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6586793 |
Ferroelectric memory and manufacturing method thereof
A ferroelectric memory includes first and second plugs respectively connected to one and the other of source/drain regions of the transistor formed on a semiconductor wafer. A first capacitor...
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6573547 |
Method for forming cell capacitor for high-integrated DRAMs
A method for forming a cell capacitor used for a high-integrated DRAM is disclosed which guarantees interfacial properties of aluminum oxide and excellent leakage current preventive properties by...
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6570202 |
Ferroelectric integrated circuit having low sensitivity to hydrogen exposure and method for fabricating same
A hydrogen barrier layer is formed above a ferroelectric thin film in an integrated circuit. The hydrogen barrier layer is directly over a protected segment of the ferroelectric thin film, while a...
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6570207 |
Structure and method for creating vertical capacitor and anti-fuse in DRAM process employing vertical array device cell complex
An integrated circuit chip is provided having both a conventional DRAM vertical transfer device and an integrated vertical storage capacitor or anti-fuse that can be accessed directly without...
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6566701 |
Encapsulated conductive pillar
The present invention provides an encapsulated 3-D conductive pillar and a method of formation thereof. Significant economic savings are achieved by filling a substantial portion of the volume of...
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6567260 |
Capacitor and semiconductor memory
In order to reduce a leakage current of a storage node ( 120 ), a rough semiconductor film ( 108 ) provided in the storage node ( 120 ) includes a portion ( 108 a ) forming a side face of the...
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6566753 |
Composite iridium barrier structure with oxidized refractory metal companion barrier
An Ir—M—O composite film has been provided that is useful in forming an electrode of a ferroelectric capacitor, where M includes a variety of refractory metals. The Ir combination film...
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6563183 |
Gate array with multiple dielectric properties and method for forming same
The invention provides an integrated circuit fabricated on a semiconductor substrate. The integrated circuit comprises a first field effect transistor and a second field effect transistor. The...
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6563153 |
Electrically tunable device and a method relating thereto
A thin film ferroelectric varactor device comprising a substrate layer, a ferroelectric layer structure and an electrode structure is presented. The ferroelectric layer structure comprises a number...
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6559499 |
Process for fabricating an integrated circuit device having capacitors with a multilevel metallization
A process for fabricating trench capacitors in an interconnect layer of a semiconductor device is disclosed. In the process, at least one interconnect is formed in the interconnect layer, which is...
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6555864 |
Ferroelectric capacitor having a PZT layer with an excess of Pb
A ferroelectric capacitor includes a lower electrode, a ferroelectric capacitor insulation film formed on the lower electrode and an upper electrode formed on the ferroelectric capacitor insulation...
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6551896 |
Capacitor for analog circuit, and manufacturing method thereof
Rapid thermal nitridation is carried out to form a nitride film on a lower electrode which is made of silicon, and a tantalum oxide dielectric film is further formed thereon. Then, wet oxidization...
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6552385 |
DRAM memory capacitor having three-layer dielectric, and method for its production
A DRAM capacitor is described that contains a BaSrTiO 3 (BST) dielectric. The dielectric has a three-layer structure enabling the formation of a potential trough in which electrons can be...
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6552379 |
Semiconductor device and manufacturing method thereof
A semiconductor device with capacitors which have a structure wherein fluctuation in thickness does not occur, even in the case that a dielectric film of low coverage is used. The semiconductor...
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6552388 |
Hafnium nitride gate dielectric
A field effect semiconductor device comprising a high permittivity hafnium (or hafnium-zirconium) nitride gate dielectric and a method of forming the same are disclosed herein. The device comprises...
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6552377 |
Mos transistor with dual metal gate structure
A method for making a ULSI MOSFET includes depositing a high-k gate insulator on a silicon substrate and then depositing a field oxide layer over the gate insulator. The field oxide layer is masked...
