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Match Document Document Title
US20150131894 VERIFICATION OF CIRCUIT STRUCTURES INCLUDING SUB-STRUCTURE VARIANTS  
A method for controlling the functional output of a verification tool upon receipt of a circuit description comprises searching for a predetermined base pattern in the circuit description. The...
US20140218642 CONDUCTIVE SHEET, TOUCH PANEL, DISPLAY DEVICE, METHOD FOR PRODUCING CONDUCTIVE SHEET, AND RECORDING MEDIUM  
The conductive sheet according to the present invention includes a base and a conductive portion that is formed on at least one main surface of the base and is formed from a plurality of thin...
US20140270472 TIERED LATENCY OF ACCESS FOR CONTENT  
A method substantially as shown and described in the detailed description and/or drawings and/or elsewhere herein. A device substantially as shown and described in the detailed description and/or...
US20080008381 Coordinate acquisition apparatus for test of printed board, and coordinate acquisition method and program for test thereof  
The present invention has been made to obtain a coordinate acquisition apparatus for test of a printed board that can automatically generate coordinates required for performing the clip test from...
US20090110263 Coplanarity inspection device for printed circuit boards  
A coplanarity inspection device for a printed circuit board includes a base, a supporting disk, a driver, a printed circuit board, a light source, an image acquisition means, and a controller. The...
US20140119635 Emission Curve Tracer Imaging  
An apparatus, a method, and a computer-program product for identifying a location of abnormal emission on integrated circuits are disclosed. The location of abnormal emission on integrated...
US20150003720 METHOD OF INSPECTING SUBSTRATE  
Provided is a method of inspecting a substrate. The method includes: receiving an image of a pad area of substrate; determining and registering a start point pixel; tracing pixels having the same...
US20060153439 PC board inspecting apparatus, inspection logic setting method, and inspection logic setting apparatus  
A technology is provided for automatically producing an inspection logic to be used in the action of inspecting a PC board. An inspection logic setting apparatus is arranged for acquiring a...
US20140177939 METHOD OF FINAL DEFECT INSPECTION  
Disclosed is a method of final defect inspection, including preparing a final defect inspection apparatus which includes a host device, a microscope, a bar code scanner, a support tool and a...
US20060023935 Printed circuit substrate appearance inspection method, printed circuit substrate appearance inspection program and printed circuit substrate appearance inspection apparatus  
A printed circuit substrate appearance inspection method comprising: an inspection area defining step defining a predetermined inspection area on an image of a printed circuit substrate including...
US20050265594 Board inspection apparatus and method  
First and second inspection stages 2 and 3 are rotatably configured and provided with four A-side inspection suction tables 22 and four B-side inspection suction tables 32. Distances between A-...
US20100027873 BOARD APPEARANCE INSPECTION METHOD AND DEVICE  
Problem to be Solved To efficiently perform a board appearance inspection with a simple structure. Solution A control unit 60 performs processing for comparing a picked-up image of a board P...
US20100080445 Constructing Variability Maps by Correlating Off-State Leakage Emission Images to Layout Information  
Improved techniques are disclosed for monitoring or sensing process variations in integrated circuit designs. Such techniques provide such improvements by constructing variability maps correlating...
US20080056560 Image capturing for pattern recognition of electronic devices  
An image capturing method and apparatus for pattern recognition of an electronic device are provided in which an electronic device is moved relative to a vision system for positioning the vision...
US20110235896 BURR DETECTING APPARATUS AND BURR DETECTION METHOD THEREOF  
A burr detection apparatus includes an imaging unit and a detection unit. The imaging unit captures an original image of a stencil. The original comprises black and white pixels. The detection...
US20080112607 SYSTEM AND METHOD FOR TESTING LEDS ON A MOTHERBOARD  
An exemplary method for testing light-emitting diodes (LEDs) on a motherboard is provided. The method includes: using a camera module to take a first bulb image of a corresponding number of...
US20090003683 COMPONENT SENSOR FOR PICK AND PLACE MACHINE USING IMPROVED SHADOW IMAGING  
A method of sensing a component held by a nozzle of a pick and place machine is provided. The method includes engaging a source of illumination and recording a reference background image when no...
