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7312605 |
AC power supply testing module and method for booting a main board
An AC power supply testing method upon booting a main board is provided. The testing method is applied to a main board, a microprocessor is in connection with the main board, and a relay is...
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7309981 |
Pressing member and electronic device handling apparatus
A first spring 54 is provided between a support member 51 driven in the Z-axis direction and a heat block 53 , and biases the support member 51 and the heat block 53 in the direction of...
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7309609 |
Detection of oxidation of carbon-containing fibers or fiber bundles in composites
The invention relates to the detection of oxidation of carbon-containing fibers or fiber bundles embedded in a nonconductive or semiconducting ceramic matrix in composites wherein use is made of...
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7307434 |
Operation voltage supply apparatus and operation voltage supply method for semiconductor device
The voltage application probe ( 54 ) and the voltage measurement probe ( 56 ) are connected to the voltage application pad ( 74 ) and the voltage measurement pad ( 76 ) of the semiconductor device...
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7307427 |
Method and apparatus for engineering a testability interposer for testing sockets and connectors on printed circuit boards
A method and apparatus is presented for gaining socket testability through the use of a capacitive interposer engineered to create capacitive coupling between signal nodes of a circuit assembly...
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7308627 |
Self-timed reliability and yield vehicle with gated data and clock
A test vehicle a system and method for evaluating an interconnect module manufacturing process while dynamically testing performance with high-speed operational frequencies is disclosed. The test...
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7307773 |
Micro-optoelectromechanical system packages for a light modulator and methods of making the same
A micro-optoelectromechanical system (MOEMS) package for a light modulator includes a sealed modulator package containing a light modulator sealed under a first transparent lid; a secondary, larger...
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7307413 |
Device using a detection circuit to determine whether an output current thereof is source-induced or load-induced, and method therefor
A device which uses a detection circuit to determine whether an output current thereof is source-induced or load-induced, and the method therefor. The device which performs some type of operation...
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7304492 |
Inspecting circuit layout for LCD panel and fabricating method for LCD panel
An inspecting circuit layout according to the present invention is provided. The inspecting circuit layout is adapted for inspecting panel units group by group, each of the panel units having a...
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7301326 |
Modular interface
An apparatus for interfacing a test head to a peripheral system is provided. The apparatus includes a first unit having a first connection member for providing electrical communication with the...
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7301325 |
Method and apparatus for creating performance limits from parametric measurements
A measurement device includes a measurement circuit that generates a parametric measurement data signal including parametric characteristics of an input signal. In an exemplary embodiment, the...
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7301327 |
Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces
Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces begins by configuring the programmable section to support a 1 st level testing of the plurality...
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7298136 |
Magnetically coupled electrical test lead
An electrical test lead includes an insulated electrical cable having a proximal end and a distal end, an electrical connector disposed at the proximal end of the cable and connected to a test...
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7298131 |
Current sensors
A current sensor comprises an outer shielding means ( 4 ), a toroidal inner core and inner shield means ( 1 ). A combined driving and sensing winding ( 3 ) is wound around the inner core. First and...
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7298164 |
System and method for display test
The system for display test includes a driving circuit having integrated circuit (IC) pads on the substrate and the IC pads are electrically connected to the signal lines, respectively. And the...
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7294997 |
Electrical meter system with color coding features
A communication system between a plurality of electrical loads and at least one electrical measurement device is configured with a plurality of wires grouped in pairs. Each pair of wires is...
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7295027 |
Semiconductor device socket and semiconductor device connecting method using anisotropic conductive sheet
A semiconductor device socket, in which a semiconductor device is installed, includes a support member on which a substrate is placed, an anisotropic conductive sheet that acts as an intermediary...
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7294998 |
Timing generation circuit and semiconductor test device having the timing generation circuit
A timing generation circuit can increase a maximum delay amount without changing the configuration of a timing memory. The timing generation circuit includes: a timing memory (TMM) 10 containing...
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7294999 |
Apparatus for automatically displaying the grade of liquid crystal display device and operating method thereof
An apparatus for automatically displaying a grade of a liquid crystal display device and operating method thereof, includes a grade determining unit of a liquid crystal display panel; a grade...
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7292024 |
Defect mitigation in display panels
Defect mitigation in display panels. Defects in a display panel are mapped, and the defect information is associated with the display system or associated with the panel. During panel operation,...
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7288927 |
Remote substance identification and location method and system
This invention relates to a method and system for remote detection of a targeted substance by the appropriate application of a probing signal that induces molecular resonance in the target...
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7285970 |
Load board socket adapter and interface method
A load board adapter which is removably attachable to a load board and provides removable and replaceable sockets for individual integrated circuit packages to provide an electrical connection...
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7285948 |
Method and apparatus providing single cable bi-directional triggering between instruments
System and apparatus enabling the use of a single cable to communicate triggering information between each of a plurality of signal acquisition devices and, illustratively, an external trigger...
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7282906 |
Electronic circuit protection device
A device for protecting an electronic circuit comprising a support to which are attached at least two circuit portions, each comprising at least one integrated circuit chip. The device comprises a...
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7282905 |
System and method for IDDQ measurement in system on a chip (SOC) design
System and method for detecting transistor failure in large-scale integrated circuits by measuring IDDQ. A preferred embodiment comprises a switch structure for an integrated circuit made up of a...
