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7106049 |
Zero-temperature-gradient zero-bias thermally stimulated current technique to characterize defects in semiconductors or insulators
A process for characterizing defects in semiconductors or insulators using a zero-bias thermally stimulated current technique wherein parasitic current is eliminated by the use of a novel ZBTSC...
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7106073 |
Method and system for area efficient charge-based capacitance measurement
The present invention is directed to a system for area efficient charge-based capacitance measurement requiring a minimum silicon area for probe pads. A structure block for the system includes...
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7102420 |
Semiconductor device and manufacturing method thereof
Some of the members constituting a semiconductor element are formed from α-Si and an HSG forming process is implemented to form hemispherical polysilicon grains at some of the members formed from...
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7102377 |
Packaging reliability superchips
A test chip module for testing the integrity of the flip chip solder ball interconnections between chip and substrate. The interconnections are thermally stressed through an array of individual...
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7102375 |
Pin electronics with high voltage functionality
In one aspect, the invention is an integrated circuit (IC) for use in testing a device. The IC includes a pin electronics (PE) driver having an output and a pin. The IC also includes a buffer...
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7102373 |
Inspection unit
A conductive member has a first face adapted to be mounted on a board on which an inspection circuit is arranged and a second face adapted to be opposed to a device to be inspected. The conductive...
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7098647 |
Coaxial cable unit, test apparatus, and CPU system
A testing apparatus for testing a device under test, includes a power source for generating a current, a coaxial cable unit for supplying the current to the device under test, a detecting unit for...
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7098650 |
Apparatus for planarizing a probe card and method using same
An apparatus for use with a wafer prober and a probe card comprising a stiffening member having a feature defining a first plane. The stiffening member is mountable atop the central portion of the...
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7098649 |
Testing circuits on substrates
The invention provides a method of testing a circuit on a substrate. Generally speaking, a substrate is located in a transfer chuck, a surface of a test chuck is moved into contact with a...
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7098681 |
Semiconductor device, method for testing the same and IC card
A semiconductor device has a boosting circuit configured to generate a boosting potential to an output line. An internal circuit is supplied with the boosting potential from the boosting circuit...
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7098652 |
Analytical circuit for an inductive sensor
An analytical circuit for an inductive electromagnetic sensor with external excitation ( 1 ) generates an output signal which is transformed to give an output signal (out), by means of...
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7098648 |
Automatic range finder for electric current testing
In an electrical circuit for testing electrical current using a plurality of precision resistors connected in parallel or in series, a range finder for receiving the current to be measured with the...
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7095242 |
In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing trays
A burn-in board for burn-in and electrical testing of a plurality of integrated circuit devices that are disposed in one or more processing trays may include a substrate having an interface surface...
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7091715 |
Method and apparatus for micro-machined sensors using enhanced modulated integrative differential optical sensing
Method and apparatus for sensing the displacements of micromachined devices and sensors. The method is referred to as the enhanced modulated integrative differential optical sensing (EMIDOS). The...
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7091716 |
Multilayer wiring board, manufacturing method therefor and test apparatus thereof
A built-in component type multilayer wiring board includes at least one resin layer and at least one frame resin layer. The resin layer includes electronic components buried therein. The frame...
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7092827 |
Edge placement accuracy of signals generated by test equipment
A software controlled mechanism causing a test equipment to place the edges of test signals accurately. The mechanism determines expected time of occurrence of an edge of a signal in relation to a...
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7088092 |
Silicon-on-insulator channel architecture for automatic test equipment
A channel architecture for use in automatic test equipment is disclosed. The channel architecture comprises pattern generation circuitry and timing circuitry responsive to the pattern generation...
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7088124 |
Utilizing clock shield as defect monitor
Disclosed is a shielded clock tree that has one or more clock signal buffers and clock signal splitters, with clock signal wiring connecting the clock signal buffers to the clock signal splitters....
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7088119 |
Mechanism for testing printed circuit board
A mechanism for testing a printed circuit board. The mechanism includes a holder, an expansion board and at least one fixing member. The expansion board has a first edge where a contact zone is...
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7088998 |
Method and product palette for testing electronic products
A product palette for carrying an electronics product on a production line for electronics products. The product palette includes a signal interface for establishing a signal connection between the...
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7088121 |
Non-contact method and apparatus for on-line interconnect characterization in VLSI circuits
A system that facilitates non-invasive in-line characterization of parameters of VLSI circuit interconnects is provided. A plurality of micro-electro-mechanical system (MEMS) cantilevers apply...
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7088123 |
System and method for extraction of C-V characteristics of ultra-thin oxides
In one embodiment, a method for extracting C-V characteristics of ultra-thin oxides includes coupling a device under test to a testing structure, in which the device under test includes a plurality...
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7088091 |
Testing a multi-channel device
In one embodiment, a method includes routing first test data from a first channel of a device to a second channel of the device, and outputting the first test data from the second channel. The...
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7084618 |
Parallel bus debugging tool
A system and method for testing the signals on a parallel communication bus uses a single printed circuit board that connects to the bus. The signals from the bus may be passively and actively...
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7084651 |
Probe card assembly
A method and apparatus for testing, the apparatus including: a probe array mounted on an inner portion of a gimbaled bearing, the inner portion of the gimbaled bearing having a spherical surface...
