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9041411 Testing of an integrated circuit that contains secret information  
An integrated circuit (10) comprises a functional circuit (12a-c) that contain information that must be secured against unauthorized access. The integrated circuit comprises a test access circuit...
9041426 Default current test method of impulse voltage mixed high voltage direct current converter valve  
The present invention provides to a default current testing method of the high voltage direct current converter valve composited by impulse voltage. The technical scheme of the invention...
9041392 Current sensor  
There is provided a current sensor capable of performing malfunction determination with high accuracy even under the influence of an adscititious magnetic field. A current sensor includes first...
9035790 Wireless power transfer electric vehicle supply equipment installation and validation tool  
A transmit pad inspection device includes a magnetic coupling device, which includes an inductive circuit that is configured to magnetically couple to a primary circuit of a charging device in a...
9030224 Semiconductor integrated circuit  
A semiconductor integrated circuit includes a plurality of dies, wherein each of the dies is configured to enable a power circuit provided therein according to a power control signal, in a state...
9030225 Over voltage protection testing apparatus  
An over voltage protection testing apparatus is applied for testing an over voltage protection function of a power supply apparatus. The over voltage protection testing apparatus mainly includes a...
9024640 Active diagnostics and ground fault detection on photovoltaic strings  
A PV system includes a plurality of PV strings configured to generate a string output power responsive to received solar irradiation, with a source conductor and a return conductor being provided...
9024641 Wire breakage detecting method for high voltage generating device  
A method of detecting a wire break in a high voltage generating device that is configured to detect a wire breakage in a low-voltage cable is disclosed. The method of a wire break includes:...
9013205 Testing apparatus and testing method  
The present disclosure provides a testing apparatus for executing a test program, to perform a first test on a circuit component on a circuit board and a second test on the circuit board. The...
9013202 Testing structure and method of using the testing structure  
A metal-to-metal leakage and breakdown testing structure for semiconductor structures and method of using the testing structure is disclosed. The testing structure includes plurality of resistor...
9007069 Method of testing a spur short circuit protection system and diagnostic device for performing the method  
A method of testing a short circuit protection system applied to a spur of an electric circuit. The short circuit protection system has a current limiting means which applies a current limit to...
8988062 Branch circuit monitor  
A branch circuit monitoring system (BCMS) for monitoring branch circuit currents in one or more electrical circuit panels is described. The system is comprised of a data center server, one or more...
8981786 Test apparatus and test method  
A test apparatus that tests a device under test outputting a data signal and a clock signal indicating a timing at which the data signal is to be sampled, the test apparatus comprising a data...
8981809 Compliant printed circuit semiconductor tester interface  
A compliant printed circuit semiconductor tester interface that provides a temporary interconnect between terminals on integrated circuit (IC) devices being tested. The compliant printed circuit...
8975899 Inverter device comprising a topology surveying a series of capacitors  
An inverter device for feeding electrical energy from a DC-power source into a power grid includes a pair of bus lines to be connected to the DC-power source; a plurality of capacitors connected...
8972216 Methods and apparatus for calibration of power converters  
Methods and apparatus for a power regulator according to various aspects of the present invention may comprise a sensor adapted to generate a measurement of a voltage or a current. A memory may...
8970238 Probe module with interleaved serpentine test contacts for electronic device testing  
A probe module for testing an electronic device comprises at least two contacts, each contact including a first end portion extending in a first direction along a first line, a second end portion...
8963558 Current differential protection  
A current differential protection system for a multi-terminal power line includes a current sensor for sensing a current at a local terminal, a controller for time synchronizing the local terminal...
8957686 Voltage measurement device and voltage measurement system  
A voltage measurement device, includes: a multiplexer that includes a plurality of input terminals at which voltage signals are inputted; a control circuit that performs voltage measurement by...
8952704 Test arrangement for AC testing of electrical high voltage components  
A test arrangement is provided for AC testing of electrical high voltage components including at least one inverter, at least one test transformer and at least one high-voltage inductor arranged...
8941108 Method to perform electrical testing and assembly of electronic devices  
A method performs electrical testing and assembly of an electronic device on a wafer and comprising a pad made in an oxide layer covered by a passivation layer. The method includes connecting the...
8941404 System and method for testing a power supply controller  
In accordance with an embodiment, a method of testing a power supply controller includes detecting whether an external switch is coupled between a first supply pin and the second supply pin. If...
8937483 Semiconductor package transferring apparatus and method of manufacturing semiconductor device using the same  
A semiconductor package transferring apparatus is disclosed. The apparatus includes a tray that includes a front side and a rear side opposite the front side, the rear side including a plurality...
8928331 Diagnostic circuit and method of testing a circuit  
A diagnostic circuit for trouble shooting electronic control units of appliances includes a voltage sensing and signal generation device with an input/output and an input. The circuit includes...
8928335 Stepped impedance flexure design in a hard disk drive  
Various embodiments concern a method for forming a trace array by modeling a trace array having a plurality of traces, each trace having a plurality of trace segments corresponding to elements of...
