Matches 1 - 42 out of 42
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7538367 Avalanche photodiode  
The present invention provides an avalanche photodiode capable of raising productivity. An n-type InP buffer layer, an n-type GaInAs light absorption layer, an n-type GaInAsP transition layer, an...
7511357 Trenched MOSFETs with improved gate-drain (GD) clamp diodes  
A MOSFET device that includes a first Zener diode connected between a gate metal and a drain metal of said semiconductor power device for functioning as a gate-drain (GD) clamp diode. The GD clamp...
7071525 Merged P-i-N schottky structure  
A Merged P-i-N Schottky device in which the oppositely doped diffusions extend to a depth and have been spaced apart such that the device is capable of absorbing a reverse avalanche energy...
7015556 Packaging substrate and manufacturing method thereof, integrated circuit device and manufacturing method thereof, and saw device  
A basic portion layer 21 of a substrate electrode 12 a connected to a projecting electrode 13 electrically and mechanically on a substrate member of ceramics. The substrate member on which...
7012337 Semiconductor device including a photosensitive resin covering at least a portion of a substrate having a via hole  
A semiconductor device includes a substrate with a via hole. An electrode is formed on a surface of the substrate so that a portion of the electrode extends through the via hole. A photosensitive...
6936868 Sequential mesa avalanche photodiode capable of realizing high sensitization and method of manufacturing the same  
A sequential mesa type avalanche photodiode (APD) includes a semiconductor substrate and a sequential mesa portion formed on the substrate. In the sequential mesa portion, a plurality of...
6921952 Torsion spring for MEMS structure  
A torsion spring for a MEMS structure has a plurality of beams, each beam having two ends wherein both ends are fixed to a predetermined area, and at least one connection bar disposed at a right...
6855587 Gate-controlled, negative resistance diode device using band-to-band tunneling  
A new gate-controlled, negative resistance diode device is achieved. The device comprises, first, a semiconductor layer in a substrate. The semiconductor layer contains an emitter region and a...
6759744 Electronic circuit unit suitable for miniaturization  
The electronic circuit unit of the present invention includes first and second insulating substrates on respective surfaces of which wiring patterns are formed, and thick-film passive elements...
6274922 Fabrication of high power semiconductor device with a heat sink and integration with planar microstrip circuitry  
A low cost highly integrated method of fabricating a heat sink on the backside of a power semiconductor device maintains device performance, improves thermal transfer, and enables reliable planar...
6075276 ESD protection device using Zener diodes  
A semiconductor device is provided which includes a first conductivity type semiconductor substrate, a second conductivity type Zener region formed in a surface layer of the first conductivity type...
5917227 Light-emitting-diode array and light-emitting-diode element  
A light-emitting-diode array includes a non-doped compound semiconductor layer between a substrate and a first compound semiconductor layer. A plurality of isolation regions extend from the first...
5612556 Monolithic integration of microwave silicon devices and low loss transmission lines  
A monolithic integrated circuit capable of operation in the microwave range which is fabricated using silicon technology wherein transmission line interconnects are fabricated along with active...
5559359 Microwave integrated circuit passive element structure and method for reducing signal propagation losses  
A passive element structure and method for a microwave integrated circuit reduces signal propagation losses. In one approach, a passive element (10) has an insulating layer (12) overlying a silicon...
5371400 Semiconductor diode structure  
Desirably, a Schottky barrier semiconductor diode has low forward direction rising voltage and high inverse direction yield voltage. A semiconductor device is provided with a first metal producing...
5343065 Method of controlling surge protection device hold current  
The hold current of a breakover type surge protection device is increased by irradiating the device with γ or x rays so as to form crystal lattice defects in the semiconductor regions thereof.
5278444 Planar varactor frequency multiplier devices with blocking barrier  
A planar frequency tripler comprised of two semiconductor diode structures connected back-to-back by an n + doped layer (N + ) of semiconductor material utilizes an n doped semiconductor material...
5140382 Microwave integrated circuit using a distributed line with a variable effective length  
In this invention, a distributed constant line on a microwave IC is formed of a Schottky metal, and a semiconductor conductive layer contacting the distributed constant line at least at one...
5086329 Planar gallium arsenide NPNP microwave switch  
A microwave switch is provided for controlling the transmission of microw energy in a microstrip transmission line structure. The microwave switch comprises an electrically conducting ground plane...
4706041 Periodic negative resistance microwave structures and amplifier and oscillator embodiments thereof  
Structures (30) with IMPATT type diodes (34) located periodically along a transmission line (38-32) to simulate a distributed diode are disclosed. Preferred embodiments include incorporation of the...
