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7005884 |
Monitoring apparatus for monitoring electrical drive current for an electric motor
Monitoring apparatus is for monitoring a parameter, such as a drive current to a motor. Motor current flows through a series resistor which provides a voltage signal which varies in response to...
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7002336 |
Test adapter for a weapon store test set
A method and apparatus for testing the electrical power system of an aircraft uses existing unmodified test equipment not otherwise capable of reliably testing and certifying the aircraft for...
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6998837 |
Serial communication testing
A coupling unit provides a signal path between at least two of: a first device under test (DUT), and first and second couplers. The first coupler is coupled to a signal analyzer. The second coupler...
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6998865 |
Semiconductor device test arrangement with reassignable probe pads
A test arrangement includes a semiconductor device, a first conductive pad electrically connected to the semiconductor device, a second conductive pad, and a programmable fuse. The second...
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6998862 |
Test socket for semiconductor components having serviceable nest
A test socket for a semiconductor component includes a base, a movable lid, socket contacts for electrically engaging terminal contacts on the component, and a retention mechanism for the...
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6998861 |
Wiring board and soldering method therefor
A circuit board for surface mounting by solder flow an electronic component having narrow lead pitches, the board having a first solder leading land having a first side and located on the circuit...
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6998863 |
Arrangement for providing electrical connections to pin electronics cards in test head
A test head for a semiconductor integrated circuit tester, the test head includes a housing, a backplane structure attached to the housing in a manner permitting pivotal movement of the backplane...
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6995578 |
Coupling unit, test head, and test apparatus
A coupling unit for electrically coupling a performance board on which an electronic device is mounted and a tester control unit for generating a control signal for controlling a test of the...
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6995581 |
Apparatus and method for detecting and rejecting high impedance failures in chip interconnects
A method and corresponding apparatus for detecting and rejecting high impedance failures in chip interconnects use monitoring circuitry on a chip to provide accurate and pro-active prediction of...
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6992498 |
Test apparatus for testing integrated modules and method for operating a test apparatus
A test apparatus for testing integrated modules has a plurality of connection locations on a carrier substrate. An integrated module may be connected, via a connection location, to a test unit...
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6992475 |
Circuit and method for determining at least one voltage, current and/or power value for an integrated circuit
A circuit and a method determine at least one electrical characteristic variable for an integrated circuit. Two or more successively produced states of a reference signal are recorded and counted...
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6992474 |
Movement actuator/sensor systems
A feedback control system, comprising a flexible rod that may have an anchored end and a free end, the rod free end movable upon the application of electric potential to the rod, a current source...
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6987382 |
System with functional and selector circuits connected by mode lead
A wafer of semiconductor material is processed to form integrated circuit dies. The dies are to be singulated or separated and encapsulated for sale and use as integrated circuits. Before...
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6988229 |
Method and apparatus for monitoring and controlling boundary scan enabled devices
A system for monitoring and controlling boundary scan chains in real time that does not require the use of test vectors or test executives. The system automatically builds virtual Devices Under...
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6984972 |
Carrier transporting apparatus, method of transporting a carrier and transporting apparatus
A carrier transporting apparatus comprises a thermostat for testing devices loaded on a carrier, and the carrier is carried out from the thermostat through an opening formed in the thermostat. A...
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6984974 |
Independently-adjustable circuit board carrier
A carrier of circuit boards includes a base frame having a plurality of first card guides disposed on its upper surface, the first card guides for securing respective first side edges of a...
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6984973 |
Part transfer apparatus, control method for part transfer apparatus, IC test method, IC handler, and IC test apparatus
A configuration having two drive shafts, a drive system 4 connected to one end of each drive shaft for rotationally driving the respective drive shaft, and a holding and transfer mechanism 5, 6 ...
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6982567 |
Combination optical and electrical metrology apparatus
A combination metrology tool is disclosed for analyzing samples, and in particular semiconductor samples. The device includes a first measurement module for determining electrical characteristics...
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6982551 |
Integrated circuit test device
A test device for testing integrated circuits includes a lid and a base joined at a hinge and secured together with a latch. Within the base is a socket body that electrically connects the...
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6979996 |
Apparatus and method for automatic elimination of round-trip delay errors induced by automatic test equipment calibration
A Dual Channel Mode for selecting specific waveform sets or characters in the applied data eliminates round trip delay errors in automatic test equipment. Drive waveforms and data are directed by a...
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6979997 |
Method of controlling the operation of a digital state machine from a master controller in an IC-chip testing system
An IC-chip testing system includes multiple digital state machines, and a master controller which controls the operation of those digital state machines by a particular method. In this method, the...
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6980012 |
Wafer probe station for low-current measurements
A probe station includes a fully guarded chuck assembly and connector mechanism for increasing sensitivity to low-level currents while reducing settling times. The chuck assembly includes a...
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6977494 |
Switchable impedance circuit for current sensing an electricity meter
An arrangement for generating a digital current measurement signal includes an analog-to-digital (A/D) converter and an impedance circuit. The A/D converter is operable to receive a voltage input...
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6977493 |
Electrical power probe for testing and supplying power to electrical wiring and devices
An electrical power probe is provided. In one aspect, an electrical power probe includes a power probe control unit adapted to connect to a direct current (DC) power source and receive an input...
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6975130 |
Techniques for controlling movement of a circuit board module along a card cage slot
A control system indicates whether a module should be inserted into a module holder. The control system includes a sensor which is configured to attach to one of a module and the module holder. The...
