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US20090288479 STANDING WAVE FLUIDIC AND BIOLOGICAL TOOLS  
The present invention provides standing wave fluidic and biological tools, including: at least one elongated fiber that has mesoscale (i.e. milliscale), microscale, nanoscale, or picoscale...
US20090261249 SCANNING PROBE MICROSCOPE APPARATUS  
There is provided a scanning probe microscope apparatus which has a high sensitivity for the interaction between the cantilever and the sample and comprises a cantilever that can oscillate stably...
US20090249867 Displacement Detector  
A displacement detector capable of making a measurement in two directions of measurement 180 degrees different from each other without the need of a switching operation has been disclosed. This...
US20090242764 SPIN-TORQUE PROBE MICROSCOPE  
A spin-torque probe microscope and methods of using the same are described. The spin-torque probe microscope includes a cantilever probe body, a magnetic tip disposed at a distal end of the...
US20090241648 Reducing Noise In Atomic Force Microscopy Measurements  
Exchanging data between an Atomic Force Microscopy (AFM) measuring device and an external controlling device using a wireless link. The wireless link replaces cables leading to the AFM measuring...
US20090178472 NON-LINEARITY DETERMINATION OF POSITIONING SCANNER OF MEASUREMENT TOOL  
Determination of non-linearity of a positioning scanner of a measurement tool is disclosed. In one embodiment, a method may include providing a probe of a measurement tool coupled to a positioning...
US20090165539 GLIDE TEST HEADS USING HEATING ELEMENTS TO FORM A PLANAR DETECTION SURFACE  
Glide test systems and associated methods are described. A glide test system includes a glide test head that is flown over the surface of a recording disk to detect asperities on the recording...
US20090158828 Scanning Probe Microscope  
In the case of measuring a pattern having a steep side wall, a probe adheres to the side wall by the van der Waals forces acting between the probe and the side wall when approaching the pattern...
US20090151435 Measurement of paper stack topography  
This is a probe that can be used to measure any curl on a stack of sheets in a sheet stacking tray. In printing systems including electrophotographic systems, sheets tend to curl on edge portions....
US20090151434 Apparatus and method using a disk drive slider and/or a peltier plate in an atomic force microscope  
An Atomic Force Microscope (AFM) using a cantilevered probe containing a slider of a kind useable in a disk drive. The AFM may use a test surface similar to a disk surface in the disk drive and...
US20090139315 NON-DESTRUCTIVE AMBIENT DYNAMIC MODE AFM AMPLITUDE VERSUS DISTANCE CURVE ACQUISITION  
A method, a system and a computer readable medium for dynamic mode AFM amplitude versus distance curve acquisition. In an embodiment, a constant force feedback mechanism is enabled prior to the...
US20090139314 SYSTEM, METHOD AND APPARATUS FOR OBTAINING TRUE ROUGHNESS OF GRANULAR MEDIA  
The true roughness of highly granular perpendicular media is measured by forming an inverse replica of the surface of the media. The invention enables AFM measurements of granular media valley...
US20090139313 Time-Tagged Data for Atomic Force Microscopy  
A scanning probe microscope and method for using the same are disclosed. The scanning probe microscope includes a probe, an electromechanical actuator that moves the sample relative to the probe,...
US20090139312 DEFECT CLASSIFICATION UTILIZING DATA FROM A NON-VIBRATING CONTACT POTENTIAL DIFFERENCE SENSOR  
A method and system for identifying and classifying non-uniformities on the surface of a semiconductor or in a semiconductor. The method and system involves scanning the wafer surface with a...
US20090138994 MEASURING DEVICE WITH DAISY TYPE CANTILEVER WHEEL  
A measuring device with a daisy type cantilever wheel enabling easier setting of a measuring head and modification head by rotating the daisy type cantilever wheel, enabling modification, adhesion...
US20090114002 REDUCTION OF VORTEX INDUCED FORCES AND MOTION THROUGH SURFACE ROUGHNESS CONTROL  
Roughness is added to the surface of a bluff body in a relative motion with respect to a fluid. The amount, size, and distribution of roughness on the body surface is controlled passively or...
US20090114001 ENHANCEMENT OF VORTEX INDUCED FORCES AND MOTION THROUGH SURFACE ROUGHNESS CONTROL  
Roughness is added to the surface of a bluff body in a relative motion with respect to a fluid. The amount, size, and distribution of roughness on the body surface is controlled passively or...
