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7265534 |
Test system for device characterization
Device characterization performed with a test system including a fixture and multiple frequency dependent test boards. In one embodiment, testing is performed with multiple sets of input and output...
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7262620 |
Resource matrix, system, and method for operating same
In one embodiment, a resource matrix is provided with a first set of pins, a second set of pins, and at least one programmable switching circuit. The first set of pins electrically couples the...
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7262590 |
Performance board and testing system
A performance board for allowing a device under test and a testing apparatus to be electrically coupled with each other, includes a base substrate on which the device under test is mounted, a first...
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7262626 |
Connection apparatus and cable assembly for semiconductor-device characteristic measurement apparatus
A connection apparatus includes a switch; a control signal connector that transmits a switching signal, sent from a controller, to the switching means; a first plurality of connectors that are...
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7262619 |
Semiconductor device test system
An apparatus for mitigating condensation formation on a device interface board during low-temperature semiconductor device testing includes a nozzle. The nozzle includes an input orifice for...
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7262612 |
Methods for evaluating characteristics of a plasma or the effects of a plasma on a substrate
A method for evaluating characteristics of a plasma or the effects of the plasma on a substrate includes introducing a plasma probe into a reaction chamber. The plasma probe may be introduced into...
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7259580 |
Method and apparatus for temporary thermal coupling of an electronic device to a heat sink during test
A method, system and apparatus for testing an electronic device. The method including: (a) forming a temporary liquid heat transfer layer on a surface of the electronic device; after step (a), (b)...
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7259549 |
Shield for tester load board
The invention provides tester load board shields for attachment to tester load boards. The shields of the invention protect from physical damage and electromagnetic interference. A preferred...
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7259582 |
Bonding pads for testing of a semiconductor device
In one embodiment, a first integrated circuit (IC) chip may comprise one or more bonding pads to which bonding wires from respective external leads may be connected. Other bonding wires connect the...
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7256594 |
Method and apparatus for testing semiconductor devices using the back side of a circuit board
A test system for a semiconductor device couples the device to the back side of a circuit board, thereby allowing the device to be tested under actual operating conditions while providing adequate...
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7256879 |
Semiconductor array tester
An array tester ( 10 ) characterizes individual ones ( 111 ) of a semiconductor devices of an array ( 11 ) based on polarization-resolving an optical far-field measurement of the individual chips (...
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7256597 |
Device design-for-test and burn-in-board with minimal external components and increased testing capacity
The invention includes a design for device design-for-test and a burn-in-board that reduce the number of external components per device on the board. Inputs to the I/Os of a device from input means...
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7253608 |
Planarity diagnostic system, e.g., for microelectronic component test systems
Maintaining proper planarity of elements of a microelectronic component test system helps ensure reliable operation of the test system. Aspects of the invention provide test systems and methods for...
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7253638 |
Apparatus and method for conducting an electrical test on a terminal fitting in a connector
A female connector (F) has a housing ( 10 ) with a front end and cavities ( 11 ) extend to the front end. Terminal fittings ( 40 ) are mounted in the cavities ( 11 ). A front wall ( 50 ) is mounted...
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7253607 |
Site-aware objects
A method for use with automatic test equipment (ATE) having sites, each which accommodates a device under test (DUT), includes defining an object for use with the plural sites, where the object is...
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7253651 |
Remote test facility with wireless interface to local test facilities
A central test facility transmits wirelessly test data to a local test facility, which tests electronic devices using the test data. The local test facility transmits wirelessly response data...
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7253606 |
Framework that maximizes the usage of testhead resources in in-circuit test system
A method and apparatus for maximizing the usage of a testhead of an in-circuit tester is presented. A testhead execution supervisor interfaces between a testhead controller and a graphical user...
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7250750 |
System and method for testing and orientation of components for assembly
There is disclosed a system and method for testing and orientation of components for assembly, including a component selection tester for testing, prior to assembly, the correct selection of a...
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7250752 |
Probe station having multiple enclosures
A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to...
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7248035 |
Automatic test equipment pin channel with T-coil compensation
A passive matching network is connected to an input/output line for an automatic test equipment drive channel to compensate for capacitances associated with a receiver circuit connected to the...
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7248036 |
Method and apparatus to probe bus signals using repeaters
An assembly including a processor socket having a cut region. The assemble further including a probe board having a repeater positioned in alignment with the cut region. The repeater is to receive...
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7248063 |
Plasma probe systems
A plasma probe system includes a plasma probe, at least one meter, and a diagnostic apparatus. The probe may include a substrate having substantially the same properties as those of a substrate to...
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7248066 |
On-chip analysis and computation of transition behavior of embedded nets in integrated circuits
An apparatus for enabling the on-chip analysis of the voltage and/or current transition behaviour of one or more embedded nets of an integrated circuit independently of the fabrication process. The...
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7245119 |
fixture for manual functional testing of wireless devices
A fixture for functional testing of an assembled wireless device, the wireless device having a data port and a removable casing concealing a battery cavity having battery contacts, the fixture...
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7245141 |
Shared bond pad for testing a memory within a packaged semiconductor device
A system is provided for communicating with a device within a packaged semiconductor device through a shared external terminal thereof. As one example, the system provides for testing a memory...
