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US20090318821 |
Method for Checking ECG Signals and ECG Measuring Device
The invention relates to a method for checking ECG signals measured by an ECG measuring device having at least three electrodes for the presence of interference errors. At least three voltages are...
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US20090281751 |
JITTER MEASUREMENT APPARATUS, JITTER MEASUREMENT METHOD, RECORDING MEDIA, COMMUNICATION SYSTEM AND TEST APPARATUS
Provided is a jitter measurement apparatus, including a sampling section that samples a signal under measurement having a cycle T, a waveform reconfiguring section that shapes a reconfigured...
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US20090281750 |
METHOD AND APPARATUS FOR IMPROVING NOISE ANALYSIS PERFORMANCE
Method and apparatus for improving performance of noise analysis using a threshold based combination of noise estimation and simulation. The method includes classifying a circuit into one of four...
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US20090271133 |
CLOCK JITTER MEASUREMENT CIRCUIT AND INTEGRATED CIRCUIT HAVING THE SAME
Provided is a measurement circuit for measuring a jitter of a clock signal. Delay elements delay the clock signal into delayed clock signal. Latches latch the delayed clock signals to indicate...
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US20090248336 |
ANALYZER FOR SIGNAL ANOMALIES
A signal analyzer includes a divergence detector for detecting periodic interference in a signal, an information detector for detecting a random event in the signal, and output circuitry for...
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US20090234605 |
POWER SUPPLY NOISE ANALYSIS METHOD, SYSTEM AND PROGRAM FOR ELECTRONIC CIRCUIT BOARD
Disclosed is a method of analyzing power supply noise including: extracting power supply and ground information as well as a capacitor and an LSI chip connected to a power supply and ground from...
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US20090234602 |
POWER SUPPLY NOISE ANALYSIS METHOD, APPARATUS AND PROGRAM FOR ELECTRONIC CIRCUIT BOARD
Disclosed is a method including: calculating power supply input impedance of the LSI from the number of output buffers of the LSI, output impedance of an output buffer, signal characteristic...
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US20090234604 |
MEASURING DEVICE, TEST DEVICE, ELECTRONIC DEVICE, PROGRAM, AND RECORDING MEDIUM
A measurement apparatus that measures a signal under measurement, including a strobe timing generator that sequentially generates strobes arranged at substantially even time intervals, a level...
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US20090221253 |
ADAPTIVE CONTROL APPARATUS USING MULTIPLE ADAPTIVE CONTROL METHODS
In the adaptive control apparatus, a computation unit computes weighting coefficients, using a first adaptive control method in a proportion α of a first computation amount, where the first...
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US20090198461 |
Systems and Methods for Testing and Diagnosing Delay Faults and For Parametric Testing in Digital Circuits
Delay-fault testing and parametric analysis systems and methods utilizing one or more variable delay time-base generators. In embodiments of the delay-fault testing systems, short-delay logic paths...
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US20090172609 |
JITTER AMOUNT ESTIMATING METHOD, METHOD FOR CALCULATING CORRELATION BETWEEN AMOUNT OF SIMULTANEOUSLY OPERATING SIGNAL NOISE AND JITTER AMOUNT, AND RECORDING MEDIUM
An SSO noise calculating unit estimates the amount of simultaneously operating signal noise caused by simultaneous operations of input/output pins peripheral to a power supply voltage pin as a...
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US20090164159 |
System And Method For Determining Signal-To-Noise Ratio (SNR), Signal-To-Noise and Distortion Ratio (SINAD) and Total Harmonic Distortion (THD)
A system for determining signal-to-noise ratio (SNR), signal-to-noise and distortion ratio (SINAD), and total harmonic distortion (THD), includes logic for estimating a frequency of a dominant...
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US20090138222 |
S/N Ratio Measuring Method in Eddy Current Testing on Internal Surface of Pipe or Tube
A method in accordance with the present invention includes the steps of: separating an eddy current signal into an X-axis component and a Y-axis component to obtain signal waveform data of the...
