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7633062 Radiation portal monitor system and method  
A portal monitoring system has a cosmic ray charged particle tracker with a plurality of drift cells. The drift cells, which can be for example aluminum drift tubes, can be arranged at least above...
7557345 Integrated circuit chips, apparatuses for obtaining backscatter data from samples, methods of backscatter analysis, and methods of forming alpha particle emission and detection systems  
Some embodiments include methods for fabricating an alpha particle emitter and detector associated with an integrated circuit chip. Some embodiments include an integrated circuit chip comprising an...
7533000 Method and apparatus for analysing a dataset of spectra  
A method of analyzing a dataset of spectra is provided in which each spectrum has a count value for each of a number of parameter values within a parameter range. The method is for identifying one...
7525325 System and method for floating-substrate passive voltage contrast  
A passive voltage contrast (PVC) system and method are disclosed for analyzing ICs to locate defects and failure mechanisms. During analysis a device side of a semiconductor die containing the IC...
7476883 Biomarker generator system  
A biomarker generator system for producing approximately one (1) unit dose of a biomarker. The biomarker generator system includes a small, low-power particle accelerator (“micro-accelerator”)...
7462836 Method and system to separate and measure 37Ar quickly  
The present invention relates to the method and equipment for inspecting nuclear experimental locales, and particularly relates to the method and system for separating and measuring 37 Ar quickly....
7429733 Method and sample for radiation microscopy including a particle beam channel formed in the sample source  
A method and sample for radiation microscopy include a sample source that includes an area of interest, an outer side of a sample formed in the sample source adjacent to the area of interest, an...
7420166 Real-time S-parameter imager  
Disclosed is a fully automated system capable of producing high quality real-time S-parameter images. It is a useful and versatile tool in Material Science and Solid State Technology for...
7394069 Large-field scanning of charged particles  
One embodiment relates to a charged-particle beam apparatus. The apparatus includes at least a source for generating the charged-particle beam, a first deflector, and a second deflector. The first...
7351525 Positronium-mediated method for identifying a contaminant gas in a gaseous mixture  
The present invention discloses an in vitro method to identify a contaminant gas in a specimen comprising a mixture of gases as a function of the decay rate of at least one species of positronium....
7319223 Method and apparatus for characterizing a recess located on a surface of a substrate  
Method and apparatus for characterizing a recess located on a surface of a substrate are provided. One embodiment of the invention provides a method for characterizing a recess located on a surface...
7254212 Particulate matter analyzer, collecting filter and system for analyzing and collecting samples from fluids  
A system, including a particulate matter analyzer and collecting filter, provides a method of analyzing and collecting samples from fluids, such as collecting particulate matter from air. A mass...
7141790 Defect inspection instrument and positron beam apparatus  
The purpose of the present invention is to inspect the position, number, and size of fine defects in a variety of solid state materials, including a semiconductor device and metallic materials,...
7005639 System and method of composition correction for beta gauges  
Beta gauge composition correction is performed using signals from a plurality of detectors that are positioned so that the ratio of radiation received by the detectors depends on the composition of...
6921896 Automatic backscatter gauge  
In an embodiment of the present invention, the same provides an edge sensor capable of locating an edge under a substrate. The edge sensor comprises a radiation source, a scanner, a microprocessor,...
6818902 Positron source  
A positron source is applicable particularly to solid state physics, including a thin target receiving a continuous or practically continuous 10 MeV electron beam in grazing incidence and...
6815676 Material defect evaluation apparatus using positron and its evaluation method  
A material defect evaluation apparatus using positron for evaluating the degree of deterioration of a specimen by measuring a positron lifetime after irradiating positron to the specimen, includes:...
6646261 SEM provided with a secondary electron detector having a central electrode  
The invention relates to wafer inspection by means of a scanning electron microscope (SEM) column in which the secondary electron detector 22, 24 is positioned centrally above the objective lens...
6642529 Methods for the automated testing of reticle feature geometries  
A method for inspecting features on a reticle is provided. The method includes providing a layout design of a test feature and transferring the layout design of the test feature onto the reticle....
6630666 Positron trap beam source for positron microbeam production  
A positron producing apparatus which includes a vacuum chamber with a source of positrons to be supplied into the vacuum chamber forming a positron cloud within a Penning Trap. The positron cloud...
6627890 Particle beam apparatus for tilted observation of a specimen  
A particle beam apparatus for tilted observation of a specimen is capable of producing magnification images of the specimen under tilted observation with high accuracy. The particle beam apparatus...
6627908 Radiation source assembly and connector press used in producing such assemblies  
A radiation source assembly and a connector press used in producing such assemblies. In the radiation source assembly, each of the cap connector and the female connector is provided with internal...
6617599 Apparatus and method for automated indexing of a nuclear gauge  
The invention provides a method and apparatus for facilitating calibration of a nuclear gauge by automating the movement of a source rod between a plurality of source rod positions. The apparatus...
6573501 Holography transmission electron microscope  
A holography electron microscope permitting electron holography without limitations on the magnification. An electron biprism is mounted between a system of intermediate lenses and a system of...
6552338 Ion photon emission microscope  
An ion beam analysis system that creates microscopic multidimensional image maps of the effects of high energy ions from an unfocussed source upon a sample by correlating the exact entry point of...
