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6767781 |
Structure and method of forming bitline contacts for a vertical DRAM array using a line bitline contact mask
A bitline contact and method of forming bitline contact for a vertical DRAM array using a bitline contact mask. In the method, gate conductor lines are formed. An oxide layer is deposited over the...
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6759726 |
Formation of an isolating wall
A method of forming an isolating wall in a semiconductor substrate of a first conductivity type, including the steps of boring in the substrate separate recesses according to the desired isolating...
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6740953 |
High frequency integrated devices
The present invention has an object to provide a high frequency integrated device which can obtain sufficient isolation even in a high frequency region of which handling frequency exceeds...
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6740954 |
Semiconductor device reducing junction leakage current and narrow width effect
A semiconductor device for reducing junction leakage current and mitigating the narrow width effect, and a fabrication method thereof, are provided. The semiconductor device includes a...
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6740910 |
Field-effect transistor, circuit configuration and method of fabricating a field-effect transistor
The gate region of a field effect transistor comprises at least one through hole wherein a nanoelement is provided which is electrically coupled to the source and the drain. The nanoelement may...
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6740955 |
Trench device isolation structure
A method of forming a trench device isolation structure, wherein, after forming a trench in a predetermined area of a semiconductor substrate, a lower isolation pattern, an upper liner pattern, and...
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6724798 |
Optoelectronic devices and method of production
The invention includes both devices and methods of production. A device in accordance with the invention includes a top surface and a bottom surface, a through wafer via extending from the top...
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6700142 |
Semiconductor wafer on which is fabricated an integrated circuit including an array of discrete functional modules
The present invention provides a semiconductor wafer that has a predetermined global functionality and comprises a top surface, a bottom surface and a peripheral edge between the top surface and...
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6700144 |
Semiconductor device and method for manufacturing the same
A semiconductor device includes the following: a semiconductor substrate of a first conduction type; an intrinsic semiconductor layer of the first conduction type formed on the semiconductor...
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6690080 |
Semiconductor structure for isolation of semiconductor devices
In an integrated circuit, particularly an integrated circuit for radio frequency applications, a semiconductor structure for isolation of semiconductor devices that includes a semiconductor...
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6680517 |
Anisotropic conductive film, production method thereof, and display apparatus using anisotropic film
An anisotropic conductive film which can be appropriately applied for the display apparatus by which the user can directly write characters•figures on the display, or erase characters and figures...
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6677225 |
System and method for constraining totally released microcomponents
A system and method are disclosed which constrain a microcomponent that is totally released from a substrate for handling of such totally released microcomponent. A preferred embodiment provides a...
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6673484 |
IC device, circuit board and IC assembly
An IC assembly includes: a circuit board; an IC device mounted on the circuit board, said IC device including an IC placed on the circuit board and a plurality of connecting terminals for fixing...
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6670691 |
Shallow trench isolation fill process
A method for filling narrow isolation trenches during a semiconductor fabrication process is disclosed. The semiconductor includes both high-aspect ratio narrow isolation trenches formed in a core...
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6667530 |
Semiconductor device and manufacturing method thereof
Photosensitive insulating films are laminated on lower-layer interconnection layers and a connection hole is formed in the photosensitive insulating film, and a interconnection groove is formed in...
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6653708 |
Complementary metal oxide semiconductor with improved single event performance
A junction isolated Complementary Metal Oxide Semiconductor (CMOS) transistor device includes a substrate of a first conductivity type and first and second buried layers formed within the substrate...
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6653709 |
CMOS output circuit with enhanced ESD protection using drain side implantation
A new cascaded NMOS transistor output circuit with enhanced ESD protection is achieved. A driver PMOS transistor has the source connected to a voltage supply, the gate connected to the input...
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6642598 |
Semiconductor device
In the semiconductor device according to the present invention having a plurality of function macro formation regions on the principal face of a semiconductor substrate, the plurality of the...
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6623845 |
Glass-ceramic composition, and electronic component and multilayer LC composite component using the same
A multilayer LC composite component includes a glass-ceramic composition and internal electrodes containing silver or copper as a main component. The multilayer LC composite component is...
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6621144 |
Data receiver gain enhancement
An improved data receiver gain enhancement is obtained in circuit by having a V/I converter and an amplifier stage, by placing a passive filter between in converter and amplifier stage....
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6620534 |
Film having enhanced reflow characteristics at low thermal budget
A method of forming a film having enhanced reflow characteristics at low thermal budget is disclosed, in which a surface layer of material is formed above a base layer of material, the surface...
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6617686 |
Semiconductor device and method of isolating circuit regions
A semiconductor device ( 10 ) includes a semiconductor die ( 14 ) having first and second circuit regions ( 30, 32 ) formed on a first surface ( 24 ). The semiconductor die is housed in a...
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6608361 |
On-chip inductor using active magnetic energy recovery
An active inductor circuit includes a primary and a secondary coil and a drive circuit monolithically integrated on a common substrate to provide high-Q inductors. Each inductor circuit comprises a...
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6600207 |
Structure to reduce line-line capacitance with low K material
A structure to reduce line—line capacitance using low dielectric constant (K) materials is provided. Embodiments in accordance with the present invention are semiconductor devices having a single...
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6593637 |
Method for establishing component isolation regions in SOI semiconductor device
A method for making an SOI semiconductor device including a silicon substrate includes implanting oxide and Nitrogen into the substrate and then annealing to drive Oxygen and Nitrogen through and...
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6576974 |
Bipolar junction transistors for on-chip electrostatic discharge protection and methods thereof
An integrated circuit device receiving signals from a signal pad that includes at least one silicon bipolar junction transistor responsive to the signals from the signal pad for providing...