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6548854 |
Compound, high-K, gate and capacitor insulator layer
A gate or capacitor insulator structure using a first grown oxide layer, a high-k dielectric material on the grown oxide layer, and a deposited oxide layer on the high-k dielectric material. The...
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6548368 |
Method of forming a MIS capacitor
Provided is a method of integrating Ta 2 O 5 into an MIS stack capacitor for a semiconductor device by forming a thin SiON layer at the Si/TaO interface using low temperature remote plasma...
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6541812 |
Capacitor and method for forming the same
A capacitor useful with semiconductor devices and a method for forming such a capacitor is provided. The capacitor comprises a contact formed in a layer of an insulating material of a semiconductor...
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6541813 |
Capacitor and method for manufacturing the same
The capacitor related to the present invention has a lower electrode, a dielectric film provided on the lower electrode and made mainly of crystal containing at Ti, O and at least one element...
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6541811 |
Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layer
A semiconductor structure includes a dielectric layer having first and second opposing sides. A conductive layer is adjacent to the first side of the dielectric layer and is coupled to a first...
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6537861 |
SOI transistor with body contact and method of forming same
An SOI field effect transistor is provided comprising a body contact that is isolated by a shallow trench that is formed into the body portion of the transistor, thereby eliminating any increase in...
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6534820 |
Integrated dynamic memory cell having a small area of extent, and a method for its production
An integrated dynamic memory cell having a small area of extent on a semiconductor substrate is described. The memory cell has a selection MOSFET with a gate connection area that is connected to a...
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6531354 |
Lanthanum oxide-based gate dielectrics for integrated circuit field effect transistors
Lanthanum oxide-based gate dielectrics are provided for integrated circuit field effect transistors. The gate dielectrics may include lanthanum oxide, preferably amorphous lanthanum oxide and/or an...
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6525366 |
Uniform dielectric layer and method to form same
An exemplary embodiment of the present invention discloses a method for forming a forming a storage capacitor having a uniform dielectric film, by a the steps of: forming a bottom electrode of the...
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6525365 |
Dielectric films and capacitor structures including same
The present invention provides a method for forming a dielectric film, e.g., a barium-strontium-titanate film, preferably having a thickness of less than about 600 Å. According to the present...
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6521930 |
Semiconductor device having Ta2O5 thin film
In the case where a Ta 2 O 5 thin film having double bond Ta═O is employed for a capacitative insulating film, Rapid Thermal Anneal in oxygen, and UV/O 3 treatment are executed at suitable...
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6518634 |
Strontium nitride or strontium oxynitride gate dielectric
A method of forming a capacitor and transistor are disclosed. Initially, a substrate having a semiconductor material on a first surface is provided. A layer of strontium nitride is then deposited...
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6515323 |
Ferroelectric memory device having improved ferroelectric characteristics
A ferroelectric capacitor with a ferroelectric film having a relatively larger amount of titanium constituent than zirconate constituent improves ferroelectric characteristics. The method for...
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6509601 |
Semiconductor memory device having capacitor protection layer and method for manufacturing the same
A semiconductor memory device having a capacitor protection layer and a method for manufacturing the same. A capacitor of the semiconductor memory device is entirely covered with an encapsulating...
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6507062 |
Capacitor for semiconductor memory device
A capacitor for a semiconductor memory device includes a semiconductor substrate, an interlayer insulation film formed on the semiconductor substrate, having contact plugs filled with a conductive...
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6506643 |
Method for forming a damascene FeRAM cell structure
A three-dimensional ferroelectric structure and fabrication method are provided. The ferroelectric capacitor structure permits immediate contact between a noble metal capacitor electrode and a...
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6504228 |
Semiconductor device and method for manufacturing the same
A lower electrode film is made to have a crystal grain laminated structure composed of a granular structure crystal grain layer and a columnar structure crystal grain layer. Also, a barrier layer...
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6501111 |
Three-dimensional (3D) programmable device
A three-dimensional (3D) memory device having polysilicon diode isolation elements for chalcogenide memory cells and method for fabricating the same are described. The memory device includes a...