8928341 Apparatus and method for automated testing of device under test  
An apparatus and a method for automated testing of electrostatic discharge of a Device Under Test (DUT) are provided. In the apparatus and the method, an electrostatic pulse is applied to the DUT,...
8922220 Short detection circuit, light-emitting diode chip, light-emitting diode device and short detection method  
A short detection circuit includes a voltage divider circuit, for generating, according to a bottom voltage of one or more light-emitting diode strings, a divided voltage less than the bottom...
8922221 Method and system for detecting a short circuit affecting a sensor  
A method of detecting a short circuit affecting a sensor, at least one terminal of the sensor being connected to a bias resistor, includes: applying to at least one bias resistor at least one test...
8917109 Method and device for pulse width estimation  
A pulse width estimation method, applied between an integrated circuit and a circuit system for generating a reference pulse with a predetermined pulse width, includes steps for the following:...
8917103 Device and method for testing semiconductor device  
A testing method for testing a semiconductor device includes heating the semiconductor device until the temperature of the semiconductor device reaches a predetermined temperature; conducting...
8912802 Component-embedded circuit substrate and method of inspecting the same  
In a component-embedded circuit substrate having a plurality of capacitors embedded therein, the capacitors are connected in parallel, inspection electrodes are formed, and the inspection...
8896336 Testing techniques for through-device vias  
Techniques for testing an electronic device with through-device vias can include using a probe card assembly with probes for contacting connection structures of the electronic device including...
8896319 Light emitting device control circuit and short detection circuit thereof  
A light emitting device control circuit controls a light emitting array which includes a plurality of light emitting device strings. Each light emitting device string includes a first terminal...
8890538 Sensing system and method for manufacturing the same  
A system includes a sensor housing having a base portion, a lid portion, and a joining portion. The joining portion is configured to be wrapped around at least a portion of an electrical wire. The...
8892380 Data measurement methods and systems  
Methods are described for measuring data in a test setup including an impedance tuner. In an exemplary embodiment, the data is data for measuring noise parameters. The data is measured versus a...
8884629 Background sensor diagnostic for multi-channel ADC  
A digital sensing device includes a sensor diagnostic system for detecting sensor fault conditions. The sensor diagnostic system including an input multiplexer applying a first burnout current or...
8886485 Method and apparatus for determining whether a cooling device in a computer system is responsive to control signals  
Some embodiments of the present invention provide a system that determines whether a cooling device in a computer system is responsive to control signals. During operation of the computer system,...
8884642 Circuit having an external test voltage  
A circuit having an external test voltage includes an amplifier, a first P-type metal-oxide-semiconductor transistor, a second P-type metal-oxide-semiconductor transistor, at least one reference...
8878529 Sensor module and method for monitoring the function thereof  
A method for monitoring the function of a sensor module including sensor which generates a measurement signal for a physical quantity to be determined and applies the measurement signal to an...
8880375 Test apparatus and test method  
Provided is a test apparatus that tests a device under test having a plurality of output terminals. The test apparatus comprises an executing section that executes a test command sequence for...
8878545 Test apparatus with physical separation feature  
A test apparatus with physical separation feature is disclosed. The test apparatus includes probes (210), a peripheral circuit (220), a circuit of special function (230), wherein the peripheral...
8872522 Frequency based fault detection  
A electrical circuit includes an excitation voltage connected via a first circuit path to an output, a switching device having a control terminal and first and second controlled terminals...
8872523 Automatic test equipment for testing an oscillating crystal and method for operating the same  
Embodiments of the invention relate to automatic test equipment for testing a circuit having an oscillating crystal and to a method for operating such automatic test equipment. A generator...
8866489 Test apparatus with power cutoff section having variable maximum and minimum thresholds  
A test apparatus that tests a device under test, including a power supply section that supplies the device under test with power, a comparing section that detects a characteristic value indicating...
8866488 Power compensation in 3DIC testing  
A device, such as a 3DIC stacked device includes a first device under test (DUT) connected to a first force pad by a first through substrate via (TSV) stack and connected to a first sense pad by a...
8866506 Contact structure for inspection  
A contact structure for inspection that is installed on a bottom surface of a circuit board includes a ground conductor that is grounded; an elastic contact member that is brought into contact...
8860429 System and method for detecting sensor leakage  
A test system for testing a sensor system includes a high-impedance resistor for forming a voltage divider with any corrosion or foreign substance that might be present between a signal conductor...
8860595 Scalable voltage ramp control for power supply systems  
A system for scalable voltage ramp control for power supply systems. A system may comprise at least power supply circuitry, digital-to-analog (D/A) converter circuitry and a controller. The power...
8860445 ***WITHDRAWN PATENT AS PER THE LATEST USPTO WITHDRAWN LIST***
Device and method for testing semiconductor device
 
A testing method for testing a semiconductor device includes heating the semiconductor device until the temperature of the semiconductor device reaches a predetermined temperature; conducting...
8860428 Apparatus and method for recognizing an error in a power bridge circuit  
An apparatus and a method for recognizing an error in a power bridge circuit containing a load, a high-side branch and a low-side branch. Accordingly, a first switched current source is connected...