US20120301010 COMPUTING DEVICE, STORAGE MEDIUM AND METHOD FOR IDENTIFYING COMPONENTS OF PCB  
In a method for identifying components of a printed circuit board (PCB) using a computing device, the computing device connects to a digital scanner and a display device. The digital scanner scans...
US20080267489 METHOD FOR DETERMINING ABNORMAL CHARACTERISTICS IN INTEGRATED CIRCUIT MANUFACTURING PROCESS  
A method for determining abnormal characteristics in integrated circuit manufacturing process is disclosed. The method comprises obtaining a charged particle microscope image of a sample test...
US20080144923 TEST APPARATUS AND METHOD FOR TESTING CONTACT FINGER  
A contact finger test apparatus is used for testing contact fingers of a printed circuit board. The contact finger test apparatus comprises a sampler, a processor and an image-analyzer module. The...
US20050190959 Drill hole inspection method for printed circuit board fabrication  
The automated inspection of features on printed circuit boards is compatible with automated manufacturing technology and greatly speeds the production of useful boards. One printed circuit board...
US20130294679 METHOD FOR INSPECTING MEASUREMENT OBJECT  
An inspection method for inspecting a device mounted on a substrate, includes generating a shape template of the device, acquiring height information of each pixel by projecting grating pattern...
US20110002529 METHOD FOR INSPECTING MEASUREMENT OBJECT  
An inspection method for inspecting a device mounted on a substrate, includes generating a shape template of the device, acquiring height information of each pixel by projecting grating pattern...
US20140119636 AUTOMATED DETECTION OF POTENTIALLY DEFECTIVE PACKAGED RADIO-FREQUENCY MODULES  
Systems and methods for identifying defective individual packaged modules are presented. A Printed Circuit Board (PCB) having a set of individual module substrates can be received. Further,...
US20140270473 VIRTUAL ASSEMBLY AND PRODUCT INSPECTION CONTROL PROCESSES  
A pick-and-place machine and method includes use of a passive component feeder cartridge including a feeder gear. Rotation of the feeder gear causes a component-bearing tape to be fed through the...
US20080253643 Component inspection imaging apparatus structure  
An improved component inspection imaging apparatus structure comprises a component inspection imaging apparatus, a component retaining turntable and a plurality of image capturing devices. The...
US20080025595 METHOD FOR AUTOMATICALLY INSPECTING POLAR DIRECTIONS OF POLAR ELEMENT  
A method for automatically inspecting positive and negative polar directions of a polar element on a substrate is provided. Firstly, an image of a standard substrate is retrieved to form a...
US20120128231 INSPECTION METHOD  
In order to inspect a board, firstly, a measurement area is set on a board, and reference data and measurement data of the measurement area are acquired. Then, a plurality of feature blocks is...
US20060291713 Board inspecting apparatus, its parameter setting method and parameter setting apparatus  
For each teaching image, a plurality of patterns of color pickup regions each include a first region for picking up a color of a first part and a second region for picking up a color of a second...
US20100290696 METHOD OF MEASURING MEASUREMENT TARGET  
In order to measure a measurement target on a PCB, height information of the PCB is acquired by using a first image photographed by illuminating a grating pattern light onto the PCB. Then, a first...
US20050047645 Method for interaction with status and control apparatus  
A GUI is presented for managing a semiconductor processing system that is comprehensible and standardized in format. The graphical display is organized so that all significant parameters are...
US20070274609 Image Search Apparatus, Image Search System, Image Search Method, and Program for Executing Image Search Method  
An object of this invention is to realize, in a semiconductor defect review apparatus, a function of easily searching for an image similar to a reference image at high speed. To this end, an...
US20140119637 SYSTEMS AND METHODS FOR PROCESSING PACKAGED RADIO-FREQUENCY MODULES IDENTIFIED AS BEING POTENTIALLY DEFECTIVE  
Systems and methods for processing potentially defective individual packaged modules are presented. A Printed Circuit Board (PCB) that includes a set of individual module substrates can be...
US20140133735 METHOD OF INSPECTING A LEAD OF AN ELECTRIC DEVICE  
A method of inspecting leads of an electric device, which is capable of improve reliability of inspection regardless of noises induced by regions near the lead. The method uses a height or a...