US20090114000 NANOPROBE TIP FOR ADVANCED SCANNING PROBE MICROSCOPY COMPRISING A LAYERED PROBE MATERIAL PATTERNED BY LITHOGRAPHY AND/OR FIB TECHNIQUES  
By forming an appropriate material layer, such as a metal-containing material, on a appropriate substrate and patterning the material layer to obtain a cantilever portion and a tip portion, a...
US20090107222 Scanning Probe Microscope with Improved Scanning Speed  
A scanning probe microscope and method for using the same are disclosed. The scanning probe microscope includes a probe, an electro-mechanical actuator, and a controller. The probe has a tip that...
US20090101815 CANTILEVER FOR NEAR FIELD OPTICAL MICROSCOPES, PLASMON ENHANCED FLUORESCENCE MICROSCOPE EMPLOYING THE CANTILEVER, AND FLUORESCENCE DETECTING METHOD  
A cantilever for near field optical microscopes is equipped with a probe in the vicinity of a free end thereof. The probe includes a thin film portion constituted by at least one layer of thin film...
US20090100917 ROCKING Y-SHAPED PROBE FOR CRITICAL DIMENSION ATOMIC FORCE MICROSCOPY  
Measuring surface profiles of structures on integrated circuits is difficult when feature sizes are less than 100 nanometers. Atomic force microscopy provides surface profile measurement capability...
US20090095058 WORK HANDLING MECHANISM AND WORK INSPECTION SYSTEM  
In the present invention, through a provision of a relay stand including a first relaying point, a second relaying point and a plurality of work mounting bases, a discharge/feed process of works...
US20090078032 Method for assessing degradation of a coating on a component by measuring its surface roughness  
A method of assessing the degradation of an oxide-forming coating on a component after a period of operational use of the component, said degradation of the coating being caused by depletion of the...
US20090064772 Atomic force gradient microscope and method of using this microscope  
A scanning probe microscope in which the probe is oscillated at a frequency lower than its resonant frequency, a force sensor that is sensitive to the bending of the cantilever and minimally...
US20090064771 METHOD OF OPERATING AN ATOMIC FORCE MICROSCOPE IN TAPPING MODE WITH A REDUCED IMPACT FORCE  
In a tapping mode Atomic Force Microscope (AFM) system, a probe is excited at an excitation frequency other than the probe's first natural frequency to produce a response signal manifesting a...
US20090056428 CANTILEVER PROBE AND APPLICATIONS OF THE SAME  
A method of fabricating a nanoscale cantilever probe. In one embodiment, the method includes the steps of forming a cantilever having a tip vertically extending from an end portion of the...
US20090049893 Surface texture measuring device, surface texture measuring method and surface texture measuring program  
A surface texture measuring device comprises a display control unit operative to display a drawing symbol entry screen having entry areas of drawing symbols. An entry acceptance unit is provided to...
US20090038382 PROBE AND CANTILEVER  
[Object of the Invention] To provide a probe 1 for use in a cantilever 2 of an scanning probe microscope (SPM) manufacturable in a simple manufacturing process and usable while allowing full...
US20090031793 ASSESSMENT OF SURFACE ROUGHNESS OF OBJECTS  
A method of assessing the surface roughness of an object includes directing gas supplied at a constant pressure through a control orifice and subsequently to a measurement nozzle adjacent to and...
US20090031792 Probe Device for a Metrology Instrument and Method of Fabricating the Same  
A method of producing a probe device for a metrology instrument such as an AFM includes providing a substrate having front and back surfaces and then forming an array of tip height structures on...
US20090031791 TRIBOACOUSTIC PROBE  
The invention relates to a sensor for the quantitative measurement of the feel of a surface, comprising a prehensile envelope, a hollow contact body for bringing into contact with the surface on a...
US20090025465 Miniaturized Spring Element and Method for Producing the Spring Element  
A miniaturized spring element is intended to be particularly suitable for use as a beam probe or cantilever for detecting atomic or molecular forces, in particular in an atomic force microscope,...