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7279887 |
In-process system level test before surface mount
Methods and systems for testing an integrated circuit during an assembly process are described. The integrated circuit is received from inventory. The integrated circuit is placed in a socket on a...
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7279886 |
Slidable mounting plate
A mounting plate ( 1 ) having one or more parts for indirectly or directly attaching a tester ( 2 ) for electronic components on the one side and a handler ( 3 ) for electronic components on the...
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7279888 |
Handling unit for electronic devices
A handling unit includes a frame, at least one arrangement module, and at least one chip carrier. The frame has at least one recess for the interchangeable mounting of at least one of the...
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7279919 |
Systems and methods of allocating device testing resources to sites of a probe card
Systems and methods of allocating device testing resources are described. In one aspect, a system for allocating m resources for testing devices to n sites of a probe card configured to...
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7278079 |
Test head utilized in a test system to perform automated at-speed testing of multiple gigabit per second high serial pin count devices
A portion of a test head utilized to perform simultaneous automated at-speed testing of a plurality of devices that generate serial data signals having gigabit per second baud rates. The portion of...
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7276929 |
Inspection system, inspection method, and method for manufacturing semiconductor device
The present invention provides an inspection system of ID chips that can supply a signal or power supply voltage to an ID chip without contact, and can increase throughput of an inspection process...
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7276896 |
Test apparatus and method for testing circuit units to be tested
The invention provides a test apparatus for testing a circuit unit ( 101 ) to be tested having a test system ( 100 ), a control bus ( 102 ) for transferring control data ( 106 ), an address bus (...
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7276895 |
Adjustable test head docking apparatus
Provided is an apparatus for establishing a distance between a test head and a peripheral. The apparatus includes a frame to which one of either a test head or a peripheral is docked. The frame has...
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7276894 |
Dynamic cradle assembly positioner system for positioning an electronic device test head
A cradle motion unit for positioning a test head. The test head has a support structure which provides three degrees of freedom, a first lock, and a second lock. The three degrees of freedom are...
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7274197 |
Contact system for interfacing a semiconductor wafer to an electrical tester
Disclosed herein are exemplary embodiments of a contact system (referred to as a “Z-block”) for interfacing a semiconductor wafer to an electrical tester, and methods for making the same. In a...
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7274202 |
Carousel device, system and method for electronic circuit tester
A rotatable or translatable carousel configured to facilitate electrical or electronic testing of Devices Under Test (DUTs) in combination with an insertion handler and a test head is disclosed....
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7271608 |
Prognostic cell for predicting failure of integrated circuits
A prognostic cell is used to predict impending failure of a useful circuit or circuits in a host IC. Increasing the stress on the prognostic cell relative to the useful circuit shifts the failure...
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7271606 |
Spring-based probe pin that allows kelvin testing
The voltage at a node of an integrated circuit can be measured or controlled using a two-wire kelvin contact with spring-based probe pins by offsetting and tapering the lower end section of the...
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7271581 |
Integrated circuit characterization printed circuit board, test equipment including same, method of fabrication thereof and method of characterizing an integrated circuit device
An integrated circuit characterization printed circuit board and method is provided for improving the uniformity of impedance introduced by a test fixture across all of the pins of the integrated...
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7271610 |
Using a parametric measurement unit to sense a voltage at a device under test
Circuitry for use in testing a device includes a first measurement unit to apply a forced voltage to the device, and a second measurement unit having functionality that is disabled. The second...
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7268535 |
Hi-pot testing device with transfer table automatically connecting to testing signal generator
An exemplary hi-pot testing device ( 2 ) includes a testing table ( 20 ), a transfer table ( 21 ) movably supported on the testing table and configured to support a product ( 200 ) to be tested,...
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7268533 |
Optical testing device
A chuck adapted to test electrical and/or optical components on a device-under-test (DUT).
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7268571 |
Method for validating and monitoring automatic test equipment contactor
A method and apparatus is provided for characterizing a contactor for automated semiconductor device testing, the method first comprising placing the contactor on a contactor test board positioned...
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7268573 |
Apparatus for generating test stimulus signal having current regardless of internal impedance changes of device under test
An apparatus for generating a current source test stimulus signal having a constant current regardless of an internal impedance value of a device under test includes a voltage source generation...
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7268534 |
Sorting handler for burn-in tester
Sorting handler for a burn-in tester including two DC testing parts and two unloading buffers on opposite sides of a burn-in board at a working post in a line with a main working line respectively,...
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7265536 |
Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station
A wafer probe station is provided with a wafer chuck, a wafer fastened on the chuck by vacuum suction, and a probe needle arrangement above the wafer to test the wafer at high frequencies by...
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7265533 |
Non-intrusive power monitor
Systems and methods for monitoring power in a conductor. A flex circuit may include multiple layers including a voltage sensing layer, a coil layer, and a ground layer. The coil layer includes...
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7265535 |
Circuit configuration for providing of a diagnostic signal for a power switching device
A circuit configuration providing a diagnostic signal for a power switching device which switches a load has a test circuit, a filter device, a validation device, and a coding device. The test...
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7265568 |
Semi-conductor component test process and a system for testing semi-conductor components
A semi-conductor component test process, and a system for testing semi-conductor components, with which several different semi-conductor-component tests can be conducted in succession. A computer...
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7265569 |
Test apparatus
A test apparatus for testing electronic devices, comprising a control section for generating control signals based on a test program set in advance to test the electronic devices, a plurality of...
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