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8952717 LED chip testing device  
The present invention provides an LED chip testing device that measures characteristics of an LED chip. The LED chip testing device includes: a rotation member that supports the LED chip and...
8890018 Method and apparatus for improved sorting of diced substrates  
A method for inspecting and sorting a plurality of IC units comprising the steps of: delivering a frame containing said IC units to a unit picking station; conducting a first inspection of said...
8712580 Transferring storage devices within storage device testing systems  
A method of transferring storage devices within a storage device testing system includes actuating an automated transporter to retrieve multiple storage devices presented for testing, and...
8686310 Packaged chip detection and classification device  
A packaged chip detection and classification device includes a rotation unit for transporting a plurality of packaged chips, a packaged chip detection unit, and a packaged chip classification...
8530771 Surface mount process, surface mount system, and feeding apparatus thereof  
A surface mount process, a surface mount system, and a feeding apparatus thereof are provided. The surface mount system includes a feeding apparatus and a surface mount apparatus. The feeding...
8269517 Handler and method for testing the same  
The invention provides a handler and a method for testing the same. The handler comprises a sorter and a testing module. The testing module further comprises a signal generator, a sensor, and a...
7982155 System of testing semiconductor devices, a method for testing semiconductor devices, and a method for manufacturing semiconductor devices  
A system of testing semiconductor devices includes a classification module configured to classify a plurality of lots into a plurality of groups; an apparatus assignment module configured to...
7982154 Sorting device and method for sorting RFID tags  
sorting device for RFID tags, comprising a dispensing unit for supplying RFID tags which are applied to a transport belt to a dispensing area, in which the RFID tags are detached from the...
7973259 System for testing and sorting electronic components  
A sorting system is provided for electronic components such as LED devices which includes a testing station for testing and determining a characteristic of each electronic component. A first tray...
7905471 Vacuum ring designs for electrical contacting improvement  
Recesses (72), surface contours, contact tip modifications (52, 56), and/or other methods of ensuring pressure between a bottom surface (50) of a test plate (5) and top surfaces (52) of electrical...
7888949 Electrical tester setup and calibration device  
An electronic testing machine includes a plurality of test modules. Each test module has a plurality of contact pairs for testing electronic components. An apparatus and process for electrical...
7878336 System and method for inspection of chips on tray  
A system for inspection of chips on a tray comprises an unloading arm device, a first support platform, and a plurality of first tray-handling apparatuses. The first support platform is disposed...
7875821 Method for sorting integrated circuit devices  
A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, including automatically reading the ID code of each of...
7851721 Electronic device sorter comprising dual buffers  
A device handler for testing and sorting electronic devices has a testing station operative to test the electronic devices and to classify them according to different binning characteristics. A...
7838790 Multifunctional handler system for electrical testing of semiconductor devices  
A multifunctional handler system for electrical testing of semiconductor devices is provided. The multifunctional handler system comprises: (1) a semiconductor device processing section comprising...
7819235 Venturi vacuum generator on an electric component handler  
At least one venturi generator is provided for use with an electrical circuit component handler. The handler includes a stationary vacuum plate and a test plate. The vacuum plate includes vacuum...
7723981 Method for transferring test trays in a side-docking type test handler  
The present invention relates to a test tray for a test handler. According to this invention, there is disclosed a technique that an insert loaded in a loading part which is arranged in a matrix...
7700891 Process for handling semiconductor devices and transport media in automated sorting equipment  
A method for sorting devices in automated handling equipment, including placing a plurality of input trays containing a plurality of devices and a plurality of empty trays into a handler; sorting...
7629550 System of testing semiconductor devices, a method for testing semiconductor devices, and a method for manufacturing semiconductor devices  
A system of testing semiconductor devices includes a classification module configured to classify a plurality of lots into a plurality of groups; an apparatus assignment module configured to...
7618832 Semiconductor substrate having reference semiconductor chip and method of assembling semiconductor chip using the same  
A semiconductor substrate having a reference semiconductor chip and a method of assembling semiconductor chips using the same are provided. According to the method, a semiconductor substrate...
7595631 Wafer level assemble chip multi-site testing solution  
A chip test system including a probe card, a chip tray and a cover plate fastened on the chip tray. The chip tray comprises a socket, a chip contact area, an extension contact area, and an...
7555358 Process and method for continuous, non lot-based integrated circuit manufacturing  
A method for continuous, non lot-based manufacturing of integrated circuit (IC) devices of the type to each have a unique fuse identification (ID) includes: reading the fuse ID of each of the IC...
7479614 Radio frequency identification tag inlay sortation and assembly  
A method, system, and apparatus for a radio frequency identification (RFID) tag inlay tester and sorter system are described. A tag inlay is received. A characteristic of the tag inlay is tested....
7390158 Handling device for electronic chip components and handling method for electronic chip components  
A handling device for electronic chip components includes an indexing table having a plurality of cavities for holding electronic chip components therein and a circulatory feeder for supplying the...
7294999 Apparatus for automatically displaying the grade of liquid crystal display device and operating method thereof  
An apparatus for automatically displaying a grade of a liquid crystal display device and operating method thereof, includes a grade determining unit of a liquid crystal display panel; a grade...
7279888 Handling unit for electronic devices  
A handling unit includes a frame, at least one arrangement module, and at least one chip carrier. The frame has at least one recess for the interchangeable mounting of at least one of the...
