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7403832 Method and system for advanced process control including tool dependent machine constants  
A controller and a method of controlling a process tool is provided, in which machine constants used for calibrating manipulated variables of the control algorithm are explicitly introduced into...
7402527 Dry etching method, fabrication method for semiconductor device, and dry etching apparatus  
When etching is performed with respect to a silicon-containing material by using a dry etching apparatus having a dual power source, the application of bias power is initiated before oxidization...
7402523 Etching method  
A method for etching an insulation film through a patterned mask, includes the steps of etching the insulation film until just before an underlayer is about to be exposed by applying a plasma, and...
7402261 Slurry compositions, methods of preparing slurry compositions, and methods of polishing an object using slurry compositions  
A slurry composition includes an acidic aqueous solution and one or both of, an amphoteric surfactant and a glycol compound. Examples of the amphoteric surfactant include a betaine compound and an...
7402257 Plasma state monitoring to control etching processes and across-wafer uniformity, and system for performing same  
The present invention is generally directed to plasma state monitoring to control etching processes and across-wafer uniformity, and a system for performing same. In one illustrative embodiment,...
7398591 Manufacturing method of a thin-film magnetic head  
The present invention relates to a manufacturing method of a thin-film magnetic head whereby re-deposition and an overlapped part in a region of a magnetoresistive effect multi-layered structure...
7396481 Etching method of organic insulating film  
This invention relates to a method for etching an organic insulating film used in the production of semiconductor devices. A sample to be etched on which a low dielectric constant organic...
7395595 Method for manufacturing P3 layer of a perpendicular magnetic write head  
A method for forming a P 3 layer with NiFe and alumina mask using resist shrink process for use in perpendicular magnetic write heads. The method includes forming a laminated layer, forming an...
7393788 Method and system for selectively etching a dielectric material relative to silicon  
A method and system for selectively and uniformly etching a dielectric layer with respect to silicon and polysilicon in a dry plasma etching system are described. The etch chemistry comprises the...
7393460 Plasma processing method and plasma processing apparatus  
The plasma processing method comprises the step of removing an organic material film forming an upper layer relative to a patterned SiOCH series film by the processing with a plasma of a process...
7392579 Method for protecting a slider mounted CPP GMR or TMR read head sensor from noise and ESD damage  
A slider mounted CPP GMR or TMR read head sensor is protected from electrostatic discharge (ESD) damage and from noise and cross-talk from an adjacent write head by means of a balanced...
7390753 In-situ plasma treatment of advanced resists in fine pattern definition  
A novel, in-situ plasma treatment method for eliminating or reducing striations caused by standing waves in a photoresist mask, is disclosed. The method includes providing a photoresist mask on a...
7389578 Manufacturing method of a perpendicular recording magnetic head  
Embodiments in accordance with the present invention relate to methods wherein when a main pole is processed by using an ion milling technique, a re-adhesion layer created on the side face of the...
7387743 Etching method and apparatus, computer program and computer readable storage medium  
An etching method, for etching a silicon nitride film on an underlying silicon oxide film by using a hard mask whose principal component is a silicon oxide, includes a step of etching the hard mask...
7384567 Method of manufacturing thin film magnetic head  
Provided is a method of manufacturing a thin film magnetic head. In particular, a method of manufacturing a thin film magnetic head is provided in which a flow process of a photoresist is applied...
7381653 Plasma processing method  
A plasma processing method is conducted while a thickness of a resist film being monitored, thereby preventing the thickness of the resist film from being reduced. The plasma processing method...
7381344 Method to reduce particle level for dry-etch  
The invention teaches a multi-step method for shutting down the dry-etch process. The ICP rf power is reduced between each of these consecutive power-down steps of the dry-etch process, the...
7378346 Integrated multi-wavelength Fabry-Perot filter and method of fabrication  
A method is provided for forming a monolithically integrated optical filter, for example, a Fabry-Perot filter, over a substrate ( 10 ). The method comprises forming a first mirror ( 16 ) over the...
7378028 Method for fabricating patterned magnetic recording media  
A method of fabricating a patterned magnetic layer comprises sequential steps of: (a) providing a workpiece comprising a non-magnetic substrate, a layer of magnetic material overlying a surface of...
7375947 Method of feedback control of ESC voltage using wafer voltage measurement at the bias supply output  
In a plasma reactor having an electrostatic chuck, wafer voltage is determined from RF measurements at the bias input using previously determined constants based upon transmission line properties...
7374696 Method and apparatus for removing a halogen-containing residue  
The invention provides for a method and integrated system for removing a halogen-containing residue from a substrate comprising etching the substrate, heating the substrate and exposing the heated...
7371485 Multi-step process for etching photomasks  
Method and apparatus for etching a metal layer disposed on a substrate, such as a photolithographic reticle, are provided. In one aspect, a method is provided for processing a photolithographic...
7371332 Uniform etch system  
Etching a layer over a substrate is provided. The substrate is placed in a plasma processing chamber. A first gas is provided to an inner zone within the plasma processing chamber. A second gas is...
7370405 Fabrication method of a high gradient-field recording head for perpendicular magnetic recording  
A thin film magnetic head for perpendicular recording of a single-pole type has a flux enhanced part and a flux enhanced end arranged on a leading side of the main pole in parallel with the cross...
7368393 Chemical oxide removal of plasma damaged SiCOH low k dielectrics  
A method for removing damages of a dual damascene structure after plasma etching is disclosed. The method comprises the use of sublimation processes to deposit reactive material onto the damaged...
