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7151281 |
Light-emitting diode structure with electrostatic discharge protection
A light-emitting diode (LED) structure with electrostatic discharge (ESD) protection is described. The LED includes a substrate, a patterned semiconductor layer, a first electrode and a second...
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7151298 |
Electrostatic discharge protection network having distributed components
An electrostatic discharge protection network comprising electrostatic discharge (ESD) clamp devices distributed between turns of a coil shaped inductor. The inductance of the coil shaped inductor...
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7145204 |
Guardwall structures for ESD protection
A semiconductor circuit for protecting an I/O pad against ESD events comprising a pMOS transistor ( 510 ) in a first n-well ( 511 ) having its source connected to Vdd and the first n-well, and its...
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7145187 |
Substrate independent multiple input bi-directional ESD protection structure
In a multiple input ESD protection structure, the inputs are isolated from the substrate by highly doped regions of opposite polarity to the input regions. Dual polarity is achieved by providing a...
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7141831 |
Snapback clamp having low triggering voltage for ESD protection
An SCR device having a first P type region disposed in a semiconductor body and electrically connected to anode terminal of the device. At least one N type region is also disposed in the body...
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7138701 |
Electrostatic discharge protection networks for triple well semiconductor devices
An electrostatic discharge protection network that uses triple well semiconductor devices either singularly or in a series configuration. The semiconductor devices are preferably in diode junction...
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7138987 |
Protection circuit for input and output of liquid crystal display
There is provided an input-output (I/O) protective circuit having more stable I/O protective function for use in the liquid crystal display device. An IO protective circuit includes: a resistance ...
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7135743 |
Electrostatic discharge protection device with complementary dual drain implant
Off-chip driver (OCD) NMOS transistors with ESD protection are formed by interposing an P-ESD implant between the N+ drain regions of OCD NMOS transistors and the N-well such that the P-ESD...
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7132697 |
Nanomaterials for quantum tunneling varistors
So-called quantum tunneling varistors are made with a matrix of particles having a nonconductive coating that is deposited on core conductive particles using atomic layer deposition methods. The...
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7129589 |
Use of an internal on-chip inductor for electrostatic discharge protection of circuits which use bond wire inductance as their load
A circuit includes a plurality of circuit components formed on a semi conductive substrate die and a bond wire. The plurality of circuit components include at least one active component that...
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7129144 |
Overvoltage protection device and manufacturing process for the same
An overvoltage protection device has a voltage-limiting region parallel to its central junction to produce a transverse junction breakdown. The spacing between the voltage-limiting region and the...
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7129545 |
Charge modulation network for multiple power domains for silicon-on-insulator technology
An SOI integrated circuit includes ESD protection on an SOI chip. A first power domain and a second power domain are provided in the SOI chip. In one embodiment, a charge modulation network in the...
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7126204 |
Integrated semiconductor circuit with an electrically programmable switching element
The invention relates to a semiconductor circuit ( 20 ) having an electrically programmable switching element ( 10 ), an “antifuse”, which includes a substrate electrode ( 2 ), produced in a...
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7119405 |
Implantation method to improve ESD robustness of thick gate-oxide grounded-gate NMOSFET's in deep-submicron CMOS technologies
An implantation method to improve ESD robustness of thick-oxide grounded-gate NMOSFET's in deep-submicron CMOS technologies. Based on standard process flow in DGO, a thick gate-oxide ESD device is...
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7115952 |
System and method for ESD protection
An integrated receiver with channel selection and image rejection substantially implemented on a single CMOS integrated circuit is described. A receiver front end provides programable attenuation...
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7115951 |
Low triggering voltage ESD protection structure and method for reducing the triggering voltage
In a triggering ESD protection structure, the triggering voltage is reduced by introducing one or more corners or spikes into the p-n breakdown junction. This may be done by providing a polygate...
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7112853 |
System for ESD protection with extra headroom in relatively low supply voltage integrated circuits
An ESD protection system providing extra headroom at an integrated circuit (IC) terminal pad. The system includes an ESD protection circuit having one or more first diodes coupled in series between...
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7110229 |
ESD protection circuit and display panel using the same
An ESD protection circuit for low temperature poly-silicon thin film transistor panel and a display panel using the same. The feature of the ESD protection circuit comprises an ESD detection...
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7109533 |
Electrostatic discharge protection device
There is provided an electrostatic discharge protection device comprising a P conductive type first P well region 101 formed in a P type epitaxial layer 31 being deposited on a surface of a P+...
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7105860 |
Flip chip light-emitting diode package
A flip chip light-emitting diode package comprising a Schottky diode group, a light-emitting diode and a plurality of bumps is provided. The Schottky diode group comprises a plurality of Schottky...
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7102196 |
Multi-layered printed circuit board for efficient electrostatic discharge protection
Disclosed is a multi-layered PCB of mobile communication terminals that may improve ESD protection of LCD through efficiently protecting LCD signal lines such as data lines and control lines from...
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7102195 |
Transistor structure for electrostatic discharge protection circuit
An electrostatic discharge (ESD) protection device includes a semiconductor layer, a source region formed in the layer, a drain region formed in the layer, a channel region in the layer between the...
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7098509 |
High energy ESD structure and method
In one embodiment, a concentric ring ESD structure includes a first p-type region and a second p-type region are formed in a layer of semiconductor material. The two p-type regions are coupled...
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7098488 |
Insulated gate bipolar transistor
An IGBT having a trench gate structure is disclosed which generates decreased noise at switching and displays superiority in saturation voltage to turn-off loss characteristics (trade-off...
