|
Match
|
Document |
Document Title |
|
|
7365310 |
Increased depth of field for high resolution imaging for a matrix-based ion source
The invention provides a method of producing an in-focus image of an area on a sample plate for an ion source, e.g., a matrix-based ion source or any other type of ion source that employs a sample...
|
|
|
7220978 |
System and method for detecting defects in semiconductor wafers
A system and method for detecting defects in semiconductor wafers in a rapid non-destructive manner. Defects in semiconductor wafers can include micropipes and screw dislocations, stress...
|
|
|
7199387 |
Apparatus and method for detecting a predetermined pattern on a moving printed product
An apparatus and method for detecting a relatively narrow predetermined pattern, such as a trigger mark, on a moving printed product uses a plurality of sensor elements arranged linearly in an...
|
|
|
7092082 |
Method and apparatus for inspecting a semiconductor wafer
An apparatus for inspecting a semiconductor wafer includes a vertically movable chuck plate for holding said semiconductor wafer, a first light source for illuminating an area on the wafer, a main...
|
|
|
6970194 |
Defect correction in electronic imaging systems
A method for processing a video data stream including a series of pixel values corresponding to pixel sites in an electronic imaging device includes the step of filtering the video data stream in...
|
|
|
6941009 |
Method for evaluating pattern defects on a water surface
The invention concerns a method for evaluating pattern defects on a wafer surface, comprising the following steps: acquiring the surface data of a plurality of individual image fields ( 4 ) of a...
|
|
|
6920249 |
Method and measuring instrument for determining the position of an edge of a pattern element on a substrate
A method and a measuring instrument for determining the position of an edge to be measured on a pattern on a substrate are described. A complete, nonlinear model intensity profile, which identifies...
|
|
|
6909105 |
Method and device for representing an object
A process for obtaining an object image of at least one object ( 40 ) is described, wherein at least two partial images of the object ( 40 ) are taken under differing object conditions which are...
|
|
|
6904164 |
Method of inspecting accuracy in stitching pattern elements
A method of quickly and accurately inspecting the stitching accuracy at which regions of a lithographic pattern are stitched at boundaries. The numerous regions of the lithographic pattern are...
|
|
|
6747697 |
Method and apparatus for digital image defect correction and noise filtering
An adaptive median filter ( 40 ) provides dynamic detection and correction of digital image defects which are caused by defective or malfunctioning elements of a radiation detector array ( 20 )....
|
|
|
6743337 |
Process and apparatus for determining the properties of a traveling material web
Process and apparatus for determining properties of a traveling material web. The process includes simultaneously illuminating a plurality of measuring points on the material web with...
|
|
|
6655777 |
Automatic horizontal and vertical head-to-head alignment method and sensor for an ink jet printer
A printhead alignment sensor for an ink jet printer includes at least two terminals defining a gap therebetween. An electrical measuring device detects a change in an electrical parameter between...
|
|
|
6640716 |
Imaging print media
A method and apparatus for imaging material. A section of a medium is photographed with a first camera having a first field of view. The medium is advanced along a feed direction and the section is...
|
|
|
6563129 |
Method and device for the contactless measurement of the deformation of a specimen to be measured
The invention relates to a method for measuring the deformation of a specimen without contact with the specimen. The surface of the measured specimen is partly illuminated by a laser light having...
|
|
|
6561706 |
Critical dimension monitoring from latent image
A system for monitoring a latent image exposed in a photo resist during semiconductor manufacture is provided. The system includes one or more light sources, each light source directing light to...
|
|
|
6538252 |
Method and device for determining the alignment of line formations in areal, especially longitudinally moved, webs of a structural formed body
In a method for determining alignment of line formations of a web, a radiation source emitting radiation and a detector with numerous radiation sensors for sensing the radiation are provided. The...
|
|
|
6515293 |
Method and apparatus for detecting thickness of thin layer formed on a wafer
A method of measuring the thickness of a thin layer, by which the thickness of a top layer formed on the surface of a wafer can be detected in real time, and an apparatus therefor. This method...
