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9035244 Automatic gain control with defocusing lens  
A method and apparatus for performing mass spectrometry using an electron source, an ion trap, and a voltage-controlled lens located between the electron source and the ion trap. A controller...
9029812 Multi-source plasma focused ion beam system  
The present invention provides a plasma ion beam system that includes multiple gas sources and that can be used for performing multiple operations using different ion species to create or alter...
9018598 Aerosol ionizer  
A system and method comprising an ion production chamber having a plasma source disposed in said chamber, a harvest gas disposed to flow through the chamber from an inlet to an outlet, and a jet,...
9018597 Gas field ionization ion source and ion beam apparatus  
In the case of a conventional gas field ionization ion source, it was not possible to carry out an analysis with a high S/N ratio and a high-speed machining process because the current amount of...
9012867 Ion sources, systems and methods  
Ion sources, systems and methods are disclosed.
8993981 Charged particle source with light monitoring for tip temperature determination  
Systems and methods for heating an apex of a tip of a charged particle source are disclosed. The charged particle source can be, for example, a gas ion source. The systems can include a detector...
8981315 Ion beam device having gas introduction port disposed on structure maintained at ground potential  
To avoid a glow discharge during the use of a conventional gas ionization chamber, there is no alternative but to increase a gas pressure. Therefore, while a conventional gas ionization chamber is...
8976932 X-ray generating device  
In an X-ray generator using an ultraviolet laser, the generation of the X-ray is stabilized. In an X-ray generation method for irradiating an ultraviolet laser beam emitted from an ultraviolet...
8963100 Nitrogen ions from a gas field ion source held at a pressure of 1.0 x 10^(-6) pa to 1.0 x 10^(-2) pa  
A focused ion beam apparatus has an ion source chamber in which is disposed an emitter for emitting ions. A gas supply unit supplies nitrogen gas to the ion source chamber so that the nitrogen gas...
8946651 Multiple anode ion source  
An ion source is provided. The ion source comprises a first cylindrical anode and a second cylindrical anode. The first cylindrical anode is concentric with the second cylindrical anode. The ion...
8927942 Ion source, nanofabrication apparatus comprising such source, and a method for emitting ions  
A ion source comprises: a chamber, an injection to inject matter into the chamber, wherein said matter comprises at least a first species, a tip with an apex located in the chamber, wherein the...
8890534 Surface ionization detector  
The present invention refers to a surface ionization detector comprises an emitter, a heating rod, a collecting electrode, a reducing liner and a housing. The emitter is made of molybdenum,...
8859982 Dual-lens-gun electron beam apparatus and methods for high-resolution imaging with both high and low beam currents  
One embodiment relates to an electron beam apparatus which includes a dual-lens electron gun for emitting an electron beam. The electron beam is a high beam-current electron beam in a first...
8859958 Ion generation using wetted porous material  
The invention generally relates to systems and methods for mass spectrometry analysis of samples. In certain embodiments, the invention provides a mass spectrometry probe including at least one...
8859956 Ion generation using wetted porous material  
The invention generally relates to systems and methods for mass spectrometry analysis of samples. In certain embodiments, the invention provides a mass spectrometry probe including at least one...
8859959 Ion generation using wetted porous material  
The invention generally relates to systems and methods for mass spectrometry analysis of samples. In certain embodiments, the invention provides a mass spectrometry probe including at least one...
8847173 Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing same  
To provide a gas field ion source having a high angular current density, the gas field ion source is configured such that at least a base body of an emitter tip configuring the gas field ion...
8835871 Electron cyclotron resonance ion source device  
An electron cyclotron resonance ion source device includes a plasma chamber configured to contain a plasma; a high-frequency system configured to transmit a high-frequency wave into the chamber; a...
8816275 Ion generation using wetted porous material  
The invention generally relates to systems and methods for mass spectrometry analysis of samples. In certain embodiments, the invention provides a mass spectrometry probe including at least one...
8809801 Gas field ionization ion source and ion beam device  
Provided is a gas field ionization ion source capable of emitting heavy ions with high brightness which are suitable for processing a sample. The gas field ionization ion source according to the...
8803084 Mass spectrometer and mass spectrometry  
A mass spectrometer featured in including an ion source including a first electrode, a second electrode, and a dielectric unit having a sample introducing unit and a sample discharging unit and...
8779380 Ion beam device  
An ion beam device according to the present invention includes a gas field ion source (1) including an emitter tip (21) supported by an emitter base mount (64), a ionization chamber (15) including...
8772735 Charged particle beam apparatus, and method of controlling the same  
A charged particle beam apparatus includes a field emission electron source, electrodes for applying an electric field to the field emission electron source, and a vacuum exhaust unit for keeping...
8766210 Variable energy charged particle systems  
Charged particle system are disclosed and include a first voltage source, a second voltage source electrically isolated from the first voltage source, a charged particle source electrically...
8748845 Ion sources, systems and methods  
Ion sources, systems and methods are disclosed.
