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US20100135461 BIOMETRIC DIAGNOSIS  
The invention provides a method of detecting neoplastic or neurological disorders comprising exposing skin or nails to X-ray diffraction and detecting changes in the ultrastructure of the skin or...
US20130202089 Convertible Scan Panel for X-Ray Inspection  
An x-ray inspection system using backscatter of an x-ray beam emitted through a scan panel contiguous with, but of a material distinct from, an enclosure that contains an x-ray source by which the...
US20080253522 Tool associated with compton scattered X-ray visualization, imaging, or information provider  
One aspect relates to providing an at least one Compton scattered X-ray visualizing, imaging, or information providing operation relative to at least one visualizing, imaging, or information...
US20140035588 BOREHOLE PARTICLE ACCELERATOR  
Borehole tools and methods for analyzing earth formations are disclosed herein. An example borehole tool disclosed herein includes an RF particle accelerator. The particle accelerator includes at...
US20130101090 Methods to Perform Backscatter Inspection of Complex Targets in Confined Spaces  
Embodiments of backscatter inspection systems include features to enable inspection of irregular surfaces, tight spacer, and other hard-to-reach places. Some embodiments include arms that maneuver...
US20120177181 RADIOGRAPHIC IMAGING DEVICE AND RADIOGRAPHIC IMAGING SYSTEM  
There is provided a radiographic imaging device including: a radiation source that irradiates radiation generated by inverse Compton scattering; a first grating at which first members that...
US20080253524 Method and system for Compton scattered X-ray depth visualization, imaging, or information provider  
One aspect relates to at least a portion of at least one Compton scattered X-ray visualizer, imager, or information provider configured to receive an at least one Compton scattered X-ray that has...
US20140037065 BOREHOLE POWER AMPLIFIER  
Borehole tools and methods for analyzing earth formations are disclosed herein. An example borehole tool disclosed herein includes an RF particle accelerator. The particle accelerator includes an...
US20090202041 COMPTON CAMERA DEVICE  
A Compton camera device according to the invention includes first means for reading coordinate data of a scattering point of a quantum ray detected by a pre-stage detector for each Compton...
US20130051529 Method and System for Identification and Authentication of Objects  
A method and system for facilitating the identification and/or authentication of objects, and to a method and system for the marking of objects with an identity and/or as of authentic origin, and...
US20110286577 Method for Obtaining a Structure Factor of an Amorphous Material, in Particular Amorphous Glass  
An incident X-ray is emitted in a wide angular sector toward an amorphous material specimen which backscatters the X-rays. The method comprises: a step of recording experimental photon intensity...
US20150241366 HIGH PERFORMANCE KRATKY ASSEMBLY  
An assembly for Kratky collimator is provided. The assembly may be used for a small angle x-ray camera or system requiring such filtering. The assembly may include a first block with a first...
US20120074305 X-ray Backscattering Part Identification and Tagging Process and Technique  
Presented is a system and method for verifying the authenticity of a part using non-destructive backscattered X-rays. The method uses an identification tag embedded in the part that when...
US20140185769 BACK SCATTERNING INSPECTION SYSTEMS FOR HUMAN BODY  
A human body back-scattering inspection system is disclosed. The system comprises a flying-spot forming unit configured to output beams of X-rays, a plurality of discrete detectors which are...
US20120328075 System and method for measuring the thickness of a zinc layer on steel and for measuring the iron concentration in a zinc layer  
A Compton radiation detection device for determining of Compton radiation of iron, includes a sensor and a filter arrangement. The filter arrangement is adapted such that the radiation emitted by...
US20090213992 VERTICAL/HORIZONTAL SMALL ANGLE X-RAY SCATTERING APPARATUS AND METHOD FOR MEASURING SMALL ANGLE X-RAY SCATTERING  
A vertical/horizontal small angle X-ray scattering apparatus, for enabling plural numbers of X-ray diffraction measurements, such as, transmission small angle X-ray diffraction, reflection small...
US20130304424 Metrology Tool With Combined X-Ray And Optical Scatterometers  
Methods and systems for performing simultaneous optical scattering and small angle x-ray scattering (SAXS) measurements over a desired inspection area of a specimen are presented. SAXS...
US20060083351 Method and System for Scatter Correction During Bi-Plane Imaging with Simultaneous Exposure  
A method for x-ray scatter correction during simultaneous bi-plane imaging using digital image processing. The basic concept includes correcting the image from each plane by combining it with an...
US20140205068 METHOD FOR EVALUATING MODULUS OF REPULSION ELASTICITY, HARDNESS AND ENERGY LOSS OF POLYMER MATERIAL  
The present invention provides a method for evaluating the rebound resilience, hardness, or energy loss of polymer materials, capable of sufficiently evaluating the difference in performance...
US20080226019 Multiple Scatter Correction  
According to an aspect of the present invention, a correction of X-ray intensities measured in an energy-resolved diffraction method may be provided for multiple scattered radiation without any...
US20140140483 METHOD FOR EVALUATING ENERGY LOSS, CHIPPING RESISTANCE AND ABRASION RESISTANCE OF POLYMERIC MATERIAL  
The present invention provides a method for evaluating energy loss in a polymeric material, wherein the method provides sufficient evaluation of the difference in performance between samples with...