|
|
|
6272440 |
Method and apparatus for measuring color and/or composition
The invention relates to a method and apparatus for determining the color and/or composition of a material. A sample of the material is illuminated with at least three separate illumination bands...
|
|
|
6264591 |
Plug combiner inspection system and method
A cigarette filter rod system comprises a plug combiner machine having a knife located downstream from a sensor. The knife generates a trigger signal which prompts an Inspection Unit to locate a...
|
|
|
6192141 |
Apparatus and method for automatically recognizing print media
An apparatus and method that automatically recognizes a print medium. The device includes a print medium sensor for detecting the kind of print media, and outputting a detection signal; a detection...
|
|
|
6173071 |
Apparatus and method for processing video data in automatic optical inspection
An apparatus and method for inspecting a printed circuit board, whereby a list of windows encompassing respective regions of the printed circuit board are generated. The windows are then scanned,...
|
|
|
6137570 |
System and method for analyzing topological features on a surface
Disclosed is a method and apparatus for using far field scattered and diffracted light to determine whether a collection of topological features on a surface (e.g., a semiconductor wafer) conforms...
|
|
|
5974160 |
Measuring method and apparatus of gloss irregularity and printing unevenness
An outer surface of an object 23 is irradiated with visible light from a light source 21, and the reflected light is acquired by a TV camera 24. A two-dimensional image with gradation is Fourier...
|
|
|
5949584 |
Wafer
An imaging system for viewing indicia on an object to be observed in which the indicia comprises a plurality of either hard and/or soft marks. The light supplied by a light source is collimated by...
|
|
|
5936353 |
High-density solid-state lighting array for machine vision applications
A solid-state lighting unit for automated visual inspection includes a high-density array of light emitting diodes. The packing density of said diode array being limited only by the physical size...
|
|
|
5877899 |
Imaging system and method for imaging indicia on wafer
An imaging system for viewing indicia on an object to be observed in which the indicia comprises a plurality of either hard and/or soft marks. The light supplied by a light source is focussed by at...
|
|
|
5771411 |
Photometry device and method
A photometry device includes a light-receiving element that photoelectrically converts light from the subject field and outputs an electrical signal corresponding to the intensity of the light. The...
|
|
|
5686729 |
Device for counting products stacked side-by-side
This invention relates to a device for counting products (1) that are thin, stacked side by side and arranged edgewise in trays (2) packaged under a translucent shrink-on film, characterized in...
|
|
|
5672885 |
Surface displacement detection and adjustment system
A surface displacement detection system including a detector for detecting displacement of a surface in a direction normal to the surface as the surface revolves; an encoder which divides the...
|
|
|
5620854 |
Method for identifying biochemical and chemical reactions and micromechanical processes using nanomechanical and electronic signal identification
A scanning probe microscope, such as an atomic force microscope (AFM) or a scanning tunneling microscope (STM), is operated in a stationary mode on a site where an activity of interest occurs to...
|
|
|
5436463 |
Sedimentary deposition of photoresist on semiconductor wafers
A conformal, substantially uniform thickness layer of photoresist is deposited on a semiconductor wafer by causing photoresist solids to "sediment" out of solution or suspension. Generally, the...
|
|
|
5416335 |
Automated visual inspection system for determining the set positions of a row of dip switches
A method and apparatus for visually inspecting a discrete DIP switch block on a circuit card and analysis of the physical position of each switch. A comparison of reflected light intensities from...
|
|
|
5408104 |
Apparatus and process with an annular fluorescent tube for detection in a moving mode of surface defects on long metallic products
An apparatus and a process for detecting surface defects on moving long metallic products utilizing linear CCD cameras for effecting exposures at successive times t1, t2,t3 . . . Tn. A processing...