7368062 Method and apparatus for a low parasitic capacitance butt-joined passive waveguide connected to an active structure  
Undoped layers are introduced in the passive waveguide section of a butt-joined passive waveguide connected to an active structure. This reduces the parasitic capacitance of the structure.
7367114 Method for plasma etching to manufacture electrical devices having circuit protection  
Methods of manufacturing a variety of circuit protection devices are provided as well as devices so manufactured. In an embodiment, a surface mount electrical device having a substrate and a pair...
RE40264 Multi-temperature processing  
The present invention provides a technique, including a method and apparatus, for etching a substrate in the manufacture of a device. The apparatus includes a chamber and a substrate holder...
7364665 Selective etching processes of SiO2 , Ti and In2 O3 thin films for FeRAM device applications  
A method of selectively etching a three-layer structure consisting of SiO 2 , In 2 O 3 , and titanium, includes etching the SiO 2 , stopping at the titanium layer, using C 3 F 8 in a range of...
7361607 Method for multi-layer resist plasma etch  
A method for etching a multi-layer resist defined over a substrate in a plasma etch chamber is provided. The method initiates with introducing the substrate having a pattern defined on a first...
7361287 Method for etching structures in an etching body by means of a plasma  
A method is proposed for etching structures into an etching body, in particular, recesses which are laterally precisely defined by an etching mask, into a silicon body, using a plasma. In the...
7360302 Manufacturing method of a magnetic sensor  
A magnetic sensor comprises magnetoresistive elements and permanent magnet films, which are combined together to form GMR elements formed on a quartz substrate having a square shape, wherein the...
7360301 Method of manufacturing a thin film magnetic head  
The invention is directed to improvement of a write element of a thin film magnetic head. The first pole portion projects from a flat surface of a first yoke portion at a medium-facing surface side...
7358192 Method and apparatus for in-situ film stack processing  
Embodiments of a cluster tool, processing chamber and method for processing a film stack are provided. In one embodiment, a method for in-situ etching of silicon and metal layers of a film stack is...
7357138 Method for etching high dielectric constant materials and for cleaning deposition chambers for high dielectric constant materials  
A process for the removal of a substance from a substrate for etching and/or cleaning applications is disclosed herein. In one embodiment, there is provided a process for removing a substance...
7354695 Producing a substrate having high surface-area texturing  
A method is provided for preparing high surface-area texturing of a substrate using methods by which material from a substrate is subtracted from or added to the surface of the substrate. In one...
7354525 Specimen surface processing apparatus and surface processing method  
For a surface processing apparatus using a plasma, a mixed gas of a fluorine-containing gas and an oxygen gas is used as an ashing gas. A mixed gas of an oxygen gas and a fluorine-containing gas is...
7354520 Method of manufacturing optical element  
An optical element comprising at least a plurality of pixels formed on a substrate and partition walls arranged respectively between adjacent pixels is manufactured by a method comprising steps of...
H002212 Method and apparatus for producing an ion-ion plasma continuous in time  
An ion-ion plasma source, that features a processing chamber containing a large concentration of halogen or halogen-based gases. A second chamber is coupled to the processing chamber and features...
7347951 Method of manufacturing electronic device  
A method of manufacturing an electronic device comprises forming a wiring material layer made of aluminum or an aluminum alloy on the surface of an insulating film on a substrate, patterning the...
7344652 Plasma etching method  
An etching method for forming a recess ( 220 ) having an opening dimension (R) of millimeter order in an object ( 212 ) to be etched such as a semiconductor wafer. A mask ( 214 ) having an opening...
7343669 Method of manufacturing a thin film magnetic head  
A manufacturing method of a thin film magnetic head is provided. In the manufacturing method of a thin film magnetic head, an inorganic insulating layer is formed along at least a sidewall surface...
7343668 Method of manufacturing perpendicular magnetic recording head capable of highly precisely defining gap distance  
A method of manufacturing a perpendicular magnetic recording head is provided. The method accurately defines a gap layer. The method includes forming a lower gap layer made of a non-magnetic...
7343667 Methods of making a side-by-side read/write head with a self-aligned trailing shield structure  
A side-by-side read/write head includes a self-aligned trailing shield, where a rear edge of the trailing shield is defined by the same lithography/etching process used to define a rear edge of a...
7343666 Methods of making magnetic write heads with use of linewidth shrinkage techniques  
In one illustrative example, a method for use in making a magnetic write head includes the steps of forming a first pole piece layer of a first pole piece; forming a patterned resist over the first...
7341673 Methods and apparatus for in situ substrate temperature monitoring by electromagnetic radiation emission  
A method in a plasma processing system of determining the temperature of a substrate. The method includes providing a substrate comprising a set of materials, wherein the substrate being configured...
7338907 Selective etching processes of silicon nitride and indium oxide thin films for FeRAM device applications  
A dry etch process is described for selectively etching silicon nitride from conductive oxide material for use in a semiconductor fabrication process. Adding an oxidant in the etch gas mixture...
7338610 Etching method for manufacturing semiconductor device  
A wafer having a dielectric layer and an electrode partially protruding from the top surface of the dielectric layer is provided. The dielectric layer is etched with a chemical solution such as...
7335601 Method of processing an object and method of controlling processing apparatus to prevent contamination of the object  
A method of manufacture includes processing an object in a chamber and subsequently generating an electrical force of attraction to float contaminants off of a region adjacent the processed object...
7335315 Method and device for measuring wafer potential or temperature  
The present invention attracts a wafer 6 , placed on a susceptor 5 , toward the susceptor 5 by the electrostatic attractive power of an electrostatic chuck electrode 7 , varies the output...