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US20090119044 |
DIGITAL SIGNAL PROCESSING IN OPTICAL SYSTEMS USED FOR RANGING APPLICATIONS
Methods and apparatuses for reducing the response time along with increasing the probability of ranging of optical rangefinders that digitize the signal waveforms obtained from the pulse echoes...
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US20090112498 |
USING SENSOR SPECTRAL ENERGY TO DETECT AND/OR ISOLATE SENSOR FAULTS
A method of detecting and/or isolating a fault of a sensor in a system in substantially real time or in non-real time (e.g., using off-line analysis). A spectral energy of a signal of the sensor is...
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US20090112499 |
DEVICE FOR JITTER MEASUREMENT AND METHOD THEREOF
The device for jitter measurement and a method thereof are provided. The device for jitter measure includes a signal retrieving module, a signal amplifying module, an edge detecting module, and a...
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US20090105976 |
AUTOMATIC JITTER MEASUREMENT METHOD
An automatic jitter measurement method for an oscilloscope is provided. The method includes: establishing a database in a data processing unit, in which the step of establishing the database...
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US20090105978 |
EMULATION AND DEBUG INTERFACES FOR TESTING AN INTEGRATED CIRCUIT WITH AN ASYNCHRONOUS MICROCONTROLLER
A method of testing a data transmission and reception system comprises sending a test signal from a transmitter ( 14 ) of the system to a receiver ( 12 ) of the system, and analyzing the received...
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US20090105977 |
TEST APPARATUS, SKEW MEASURING APPARATUS, DEVICE AND BOARD
There is provided a test apparatus for testing a device under test, which includes a plurality of drivers which output signals to the device under test, an output control section which controls the...
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US20090088996 |
Jitter measuring system and method
The present invention relates to a jitter measuring system, comprising: a delay circuit for receiving a clock signal and delaying the clock signal to generate a delay signal; a jitter amplifier for...
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US20090063071 |
SYSTEM, METHOD, AND APPARATUS FOR DISTORTION ANALYSIS
A system, method, and apparatus for distortion analysis is provided. A method in accordance with at least one embodiment of the present disclosure may include receiving a clock frequency at a...
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US20090048796 |
TEST APPARATUS
A test apparatus for testing a device under test includes a multi-strobe generating section that generates a plurality of strobe signals with different phases in each of cycles of an output signal...
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US20080251730 |
Method for Determining a Particle and Sensor Device Therefor
A method for determining a particle impact on a sensor device comprising M sensing areas, each impact causing a variation of at least one physical magnitude of several sensing portions, said method...
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US20080228417 |
CHANGING POINT DETECTING CIRCUIT, JITTER MEASURING APPARATUS AND TEST APPARATUS
A changing point detection circuit is provided that detects timing of changing points at which a logic value of a signal under measurement changes and includes a multi-strobe circuit generating a...
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US20080221813 |
Jitter-Based Calibration Procedure With Improved Resolution For Optical Disc Drives
An optical disc drive apparatus ( 1 ), suitable for storing information on or reading information from an optical disc ( 2 ), typically a DVD or a CD or a BD, is designed for performing a method...
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US20080205219 |
JITTER MEASURING APPARATUS AND METHOD, SIGNAL PERIOD MEASURING APPARATUS AND METHOD, AND OPTICAL DISK PLAYER
An apparatus to measure jitter of a signal read from an optical disk includes a binarization unit to binarize an input signal to generate a binary signal, an ideal signal generator to generate a...
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US20080189064 |
PROBABILITY DENSITY FUNCTION SEPARATING APPARATUS, PROBABILITY DENSITY FUNCTION SEPARATING METHOD, PROGRAM, TESTING APPARATUS, BIT ERROR RATE MEASURING APPARATUS, ELECTRONIC DEVICE, AND JITTER TRANSFER FUNCTION MEASURING APPARATUS
There is provided a probability density function separating apparatus that separates a predetermined component in a given probability density function. The probability density function separating...