|
|
|
5340994 |
Method for inspecting the length of a flexible thin object having binarizing and thinning steps
A method for automatically inspecting a flexible thin object without having to touch the object. First, a digital image of a flexible thin object is input. Then the image is binarized. The...
|
|
|
5283443 |
Method for inspecting garments for holes having a contrasting background
A method for inspecting garments for holes includes front-lighting the garment against a contrasting background and forming a pixel image thereof, isolating garment pixels from background pixels by...
|
|
|
RE34345 |
Fiber optic imaging system for on-line monitoring
A target is viewed by means of a coherent fiber optic bundle comprising a two dimensional array of fibers. A one dimensional linear light detector array, fixed relative to the coherent fiber optic...
|
|
|
5218211 |
System for sampling the sizes, geometrical distribution, and frequency of small particles accumulating on a solid surface
A system which samples and records the locations of opaque particles accumulating on a surface. The system represents graphically the geometrical distributions of the particles through an integral...
|
|
|
5187376 |
Print monitoring apparatus with data processing
A print monitoring apparatus for monitoring a print transported out of a printing unit comprises a defect position discrimination unit for discriminating a position of a defect on a print web of...
|
|
|
5155372 |
Optical inspection system utilizing wedge shaped spatial filter
The present invention includes a system for monitoring surface structures on a planar surface utilizing a radiation source emitting a beam. The planar surface has various surface structure types,...
|
|
|
4882498 |
Pulsed-array video inspection lighting system
An engineered lighting system for use in an inspection system is comprised of an array of light emitting diodes. A specimen is brought into the viewing area, and a current pulse is provided to the...
|
|
|
4801809 |
Sheet inspection apparatus and methods providing simultaneous resolution of measurement zones and wavelength bands
Disclosed are sheet inspection apparatus and methods for rapid, repetitive measurement of a quality attribute in each of a plurality of measurement zones of a continuously-manufactured sheet of...
|
|
|
4792696 |
Method and an apparatus for determining surface shape utilizing object self-shadowing
A method and apparatus are provided wherein a moving light source is passed over a surface whose shape is to be determined, in two orthogonal paths and is fixed at a plurality of positions along...
|
|
|
4767935 |
System and method for measurement of traveling webs
A system and method for optically measuring parameters such as dry basis weight of fibrous sheet materials during manufacture without scanning. The system includes mirror sections for reflecting...
|
|
|
4763006 |
Device determining surface element inclination angle for the optical detection of form errors of a low order
A device is provided for the optical detection of form errors of a low order, for example of roughness. The device possesses a light source whose light probes the body to be examined and a...
|
|
|
4710642 |
Optical scatterometer having improved sensitivity and bandwidth
An improved optical scatterometer includes a multiple detector array that enables the measurement of sample microstructure over an increased range of spatial frequency. One array of optical...
|
|
|
4670659 |
Calibration method for an optical measuring system employing reference grids in a series of reference planes
The invention proposes an electro-optical measurement system to be used to measure the width and possibly also the thickness of a strip 14 being rolled. The strip is imaged onto an electro-optical...
|
|
|
4569024 |
Process and installation for the treatment of rough sheets issuing from a rolling mill for flat products
The process is for cutting rough mother sheets TM issuing from a rolling mill into daughter sheets of predetermined dimensions. In the course of this process, there is determined the inscribability...
|
|
|
4516031 |
Method of determining the degree of wear of bank-notes and a device for carrying out this method
A method of determining the degree of wear of bank-notes 1, in which testing is carried out along edge 2 with a photodiode row 30 arranged perpendicular to the direction of transport. Depending on...
|
|
|
4252443 |
Blackening sensor
A blackening sensor analyses a signal generated by the detection of scattered light reflected from a succession of small illuminated areas on the surface of a web to determine the degree of...
|
|
|
4239384 |
Method and apparatus for automatically recognizing photographic originals unsuitable for copying
A negative whose printability is to be automatically ascertained is subdivided into a central zone, a foreground zone, and a background zone. Whole-zone density signals are produced for the...
|