US20090025464 Surface-roughness/contour measuring apparatus  
A surface-roughness/contour measuring apparatus ( 1 ) comprises: a stylus orientation changing part ( 9 ) by which a rotatable support part ( 62, 64, 71 a, 71 b ) for supporting a cantilever ( 7 )...
US20090013771 Texture measuring apparatus and method  
A texture measuring apparatus that measures surface information of an object includes: a probe coming into contact with the object while moving on a surface of the object; a first sensor unit,...
US20090013770 Material property measurements using multiple frequency atomic force microscopy  
Apparatus and techniques for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs...
US20090007645 PIEZOELECTRIC MICROCANTILEVERS AND USES IN ATOMIC FORCE MICROSCOPY  
The invention is direct to a piezoelectric microcantilever for static contact and dynamic noncontact atomic force microscopy which may be carried out in solution. The piezoelectric microcantilever,...
US20090000365 AFM Tweezers, Method for Producing AFM Tweezers, and Scanning Probe Microscope  
AFM tweezers includes: a first probe that comprises a triangular prism member having a ridge, a tip of which is usable as a probe tip in a scanning probe microscope; a second probe that comprises a...
US20090000364 ELECTROCHEMICAL DEPOSITION PLATFORM FOR NANOSTRUCTURE FABRICATION  
Probe-based methods are provided for formation of one or more nano-sized or micro-sized elongated structures such as wires or tubes. The structures extend at least partially upwards from the...
US20090000363 Materials and Methods for Identifying Biointeractive Nanostructures and/or Nanoparticles  
Disclosed herein are surface force microscope probes comprising living cells adhered thereto, as well as methods of making same. Also disclosed is a system for high throughput screening of...
US20090000362 Nanotweezer And Scanning Probe Microscope Equipped With Nanotweezer  
A nanotweezer ( 1 ) according to the present invention includes: a supporting member ( 25 ); an observation probe ( 10 ) that projects out from the supporting member ( 25 ), and is used when...
US20080316904 METHOD AND APPARATUS FOR REDUCING TIP-WEAR OF A PROBE  
The present invention relates to a method of reducing the wear of a tip of a probe when the tip is in contact with a surface of a substrate and when the probe is mounted on a support structure. A...
US20080314131 SAMPLE MANIPULATING APPARATUS  
There is provided a sample manipulating apparatus 1 which is an apparatus of manipulating a sample S mounted on a substrate surface 2 a , in which at least a position data and a shape data are...
US20080307866 Particle removing method, particle removing device, atomic force microscope, and charged particle beam apparatus  
Small tweezers having a pair of arms openable and closable is moved closer to a sample and grips a particle attached on a surface of the sample and carries it onto an adhesion member to attach it...
US20080307864 Scan Type Probe Microscope  
Provided is an atomic force microscope capable of increasing the phase detection speed of a cantilever vibration. The cantilever ( 5 ) is excited and the cantilever ( 5 ) and a sample are...
US20080295585 Tweezer-Equipped Scanning Probe Microscope and Transfer Method  
A tweezer-equipped scanning probe microscope comprises a first arm with a probing portion, a second arm that moves along an opening direction or a closing direction relative to the first arm, an...
US20080295584 Resonant Difference-Frequency Atomic Force Ultrasonic Microscope  
A scanning probe microscope and methodology called resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), employs an ultrasonic wave launched from the bottom of a sample while...
US20080295583 Surface Scanning Method  
The invention relates to a dynamic-mode surface ( 12 ) scanning method in which a cantilever ( 10 ) provided with a probe ( 18 ) is non-positively coupled to the surface and is made to oscillate in...
US20080295571 ABNORMALITY DETECTING METHOD FOR FORM MEASURING MECHANISM AND FORM MEASURING MECHANISM  
A form measuring mechanism 100 which measures a form of an object 102 to be measured by bringing a probe 124 into direct contact with the object 102, includes a plurality of reference...
US20080295570 POSITIONING APPARATUS AND SCANNING PROBE MICROSCOPE EMPLOYING THE SAME  
There is provided a scanning probe microscope employing a positioning apparatus M 1 including a unit to be driven in XY direction having a substantially square form in plane geometry at the center...
US20080289404 Molecule Measuring Device and Molecule Measuring Method  
A molecule measuring apparatus capable of controlling the drawing directions of molecules always in a uniaxial direction in a measurement performed by extending and retracting the molecules on a...
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