Matches 1 - 50 out of 203 1 2 3 4 5 >
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7560720 Methods and apparatuses of detecting foreign particles or faults in a plurality of filled containers  
A method of detecting unwanted objects or faults in containers containing a fluid or liquid includes: (a) moving the containers along a path of travel; (b) providing; a light source emitting light...
7542821 Multi-unit process spatial synchronization of image inspection systems  
A conversion control system is described that includes a database to store data defining a set of rules and an interface to receive local anomaly information from a plurality of different analysis...
7476834 Diagnosis system including correlating radiographed image data with patient information  
A diagnosis system includes an image generating apparatus for forming photographed image data and a control apparatus, wherein the image generating apparatus includes an FPD having an image...
7456948 Method for detecting particles and defects and inspection equipment thereof  
A method and equipment which includes an illustrated-spot illumination-distribution data table for storing an illumination distribution within an illustrated spot and which calculates a coordinate...
7417244 Surface inspection apparatus and method thereof  
An apparatus for detecting defects, including: a first illumination optical unit which illuminates from a normal direction or in the vicinity of the normal direction; a second illumination optical...
7394084 Method of generating image and illumination device for inspecting substrate  
For generating an image for inspection of a substrate, a camera is provided above this substrate with an optical axis orienting downward and a plurality of multi-colored light emitting members are...
7330583 Integrated visual imaging and electronic sensing inspection systems  
Integrated inspection and test systems for liquid crystal display (LCD) active plates. The integrated inspection and test systems may combine visual imaging inspection and an electronic sensing...
7202491 Method for sensing wafers located inside a closed wafer cassette  
Wafers in a cassette are mapped without having to open the cassette. The cassette is at least partially transparent to a particular type of radiation. A source of the radiation is directed into the...
7173270 Detector system for detecting a height of a particle, and lithographic apparatus and device manufacturing method including the same.  
A lithographic apparatus transfers a pattern from a patterning device onto a substrate and includes a projection system to project a patterned radiation beam onto the substrate; a controllable...
7166856 Apparatus and method to inspect display panels  
An apparatus and method to inspect a display panel that can correctly detect a defect of the display panel itself. In the method of inspecting the display panel, a first image is captured from the...
7104127 Nondestructive method for inspecting cladding tubes  
The present invention relates to a nondestructive method or inspecting defects of the cladding of a nuclear fuel rod, which is featured by a wave emitter obliquely discharging an inspection wave to...
7015445 Method for optimizing inspection speed in low, and fluorescent light applications without sacrificing signal to noise ratio, resolution, or focus quality  
The method for optimizing inspection speed during optical inspection of parts in high, low and fluorescent light applications. There are described autofocus mechanisms and methods optimized for...
7004421 Inspection device of winding appearance of tape and improvement processing method for the same  
To provide a winding appearance inspection device of a tape capable of gathering a line speed in an inspection process, as well as capable of inspecting a winding appearance of the tape wound on a...
6989548 Inspection device for metal rings of a continuously variable transmission belt  
An inspection device for metal rings of a Continuously Variable Transmission (CVT) V-belt which does not perform excessive detection of gloss marks as a detrimental manufacturing flaw configured...
6972422 Method for measuring particles in glass substrate  
Particles in a glass substrate are measured by executing following steps: sequentially conveying a plurality of glass substrates; scanning with a camera a unit area of a glass substrate in a...
6936836 Method and apparatus for examining fiber material traveling in a fiber processing machine  
An apparatus for evaluating a fiber web running in a card includes a camera for scanning the fiber web along a length and width portion thereof to detect useful fibers and empty locations in the...
6919557 Device for continuous movement of objects with symmetry, use for visual inspection and control  
A device for controlling a continuous movement of an object with symmetry of revolution ( 1 ) comprises a conveyor ( 5 ) having two parallel guides, ( 6 ) and at least one pair of belts ( 8 )...
6797976 Method and apparatus for examining defects in or on sheet material  
For examining defects in sheet material, in particular bank notes, the sheet material is convexly curved and tested in the area of the convex curvature. A detector is disposed tangentially to an...
6794635 Apparatus and method for detecting an amount of depolarization of a linearly polarized beam  
An apparatus and a method for detecting an amount of depolarization of a linearly polarized beam transmitted by a birefringent medium in the direction of the optical axis thereof includes a first...
6784447 Vision system with reflective device for industrial parts  
A machine vision inspection system for industrial parts such as plastic molded caps or the like can reliably detect defects at very high inspection rates on the order of 1600 per minute of a...
6753542 Defect detection apparatus and storage medium readable by computer  
According to the present invention, there is disclosed a defect detection apparatus comprising an illuminating unit which irradiates an inspection object with illuminating light, and an image...
6747697 Method and apparatus for digital image defect correction and noise filtering  
An adaptive median filter ( 40 ) provides dynamic detection and correction of digital image defects which are caused by defective or malfunctioning elements of a radiation detector array ( 20 )....
6686602 Patterned wafer inspection using spatial filtering  
Apparatus for spatial filtering includes a Fourier lens, adapted to collect radiation emitted from a point and to separate the collected radiation into spatial components in a Fourier plane of the...
6683687 Method and apparatus for assessing the effect of yarn faults on woven or knitted fabrics  
The assessment of the effects of yarn faults is carried out by simulating the fabric image. In a first step, the yarn is examined by a measuring member for parameters associated with the volume...
