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7365529 |
Test structure design for reliability test
A flexible semiconductor test structure that may be incorporated into a semiconductor device is provided. The test structure may include a plurality of test pads designed to physically stress...
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7365550 |
Low impedance test fixture for impedance measurements
A test fixture couples with a test instrument to measure impedance of a device. An upper layer of the test fixture has (a) a first and a second solder pad for electrical connection to the device,...
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7362091 |
Test probe having modular components
A test probe. The test probe includes an interconnect module configured to connect to a modular, replaceable wireless module, a connect module configured to communicate with a communication network...
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7362092 |
Isolation buffers with controlled equal time delays
A system is provided for controlling the delay in an isolation buffer. Multiple such isolation buffers are used to connect a single signal channel to multiple lines and controlled to provide an...
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7362148 |
Device for controlling a semiconductor element
A control device for controlling a load drive semiconductor element for driving a load has a test operation mode for measuring a leak current of the load drive semiconductor element. In the test...
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7362090 |
Automated tray transfer device for prevention of mixing post and pre-test dies, and method of using same
A method of sorting automated tray transfer trays includes detecting if a die remains in the tray. The method includes the ability to interrupt the automated tray transfer process to prevent mixing...
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7360716 |
Method of determining at least one marking element on a substrate
A method of establishing at least one marking element on a substrate ( 1 ). By means of design data of the substrate ( 1 ) at least a fictitious marking element ( 5 ) on the substrate ( 1 ) is...
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7362117 |
Cooling fin connected to a cooling unit and a pusher of the testing apparatus
A device testing apparatus including a connection terminal to which an electronic device under test is detachably attached, a pusher for pushing the electronic device in the direction of the...
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7362088 |
Non contact method and apparatus for measurement of sheet resistance of P-N junctions
A contactless sheet resistance measurement apparatus and method for measuring the sheet resistance of upper layer of ultra shallow p-n junction is disclosed. The apparatus comprises alternating...
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7362089 |
Carrier module for adapting non-standard instrument cards to test systems
A carrier module that is able to adapt non-standard instrument cards to the architecture of a test system is disclosed. Instrument cards based on non-standard architectures may be combined on a...
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7362093 |
IC selectively connecting logic and bypass conductors between opposing pads
In a functional mode, the functional core logic of a die is connected to the input and output pads and the die performs its intended function. In a bypass mode, the input and output buffers of the...
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7362087 |
Adapter for circuit board examination and device for circuit board examination
An adaptor for inspection of circuit boards includes a wiring board for connection, on a front surface of which a plurality of connecting electrodes are formed correspondingly to electrodes to be...
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7358717 |
Input by-pass circuit for a current probe
An input by-pass circuit for a current probe has first and second switches coupled between current probe inputs and current sensing circuit inputs. A switch control is coupled to the switching...
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7358718 |
Semiconductor device and electronics device
A plurality of switch circuits are disposed so as to correspond to a plurality of circuit blocks, respectively. Each of the plurality of switch circuits is connected between a power supply terminal...
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7355385 |
Voltage injector and detector using pixel array for printed circuit board testing
One embodiment includes an injector pixel array having injector pixels each coupled to the bottom surface of a conductive material having a directional electrical conductivity only in a direction...
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7355387 |
System and method for testing integrated circuit timing margins
An integrated circuit load board includes a substrate on which a plurality of integrated circuit sockets and an integrated test circuit are mounted. The integrated test circuit includes circuitry...
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7355386 |
Method of automatically carrying IC-chips, on a planar array of vacuum nozzles, to a variable target in a chip tester
A method of automatically carrying IC-chips, on a planar array of vacuum nozzles, to a variable target in a chip tester uses a set of laser distance sensors to align the vacuum nozzles with the...
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7355432 |
Buffer circuit, driver circuit, and semiconductor testing apparatus
There is provided a buffer circuit that can deal with input and output signals having a large voltage swing. Such a buffer circuit is designed for outputting an output signal corresponding to an...
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7355427 |
Clamping top plate using magnetic force
A test fixture, for testing an electronic device, includes: a test platform including electrically conductive contacts protruding from a device receiving surface in the test platform; a positioning...
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7352170 |
Exhaustive diagnosis of bridging defects in an integrated circuit including multiple nodes using test vectors and IDDQ measurements
A method, system and computer program product for diagnosing a bridging defect in an integrated circuit including multiple nodes are disclosed. Quiescent power supply current (I DDQ ) of the...
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7353090 |
System, bus monitor assembly and method of monitoring at least one data bus of an aircraft
A system is provided for monitoring at least one data bus of an aircraft. The system includes an aircraft adapted to control the operation of stores of a second predetermined type (e.g., Harpoon...
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7352166 |
Resistance ratio digitizing ohmmeter system
A digitizing ohmmeter system for providing a digital resistance ratio measurement includes a high impedance current source providing a DC excitation current to an impedance-varying input sensor and...
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7352169 |
Testing components of I/O paths of an integrated circuit
Testing the components of I/O paths in an integrated circuit at-speed operation (i.e., the speed at which the integrated circuit would be operated during normal non-test mode). In an embodiment,...
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7348787 |
Wafer probe station having environment control enclosure
A wafer probe station is equipped with an integrated environment control enclosure substantially surrounding a supporting surface for holding a test device, such enclosure limiting fluid...
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7348769 |
Electricity meter with power supply load management
An electricity meter for monitoring electric power consumed from a service line is disclosed. The electricity meter includes a power consumption metering system for measuring the amount of power...