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6501121 |
Semiconductor structure
A structure and method for forming a high dielectric constant device structure includes a monocrystalline semiconductor substrate and an insulating layer formed of an epitaxially grown oxide such...
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6498364 |
Capacitor for integration with copper damascene processes
The present invention provides a capacitor for use in a semiconductor device having a damascene interconnect structure, such as a dual damascene interconnect, formed over a substrate of a...
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6495879 |
Ferroelectric memory device having a protective layer
A ferroelectric memory device includes an array of memory cells each having a cell transistor and a ferroelectric capacitor, an insulator film overlying the ferroelectric capacitor and including...
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6495413 |
Structure for masking integrated capacitors of particular utility for ferroelectric memory integrated circuits
A method for fabricating integrated capacitors, of particular utility in forming a ferroelectric capacitor array for a ferroelectric memory integrated circuits, begins with provision of a...
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6492673 |
Charge pump or other charge storage capacitor including PZT layer for combined use as encapsulation layer and dielectric layer of ferroelectric capacitor and a method for manufacturing the same
A charge storage capacitor includes a bottom electrode, a dielectric layer formed on the bottom electrode, and a local interconnect electrode formed on the dielectric layer, wherein the dielectric...
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6486021 |
Method for manufacturing a semiconductor device having incorporated therein a high K capacitor dielectric
A semiconductor device for use in a memory cell includes an active matrix an active matrix provided with a semiconductor substrate, a plurality of transistors formed on the semiconductor substrate...
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6483143 |
Semiconductor device having a capacitor structure including a self-alignment deposition preventing film
In a semiconductor device including a plurality of memory cells, a deposition preventing film is formed on an interlayer insulating film in which a plurality of holes are formed, or a seed film is...
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6479856 |
Electrode and a capacitor and DRAM containing the same
A Layered product ( 70 ) is formed on a high-dielectric-constant layer ( 64 ). The layered product has a layered structure consisting of an upper electrode ( 71 ), a barrier layer ( 72 ), a stopper...
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6479849 |
Dielectric capacitor and memory and method of manufacturing the same
A bottom electrode, a dielectric film and a top electrode are sequentially provided on a substrate portion. The bottom electrode comprises an adhesive layer including IrHf, a precious metal layer...
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6475854 |
Method of forming metal electrodes
A capacitor structure comprising a bottom electrode, an insulator and a top electrode, and method for manufacturing the same. The bottom and top electrodes preferably include a metal portion and a...
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6475856 |
Capacitors and capacitor forming methods
The invention includes capacitors, capacitor forming methods, field effect transistors, and field effect transistor forming methods. In one aspect, a method of forming a layer including tungsten...
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6472700 |
Semiconductor device with isolation insulator, interlayer insulation film, and a sidewall coating film
A semiconductor device capable of suppressing increase in the junction leakage current and preventing deterioration in the electric characteristics even when the device is miniaturized, and a...
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6465826 |
Embedded LSI having a FeRAM section and a logic circuit section
An embedded LSI includes a FeRAM macro block and an associated logic circuit section. A hydrogen barrier layer covers the FeRAM macro block as a whole and exposes the logic circuit section. The...
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6465825 |
Thin film multilayered structure, ferroelectric thin film element, and manufacturing method of the same
A thin film multilayered structure comprises a single crystal Si substrate; a MgO buffer layer epitaxially grown on said single crystal Si substrate; and a metallic thin film made of Ir or Rh...
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6462368 |
Ferroelectric capacitor with a self-aligned diffusion barrier
A diffusion preventive layer extending between the bottom surface of a lower electrode and an interconnection connecting the lower electrode to one of the diffusion layer of a switching transistor...
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6459118 |
NAND type nonvolatile ferroelectric memory cell
NAND type non-volatile ferroelectric memory cell and non-volatile ferroelectric memory of the same, in which numbers of access to a main cell and a reference cell are made the same, to maintain...
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