Matches 1 - 50 out of 112 1 2 3 >


Match Document Document Title
8742385 Beam distortion control system using fluid channels  
Paper and continuous web scanners operate at varying and high temperature conditions that cause distortion of the support beams and ultimately misalignment of the scanner heads. Circulating a heat...
6710868 Optical inspection system with dual detection heads  
Apparatus for inspection of a sample includes an optical assembly made up of first and second optical heads with respective first and second levels of spatial resolution, such that the second...
6670627 Apparatus and method for continuous surface examination comprising a light shielding member at outer ends of the examined surface  
A surface examining apparatus irradiates an examinatorial light from a projector on a examined body that runs in a Z-direction. The projector is arranged at a distance from the surface of the...
6622621 Device for detecting register marks  
A device for detecting register marks includes at least one receiver for scanning register marks along a track disposed in a direction of movement of the register marks, and a device for...
6621082 Automatic focusing system for scanning electron microscope equipped with laser defect detection function  
A scanning electron microscope equipped with a laser defect detection function has an automatic focusing function that performs the steps of: obtaining a deviation (offset) amount between focal...
6538252 Method and device for determining the alignment of line formations in areal, especially longitudinally moved, webs of a structural formed body  
In a method for determining alignment of line formations of a web, a radiation source emitting radiation and a detector with numerous radiation sensors for sensing the radiation are provided. The...
6462813 Surface defect inspection system and method  
A system and method for detecting defects on a painted workpiece surface. The system includes an elongated line of light having a pair of sharp transition zones. The line of light falls onto a...
6426510 Device and method for inspecting pattern shapes  
An inspection device for inspecting pattern shapes of rectiles or mask patterns is disclosed. The inspection device includes a light source for irradiating inspection light, a scanning unit for...
6219135 Device for optically recording, digitally, a parameter on a longitudinally moved thread-type material  
The invention relates to a device and a method for the optical recording of at least one parameter on a longitudinally moved thread-type material. To enable parameters such as the diameter of a...
5917590 Optical inspection device and lithographic apparatus provided with such a device  
A description is given of an optical inspection device for inspecting two oppositely located surfaces (3, 4) of a transparent object (1), for example a lithographic mask. The device is constructed...
5808735 Method for characterizing defects on semiconductor wafers  
10A method is described for detecting and characterizing defects on a test surface of a semiconductor wafer. A three-dimensional image of the test surface is aligned and compared with a...
5798830 Method of establishing thresholds for image comparison  
A method is described for optimizing intensity-comparison thresholds used to compare test and reference images for defect detection. Intensity differences between corresponding pixels in the two...
5745244 Scanning device for scanning a physical property of a fibrous web  
The invention relates to a scanning device (1) for measuring physical properties of a moving fibrous web (2) which has two longitudinal edges and is intended to run in a predetermined path of...
5644392 Scanning system for lumber  
A scanning system for wood products to detect grain defects and product geometry simultaneously. Multiple scanner sets cast parallel beams of light at an angle of incidence in a plane that is...
5625197 Method of determining a scanning interval in surface inspection  
A scanning interval, at which an area illumination scans a subject surface for surface defect inspection, is determined based on a smallest histogram of histograms for a same value of picture...
5621220 Apparatus for evaluating measuring values  
An apparatus evaluates measuring values from a laminar material, wherein the laminar material is moving in a single plane in a predetermined direction, the laminar material being moved also being...
5615777 Egg candling system  
A light beam such a laser beam is used to scan the surface of an egg for flaws such as pin holes, cracks, thinned shell regions, etc. The light beam is vibrated with a rocking/rotating movement to...
5591985 Surface state inspecting system including a scanning optical system for scanning a surface to be inspected with a first light and for simultaneously scanning a diffraction grating with a second light  
A surface state inspecting system includes a scanning optical system for scanning a surface to be inspected, with first light and simultaneously for scanning a diffraction grating with second...
5559341 System for detecting defects in articles using a scanning width which is less than width of portion of the article scanned  
An apparatus for sensing the deflection of a beam directed at an article detects slight deflection of the beam when the beam is directed at a large angle of incidence. The large angle of incidence...
5471066 Defect inspection apparatus of rotary type  
A simple signal processing system is utilized to detect defects on the surface of a substrate formed with a circuit pattern at high speed. Light flux from a light source illuminates an inspection...
5459330 Process and device for the inspection of glass  
A process and a device for inspecting glass including the use of a laser to illuminate successive cross section planes YX of a piece of glass to be inspected by relative displacement of a light...
5448350 Surface state inspection apparatus and exposure apparatus including the same  
This invention relates to a surface state inspection apparatus, and more particularly, to a surface state inspection apparatus which is suitable for detecting foreign particles or pattern defects...
5412220 Optical scanning device for lumber  
The present invention relates to an optical scanning device for use in sawmills, to determine the severity and location of surface defects on lumber, for the purpose of grading and trimming,...
5389794 Surface pit and mound detection and discrimination system and method  
A surface pit and mound detection and discrimination system including a device for scanning a beam of radiation over a surface, and a mechanism for detecting a local slope on the surface for...
5337140 Optical detecting system wtih self-correction  
A laser beam particle-detecting apparatus can automatically detect the position of minute particles on a substrate. A laser beam can be scanned across the substrate, and optical detectors can...