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7348768 |
Tray transfer unit and automatic test handler having the same
Provided is a tray transfer apparatus having a transfer plate arranged and configured to support a tray containing a number of semiconductor devices in an array of pockets. The tray transfer...
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7345501 |
Electro-optical device, electronic apparatus, and mounting structure
An electro-optical device includes a first substrate that holds an electro-optical material, a first IC that is mounted on the first substrate and that has a plurality of first terminals, a...
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7345466 |
Method and apparatus for cleaning a probe card
A cleaning device for use in a semiconductor processing. The device comprises a substrate supporter for supporting a substrate to be cleaned, a scrub pad mounting plate, and a chuck coupling to the...
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7345497 |
Protection circuit for semiconductor device and semiconductor device including the same
A protection circuit comprises: at least one shielded line arranged to cover an area to be protected over a semiconductor device, the at least one shielded line having only one route from a start...
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7342402 |
Method of probing a device using captured image of probe structure in which probe tips comprise alignment features
An image of an array of probes is searched for alignment features. The alignment features are then used to bring contact targets and the probes into contact with one another. The alignment features...
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7342404 |
Device for measurement and analysis of electrical signals of an integrated circuit component
According to the invention, one or more external test connection contact points (pads; pins; balls), are provided in an integrated circuit component (chip) ( 1 ), through which signals ( 4, 5, 6 )...
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7342405 |
Apparatus for reducing power supply noise in an integrated circuit
A power supply provides power to a power terminal of an integrated circuit device under test (DUT). The DUT's demand for current at the power input terminal may temporarily increase due, for...
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7339368 |
Methods and apparatus for testing circuit boards
A method includes placing a circuit board on a test sheet so that conductive pins on an underside of the circuit board are in electrically conductive contact with electrically conductive contact...
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7339389 |
Semiconductor device incorporating characteristic evaluating circuit operated by high frequency clock signal
In a semiconductor device, a main circuit is operated by a first clock signal, and at least one characteristic evaluating circuit is operated by a second clock signal whose frequency is higher than...
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7336065 |
Energy device with an extended dynamic range on current readings
Systems and methods are disclosed for accurately measuring delivered or supplied electrical energy over an extended range of values. In one embodiment, a meter for monitoring the energy at a remote...
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7336066 |
Reduced pin count test method and apparatus
Testing of an electronic device is carried out by combining power and signal delivery on a single pair of wires. The power delivery is decoupled from the signal delivery, using inductors, so the...
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7332925 |
Engaging device of circuit board
An engaging device of a circuit board is disclosed. The engaging device is for engaging a circuit board having a positioning hole to a housing of an electronic device. The engaging device includes...
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7332905 |
Fixture for circuit board
A fixture for clamping and fixing a circuit board is provided. The fixture includes a base and a moving element. The base includes a first supporting board and a second supporting board disposed on...
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7332907 |
Semiconductor device having a connection inspecting circuit for inspecting connections of power source terminals and grounding terminals
The invention provides a semiconductor device that can inspect the connection states of power source terminals and grounding terminals of a test LSI at a low cost and in a short time, and an...
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7332926 |
Semiconductor test apparatus
Good device PASS/FAIL determination is realized by measuring timings of a cross point of differential clock signals CLK and a data signal DATA output from a DUT, and obtaining a relative phase...
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7332906 |
Vacuum circuit interrupter including circuit monitoring leakage or loss of vacuum and method of monitoring a vacuum interrupter for leakage or loss of vacuum
A method monitors a vacuum interrupter for leakage or loss of vacuum. The vacuum interrupter includes a line side, a load side and separable contacts electrically connected therebetween. The line...
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7332927 |
Apparatus for temporary thermal coupling of an electronic device to a heat sink during test
A method, system and apparatus for testing an integrated circuit chip. The system including: means for forming a liquid polyalphaolefine layer on a bottom surface of the integrated circuit chip, a...
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7332904 |
On-chip resistor calibration apparatus and method
An on-chip resistor is calibrated with a sense circuit that compares a resistance associated with an off-chip resistor to the on-chip resistor via a current-mirror circuit and a comparator. A...
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7330040 |
Test circuitry wafer
Method and apparatus for testing a plurality of devices on a device wafer. One embodiment provides a test circuitry wafer having a first surface and a second surface, the test circuitry wafer...
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7330043 |
Semiconductor device and test method for the same
A multi-bus semiconductor device and a method of its probing test perform the DC test for individual pads of a device while dealing with an adequate number of devices for simultaneous measurement...
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7330024 |
Power supply device, test apparatus, and power supply voltage stabilizing device
A power supply device for supplying source current to an electronic device comprises: a current output unit for outputting output current including at least the source current as a component of the...
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7330025 |
Touchdown counter for integrated circuit testers
A touch-down counter is provided that maintains a count of how many times integrated circuits are placed into contact with a contactor in a test handler. The test handler has a work press that...
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7330023 |
Wafer probe station having a skirting component
A probe station includes a fully guarded chuck assembly and connector mechanism for increasing sensitivity to low-level currents while reducing settling times. The chuck assembly includes a...
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7330037 |
Electrical characteristic measuring probe and method of manufacturing the same
In an electrical characteristic measuring probe of the present invention constructed by assembling a plurality of probe parts, each comprising a base portion, a plurality of terminal portions...
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7327135 |
Testing apparatus and testing method using the same
An exemplary testing apparatus ( 200 ) for testing electronic device ( 280 ) includes a workbench ( 210 ), a conveyance board ( 221 ) for supporting the electronic device to be tested and a testing...
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