8729495 Methods and apparatus for detecting neutral chemical units via nanostructures  
Suspended nanotubes are used to capture and ionize neutral chemical units, such as individual atoms, molecules, and condensates, with excellent efficiency and sensitivity. Applying a voltage to...
8723138 Electron beam source and method of manufacturing the same  
A tip of an electron beam source includes a core carrying a coating. The coating is formed from a material having a greater electrical conductivity than a material forming the surface of the core.
8716681 Sample processing method  
In one embodiment, a sample processing method includes placing a sample on a sample placing module, and setting first processing boxes on one side of slice formation scheduled regions of the...
8710473 Droplet generation and detection device, and droplet control device  
A droplet generation and detection device may include: a droplet generation unit for outputting a charged droplet; at least one droplet sensor including a magnetic circuit including a coil...
8710457 Process for the production of electric energy by the excitation and capture of electrons from ground or water sources  
The process of the present application facilitates the production of electric energy by the excitation and capture of electrons from atoms, molecules and ions from ground or water sources, or any...
8709350 Compact ion accelerator source  
An ion source includes a conductive substrate, the substrate including a plurality of conductive nanostructures with free-standing tips formed on the substrate. A conductive catalytic coating is...
8692217 Multi-source plasma focused ion beam system  
The present invention provides a plasma ion beam system that includes multiple gas sources and that can be used for performing multiple operations using different ion species to create or alter...
8674321 Microplasma ion source for focused ion beam applications  
The present invention provides a method of obtaining a bright source of ions with narrow energy spread for focused ion beam applications using micro plasmas. As a preferred embodiment, a high...
8663570 Sterilizing apparatus and ion generating apparatus  
A sterilizing apparatus and an ion generating apparatus, which generate sufficient amount of cations in a short period of time and also maintain the amount of ions generated at a level that is...
8653462 Methods and systems for detecting terahertz radiation by radiation enhanced emission of fluorescence  
Methods and systems for detecting radiation, particularly, terahertz (THz) radiation, are disclosed. The methods and systems disclosed include directing an optical beam in a volume of gas;...
8593051 Apparatus for producing a charged particle beam  
Apparatus for the production of a charged particle beam, comprising: an ion source plasma chamber (104), having a door (106), and an accelerator (102) mounted on the face of the door remote from...
8575867 Electric field-guided particle accelerator, method, and applications  
A charged particle accelerator having a curvilinear beam trajectory maintained solely by a laterally directed, constant electric field; requiring no magnetic field. A method for controlling the...
8576535 Ion-generating device and electrical apparatus  
An ion-generating device has a positive electrode pair and a negative electrode pair. The positive electrode pair and the negative electrode pair are disposed in a casing with a space interposed...
8563944 Ion beam device  
Provided is an ion beam device provided with a gas electric field ionization ion source which can prevent an emitter tip from vibrating in a non-contact manner. The gas electric field ionization...
8563954 Ion beam stabilization  
Ion microscope methods and systems are disclosed. In general, the systems and methods provide high ion beam stability.
8558192 Gas delivery system with voltage gradient for an ion microscope  
Disclosed are systems and methods for applying a voltage gradient to a gas delivery system, delivering a gas through a length of the gas delivery system having the voltage gradient, the gas having...
8541757 Accelerator on a chip having a cold ion source  
An assembly includes a cold ion source and a chip. The cold ion source is fixed to the chip so that ions from the ion source can enter an acceleration channel in the chip. In one specific example,...
8530854 Micro gas-puff based source  
Various technologies described herein pertain to a micro gas-puff based source of neutrons, x-rays, and/or energetic particles. The micro gas-puff based source can generate plasma, which can emit...
8530832 Ion sources for improved ionization  
Improved apparatuses and methods are provided for ionizing samples and analyzing the samples with mass spectrometry.
8519355 Charged particle source  
A charged particle source comprises at least one gas inlet configured to supply gas particles, at least one tip having a tip apex being biased to provide an electrical field for generating charged...
8502162 Atmospheric pressure ionization apparatus and method  
An atmospheric pressure ionization apparatus includes a chamber, an ion inlet structure, an electrode, a sample emitter, and a gas passage. The ion inlet structure includes a sampling orifice. The...
8481965 Process for the production of electric energy by the extraction of electrons from atoms and molecules  
The process of the present application facilitates the production of electric energy by the deliberate extraction of electrons from atoms and molecules of a gas, vapor, liquid, particulate solid,...
8481966 Microplasma ion source for focused ion beam applications  
A high pressure microplasma source operating in a normal glow discharge regime is used to produce a cold bright focused beam of Xe+ and/or Xe2+ ions having ion temperature of the order of 0.5-1 eV...
8481927 High yield atmospheric pressure ion source for ion spectrometers in vacuum  
Gaseous analyte molecules are ionized at atmospheric pressure and provided to an inlet capillary of an ion spectrometer vacuum system by passing the ions through a reaction tube that ends in a...
8455840 Gas field ion microscopes having multiple operation modes  
The disclosure relates to ion beams systems, such as gas field ion microscopes, having multiple modes of operation, as well as related methods. In some embodiments, the disclosure provides a...

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