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6975105 |
Side supports with adjustable center of gravity
An apparatus is used for coupling a test head to a mounting unit such as a cradle in which the test head pivots. A base is attachable to a test head. An extension member extends away from the test...
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6975106 |
Phase locked time interval analyzer
A method of analysis of a time interval between two selected measurement edges of interest includes locking a plurality of at least three substantially interchangeable oscillators to a common...
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6972585 |
Semiconductor integrated circuit device and digital measuring instrument
In a semiconductor integrated circuit device having a DRAM 30 , the DRAM 30 has an internal refresh period measuring circuit 20 . Supplied with a test mode command as an external command, a...
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6972586 |
Panel inspection apparatus
A panel inspection apparatus that contacts a PDP electrode, which is arranged on a display panel, with high accuracy. An inspection unit includes a pressurizing lever for pressing an inspection...
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6971793 |
Test handler temperature monitoring system
The invention provides a temperature monitoring system for a semiconductor test handler. A preparation stage brings a test device to a predetermined temperature for testing at a test platform at...
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6972584 |
Power decoupling circuit for loop powered time-of-flight ranging systems
A power decoupling circuit for a time-of-flight ranging or level measurement system coupled to a current loop. The level measurement system receives power from the current loop and includes a loop...
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6972581 |
Apparatus for handling electronic components and method for controlling temperature of electronic components
A handler 1 is provided with an inner chamber 104 containing inside thereof heat sinks 40 of pushers 30 , a temperature adjusting unit 91 for controlling the atmosphere temperature inside...
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6970008 |
Chip testing machine with rotary conveying disk set for receiving and conveying the chips for testing
A chip testing machine includes a testing mechanism for acquiring data of chips and sorting same into several different groups according to outcome of testing operation, a feeding mechanism for...
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6969985 |
Active coupler
A coupler circuit for sampling an output power of a signal from an output power source has at least one first sampling element for sampling a first portion of the signal and at least one second...
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RE38894 |
Method and apparatus for testing integrated circuits
There is an IC (integrated circuit) testing device 11 that receives singulated ICs from a singulation station's bottom table 44 , where an IC 15 has slid down onto loading ramp or track 16 ....
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6969620 |
Semiconductor device inspection system
A device inspection apparatus inspects a plurality of semiconductor devices on an individual device basis. An inspection target sorting part ( 8 ) omits an execution of an inspection to be applied...
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6970009 |
Single-transistor two resistor circuit which translate test signals to selectable voltage levels
A signal translator circuit, for use in sending test signals to an IC-chip in a chip testing system, includes first and second resistors, and a single transistor. The transistor has a current...
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6970006 |
Apparatus for the automated testing, calibration and characterization of test adapters
The apparatus enables the automated testing, calibration and characterization of test adapters for semiconductor devices. A holder for the test adapter can be rotated in a defined manner. At least...
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6967493 |
Probe card and contactor of the same
A probe card used for measuring electrical characteristics of a semiconductor device such as an LSI chip and comprising a contactor mounting substrate on which a plurality of contactors are...
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6967487 |
Distributed diode fault check
A method and apparatus for testing for latent faults in the isolation devices of a system including redundant power supplies which supply power to one or more system units. A system controller is...
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6967475 |
Device transfer mechanism for a test handler
The invention provides a mechanism for a test handler using for electrical testing of electronic devices. The devices are placed on a platform configured to move semiconductor devices from an...
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6967474 |
Device for positioning an electronic test head with respect to a manipulator for manipulating electronic components, in particular integrated circuits
A device for positioning an electronic test head with respect to a manipulator for manipulating electronic components, in particular integrated circuits, includes a supporting structure fitted to a...
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6967495 |
Dynamic burn-in apparatus and adapter card for dynamic burn-in apparatus
In an adapter card, is a clock signal converting circuit converts a clock signal, output from a signal generator of a burn-in apparatus, from a lower—to a higher-frequency clock signal. Plural...
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6965248 |
Compensation for test signal degradation due to DUT fault
An electronic device tester channel transmits a single test signal to multiple terminals of electronic devices under test (DUTs) through a set of isolation resistors. The tester channel employs...
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6963212 |
Self-testing input/output pad
The present invention teaches an apparatus for testing the circuitry in an input/output (I/O) pad without probing the contact site on the I/O pad. A dominant driving circuit has an output coupled...
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6963208 |
Probe device, probe card channel information creation program, and probe card information creation device
A probe device includes a supporting member for supporting the probe card having a plurality of channels. Each of the channels has a group of probes which are brought into contact with plural...
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6963209 |
Apparatus and method for calibrating equipment for high frequency measurements
Calibration standards for accurate high frequency or wide bandwidth calibration measurements. A “short” or “reflect” standard is formed in a printed circuit board from a conductive coating...
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6963198 |
Signal detection contactor and signal correcting system
A signal detection contactor has a contactor main body and a plurality of coaxial bodies. Each coaxial body includes a core wire. The core wire is used for coming into contact with a probe of a...
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6963210 |
Various electrical characteristics and small test point testing module
A various electrical characteristics and small test point testing module comprised of a carrier plate, a guide correction layer, a clamp pin layer, linear probes, first cushioning components,...
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6960908 |
Method for electrical testing of semiconductor package that detects socket defects in real time
An electrical testing method for a semiconductor package for detecting defects of sockets mounted on a device under test (DUT) board is provided. A tester performs electrical test, accumulates...
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