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US20080177489 |
SYSTEM AND CIRCUIT FOR CONSTRUCTING A SYNCHRONOUS SIGNAL DIAGRAM FROM ASYNCHRONOUSLY SAMPLED DATA
A system and circuit for constructing a synchronous signal diagram from asynchronous sampled data provides a low cost and production-integrable technique for providing a signal diagram. The data...
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US20080172193 |
METHOD AND APPARATUS FOR ON-CHIP PHASE ERROR MEASUREMENT TO DETERMINE JITTER IN PHASE-LOCKED LOOPS
An apparatus includes a phase-locked loop (PLL) circuit including a phase-frequency detector configured to output phase error signals. A phase error monitor circuit is configured to determine...
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US20080162060 |
IDENTIFYING PERIODIC JITTER IN A SIGNAL
Identifying periodic jitter in a signal includes identifying transition regions of the signal, where the transition regions correspond to regions of the signal where the signal changes between...
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US20080147340 |
METHOD AND SYSTEM FOR MEASURING SIGNAL CHARACTERISTICS OF DATA SIGNALS TRANSMITTED BETWEEN INTEGRATED CIRCUIT CHIPS
Data signals received in an integrated circuit are coupled to a receiver and to an on-chip data acquisition system which takes measurement samples of the data signal in response to a measurement...
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US20080125991 |
JITTER FREQUENCY DETERMINING SYSTEM
A jitter frequency determining system is provided that includes a comparator, a clock source, a latching circuit, a memory device and a processor. The comparator is adapted to receive at least one...
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US20080125990 |
BUILT-IN SELF TEST CIRCUIT FOR ANALOG-TO-DIGITAL CONVERTER AND PHASE LOCK LOOP AND THE TESTING METHODS THEREOF
A BIST circuit for testing both an analog-to-digital converter and a phase lock loop includes a controllable delay circuit, a NAND gate, a dividing circuit, a NOR gate and a charge/discharge...
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US20080103710 |
DATA COMPRESSION FOR A WAVEFORM DATA ANALYZER
A compressor for waveforms having at least two waveform states separates the waveform samples into waveform state sample vectors for each waveform state. Waveform state encoders encode the waveform...
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US20080097710 |
Method for Measuring the Phase Jitter of a High-Frequency Signal and a Measuring Device for the Implementation of This Method
In order to measure the phase jitter of a high-frequency signal, a spectrum analyzer is used. The high-frequency signal (HF) to be measured is either multiplied by M and/or the output frequency of...
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US20080091371 |
Calibration apparatus, calibration method, and testing apparatus
There is provided a calibration apparatus that calibrates a jitter measuring circuit for outputting a jitter measuring signal with a level according to an amount of jitter in an input signal based...
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US20080077342 |
JITTER MEASUREMENT APPARATUS, JITTER MEASUREMENT METHOD, AND RECORDING MEDIUM
There is provided a jitter measurement apparatus for measuring a jitter of a data signal having a substantially constant data rate. The jitter measurement apparatus includes therein a signal...
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US20080048726 |
Signal Integrity Measurement Systems and Methods Using a Predominantly Digital Time-Base Generator
Signal-integrity measurement systems and methods utilizing unique time-base generation techniques for controlling the sampling of one or more signals under test. A time-base generator made in...
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US20080033672 |
Quantum Resonance Interferometry for Detecting Signals
A computer-implemented method for signal analysis includes receiving a first signal, receiving a second signal, coupling the first signal with a first function generated from a first quantum...
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US20080004821 |
Method and Apparatus for Determining Data Signal Jitter Via Asynchronous Sampling
A method and apparatus for determining data signal jitter via asynchronous sampling provides a low cost and production-integrable mechanism for measuring data signal jitter. The data signal is...
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