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7098510 |
Multifinger-type electrostatic discharge protection element
A multifinger ESD protection element has between an input wiring to which a surge current is input and a reference-potential wiring, 2n-number (where n is a natural number of 2 or greater) of...
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7098512 |
Layout patterns for deep well region to facilitate routing body-bias voltage
Layout patterns for the deep well region to facilitate routing the body-bias voltage in a semiconductor device are provided and described. The layout patterns include a diagonal sub-surface mesh...
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7098522 |
High voltage device with ESD protection
A high voltage device. A high voltage MOS transistor is applied in the ESD protection device to the structure of which a doped region is added, generating a parasitic semiconductor controlled...
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7091098 |
Semiconductor device with spacer having batch and non-batch layers
A semiconductor device including a gate stack located over a substrate and a spacer located over the substrate and adjacent the gate stack. The spacer includes a plurality of layers, wherein at...
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7091554 |
Semiconductor device
A semiconductor device with high turn off capability includes a plurality of stripe trench lines which are provided in each of adjacent cell regions of a semiconductor layer in parallel and...
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7091588 |
Semiconductor device including primary and secondary side circuits on first and second substrates with capacitive insulation
A primary side circuit and a secondary side circuit are provided on first and second semiconductor substrates, respectively. A first capacitive insulator on the first substrate electrically...
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7087968 |
Electrostatic discharge protection circuit and semiconductor circuit therewith
An ESD protection circuit is adapted for an integrated circuit with a first power source and a second power source. The ESD protection circuit comprises a first silicon controlled rectifier (SCR),...
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7081659 |
Semiconductor apparatus having a built-in electric coil and a method of making the semiconductor apparatus
A semiconductor apparatus includes lower conductive film strips, an inter-layer insulating layer, implanted conductive members, and upper conductive film strips. The lower conductive film strips...
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7081654 |
Method and system for a programmable electrostatic discharge (ESD) protection circuit
An electrostatic discharge (ESD) protection device is disclosed. The ESD protection device comprises a source diffusion in a substrate and a deeper body diffusion in the substrate. The ESD...
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7078772 |
Whole chip ESD protection
This invention provides two circuit embodiments for a whole chip electrostatic discharge, ECD, protection scheme. It also includes a method for whole chip ESD protection. This invention relates to...
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7075156 |
Collector structure for electrostatic discharge protection circuits
Electrostatic discharge (ESD) devices for protection of integrated circuits are described. ESD devices may be configured to provide uniform breakdown of finger regions extending through a first...
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7074687 |
Method for forming an ESD protection device
An ESD protection device ( 20 ) comprises an N-type epitaxial collector ( 21 ), a first, lightly doped, deep base region ( 221 ) and second, highly doped, shallow base region ( 222 ) that extends a...
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7075154 |
Electrostatic discharge protection device
An electrostatic discharge protection device formed on a substrate. The electrostatic discharge protection device includes a first isolation region formed over the substrate, an active region...
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7075155 |
Structure for protecting a semiconductor circuit from electrostatic discharge and a method for forming the structure
A structure for protecting a semiconductor circuit from electrostatic discharge is provided. The structure comprises a semiconductor substrate of a first conductivity type having two wells of a...
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7075123 |
Semiconductor input protection circuit
A lateral PNP transistor PB and a lateral NPN transistor NB are serially connected between an input terminal and a reference potential (ground potential). In the transistor PB, a diode D 1 is...
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7071514 |
Electrostatic discharge protection device
A compact ESD protection device is described that uses the reverse breakdown voltage of a base-emitter junction as a trigger diode to switch a transistor that shunts the forward bias ESD current to...
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7071528 |
Double-triggered silicon controlling rectifier and electrostatic discharge protection circuit thereof
A double-triggered silicon controller rectifier (SCR) comprises a plurality of N+ diffusion areas, a plurality of P+ diffusion areas, a first N-well region, a second N-well region and a third...
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7067887 |
High voltage device and high voltage device for electrostatic discharge protection circuit
A high voltage device for an electrostatic discharge protection circuit is provided. A silicon layer is disposed in a substrate. A first type well and a second type well are disposed in the silicon...
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7067852 |
Electrostatic discharge (ESD) protection structure
An ESD protection structure includes a semiconductor substrate of a first conductivity type, and first and second well regions of a second conductivity type disposed in the substrate. The first and...
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7067884 |
Electrostatic discharge device
M pieces of n-well regions nW are provided on a main surface of a p-type silicon substrate 3 , and p-well regions pW are provided among the n-well regions adjacent to one another. Moreover, each...
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7067883 |
Lateral high-voltage junction device
A lateral high-voltage junction device for over-voltage protection of an MOS circuit includes a substrate having a first junction region separated from a second junction region by a substrate...
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7067878 |
Field effect transistor
A MOS field effect transistor. A field relaxation layer of a gate overlap structure is disposed in contact with a drain region for the purpose of relaxation of the electric field by increasing a...
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7064418 |
Method and structure of diode
A method and a structure of a diode are provided. The diode is used in an electrostatic discharge protection circuit using TFT (Thin Film Transistor) fabrication technology. A semiconductor layer...
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7064392 |
Semiconductor device
In an N-channel type field effect transistor constituting an input/output protection circuit, an N-type well 1 a with a lower dopant concentration than the source region 3 c is formed under the...
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7061052 |
Input protection circuit connected to protection circuit power source potential line
An input protection circuit capable of precisely bypassing a surge current to a power source terminal and protecting the gate of a protective transistor from an electrostatic surge. The input...
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7061051 |
SCR-ESD structures with shallow trench isolation
A novel device structure and process are described for an SCR ESD protection device used with shallow trench isolation structures. The invention incorporates an SCR device with all SCR elements...
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