6671397 Measurement system having a camera with a lens and a separate sensor  
A measurement system ( 1 ) has a camera with a lens ( 12 ) and a separate sensor ( 10 ) mounted so that their planes ( 13,11 ) intersect at an object plane ( 3 ) according to the Scheimpflug...
6646280 Device and method for inspecting and cutting strips of security documents  
A device and a method for processing valuable documents, such as securities, involves the separating of sheets of such documents into strips of documents. These strips are inspected and are...
6633052 Discriminating paper sensor  
A paper sensor uses two sample and hold circuits which are fired by the phase and antiphase of an oscillator that also drives an infrared light emitting diode (LED). These circuits sample the...
6566674 Method and apparatus for inspecting substrates  
Apparatus for detecting defects in a substrate comprises a laser for providing a laser beam, and a bi-cell photodiode comprising two cells. Circuitry coupled to the bi-cell photodiode provides a...
6548821 Method and apparatus for inspecting substrates  
Substrate inspection apparatus in accordance with the invention comprises optics for reflecting a laser beam off of a substrate and a detector for detecting the reflected laser beam. If a defect is...
6546126 Method for automatically setting intensity of illumination fpr positional recognion and quality controlde  
A method for automatically setting illumination intensity of light sources used within either positional recognition devices or quality control devices that, in turn, are used in devices that...
6531707 Machine vision method for the inspection of a material for defects  
A machine vision method and system for inspecting a material. The system comprises a light source arranged to illuminate the material and an imaging device configured to acquire image data...
6525333 System and method for inspecting containers with openings with pipeline image processing  
A system and method of the present invention allows the inspection of an object having an annular opening, such as a container or can, and uses a plurality of cameras that acquire grayscale images...
6525331 Ball grid array (BGA) package on-line non-contact inspection method and system  
A method and apparatus is disclosed for non-contact, on-line inspection of objects including a ball grid array package by means of a shadow moiré technique combined with a novel flash...
6521906 Method and apparatus for measuring the distortion angle of a strip of textile, wherein a sensor array scans at progressively altered angles  
Method of measuring a distortion angle between the longitudinal extent of the weft threads or rows of stitches in a textile strip (T) that is being continuously transported in a transporting...
6493076 Method and arrangement for measuring wood  
The invention relates to a method and arrangement for measuring the quality of wood. The wood comprises not only a pure body but also components of bark and knots, having optical properties...
6486946 Method for discriminating between holes in and particles on a film covering a substrate  
P-polarized light or having a strong P-polarized component is directed onto a filmed substrate at two (or more) different incidence angles, one angle being relatively large and the other angle...
6437357 Glass inspection system including bright field and dark field illumination  
An inspection system for a sheet of glass. The system comprises a first laser and a second laser, each of which provide a sheet of light, a cylindrical lens system, and a first light detection...
6407404 Apparatus for the examining defect of monolithic substrate and method for examining the same  
An apparatus inputs an image of a regularly latticed-patterns. The inputted image data is transformed into frequency data by the Fourier transformation. The frequency data is restored into image...
6384421 Vision system for industrial parts  
A machine vision inspection system for industrial parts such as plastic molded caps or the like can reliably detect defects at very high inspection rates on the order of 1600 per minute of a...
6342704 Method and apparatus for detecting nitride residue on semiconductor wafers  
Residue such as nitride remaining on the surface of a semiconductor wafer following plasma etching using nitride is detected after the wafer is transferred from the etching chamber to an exit load...
6216432 Method for inspecting spinning bobbins and system for implementing such method  
The method which is applicable to the inspection of bobbins of yarn of any size, color and material, is based on the acquisition of images of the surface of the bobbin and on their processing by a...
6207946 Adaptive lighting system and method for machine vision apparatus  
A variable intensity lighting system for use with a machine vision apparatus for capturing high contrast images of articles to be inspected, such as semiconductor packages, includes an LED or...
6166393 Method and apparatus for automatic inspection of moving surfaces  
In a method an an apparatus for automatic inspection of moving surfaces using at least three different illumination/observation channels, the surface to be inspected under a bright field condition...
6153889 Method and an apparatus for inspecting articles  
An apparatus (42) for inspecting an as cast turbine blade (40), with impingement cooling passages (36) (see FIG. 2 ), comprises a vacuum pump (52) arranged to evacuate the interior of the turbine...
6147357 Apparatus and method for inspecting the edge micro-texture of a semiconductor wafer  
An apparatus and a method are provided for inspecting the edge micro-texture of a semiconductor wafer. The apparatus includes a diffuse hemisphere having at least one access port and has a normal...
6130438 Wrapping paper defect inspection apparatus for a cigarette manufacturing machine  
A wrapping paper defect inspection apparatus for a cigarette manufacturing machine is provided which permits easy and reliable detection of a defect, such as a pinhole, in elongate wrapping paper...
6121599 Device for use in the optical investigation of surfaces  
A device for optical investigation of a microscope slide includes a support, and a microscope slide holder fixedly attached to the support. A holder unit is attached to the support with at least...
6118524 Arc illumination apparatus and method  
An illumination apparatus and method illuminates one or more reflective elements, such as solder balls on an electronic component or other protruding surfaces or objects. The illumination apparatus...
6115490 Apparatus for determining the powder density on a dusty printed article  
To generate a high-contrast image of powder particles located on the surface of a print product, a measurement apparatus has an illumination unit which generates a measurement light beam which...
6111261 Process and device for assessing the quality of processed material  
The quality of printed, processed material is assessed by passing the processed material through an inspection device. The material for inspection is illuminated with directional light beams. The...
Matches 1 - 50 out of 203 1 2 3 4 5 >