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4331708 |
Method of fabricating narrow deep grooves in silicon
A method of fabricating deep grooves having submicron widths in a semiconductor substrate. A pattern of submicron oxidation masking elements formed on the substrate surface serves as an oxidation...
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4307180 |
Process of forming recessed dielectric regions in a monocrystalline silicon substrate
A method of forming surface planarity to a substrate during removal of excess dielectric material when fabricating recessed regions of dielectric material in a semiconductor device wherein a...
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4278705 |
Sequentially annealed oxidation of silicon to fill trenches with silicon dioxide
A process for making dielectrically isolated silicon integrated circuits which use silicon oxide filled trenches to provide isolation is described. To minimize damage to the silicon, the trenches...
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4271583 |
Fabrication of semiconductor devices having planar recessed oxide isolation region
In the fabrication of semiconductor integrated circuits which include recessed oxide isolation regions (29), formation of the undesired "bird's head" and "bird's beak" is avoided by reducing the...
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4264409 |
Contamination-free selective reactive ion etching or polycrystalline silicon against silicon dioxide
Disclosed is an improved Reactive Ion Etching (RIE) technique for etching polycrystalline silicon or single crystal silicon as must be done in Very Large Scale Integration (VLSI) using silicon...
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4211582 |
Process for making large area isolation trenches utilizing a two-step selective etching technique
A method for making wide, deep recessed oxide isolation trenches in silicon semiconductor substrates. A semi-conductor substrate is selectively etched to produce a spaced succession of narrow,...
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4182636 |
Method of fabricating self-aligned contact vias
A fabrication method is disclosed for providing self-aligned (i.e., misregistration tolerant or "borderless") contact vias for electrical connections between metal interconnection lines and...
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4169000 |
Method of forming an integrated circuit structure with fully-enclosed air isolation
A method for forming a fully-enclosed air isolation structure which comprises etching a pattern of cavities extending from one surface of a silicon substrate into the substrate to laterally...
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4139442 |
Reactive ion etching method for producing deep dielectric isolation in silicon
A method for producing deeply recessed oxidized regions in silicon. A series of deep trenches are formed in a silicon wafer by a reactive ion etching (RIE) method. In a first species, the trenches...
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4104086 |
Method for forming isolated regions of silicon utilizing reactive ion etching
A method for isolating regions of silicon involving the formation of openings that have a suitable taper in a block of silicon, thermally oxidizing the surfaces of the openings, and filling the...
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4081823 |
Semiconductor device having porous anodized aluminum isolation between elements thereof
An integrated circuit having dielectric isolation is fabricated by growing a double epitaxial layer of N-type semiconductive material onto a P-type substrate. A dielectric layer is formed over the...
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4044454 |
Method for forming integrated circuit regions defined by recessed dielectric isolation
In the fabrication of integrated circuits, a method is provided for forming dielectrically isolated regions in a silicon substrate comprising initially introducing conductivity-determining...
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4045249 |
Oxide film isolation process
In an oxide film isolation process wherein a groove portion is formed in that region of a semiconductor substrate in which an isolation layer is to be formed, oxygen or nitrogen is implanted into...
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4039359 |
Method of manufacturing a flattened semiconductor device
A method of manufacturing a semiconductor device whose surface is flattened, comprises the steps of forming a first semiconductor oxide film at selected areas of a surface of a semiconductor...
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3998673 |
Method for forming electrically-isolated regions in integrated circuits utilizing selective epitaxial growth
An improved process for forming electrically-isolated regions in integrated circuits in the form of dielectric moats surrounding the regions and P-N junctions underlying the regions. Moats or...
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3997378 |
Method of manufacturing a semiconductor device utilizing monocrystalline-polycrystalline growth
In the manufacture of a semiconductor device, when an epitaxially-grown layer is formed on a semiconductor substrate partially formed with an oxide, a polycrystalline layer is formed on the oxide;...
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3970486 |
Methods of producing a semiconductor device and a semiconductor device produced by said method
A method of making a semiconductor device is described in which a selected surface portion of a silicon wafer is masked against oxidation, and then the surface is oxidized to grow a thermal oxide...
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3891469 |
Method of manufacturing semiconductor device
A method of manufacturing a semiconductor device in which the regions of elements formed within the same silicon substrate are insulatingly isolated from each other by a silicon dioxide region...
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3795846 |
AN INTEGRATED SEMI-CONDUCTOR DEVICE HAVING FUNCTIONAL REGIONS ISOLATED BY P-N JUNCTIONS THEREBETWEEN
An integrated semiconductor rectifier device comprising a semiconductor substrate having a pair of mutually opposed principal surfaces, said substrate including a plurality of function regions of...
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3400309 |
Monolithic silicon device containing dielectrically isolatng film of silicon carbide
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3343255 |
Structures for semiconductor integrated circuits and methods of forming them
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3725146 |
Title is not available
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3597287 |
Title is not available
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