H000029 Tunnett diode and method of making  
A TUNNETT (tunneling transit time) electronic device comprising a very thin injector uniformly doped at a high concentration, a thin drift region of lower doping of the same semiconductivity type,...
4352115 Transit time diode with an input structure formed by a matrix of micropoints  
A semiconducting diode utilizing the transit time of electrical charge carriers in a semiconductor medium, having an input structure formed by a matrix of micropoints, said matrix consisting of a...
4286276 Dual Schottky contact avalanche semiconductor structure with electrode spacing equal to EPI layer thickness  
A semiconductor structure comprising two conventional electrodes of an avalanche diode and furthermore a supplementary electrode. In a preferred embodiment the conventional and supplementary...
4201604 Process for making a negative resistance diode utilizing spike doping  
A modified Read-type diode having an extremely thin doping spike and with the electric field in the drift region terminated before the buffer zone. The buffer zone and a drift region are first...
4197551 Semiconductor device having improved Schottky-barrier junction  
A semiconductor device having an improved non-diffusive Schottky-barrier junction and metallization layers and method for producing the same. A thin layer of a Schottky-barrier forming metal such...
4106959 Producing high efficiency gallium arsenide IMPATT diodes utilizing a gas injection system  
The operating frequency of an IMPATT diode depends on the width of the depletion region formed during operation. The frequency of high efficiency GaAs IMPATT diodes comprising a non-uniformly doped...
4060820 Low noise read-type diode  
A Read-type avalanche diode having a low noise measure and capable of attaining output signal powers of one watt or more. An effective injection current is defined as the conduction current in the...
4034394 Schottky semiconductor device  
A Schottky semiconductor device includes a gallium arsenide substrate, a first metal layer formed of niobium, tantalum or vanadium to define a Schottky junction with the substrate, a second metal...
4033810 Method for making avalanche semiconductor amplifier  
A microwave semiconductor amplifier or oscillator system in which a semiconductor device has an avalanching region at a junction and a heat sink having a higher thermal conductivity than said...
4001858 Simultaneous molecular beam deposition of monocrystalline and polycrystalline III(a)-V(a) compounds to produce semiconductor devices  
Described is a molecular beam technique for fabricating semiconductor devices from Group III(a)-V(a) compounds. To form planar isolated devices, an amorphous insulative layer is formed on selected...
3986192 High efficiency gallium arsenide impatt diodes  
The operating frequency of an IMPATT diode depends on the width of the depletion region formed during operation. The frequency of high efficiency GaAs IMPATT diodes comprising a non-uniformly doped...
3921192 Avalanche diode  
An avalanche diode including an active region having a barrier side and a collector side in which the net activator concentration in a first zone of the active region adjacent the barrier side is...
3904449 Growth technique for high efficiency gallium arsenide impatt diodes  
High efficiency GaAs Schottky barrier IMPATT diodes comprising a non-uniformly doped depletion region are fabricated by instantaneously injecting a known volume of a known concentration of dopant...
3896479 Reduced stresses in III-V semiconductor devices  
Substrate tensile stresses resulting from the combination of an electroplated gold or silver heat sink with a metal contact on III-V semiconductor devices, such as GaAs IMPATT diodes, may be...
3739243 SEMICONDUCTOR DEVICE FOR PRODUCING OR AMPLIFYING ELECTRIC OSCILLATIONS  
A Tunnel Transit Time Microwave Device is described, employing a Schottky barrier.
3701050 SOLID STATE MICROWAVE OSCILLATING DEVICE  
The present invention provides a device for producing microwave oscillations which generally comprises a solid state oscillating element and a cavity resonator, said element comprising a...
3655540 METHOD OF MAKING SEMICONDUCTOR DEVICE COMPONENTS  
Extremely thin semiconductor wafers are formed by growing an N-conductivity epitaxial layer on an N + -type substrate. A Schottky barrier contact is formed on the epitaxial layer and the assembly...
3638082 PNPN IMPATT DIODE HAVING UNEQUAL ELECTRIC FIELD MAXIMA  
This invention relates to a high-frequency semiconductor device wherein the internal built-in electric field distribution in a semiconductor is made to have two peak values under a DC bias...
3621466 NEGATIVE RESISTANCE AVALANCHE DIODE STRUCTURES  
Undesired electron trapping in a Read diode is prevented in one embodiment by using a p+pnin+ structural configuration. In another embodiment, a metal-nin+ configuration is used, with the...
3493823 NEGATIVE-RESISTANCE SEMICONDUCTOR DEVICE FOR HIGH FREQUENCIES  
3466512 IMPACT AVALANCHE TRANSIT TIME DIODES WITH HETEROJUNCTION STRUCTURE  
3558366 Title is not available  
Matches 1 - 42 out of 42