US20080232673 METHOD FOR MANUFACTURING ELECTRONIC DEVICE  
A method for manufacturing an electronic device is provided. The method includes: pressure-bonding a plurality of terminals of an electronic component to a plurality of electrodes formed on a...
US20140219542 METHOD OF GENERATING HEIGHT INFORMATION IN CIRCUIT BOARD INSPECTION APPARATUS  
A method of generating height information in a circuit board inspection apparatus, first, obtaining a first image corresponding to a first area and a second image corresponding to a second area...
US20090087082 PATTERN INSPECTION APPARATUS AND METHOD  
A pattern inspection apparatus includes a stage configured to mount a target workpiece to be inspected thereon, a sensor configured to include a plurality of light receiving elements arrayed in a...
US20130315468 PATTERN GENERATING APPARATUS AND PATTERN SHAPE EVALUATING APPARATUS  
Although there has been a method for evaluating pattern shapes of electronic devices by using, as a reference pattern, design data or a non-defective pattern, the conventional method has a problem...
US20130136335 PATTERN GENERATING APPARATUS AND PATTERN SHAPE EVALUATING APPARATUS  
Although there has been a method for evaluating pattern shapes of electronic devices by using, as a reference pattern, design data or a non-defective pattern, the conventional method has a problem...
US20090129664 PATTERN INSPECTION APPARATUS AND METHOD  
A pattern inspection apparatus includes a stage configured to mount thereon a target workpiece to be inspected where patterns are formed, at least one sensor configured to move relatively to the...
US20160321799 Hybrid Phase Unwrapping Systems and Methods for Patterned Wafer Measurement  
Systems and methods for unwrapping phase signals obtained from interferometry measurements of patterned wafer surfaces are disclosed. A phase unwrapping method in accordance with the present...
US20160225136 SOFT BACK-UP PIN STATE CHECKING DEVICE  
A soft back-up pin state checking device including a soft back-up pin formed of a bottom-side holder portion, and a top-side soft pin portion which is held by the holder portion in an exchangeable...
US20160225129 A METHOD OF GENERATING REFERENCE DATA FOR INSPECTING A CIRCUIT BOARD  
The present invention relates to a method of generating reference data for inspecting a circuit board. The method comprises steps of scanning a bare circuit board to obtain image information of...
US20160025649 METHOD OF INSPECTING FOREIGN SUBSTANCE ON SUBSTRATE  
In order to inspect a substrate, an image information of a substrate before applying solder is displayed. Then, at least one inspection region on the substrate is image-captured to obtain an image...
US20150371377 METHOD AND SYSTEM FOR INSPECTION OF A PATTERNED STRUCTURE  
A method and a system for inspection of a patterned structure are provided. In various embodiments, the method for inspection of a patterned structure includes transferring the patterned structure...
US20150332452 INSPECTION METHOD, TEMPLATE SUBSTRATE, AND FOCUS OFFSET METHOD  
A substrate to be inspected includes a first pattern constructed with a repetitive pattern that is not resolved by a wavelength of a light source, and at least one alignment mark that is arranged...
US20150332449 METHOD AND APPARATUS FOR INTEGRATED CIRCUIT DESIGN  
A method for IC design is provided. Firstly, an IC design layout having a main feature with an original margin is received. Then, a first modified margin of the main feature is generated; and a...
US20150294456 Method of Detection of Faults on Circuit Boards  
A method of detection of faults on circuit boards comprising the steps of capturing an image (14) of each of a plurality of circuit boards (10) and dividing each of the captured images (14) into a...
US20140160271 DETECTION SYSTEM AND METHOD  
A detection system and method for detecting if of a plurality of electrical elements on a printed circuit board (PCB) is loaded inversely are provided. The system includes a setting module to...
US20110280468 METHOD AND SYSTEM FOR QUICKLY IDENTIFYING CIRCUIT COMPONENTS IN AN EMISSION IMAGE  
A system and method for localization and resolvability of an integrated circuit includes selecting one or more electrical stimuli to be applied to a device under test such that the electrical...

Matches 1 - 50 out of 51 1 2 >