5331178 Optical surface inspecting system for inspecting the surface of a rolling roll having mechanism for keeping clean a window through which a camera detects a condition of the rolling roll  
An optical surface inspecting system in accordance with the present invention forms still pictures of the surface of a rolling roll while the rolling roll is rotating. The optical surface...
5210592 Method and apparatus for determining the optical quality of a transparent plate  
Method for determining the optical quality of a transparent plate, particularly a float glass plate, in which two parallel light beams having a reciprocal spacing are directed onto the plate under...
5166535 Surface inspecting apparatus with surface inspection width adjustment  
A surface inspecting apparatus generates an inspecting width gate signal by in a procedure wherein when the subject matter is subjected to the scanning via the light beam, a counting means...
5155371 Apparatus for detecting deformations in pressed members  
A device for detecting deformations in the surface of a workpiece includes a light source for illuminating the surface of the workpiece; a detector situated at a fixed predetermined distance from...
5008558 System for detecting minute particles on or above a substrate  
A fine-particle measuring apparatus designed to measure fine particles attached to the surface of a substrate for a semiconductor device set in a processing unit for formation of films, etching,...
5006722 Flaw annunciator with a controllable display means for an automatic inspection system  
An annunciator system and method for indicating when the number of detected flaws in a moving web is greater than a preselected threshold. The method and system includes a controllable display...
4982105 Surface inspecting apparatus with strip width dividing means  
An apparatus for inspecting the surface of a web material moving lengthwise at a constant speed by scanning the surface in the direction of the width of the surface with a light beam. The scanned...
4947684 System and process for detecting properties of travelling sheets in the machine direction  
To determine machine-direction variations in measurements of a travelling sheet during production, the sheet is repeatedly traversed with a scanning sensor and, during each traverse, measurements...
4933566 Method of detecting tape defects  
A method of detecting tape defects according to a light amount signal obtained from the surface of a tape by scanning the width of the tape surface with a light beam is disclosed. The light beam...
4922337 Time delay and integration of images using a frame transfer CCD sensor  
A tachometer (32) monitors the speed of a continuously moving web or article (12). A lens (20) focuses an image of a portion of the web in an examination region (14) on image section (22) of a CCD...
4914308 Web defect scanning apparatus with incandescent illumination means  
In a scanning apparatus, a scanned transverse region of a moving web is illuminated by focused illumination from an elongate incandescent lamp with a long filament maintained in tension and...
4914309 Discriminating type flaw detector for light-transmitting plate materials  
This invention relates to a discriminating type flaw detector for detecting the types, sizes and locations of flaws existing in a light-transmitting plate material with high accuracy and high...
4868403 Surface inspecting apparatus  
An apparatus for inspecting the surface of web material moving lengthwise at a constant speed by scanning the surface in the direction of the width of the surface with a light beam. The scanned...
4861984 Surface inspection or ranging apparatus with image derotation  
Apparatus for measuring surface defects or the distance from the apparatus to a surface comprising means (37,38,43,44) for passing a beam (48) of light to the surface (11) at an angle other than...
4827142 Method and system for optically testing sawn timber for faults  
In a timber testing apparatus, use is made of an optical process, in which there is a linewise scanning of the timber surface at right angles to the longitudinal direction of the timber. If an...
4816666 Apparatus and methods for inspection of electrical materials and components  
A capacitor has a top plate 2 in the form of a photodiode array and a bottom plate 2. An RF source 3 is connected between plates 1 and 2. Insulating or semiconducting material to be tested is...
4794264 Surface defect detection and confirmation system and method  
A surface inspection defect detection and confirmation technique in which a beam of radiation is directed at the surface to be inspected; the radiation scattered from the surface is separately...
4764681 Method of and apparatus for electrooptical inspection of articles  
An electrooptical system in which workpieces are illuminated from a generally uniform source of light and are line scanned for light intensity deviations characteristic of defects. Pulse trains...
4760270 Method of and apparatus for comparing data signals in an electrooptical inspection system  
A system of detecting abrupt optical deviations in an object such as defects in a TV tube faceplate employing a line scan camera operated at a fixed scan frequency to feed analog video signals to...
4737650 Inspection apparatus  
A beam of radiation is scanned across a sheet 13 and is either reflected therefrom or transmitted therethrough. Faults in the sheet 13 deflect, scatter or alternate the beam which is then passed...
4731855 Pattern defect inspection apparatus  
A pattern defect inspection apparatus detects presence or absence of a defect in a pattern formed on a semiconductor wafer by scanning the pattern normally to the surface thereof by a coherent...
4715709 Surface flaw detecting method and apparatus  
A method for detecting flaws in a surface of an inspected object can moderate the requirements for inspection condition accuracy, particular for adjustment of spatial relationships among a laser...
4702283 Process and apparatus for inspecting woven fabric during its production on one or more looms  
Optical scanning and inspection of loomed fabric on one or more looms is carried out using a travelling optical scanner that scans an inspection area of fabric on a loom faster than the fabric...
4643230 Method and apparatus for the automatic monitoring of textile fabrics, especially woven fabrics  
The length of fabric is scanned continuously directly at the weaving machine and any defective variations from the texture judged to be normal are determined and displayed. Scanning is performed...
4591726 Optical fault seeking apparatus for webs  
In an optical fault seeking apparatus for webs moved in their longitudinal direction there is provided an optical scanning arrangement which generates a light bead on the surface of the web which...

Matches 1 - 50 out of 112 1 2 3 >