high-definition...
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7616004 |
Backplane tester and method of use
The present invention can be generally described as a backplane test device that provides the possible flexibility of being operationally resident on a standard card form factor, and thereby,...
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7612568 |
Open-circuit testing system and method
The invention discloses a testing system and method suitable for determining the connection state of an electronic component in an electronic device assembly. In an embodiment, the testing system...
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7609068 |
System and method for particulate sensor diagnostic
A particulate (soot) sensor system has a diagnostic feature for verifying the integrity of the wiring leads. The sensor system includes a sensor and processing circuitry. The sensor has a...
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7598762 |
Semiconductor driver circuit with signal swing balance and enhanced testing
A semiconductor driver circuit includes impedance units for generating impedances at data pads, independently of each-other. Thus, signal swing widths of data signals generated at the data pads may...
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7598749 |
Integrated circuit with fuse programming damage detection
An integrated circuit with an efuse having an efuse link includes a damage detection structure disposed in relation to the efuse so as to detect damage in the IC resulting from programming the...
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7598743 |
Battery maintenance device having databus connection
An electronic battery tester or charger for use with a storage battery includes a first and a second electrical connector configured to electrically couple to terminals of the storage battery....
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7594206 |
Fault detecting method and layout method for semiconductor integrated circuit
The present invention provides a fault detecting method and a layout method for a semiconductor integrated circuit. The fault detecting method performs detection for faults in a semiconductor...
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7587298 |
Diagnostic method for root-cause analysis of FET performance variation
A diagnostic method of and computer system for root-cause analysis of performance variations of FETs in integrated circuits and a method and computer system for monitoring a field effect transistor...
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7583833 |
Method and apparatus for manufacturing data indexing
A method, apparatus, and a system for generating an index for storing data. A pattern associated with a first set of data is determined. The first set of data is stored. A determination is made as...
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7583093 |
Electrical test method of an integrated circuit
A method for testing an integrated circuit is provided comprising steps of providing at least one first conductive path stretching along an element of the integrated circuit, applying a voltage at...
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7576643 |
Sensor for measuring physical variables and for passing on the measured variable, circuit having such a sensor and method for operating the sensor and the circuit
A sensor for measuring a variable, in particular a physical variable, includes at least one converter element converting the variable into an electrical signal. At least one electronic signal...
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7573937 |
Phase rotator control test scheme
Techniques and apparatus for testing phase rotators for detecting defective tap weights are provided. Phase rotator test logic may include a master phase rotator to cycle the phase of a clock...
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7573393 |
Integrated fault output/fault response delay circuit
A time delay fault device includes an integrated circuit (IC) having an electronic circuit having a fault indicator signal output and a time delay circuit having an input connected to the fault...
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7573315 |
Control device and method of operating the control device having controller chips and change-over unit
A control device contains a plurality of controllers, a common signal output, and a change-over unit. The controllers are coupled on an output side to the common signal output through the...
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7560936 |
Method and apparatus for ground bounce and power supply bounce detection
A method and apparatus for ground bounce and power supply bounce detection in devices have been disclosed. In one case one input to a differential amplifier is coupled to a reference voltage and...
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7554335 |
Production test technique for RF circuits using embedded test sensors
A single test stimulus and a simple test configuration with embedded envelope detectors are used to estimate all the specification values of interest for an RF circuit under test in an integrated...
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7550976 |
Apparatus/method for measuring the switching time of output signals of a DUT
A measurement apparatus is provided for measuring at least one of the switching times of the output signals output from a device under test. The measurement apparatus comprises: a first...
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7548069 |
Signal measurement systems and methods
An exemplary embodiment of a measurement system for conducting measurements on a device-under-test (DUT) includes a signal transmission line, an impedance controlling tuner including a signal...
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7541815 |
Electronic device, testing apparatus, and testing method
A testing apparatus tests the performance of an electronic device having an operation circuit for providing a useful output signal. A demodulator configured to provide a phase or frequency...
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7537943 |
Method of manufacturing a semiconductor integrated circuit device
A technique of manufacturing a semiconductor integrated circuit device is provided for reducing the possibility of attachment of foreign matter to a membrane probe when performing probe inspection...
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7531756 |
Shielding apparatus
A shielding apparatus for electromagnetic testing comprises a platform, a lid, a driving unit, a pulley system, and a counterbalance. The platform is for placing an electronic device to be tested....
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7519486 |
Method and apparatus to test the power-on-reset trip point of an integrated circuit
Circuitry for testing a power-on-reset circuit in an integrated circuit includes a high-voltage detector coupled to a first I/O pad of the integrated circuit. A power-on-reset circuit in the...
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7518377 |
Measurement apparatus, test apparatus, and measurement method
A signal whose voltage level fluctuates with respect to a high voltage is measured with favorable accuracy. Provided is a measurement apparatus for measuring a fluctuation of a voltage level of an...
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7518129 |
Preventing dosage drift with duplicate dose integrators
A method for identifying a drifted dose integrator in an implantation system and an implantation system are provided. The implantation system includes a first dose integrator and a second dose...
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7516037 |
Method evaluating threshold level of a data cell in a memory device
A method evaluating threshold of a data cell in a memory device including a programming locus coupled with the data cell for receiving a programming signal setting a stored signal level in the data...