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7245120 |
Predictive, adaptive power supply for an integrated circuit under test
A main power source supplies current through path impedance to a power terminal of an integrated circuit device under test (DUT). The DUT's demand for current at the power input terminal...
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7245135 |
Post and tip design for a probe contact
The present invention relates to A microfabricated tip and post structure comprising a post having a rough top surface that diffuses incident light and a cross-section, and a tip, lithographically...
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7245134 |
Probe card assembly including a programmable device to selectively route signals from channels of a test system controller to probes
A probe card of a wafer test system includes one or more programmable ICs, such as FPGAs, to provide routing from individual test signal channels to one of multiple probes. The programmable ICs can...
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7242204 |
Substrate aligning system
The present invention provides a substrate aligning system which prevents particles or the like from attaching to a substrate such as a wafer used in the semiconductor manufacturing process, and...
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7242179 |
Digital circuit for frequency and timing characterization
A digital circuit operating frequency characterizer provides a combination of frequency and duty cycle characterization. The digital circuit operating frequency characterizer includes a...
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7242212 |
Liquid crystal display panel test apparatus
A liquid crystal display (LCD) panel test apparatus includes a testing table on which an LCD panel is positioned for testing. A photographing unit disposed over the testing table photographs the...
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7242178 |
Digital cable toning apparatus and method
A digital toner/locator employs tone packets using a 455 Khz. carrier. Plural packet quanta provide multiple test modes which are advantageously selected from a probe without requiring returning to...
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7242210 |
Method and apparatus for circuit board inspection capable of monitoring inspection signals by using a signal monitor incorporated in the apparatus
An inspection apparatus includes an interface connector, an inspection mechanism, and a monitor. The interface connector connects the inspection apparatus with an external device. The inspection...
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7242177 |
Method and circuit arrangement for current measurement
A method with corresponding circuit arrangement is disclosed, whereby for evaluation of a measured signal arising as an analogue value with a potential greater than zero potential in a measuring...
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7239127 |
Apparatus and method for inspecting electronic circuits
The present invention provides an apparatus and a method for used in a board inspection capable of an inspection of defect in a circuit board with high resolution over a wide range. The method is...
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7239161 |
Gantry-type XY stage
Nine vibration isolating mounts are disposed on a pedestal, and a granite plate is placed thereon. A pair of guide bases are disposed on the granite plate, and disposed thereon are a pair of posts...
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7239128 |
Liquid crystal module inspecting apparatus and liquid crystal module
An inspection and adjustment of a liquid crystal module have required a number of processes, which has been inefficient. According to the present invention, OSD image data is stored in a ROM 42 ...
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7239126 |
System bench wireless mapping board
A system for testing electronic modules comprising at least one mapping board box, and at least one harness operably attached to the mapping board box with a harness port is disclosed. The mapping...
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7235996 |
Functionality test method
A functionality test method for a technical system having at least one technical component to be regularly tested. The method including the steps of defining a test interval by setting a minimum...
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7235991 |
Insert having independently movable latch mechanism for semiconductor package
In an example embodiment, an insert having an independently movable latch mechanism for loading a semiconductor package may include an insert body having a pocket, latch units installed at opposite...
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7235964 |
Test head positioning system and method
An apparatus for supporting a load includes pneumatic units and couplers coupled to opposite sides of the load. The couplers move the load parallel to a first axis responsive to actuation of the...
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7233152 |
Short detection circuit and short detection method
A circuit and method for judging a latent short-circuit defect, also known as a short-circuit defect with time passing, in the case of a high voltage system. A detection-dedicated wiring for...
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7233438 |
Specimen temperature adjusting apparatus
A specimen temperature adjusting apparatus includes a specimen stage that the observation specimen is to be placed on and a temperature adjustment element that is attached to the specimen stage....
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7233159 |
Ergonomic, rotatable electronic component testing apparatus
Apparatuses and methods for testing electronic components, such as printed circuit boards, in an ergonomic manner are disclosed. An electronic component testing apparatus comprises a base, a test...
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7233162 |
Arrangements having IC voltage and thermal resistance designated on a per IC basis
Systems for testing a plurality of integrated circuits at a plurality of frequencies and voltages is disclosed. In one embodiment, a plurality of integrated circuits is tested at least once within...
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7233157 |
Test board for high-frequency system level test
A test board for a high-frequency system level test: The test board includes a main board having through holes filled with a conductive material. These holes may be located at a portion of the main...
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7230415 |
Quantum junction device as switch and detector
A quantum junction device having three or more wires connected to a loop surrounding a magnetic flux is used to act as a switch responsive to magnetic flux and therefore useable for mass storage...
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7230442 |
Semi-conductor component testing process and system for testing semi-conductor components
The invention involves a semi-conductor component testing process, and a system for testing semi-conductor components, in which a central computer device, in particular a central test apparatus is...
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7230416 |
Inspecting apparatus for liquid crystal displays
An inspecting apparatus ( 20, 40, 50, 60 ) for liquid crystal displays includes a base plate ( 21, 41 ), a connecting device ( 200, 400 ) mounted on the base plate, a working table ( 25, 45, 55, 65...
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7227350 |
Bias technique for electric utility meter
The invention contemplates an electrical power meter and method of operating the same, where the meter has electronic components (e.g., a power supply and a voltage sensing circuit) and receives...
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