7239970 Robotic system for optically inspecting workpieces  
A manufacturing cell for inspecting workpieces such as magnetic disk substrates comprises an input conveyor for providing workpieces to be tested, one or more testers for inspecting the...
7221180 Device and method for testing electronic components  
A test device includes first and second testers each having at least one testing contact for making contact with at least one external contact of an electronic component; and a conveying device...
7202684 Thermal stratification test apparatus and method providing cyclical and steady-state stratified environments  
A method and apparatus for a thermal stratification test providing cyclical and steady-state stratified environments. In order to test an electronic device, for example one having one or more...
7189938 Process and system to package residual quantities of wafer level packages  
Various preferred processes and equipment are described herein that more efficiently handle residual semiconductor parts during packaging. The processes include picking and removing all of the bad...
7183758 Automatic exchange of degraders in accelerated testing of computer chips  
Issues that are addressed in accordance with at least one presently preferred embodiment of the present invention, are: improvements upon the time it takes to physically swap degraders (done...
7161346 Method of holding an electronic component in a controlled orientation during parametric testing  
A component handler includes an improved test seat having a shape that ensures that an electronic component seated in the test seat is in an appropriate orientation for parametric testing. The...
7151388 Method for testing semiconductor devices and an apparatus therefor  
A method for testing integrated circuit devices and loading such devices into a test board for further testing and an apparatus therefor is disclosed. The method allows for selection between two...
7119299 Work inspection system  
A work inspection system 2 includes: a conveyor table 7 vertically positioned, and conveying works W stored in work-storing pockets 9; a work inspection apparatus for inspecting the works stored...
7030634 Characteristic measuring apparatus for electronic components  
An apparatus for measuring the electrical characteristic of a chip-shaped electronic component having first and second external terminal electrodes at first and second opposing ends thereof...
7017731 Electronic component conveying device  
An electronic-component conveying device includes a conveying plate which moves in one conveying direction and has a plurality of component-holders arranged at a predetermined pitch along the...
RE38894 Method and apparatus for testing integrated circuits  
There is an IC (integrated circuit) testing device 11 that receives singulated ICs from a singulation station's bottom table 44, where an IC 15 has slid down onto loading ramp or track 16. The IC...
6943541 Apparatus and method for testing circuit modules  
Circuit modules comprise a carrier surface with components mounted thereon. A testing apparatus for these modules comprises a magazine for hosting a row of circuit modules. The row is pushed into...
6897393 Methods for reducing costs and increasing throughput in the manufacture of disk drives by categorizing the disk drives based upon measured disk pack imbalance  
A method of manufacturing disk drives that are subject to disk pack imbalance includes steps of measuring the disk pack imbalance of each drive and assigning each of the drives to one of a...
6881914 Apparatus and method for handling, storing and reloading carriers for disk-shaped items, such as semiconductor wafers or CDs  
An apparatus for handling, storing and reloading carriers for disk-shaped items, such as semiconductor wafers or CDs, has at least one cleaning unit and at least one storage unit for the carriers...
6781363 Memory sorting method and apparatus  
A method and apparatus performs testing, sorting, and packaging of partially defective semiconductor memory devices in order to construct usable memory chip or module packages that meet the...
6769963 IC handler and contact cleaning method  
The invention can be easily applied to various contacts irrespective of the length of time needed for replacing ICs with other ICs relative to the contact. An IC handler comprises contact cleaning...
6750416 Instrument for measuring and sorting resistors and method therefor  
The invention describes a method for measuring and classifying resistors (2), in which in a measuring station (3) the resistance value of the resistor (2) supplied by a feed and transport device...
6747228 Enhanced grading and sorting of semiconductor devices using modular “plug-in” sort algorithms  
A semiconductor device sorting method and apparatus involve development of small, self-contained and focused “qualification” or “sort” algorithm test programs or “modules”, each of which modules...
6674036 Method for marking packaged integrated circuits  
The invention provides methods for marking packaged ICs. In a first embodiment, only the minimum performance information is first marked on the package, regardless of the actual performance of the...
6633014 Enhanced grading and sorting of semiconductor devices using modular “plug-in” sort algorithms  
A semiconductor device sorting method and apparatus involve development of small, self-contained and focused “qualification” or “sort” algorithm test programs or “modules”, each of which modules...
6625558 Method and apparatus for testing CMOS image sensors  
A method and apparatus which enables fast testing of light sensing integrated circuits is disclosed. The integrated circuit is positioned in a test head which includes a light source output...
6578261 Part-mounting system comprising a plurality of part mounting devices and method of part mounting  
In a part-mounting system formed by linking plural part-mounting devices which carry out respective process steps of part-mounting, when a production tact-time of one of the devices varies beyond...
6574528 Card assembly apparatus, card inspecting apparatus and card magazine used therefor  
The invention relates to a card assembly apparatus for assembling PC cards and the like, and it is an object of the invention to provide a card assembly apparatus which makes it possible to reduce...
6525528 ROM automatic burning device  
An automatic ROM burning device, comprising a support plate that is erected almost vertically. On the surface of the support plate is at least one feeder chute, inside which is inserted an IC rod,...

Matches 1 - 50 out of 267 1 2 3 4 5 6 >