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7414390 |
Signal detection contactor and signal calibration system
A signal detection contactor has a contactor main body and a plurality of coaxial bodies. Each coaxial body includes a core wire. The core wire is used for coming into contact with a probe of a...
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7411410 |
LCD test device and test process thereof
An LCD test device and a test process thereof are disclosed, in which a defect of an LCD panel is exactly identified through exact electrical connection between an LCD panel and a probe unit. The...
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7411384 |
Wafer chuck
A wafer chuck is provided with a plurality of pins which protrude and retreat in a plurality of through holes formed in a vertical direction on a mounting table, and an ascending/descending...
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7411383 |
Method and apparatus for discharging voltages from a circuit under test
In one embodiment, voltages are discharged from a circuit under test by, after pins of a circuit tester have been coupled to nodes of the circuit under test, making a first one of the pins an...
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7408339 |
Test system of semiconductor device having a handler remote control and method of operating the same
A test system of a semiconductor device for a handler remote control is provided. The system includes: a tester for testing the semiconductor device; a handler connected to the tester through a...
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7408338 |
Handler for testing semiconductor devices
A handler for testing semiconductor devices is disclosed which is capable of simplifying the process carried out in an exchanging station, namely, the process of loading/unloading semiconductor...
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7408371 |
Apparatus for measuring on-chip characteristics in semiconductor circuits and related methods
An apparatus for measuring on-chip characteristics in a semiconductor circuit is provided. The apparatus for measuring the on-chip characteristics includes an oscillation unit, a timing test unit,...
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7408369 |
System and method for determining thermal shutdown characteristics
Systems and methods are disclosed to enable determining thermal protection characteristics of an integrated circuit. In one embodiment, an integrated circuit includes a proportional to absolute...
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7408337 |
Compensating for loss in a transmission path
An apparatus to compensate for loss in a transmission path includes a circuit block that incorporates time constants into a signal transmitted via the transmission path. The time constants...
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7408336 |
Importation of virtual signals into electronic test equipment to facilitate testing of an electronic component
Electronic component validation testing is facilitated by a method, system and program product which allows the importation of virtual signals derived from simulation verification testing of the...
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7405573 |
Electrical connector for semiconductor device test fixture and test assembly
An interconnect assembly is for use in connection with a semiconductor device under test (DUT) having a plurality of leads to electronic test equipment. The interconnect assembly includes a cable...
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7405553 |
Load testing of uninterrupted power supply systems using regenerative loading by supplying percentage of a test power
To ensure high level of reliability, it is desirable to test an electrical device, such as an uninterruptible power supply (UPS) system, periodically with minimum possible energy usage and without...
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7403027 |
Apparatuses and methods for outputting signals during self-heat burn-in modes of operation
An apparatus and method for selecting and outputting test patterns and internal signals during various SHBI modes of operation. The apparatus may include multiple input/output (I/O) pins, one or...
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7403023 |
Apparatus and method of measuring defects in an ion implanted wafer by heating the wafer to a treatment temperature and time to substantially stabilize interstitial defect migration while leaving the vacancy defects substantially unaltered.
The invention relates to the use of the metrology methods and the related apparatus disclosed herein that incorporate thermal treatment devices and methods that improve defect detection....
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7402995 |
Jig device for transporting and testing integrated circuit chip
A novel jig device useful for transporting and testing an IC chip is disclosed. The jig device comprises a main jig body, having a holding part onto which the IC chip to be tested is attracted and...
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7403030 |
Using parametric measurement units as a source of power for a device under test
An apparatus for providing current to a device under test includes a first parametric measurement unit configured to provide current to the device, and a second parametric measurement unit...
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7402994 |
Self-cleaning lower contact
An electrical component handler that tests electrical circuit components and includes a self-cleaning lower contact offers reduced yield loss and mean time between assists. A preferred embodiment...
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7400135 |
Test fixture and method for circuit board testing
A Printed Circuit Board (PCB) test fixture includes flex sensors for monitoring the flex (or distortion) of the PCB during testing. The PCB is positioned above irregular array of test probes. The...
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7400159 |
Integrated complex nano probe card and method of making same
An integrated complex nano probe card is disclosed to include a substrate layer having a front side and a back side, and complex probe pins arranged in the substrate layer. Each complex probe pin...
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7400130 |
Integrated circuit device
An integrated circuit device comprises internally on-chip an oscillator with a signal output. The device has a reference clock input, a first counter with a count input, a control input and a...
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7400134 |
Integrated circuit device with multiple chips in one package
The integrated circuit device includes a memory chip and a logic chip. The memory chip has memory I/O pads and test pads. The test pads are placed in line at the position outer than memory I/O pads...
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7398181 |
Method for retrieving reliability data in a system
An aspect of the present invention is a method for retrieving reliability data in a system. The method includes coupling a device to the system, collecting the reliability data with the device and...
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7397235 |
Pin electronic for automatic testing of integrated circuits
A pin electronic adapted for use in an automatic test equipment for testing integrated circuits ICs includes a driver circuit having an input for receiving an input signal from a data source and an...
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7398169 |
Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device
There is provided a measuring apparatus for measuring a signal-under-test, having a comparator for sequentially comparing voltage values of the signal-under-test with a reference voltage value fed...
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7394275 |
Systems and methods for generating and evaluating high frequency, low voltage swing signals at in-circuit testing
Systems and methods for testing components of printed circuit assemblies (PCA) that generate high frequency, low voltage swing signals or that operate using such signals are disclosed. High...
