Matches 1 - 12 out of 12


Match Document Document Title
US20130180019 PROBE SHAPE EVALUATION METHOD FOR A SCANNING PROBE MICROSCOPE  
Provided is a method of evaluating a probe tip shape in a scanning probe microscope, including: measuring the probe tip shape by a probe shape test sample having a needle-like structure;...
US20090071506 Debris removal in high aspect structures  
A method of debris removal is provided. The method includes positioning a nanometer-scaled tip adjacent to a piece of debris on a substrate. The method also includes adhering the piece of debris...
US20140033374 SYSTEM FOR FABRICATING NANOSCALE PROBE AND METHOD THEREOF  
Disclosed is a method for fabricating a nanoscale probe. A first conductor and a second conductor are immersed into an electrolyte contained in an electrolytic tank. The first conductor and the...
US20100043108 PROBE FOR SCANNING PROBE MICROSCOPE  
In a tip having a carbon nanotube tip used to a scanning probe microscope, its length of the tip is adjusted in a several order of 10 nm and the tip maintains cylindrical shape up to the extremity...
US20080054928 Electric potential difference detection method and scanning probe microscope  
An electric potential difference detection method detecting an electric potential difference occurring between a surface of a sample and a probe of a cantilever of a scanning probe microscope...
US20120159678 NANOMETER-SCALE SHARPENING OF CONDUCTOR TIPS  
The invention provides methods for sharpening the tip of an electrical conductor. The methods of the invention are capable of producing tips with an apex radius of curvature less than 2 nm. The...
US20100071100 Probes, Methods of Making Probes, and Applications using Probes  
Provided herein are methods and apparatuses for analyzing molecules, particularly polymers, and molecular complexes with extended conformations. In particular, the methods and apparatuses are used...
US20120174269 METAL TIP FOR SCANNING PROBE APPLICATIONS AND METHOD OF PRODUCING THE SAME  
A metal tip (1) for scanning probe applications is provided. The tip (1) has an axial extension (I), a radial extension (d), a pointy section (B) that extends axially from a section of maximum...
US20110055987 METHOD TO REDUCE WEDGE EFFECTS IN MOLDED TRIGONAL TIPS  
A method of producing sharp tips useful for scanning probe microscopy and related applications is described. The tips are formed by deposition into a mold(s) formed in a sacrificial crystalline...
US20050088173 Method and apparatus for tunable magnetic force interaction in a magnetic force microscope  
The present invention is a method an apparatus for tunable magnetic force interaction for a magnetic force microscope. In one embodiment, the magnetic moment of a probe tip is oscillated using a...
US20100235954 DUAL-TIP CANTILEVER  
A device comprising at least one cantilever comprising at least two tips is described, where the tips have substantially the same tip heights. Methods for making and using such a device are also...
US20120255073 SCANNING PROBE LITHOGRAPHY APPARATUS AND METHOD, AND MATERIAL ACCORDINGLY OBTAINED  
A scanning probe lithography (SPL) apparatus, an SPL method, and a material having a surface thickness patterned according to the SPL method. The apparatus includes: two or more probes with...

Matches 1 - 12 out of 12