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7084652 |
Non-destructive contact test
A non-destructive contact test method and apparatus for testing an electric characteristic of a test object is provided. The method includes providing an apparatus having a conductor, wherein the...
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7082683 |
Method for attaching rod-shaped nano structure to probe holder
The present invention relates to a method for manufacturing a probe for detecting surface signals or chemical signals through a long and slender rod-shaped nano structure such as tungsten nanowire,...
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7081635 |
High activity, spatially distributed radiation source for accurately simulating semiconductor device radiation environments
The present invention pertains to radiation sources that mimic radiation environment(s) encountered by packaged semiconductor devices. The sources are suitable for use in test systems operative to...
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7081768 |
Device for testing printed circuit boards
A device for testing printed circuit boards ( 1 ) that have contact points ( 3 ) arranged in a pattern. The device includes a needle plate ( 4 ) that is parallel to the printed circuit board ( 1 )...
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7081869 |
Test fixture for assembled wireless devices
A fixture for radio frequency (“RF”) testing of an assembled wireless device, the wireless device having a removable casing concealing one or more RF spring connectors, the fixture comprising:...
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7078890 |
Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment
A clamping assembly for connecting a first plurality of contacts to a second plurality of contacts on a circuit board. The circuit board has a first outer face and a second outer face. The second...
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7078925 |
Method and apparatus for detecting and correcting wiring errors in power monitoring applications
A three-phase monitoring system for detecting and dynamically correcting wiring errors in an electrical circuit. The system includes a voltage divider circuit and a current transformer circuit...
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7078889 |
Semiconductor test apparatus for testing semiconductor device that produces output data by its internal clock timing
A recovery clock synchronized with an internal clock faster than a system clock is obtained with an edge timing of the system clock output from a DUT. The present invention includes: a time...
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7076391 |
Methods and systems for asynchronously testing a plurality of disk drives
An asynchronous system for testing disk drives includes a test platform that includes a plurality of slots for receiving and for providing communication with drives. The slots are segregated into a...
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7075323 |
Large substrate test system
A method and system for testing one or more large substrates are provided. In one or more embodiments, the system includes a testing chamber having a substrate table disposed therein. The substrate...
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7075325 |
Method and apparatus for testing semiconductor devices using an actual board-type product
Semiconductor devices are tested under actual operating conditions by interfacing the devices to an actual board-type product, for example, through a test board tat includes a mounting unit such as...
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7071487 |
Wafer-level package having test terminal
A wafer-level package includes a semiconductor wafer having at least one semiconductor chip circuit forming region each including a semiconductor chip circuit each provided with test chip terminals...
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7068942 |
Selection of IC Vdd for improved voltage regulation of transciever/transponder modules
An integrated circuit for use at a reduced Vdd voltage. An integrated circuit is designed and implemented such that it is usable at a voltage less than an industry standard Vdd voltage. The...
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7068026 |
Sensor signal circuit and measuring instrument
A sensor signal circuit of the present invention includes a tacho generator ( 42 ) for detecting revolution speed of a motor and outing a detection result as a sensor signal converted to a voltage,...
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7064568 |
Optical testing of integrated circuits with temperature control
Method and apparatus for optically testing (e.g., using a laser beam) an operating integrated circuit (device under test—DUT) that actively control the operating temperature of the DUT. This is...
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7064535 |
Measurement circuit with improved accuracy
A measurement circuit for measuring input voltages in an automatic test system includes a pedestal source, a differential amplifier, and a feedback amplifier. The differential amplifier measures a...
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7061227 |
Apparatus and method for calibrating a semiconductor test system
A process and device for calibrating a semiconductor component test system includes a first connection, at which a corresponding signal, in particular a calibration signal can be input, and a...
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7061260 |
Calibration device for the calibration of a tester channel of a tester device and a test system
A calibration device for the calibration of a tester channel of a tester device is provided. The calibration device includes a connecting device and a planar contact carrier with a first contact...
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7057411 |
Semiconductor integrated circuit including test pins and method for testing thereof
A semiconductor integrated circuit comprises a plurality of data output pins, a test pin, a data processing circuit for generating output signals in response to input signals, and an output circuit...
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7057410 |
Interface structure for semiconductor integrated circuit test equipment
An interface structure for use in a semiconductor integrated circuit tester for connecting a test head interface to a DUT interface includes a first frame member having first and second opposite...
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7057401 |
Electrical wiring inspection system
A system for testing and documenting the electrical wiring in a building, for example, includes a Portable Circuit Analyzer (PCA) that is connected to the building's Load Center through an...
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7057397 |
Output impedance measurement techniques
Systems and methods are disclosed for providing output impedance measurement techniques. For example, in accordance with an embodiment of the present invention, a system includes a controller...
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7053647 |
Method of detecting potential bridging effects between conducting lines in an integrated circuit
A method and system for detecting a potential reliability problem cause by electrical bridging in an integrated circuit. A voltage difference is created between two conducting lines in the...
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7053636 |
Probe device for electrical testing an integrated circuit device and probe card using the same
The present probe device comprises an insulative body, at least one supporter positioned in the insulative body, a probe positioned substantially at the center of the supporter, and a conductive...
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7053642 |
Method and apparatus for enabling reliable testing of printed circuit assemblies using a standard flying prober system
A method and apparatus allows adapting a standard flying prober system to probe test point targets on Printed Circuit Assemblies (PCAs) having irregularities in their planarity. The method and...
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