6465781 Method and apparatus for inspecting or measuring a sample based on charged-particle beam imaging, and a charged-particle beam apparatus  
A method and an apparatus for inspecting or measuring a sample based on charged-particle beam are provided to relieve charge-up of the sample, so that high-quality electron image is obtained. A UV...
6310936 Thin layer nuclear density guage  
The present invention provides an improved thin layer nuclear density gauge comprising a gauge housing having a vertical cavity therethrough and a base, a first radiation detector located at a...
6307205 Omega energy filter  
There is disclosed an OMEGA energy filter comprising three magnetic field regions and producing small aberrations. The electron beam trajectory from the entrance window plane to the slit plane is...
6291823 Ion-induced electron emission microscopy  
An ion beam analysis system that creates multidimensional maps of the effects of high energy ions from an unfocussed source upon a sample by correlating the exact entry point of an ion into a...
6285734 Method for determining element contents using wave dispersive and energy dispersive x-ray fluorescence analysis  
The invention relates to a method for defining element contents contained by solid, liquid or slurry-like materials by means of an X-ray fluorescence method in an online analysis. According to the...
6238522 Method and apparatus for measuring sheet thickness in a paper-making machine  
A method and apparatus for measuring thickness of a fiber material during manufacture of the fiber material, especially paper in a paper-making machine, comprises a gamma radiation transceiver in...
6228664 Calibration method for radiation spectroscopy  
A method of calibrating and using a radiation detector to quantify the radioactivity in or on a wide variety of objects, over a wide range of object sizes (points to hundreds of cubic meters), over...
6204507 Device for testing flat materials  
A device for testing flat materials during production of material webs has a radiation source from which radiation passes through the material under investigation, residual radiation on another...
6153884 Radioisotope proximity sensor  
A radioisotope proximity sensor is provided for detecting proximity or distance to a nearby object containing a small radiation source complementary to the sensor. The output of the sensor is...
6149593 Method and apparatus for detecting beta radiation  
A method and apparatus for detecting beta particles in the presence of high gamma background using secondary electron emission (SEE) as the primary beta particle detector. Diamond-like thin films...
6043489 Positron source  
A positron source with high intensity and low energy bandwidth and small spatial dimensions, has a positron emitter of high specific activity and, following the positron emitter, a reflection...
5753914 Method and apparatus for investigating the physical properties of material surface layer  
An improved method is disclosed which investigates the surface layer of a material. A pulsed slow positron beam having a pulse duration in a nanosecond range is focused and irradiated on the...
5696372 High efficiency near-field electromagnetic probe having a bowtie antenna structure  
A near field electromagnetic probe converts an incident energy beam into an interrogating beam which exhibits, in the near field vicinity of the probe, a transverse dimension that is small in...
5672876 Method and apparatus for measuring distribution of radioactive nuclide in subject  
The invention intends to measure true distribution of a radioactive nuclide in respective parts of a subject. A density of each part of a subject sample is measured by measuring the intensity of...
5627372 Measuring on-line tobacco rod basis weight using combined high accuracy/slow response and low accuracy/fast response gauges  
A method and apparatus are provided for sensing basis weight of a rod of material, such as tobacco, by two basis weight sensing operations which are then combined. A first sensing operation having...
5625187 Apparatus for measuring the density of accumulations of fibrous material in multiple rod making machines of the tobacco processing industry  
Two parallel cigarette rods are guided in a twin cigarette rod making machine between two stationary ionization chambers of a density measuring apparatus. Two radiation sources are mounted on a...
5576541 Apparatus for measuring the basis weight  
An apparatus for measuring the basis weight of a web-shaped material under test comprises a radioactive β radiation source on one side of the material under test and a β radiation detector on the...
5530245 Surface characterization of catalytic materials by positron annihilation radiation lineshapes measurements  
Positron annihilation radiation lineshapes from two-dimensional angular correlation and Doppler broadened spectrum measurements are used to monitor specific surface acidity (proton concentration...
5509622 Protective cover, radiation shield and test unit for helicopter blade crack indicator  
A cover for a pressure sensor for indicating cracks in a hollow aircraft blade, the sensor having a shaft carrying a radiation source, with the shaft sliding in a housing between a first position...
5510616 Cigarette density profile measurement system  
A cigarette density profile measurement system which utilizes a hopper system for storing a large number of cigarette rods whose density is to be measured which hopper system is used to feed one...
5406085 Apparatus and method for rapid and nondestructive determination of lattice defects in semiconductor materials  
A method and apparatus for rapidly yet nondestructively testing a semiconductor wafer is disclosed. A multi-spot positron source assembly directs positrons over an entire semiconductor wafer at one...
5399859 Flow meter  
A basis weight scanner using a beta-ray source and an electron detector on opposite sides of a web of wood pulp sheeting is used to calculate the weight of wood pulp advanced past a measuring...
5331163 Radioactive areal density detector with scintillating receiver  
Apparatus for continuously determining the areal density along a length of a material includes a radioactive source and a scintillating receiver. In a first embodiment, the invention measures the...
5233195 Methods and apparatus for measuring characteristics of moving webs  
Characteristics of moving webs are measured using a radiation source shutter which is rotatably movable between an opened-shutter position and a closed-shutter position and structured to permit...
5229610 Method and apparatus for detecting hydrogen-containing compounds  
A low-cost detector of hydrogen-containing compounds in gas or thin-film samples is disclosed. The device preferably includes an alpha particle source, an energy degrading medium, a charged...
Matches 1 - 50 out of 330 1 2 3 4 5 6 7 >