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6576975 |
Organic semiconductor devices using ink-jet printing technology and device and system employing same
An emission system for presenting visual image is disclosed. The emissive system typically contains first electrodes ( 90 ) deposited over and in contact with a substrate. One or more conjugated...
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6576345 |
Dielectric films with low dielectric constants
Thin films possessing low dielectric constants (e.g., dielectric constants below 3.0) are formed on integrated circuits or other substrates. Caged-siloxane precursors are linked in such a way as to...
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6570237 |
Semiconductor device with a protective diode having a high breakdown voltage
A semiconductor device forms a protective diode with a high breakdown voltage at a power terminal of a power IC. An N-type well is formed in a P-type semiconductor substrate, the well electrically...
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6559514 |
Semiconductor memory device having auxiliary conduction region of reduced area
A semiconductor memory device includes a semiconductor substrate; a plurality of word lines provided on the semiconductor substrate and arranged in parallel to each other; a plurality of memory...
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6548881 |
Method and apparatus to achieve bond pad crater sensing and stepping identification in integrated circuit products
Method for stepping identification and bond pad crater jeopardy identification in integrated circuits and apparatus which performs the method, A unique device, a polysilicon meander, is formed...
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6545337 |
Semiconductor integrated circuit device
Collector regions ( 32, 33 ) with films capable of withstanding high voltage by laminating 4 epitaxial layers when the collector regions ( 32, 33 ) are formed. In order to reduce effects caused by...
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6545336 |
Semiconductor device, and method of manufacturing the same
There is described a semiconductor device which has an isolation region, the isolation region being polished by means of chemical-and-mechanical polishing, and which prevents occurrence of...
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6541839 |
Microelectronics structure comprising a low voltage part provided with protection against a high voltage part and method for obtaining said protection
A microelectronic structure with a low voltage part and high voltage part, such that the low voltage part is protected against the high voltage part and process of obtaining this protection. The...
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6534840 |
Semiconductor device having self-aligned structure
A sidewall insulating film is formed on the side faces of a gate electrode on a substrate. A trench isolation film is also formed to be self-aligned with the gate electrode. The upper surface of...
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6534869 |
Method for reducing stress-induced voids for 0.25 &mgr m micron and smaller semiconductor chip technology by annealing interconnect lines prior to ILD deposition and semiconductor chip made thereby
A method for making 0.25-micron semiconductor chips includes annealing the metal interconnect lines prior to depositing an inter-layer dielectric (ILD) between the lines. During annealing, an alloy...
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6525391 |
Nickel silicide process using starved silicon diffusion barrier
A MOSFET semiconductor device includes a substrate, a gate electrode, a gate oxide, first and second sets sidewall spacers, and nickel silicide layers. The gate oxide is disposed between the gate...
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6525394 |
Substrate isolation for analog/digital IC chips
The specification describes techniques for isolating noisy subcircuits in integrated analog/digital devices. Isolation is obtained using a modification of triple well isolation wherein the deep...
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6525392 |
Semiconductor power device with insulated circuit
A semiconductor power device with an insulated control circuit is formed in a chip of semiconductor material having predominantly a first type of conductivity. The device includes a region having a...
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6512282 |
Semiconductor device and method for fabricating the same
A sidewall insulating film is formed on the side faces of a buried gate electrode on a substrate. A trench isolation film, self-aligned with the gate electrode, is also formed so that the upper...
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6501330 |
Signal processing semiconductor integrated circuit device
A semiconductor integrated circuit comprising a first circuit block including an oscillation circuit considered to be a noise generator and a second circuit block including circuits considered to...
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6489850 |
Crosstalk suppression in differential AC coupled multichannel IC amplifiers
A multichannel parallel IC amplifier includes a plurality of amplifier circuits formed on an IC substrate. Each amplifier circuit is coupled to respective inputs via a pair of capacitors. The...
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6465864 |
Diode structure on MOS wafer
Three diode structures on a metal-oxide-semiconductor (MOS) wafer. Each diode structure is capable of reducing parasitic current through the wafer and hence increasing the power conversion...
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6462385 |
Semiconductor memory device with latch-up suppression
A semiconductor memory device has a semiconductor substrate, a peripheral circuit region and a memory cell region on the principal surface of the semiconductor substrate. The semiconductor memory...
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6445048 |
Semiconductor configuration having trenches for isolating doped regions
A semiconductor configuration includes a substrate having a first conduction type. A transistor configuration is disposed at the substrate and is formed from at least one field-effect transistor...
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6433370 |
Method and apparatus for cylindrical semiconductor diodes
Semiconductor diodes are diode connected cylindrical junction field effect devices having one diode terminal as the common connection between a top gate, a back gate and a first channel terminal of...
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6424019 |
Shallow trench isolation chemical-mechanical polishing process
A process for fabricating a trench filled with an insulating material in a surface of an integrated circuit substrate is described. One step of the process includes defining a masking layer on a...
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6410972 |
Standard cell having a special region and semiconductor integrated circuit containing the standard cells
The present invention provides a standard cell which can reduce an effective cell size and improve an integration degree of a semiconductor integrated circuit. The standard cell includes a...
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6369418 |
Formation of a novel DRAM cell
A DRAM cell capacitor is described. Capacitor formation and cell isolation methods are integrated by using support sidewalls to form vertical DRAM capacitors. Doped polysilicon adjacent to the...
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6368952 |
Diffusion inhibited dielectric structure for diffusion enhanced conductor layer
Within a method for forming a microelectronic fabrication, there is first provided a substrate. There is then formed over the substrate a microelectronic device passivated with a patterned first...
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