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7394261 |
Semi-conductor chip package capable of detecting open and short
A semiconductor chip package capable of detecting an open and a short is disclosed, comprising: a first pad group comprising a plurality of first substrate pad sub groups, formed on a substrate,...
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7394241 |
Method and apparatus for testing power switches using a logic gate tree
A method for testing power switches using a logic gate tree, the method includes providing a logic gate tree electrically connected to a plurality of power switches, each output node of the...
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7388366 |
Test system connection system with triaxial cables
A connection system for connecting test equipment to a device under test (DUT) includes a first pair of equal-length triaxial cables, each having a desired characteristic impedance between a center...
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7388394 |
Multiple layer printed circuit board having misregistration testing pattern
A method of testing for misregistration in a multiple layer printed circuit board includes providing an electrical test pattern on one or more layers of the board, testing for an electrical signal...
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7388365 |
Method and system for inspecting specimen
Method and system for obtaining a potential distribution image of a specimen using two probes having two probes contacted with a patterned surface of the specimen, a scanning unit for scanning a...
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7385386 |
Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober
A probe card transporting apparatus includes a truck and transporting mechanism. The truck can move on a floor surface freely. The transporting mechanism is arranged above the truck to be able to...
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7385385 |
System for testing DUT and tester for use therewith
A tester configured to stack with at least one other tester to provide a test system for simultaneously testing a number of devices in parallel on different testers, or testing a device having more...
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7385406 |
Automated electrical wiring inspection system
The present invention is directed to an electrical wiring inspection system. The system includes an electrical measurement apparatus having at least one load center connector configured to couple...
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7383746 |
Compliance module, particularly for a manipulator for positioning a test head, and one such manipulator
A compliance module, particularly for a manipulator for positioning a test head, comprising a housing that is securable to a component. The compliance module furthermore comprises an inner sleeve...
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7382117 |
Delay circuit and test apparatus using delay element and buffer
There is provided a delay circuit that delays an input signal to output the delayed signal. The delay circuit includes a first delay element operable to receive the input signal and delay the input...
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7378864 |
Test apparatus having multiple test sites at one handler and its test method
A test apparatus includes one handler connected to a tester and one test board divided into two or more sites or two or more test boards. Since only the sites on the test board (or test boards)...
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7378837 |
Method and system for calibrating a micro-electromechanical system (MEMS) based sensor using tunneling current sensing
A system and method for controlling a tunneling current between a first element and a second element of a micro-electro-mechanical system (MEMS) sensor. The system includes a tunneling current...
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7378834 |
Electronic assembly tester and method for optoelectronic device
An electronic assembly tester for testing an electrical component of an optoelectronic device. The electrical component includes a transmit and receive port. The tester includes of a base, an arm,...
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7378835 |
Interleaved differential multiplexer
An N-wire interleaved differential multiplexer. The N-wire interleaved differential multiplexer may be formed by interleaving the channels and corresponding switches of N one-wire multiplexers....
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7378862 |
Method and apparatus for eliminating automated testing equipment index time
The present invention eliminates the indexing time of an SOC tester, or at least reduces it to the time delay for an electronic switch to toggle or a mechanical shift to occur between two banks of...
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7375508 |
Device and a process for the calibration of a semiconductor component test system
A device and a process for the calibration of a semi-conductor component test system The invention relates to a process and a device for the calibration of a probe card and/or of a semi-conductor...
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7375540 |
Process monitor for monitoring and compensating circuit performance
A method and system for monitoring and compensating the performance of an operational circuit is provided. The system includes one or more integrated circuit chips and a controller. Each integrated...
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7372252 |
Automated platform for electronic apparatus environmental testing & method of use
An automated platform for electronic apparatus environmental testing and the methods of its operation holds and positions electronic devices during environmental testing. The automated platform may...
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7372250 |
Methods and apparatus for determining a position of a substrate relative to a support stage
A sensing system includes a plurality of probes arranged in a spaced relation around a stage that is adapted to support a substrate. Each probe includes a detection portion adapted to move from a...
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7372251 |
Semiconductor integrated circuit and memory test method
A semiconductor integrated circuit has a memory operating on a first clock. A memory device captures first output data, being output from the memory in synchronization with the first clock,...
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7373574 |
Semiconductor testing apparatus and method of testing semiconductor
A semiconductor testing apparatus, includes a test signal generating unit that generates a test signal corresponding to a test pattern to output the generated test signal to a device under test...
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7368902 |
Impedance calibration for source series terminated serial link transmitter
Substantially-accurate calibration of output impedance of a device-under-test (DUT) to within a predetermined range of allowable impedance. The DUT is part of a source series terminated (SST)...
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7368933 |
Method for testing standby current of semiconductor package
A system and method for testing standby current of a semiconductor package is provided. The method includes testing semiconductor chips formed on a wafer having a predetermined wafer run number,...
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7365555 |
Semiconductor device, method for testing the same and IC card
A semiconductor device has a boosting circuit configured to generate a boosting potential to an output line. An internal circuit is supplied with the boosting potential from the boosting circuit...
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7365552 |
Surface mount package fault detection apparatus
A fault detection apparatus for surface mount packages is provided. The apparatus can include a retainer for releasably securing a circuit board such as a printed circuit board having an electrical...
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