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7388394 |
Multiple layer printed circuit board having misregistration testing pattern
A method of testing for misregistration in a multiple layer printed circuit board includes providing an electrical test pattern on one or more layers of the board, testing for an electrical signal...
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7388366 |
Test system connection system with triaxial cables
A connection system for connecting test equipment to a device under test (DUT) includes a first pair of equal-length triaxial cables, each having a desired characteristic impedance between a center...
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7388365 |
Method and system for inspecting specimen
Method and system for obtaining a potential distribution image of a specimen using two probes having two probes contacted with a patterned surface of the specimen, a scanning unit for scanning a...
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7385406 |
Automated electrical wiring inspection system
The present invention is directed to an electrical wiring inspection system. The system includes an electrical measurement apparatus having at least one load center connector configured to couple...
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7385386 |
Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober
A probe card transporting apparatus includes a truck and transporting mechanism. The truck can move on a floor surface freely. The transporting mechanism is arranged above the truck to be able to...
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7385385 |
System for testing DUT and tester for use therewith
A tester configured to stack with at least one other tester to provide a test system for simultaneously testing a number of devices in parallel on different testers, or testing a device having more...
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7383746 |
Compliance module, particularly for a manipulator for positioning a test head, and one such manipulator
A compliance module, particularly for a manipulator for positioning a test head, comprising a housing that is securable to a component. The compliance module furthermore comprises an inner sleeve...
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7382117 |
Delay circuit and test apparatus using delay element and buffer
There is provided a delay circuit that delays an input signal to output the delayed signal. The delay circuit includes a first delay element operable to receive the input signal and delay the input...
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7378864 |
Test apparatus having multiple test sites at one handler and its test method
A test apparatus includes one handler connected to a tester and one test board divided into two or more sites or two or more test boards. Since only the sites on the test board (or test boards)...
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7378862 |
Method and apparatus for eliminating automated testing equipment index time
The present invention eliminates the indexing time of an SOC tester, or at least reduces it to the time delay for an electronic switch to toggle or a mechanical shift to occur between two banks of...
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7378837 |
Method and system for calibrating a micro-electromechanical system (MEMS) based sensor using tunneling current sensing
A system and method for controlling a tunneling current between a first element and a second element of a micro-electro-mechanical system (MEMS) sensor. The system includes a tunneling current...
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7378835 |
Interleaved differential multiplexer
An N-wire interleaved differential multiplexer. The N-wire interleaved differential multiplexer may be formed by interleaving the channels and corresponding switches of N one-wire multiplexers....
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7378834 |
Electronic assembly tester and method for optoelectronic device
An electronic assembly tester for testing an electrical component of an optoelectronic device. The electrical component includes a transmit and receive port. The tester includes of a base, an arm,...
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7375540 |
Process monitor for monitoring and compensating circuit performance
A method and system for monitoring and compensating the performance of an operational circuit is provided. The system includes one or more integrated circuit chips and a controller. Each integrated...
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7375508 |
Device and a process for the calibration of a semiconductor component test system
A device and a process for the calibration of a semi-conductor component test system The invention relates to a process and a device for the calibration of a probe card and/or of a semi-conductor...
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7373574 |
Semiconductor testing apparatus and method of testing semiconductor
A semiconductor testing apparatus, includes a test signal generating unit that generates a test signal corresponding to a test pattern to output the generated test signal to a device under test...
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7372252 |
Automated platform for electronic apparatus environmental testing & method of use
An automated platform for electronic apparatus environmental testing and the methods of its operation holds and positions electronic devices during environmental testing. The automated platform may...
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7372251 |
Semiconductor integrated circuit and memory test method
A semiconductor integrated circuit has a memory operating on a first clock. A memory device captures first output data, being output from the memory in synchronization with the first clock,...
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7372250 |
Methods and apparatus for determining a position of a substrate relative to a support stage
A sensing system includes a plurality of probes arranged in a spaced relation around a stage that is adapted to support a substrate. Each probe includes a detection portion adapted to move from a...
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7368933 |
Method for testing standby current of semiconductor package
A system and method for testing standby current of a semiconductor package is provided. The method includes testing semiconductor chips formed on a wafer having a predetermined wafer run number,...
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7368902 |
Impedance calibration for source series terminated serial link transmitter
Substantially-accurate calibration of output impedance of a device-under-test (DUT) to within a predetermined range of allowable impedance. The DUT is part of a source series terminated (SST)...
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7365555 |
Semiconductor device, method for testing the same and IC card
A semiconductor device has a boosting circuit configured to generate a boosting potential to an output line. An internal circuit is supplied with the boosting potential from the boosting circuit...
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7365552 |
Surface mount package fault detection apparatus
A fault detection apparatus for surface mount packages is provided. The apparatus can include a retainer for releasably securing a circuit board such as a printed circuit board having an electrical...
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7365550 |
Low impedance test fixture for impedance measurements
A test fixture couples with a test instrument to measure impedance of a device. An upper layer of the test fixture has (a) a first and a second solder pad for electrical connection to the device,...
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7365529 |
Test structure design for reliability test
A flexible semiconductor test structure that may be incorporated into a semiconductor device is provided. The test structure may include a plurality of test pads designed to physically stress...
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7362148 |
Device for controlling a semiconductor element
A control device for controlling a load drive semiconductor element for driving a load has a test operation mode for measuring a leak current of the load drive semiconductor element. In the test...