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7511507 |
Integrated circuit and circuit board
An integrated circuit has an analog output circuit for outputting an analog signal and a leadless terminal for connecting an output line of the analog output circuit to a circuit board by...
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7508217 |
Test apparatus and test module
A test apparatus is provided. The test apparatus includes: a signal provision section that provides a test signal to a device under test; an input section that inputs the output signal outputted...
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7502326 |
Methods used to simultaneously perform automated at-speed testing of multiple gigabit per second high serial pin count devices
A method performs automated at-speed testing of devices. The method includes the steps of generating multiplexer control signals, forming various signal paths between a set of multiplexers and the...
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7501832 |
Method and circuit for the detection of solder-joint failures in a digital electronic package
The solder-joint integrity of digital electronic packages, such as FPGAs or microcontrollers that have internally connected input/output buffers, is evaluated by applying a time-varying voltage...
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7496466 |
System for fault determinations for high frequency electronic circuits
A positioning system is provided for mounting a circuit board or device to be tested, and for mounting a sensor assembly, the positioning system having the capability of moving the sensor assembly...
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7493226 |
Method and construct for enabling programmable, integrated system margin testing
The present invention provides a margin testing system, incorporated in an electronic system (e.g., a computer system), that includes a controller, a frequency control module, and a voltage control...
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7492529 |
Bi-convex solid immersion lens
A bi-convex solid immersion lens is disclosed, having a top and bottom convex surfaces. The radius of curvature of the bottom surface is larger than that of the top surface. A conical sloped...
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7489139 |
System and method for checking decoupling of power supply in printed wiring board
A checking unit includes a power net extractor for extracting a power net with power attribution, which is segmented by a power-decoupling element, with reference to circuit design data of a...
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7486083 |
Managing system stability
System stability is managed. It is determined that a data storage system is responsive to an enclosure that is unstable. Based on the determination, the enclosure is temporarily prevented from...
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7477110 |
Method and device for testing a phase locked loop
According to an example embodiment, there is a testing device for testing a phase locked loop having a power supply input. The testing device comprises a power supply unit for providing a power...
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7477064 |
Probing apparatus and positional deviation acquiring method
In a prober, a post-contact image representing a region including a pad is acquired by capturing an image of a substrate after a probe has been brought into contact with the pad having an existing...
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7472038 |
Method of predicting microprocessor lifetime reliability using architecture-level structure-aware techniques
A method of predicting the lifetime reliability of an integrated circuit device with respect to one or more failure mechanisms includes breaking down the integrated circuit device into structures;...
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7466140 |
Signal generation circuit, jitter injection circuit, semiconductor chip and test apparatus
There is provided a signal generation circuit for generating an output signal including jitter injected thereto. The signal generation circuit includes a jitter output section that outputs a first...
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7456636 |
Test structures and method of defect detection using voltage contrast inspection
Test structures and a method for voltage contrast (VC) inspection are disclosed. In one embodiment, the test structure includes: a gate stack that is grounded by a ground to maintain the gate stack...
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7456635 |
Circuit arrangement comprising a multi-wire line for supplying current and emitting signals
A circuit arrangement with a multi-wire line for supplying current to a sensor and for emitting a signal that corresponds to a measured value to an evaluation module via a signal line. To eliminate...
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7453932 |
Test device and setting method
A testing apparatus for testing a device under test is provided, wherein the testing apparatus includes: a comparator for receiving a signal output from the device under test and converting the...
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7453169 |
Integrity testing of isolation means in an uninterruptible power supply
An uninterruptible power supply wherein an isolation device is automatically tested during normal operation to ensure that it is capable of effectively isolating the input from an auxiliary power...
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7447964 |
Difference signal path test and characterization circuit
A test circuit and programmable voltage divider that may be used in the test circuit. The programmable voltage divider develops a voltage difference signal that may be digitally selected. The test...
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7446541 |
Solenoid test device
A solenoid test device includes a clock circuit, a control circuit, and an output port configured for coupling to two ends of a solenoid. The clock circuit generates a clock signal and sends it to...
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7446538 |
Device for identifying AC power supply arrangement
A device for identifying an arrangement of an AC power supply. The device includes first and second voltage detecting circuits and a comparison logic circuit. The first voltage detecting circuit,...
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7437258 |
Use of I2C programmable clock generator to enable frequency variation under BMC control
The present invention provides systems and methods for performing frequency margin testing of a computer system, such as a server. A system of the invention can include a controller, e.g., a BMC,...
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7433793 |
Error detection apparatus and method and signal extractor
A modulated voltage signal modulated at a predetermined frequency f 0 is supplied to an integrated circuit under test to be tested set at an arbitrary stationary point, and an observation signal...
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7432722 |
Flexible continuity and circuit tester
A flexible circuit and continuity testing device may include a flexible printed circuit substrate. A battery having a positive and negative terminal may be attached to the substrate. An...
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7432720 |
Method and system for isolated current and voltage monitoring
An embodiment of the invention provides a method for monitoring electrical characteristic on an electronic circuit board. This electrical characteristic can be voltage or current. The electrical...
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