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7362117 |
Cooling fin connected to a cooling unit and a pusher of the testing apparatus
A device testing apparatus including a connection terminal to which an electronic device under test is detachably attached, a pusher for pushing the electronic device in the direction of the...
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7362093 |
IC selectively connecting logic and bypass conductors between opposing pads
In a functional mode, the functional core logic of a die is connected to the input and output pads and the die performs its intended function. In a bypass mode, the input and output buffers of the...
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7362092 |
Isolation buffers with controlled equal time delays
A system is provided for controlling the delay in an isolation buffer. Multiple such isolation buffers are used to connect a single signal channel to multiple lines and controlled to provide an...
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7362091 |
Test probe having modular components
A test probe. The test probe includes an interconnect module configured to connect to a modular, replaceable wireless module, a connect module configured to communicate with a communication network...
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7362090 |
Automated tray transfer device for prevention of mixing post and pre-test dies, and method of using same
A method of sorting automated tray transfer trays includes detecting if a die remains in the tray. The method includes the ability to interrupt the automated tray transfer process to prevent mixing...
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7362089 |
Carrier module for adapting non-standard instrument cards to test systems
A carrier module that is able to adapt non-standard instrument cards to the architecture of a test system is disclosed. Instrument cards based on non-standard architectures may be combined on a...
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7362088 |
Non contact method and apparatus for measurement of sheet resistance of P-N junctions
A contactless sheet resistance measurement apparatus and method for measuring the sheet resistance of upper layer of ultra shallow p-n junction is disclosed. The apparatus comprises alternating...
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7362087 |
Adapter for circuit board examination and device for circuit board examination
An adaptor for inspection of circuit boards includes a wiring board for connection, on a front surface of which a plurality of connecting electrodes are formed correspondingly to electrodes to be...
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7360716 |
Method of determining at least one marking element on a substrate
A method of establishing at least one marking element on a substrate ( 1 ). By means of design data of the substrate ( 1 ) at least a fictitious marking element ( 5 ) on the substrate ( 1 ) is...
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7358718 |
Semiconductor device and electronics device
A plurality of switch circuits are disposed so as to correspond to a plurality of circuit blocks, respectively. Each of the plurality of switch circuits is connected between a power supply terminal...
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7358717 |
Input by-pass circuit for a current probe
An input by-pass circuit for a current probe has first and second switches coupled between current probe inputs and current sensing circuit inputs. A switch control is coupled to the switching...
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7355432 |
Buffer circuit, driver circuit, and semiconductor testing apparatus
There is provided a buffer circuit that can deal with input and output signals having a large voltage swing. Such a buffer circuit is designed for outputting an output signal corresponding to an...
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7355427 |
Clamping top plate using magnetic force
A test fixture, for testing an electronic device, includes: a test platform including electrically conductive contacts protruding from a device receiving surface in the test platform; a positioning...
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7355387 |
System and method for testing integrated circuit timing margins
An integrated circuit load board includes a substrate on which a plurality of integrated circuit sockets and an integrated test circuit are mounted. The integrated test circuit includes circuitry...
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7355386 |
Method of automatically carrying IC-chips, on a planar array of vacuum nozzles, to a variable target in a chip tester
A method of automatically carrying IC-chips, on a planar array of vacuum nozzles, to a variable target in a chip tester uses a set of laser distance sensors to align the vacuum nozzles with the...
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7355385 |
Voltage injector and detector using pixel array for printed circuit board testing
One embodiment includes an injector pixel array having injector pixels each coupled to the bottom surface of a conductive material having a directional electrical conductivity only in a direction...
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7353090 |
System, bus monitor assembly and method of monitoring at least one data bus of an aircraft
A system is provided for monitoring at least one data bus of an aircraft. The system includes an aircraft adapted to control the operation of stores of a second predetermined type (e.g., Harpoon...
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7352170 |
Exhaustive diagnosis of bridging defects in an integrated circuit including multiple nodes using test vectors and IDDQ measurements
A method, system and computer program product for diagnosing a bridging defect in an integrated circuit including multiple nodes are disclosed. Quiescent power supply current (I DDQ ) of the...
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7352169 |
Testing components of I/O paths of an integrated circuit
Testing the components of I/O paths in an integrated circuit at-speed operation (i.e., the speed at which the integrated circuit would be operated during normal non-test mode). In an embodiment,...
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7352166 |
Resistance ratio digitizing ohmmeter system
A digitizing ohmmeter system for providing a digital resistance ratio measurement includes a high impedance current source providing a DC excitation current to an impedance-varying input sensor and...
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7348787 |
Wafer probe station having environment control enclosure
A wafer probe station is equipped with an integrated environment control enclosure substantially surrounding a supporting surface for holding a test device, such enclosure limiting fluid...
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7348769 |
Electricity meter with power supply load management
An electricity meter for monitoring electric power consumed from a service line is disclosed. The electricity meter includes a power consumption metering system for measuring the amount of power...
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7348768 |
Tray transfer unit and automatic test handler having the same
Provided is a tray transfer apparatus having a transfer plate arranged and configured to support a tray containing a number of semiconductor devices in an array of pockets. The tray transfer...
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7345501 |
Electro-optical device, electronic apparatus, and mounting structure
An electro-optical device includes a first substrate that holds an electro-optical material, a first IC that is mounted on the first substrate and that has a plurality of first terminals, a...
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