US20130315375 X-ray analysis apparatus with single crystal X-ray aperture and method for manufacturing a single crystal X-ray aperture  
An X-ray analysis apparatus has at least one X-ray aperture (4; 4a, 4b) which delimits an X-ray beam (RS) emitted by an X-ray source (2). The at least one X-ray aperture (4; 4a, 4b) is disposed at...
US20090060135 X-Ray Tomography Inspection Systems  
The present invention is an X-ray scanning system with an X-ray source arranged to generate X-rays from X-ray source positions around a scanning region, a first set of detectors arranged to detect...
US20120314842 System for Identifying Radiation Zones in X-ray Imaging  
A system displays potential radiation zones in an angiography X-ray laboratory during an angiography procedure, for example, and identifies areas of potentially harmful radiation due to X-ray...
US20130208857 X-Ray Inspection using Wavelength-Shifting Fiber-Coupled Scintillation Detectors  
A detector and methods for inspecting material on the basis of scintillator coupled by wavelength-shifting optical fiber to one or more photo-detectors, with a temporal integration of the...
US20110235029 PATTERN MEASURING METHOD AND PATTERN MEASURING APPARATUS  
According to one embodiment, a pattern measuring method includes: irradiating, from a plurality of different incident directions, electromagnetic waves on a periodical structure pattern in which a...
US20120051518 X-RAY SCATTERING MEASUREMENT DEVICE AND X-RAY SCATTERING MEASUREMENT METHOD  
A X-ray scattering measurement device and measurement method can measure, with high resolution, the intensity of X-rays which have undergone small-angle scattering and diffraction with reflection...
US20120263276 Backscatter System with Variable Size of Detector Array  
A variable-geometry backscatter inspection system has a radiation detector array including one or more backscatter radiation detectors. The position of a second backscatter radiation detector is...
US20050105685 Simultaneous multifocal coherent x-ray scanning (cxrs)  
The invention relates to a system for measuring the pulse transmission spectrum of X-ray quanta that are elastically scattered in an examination zone for containers according to the preamble of...
US20080013684 Systems and methods for generating an improved diffraction profile  
A system for generating an improved diffraction profile is described. The system includes at least one x-ray source configured to generate x-rays and a primary collimator outputting a first x-ray...
US20140270080 Electrochemical Test Cell For Enabling In-Situ X-Ray Diffraction and Scattering Studies of Scale Formation and Microstructural Changes in Materials with Flow Through Solution  
An electrochemical test cell apparatus is disclosed for enabling in-situ X-ray transmission of a flowing fluid using a small angle X-ray scattering technique. A base has a recessed portion that...
US20140270079 X-ray analyzing system for x-ray scattering analysis  
An X-ray analyzing system for x-ray scattering analysis having an x-ray source for generating a beam of x-rays propagating along a transmission axis (3), at least one hybrid slit (5b) with an...
US20080267353 Energy Discriminating Scatter Imaging System  
A specimen inspection system includes a photon source for outputting photons along a transmission path and a conveyor for translating a specimen completely through the transmission path. A...
US20110135061 DEVICE AND METHOD FOR ANALYZING NANOPARTICLES BY COMBINATION OF FIELD-FLOW FRACTIONATION AND X-RAY SMALL ANGLE SCATTERING  
The invention relates to a method and to an apparatus for analyzing nanoparticles, wherein the nanoparticles are first fractionated as a function of their particle size and subsequently analyzed,...
US20130022167 High Speed, Non-Destructive, Reel-to-Reel Chip/Device Inspection System and Method Utilizing Low Power X-rays/X-ray Fluorescence  
A reel-like format for transporting devices under test (DUT) into low power x-ray inspection system allows for high speed transportation and inspection that is several orders of magnitude faster...
US20150185168 DEVICE FOR MEASURING RESONANT INELASTIC X-RAY SCATTERING OF A SAMPLE  
A device for measuring resonant inelastic X-ray scattering of a sample with a single exposure step includes a first reflection zone plate configured to be irradiated first and foremost by an X-ray...
US20140348293 Photomultiplier and Detection Systems  
The invention provides a switchable photomultiplier switchable between a detecting state and a non-detecting state including a cathode upon which incident radiation is arranged to impinge. The...
US20110116599 Scanning Systems  
The invention provides a method and system for scanning an object comprising providing a first detector region having a thickness of at least 2 mm and a second detector region having a thickness...
US20090034682 ADAPTING A HIGH-PERFORMANCE PULSE PROCESSOR TO AN EXISTING SPECTROMETRY SYSTEM  
A method of utilizing the output of a first pulse processor, such as processor designed for use with an SDD, to generate the input signal expected by the second pulse processor, such as an...
US20130308756 Apparatus and Method for Nanoflow Liquid Jet and Serial Femtosecond X-ray Protein Crystallography  
Techniques for nanoflow serial femtosecond x-ray protein crystallography include providing a sample fluid by mixing a plurality of a first target of interest with a carrier fluid and injecting the...
US20140355741 MODULATED X-RAY HARMONIC DETECTION  
The presently disclosed technique provides a method and apparatus for use in modulated X-ray harmonic detection and identification. More specifically, it specifies a X-ray backscatter imaging...
US20130202090 INTERNAL IMAGING SYSTEM  
A system for the inspection of the internal structure of a target includes at least one x-ray source that emits collimated x-rays to irradiate the target. At least one detector is positioned to...
US20110249798 Scatter Attenuation Tomography using a Monochromatic Radiation Source  
A system and methods for characterizing an inspected object on the basis of attenuation between identified regions of scattering and a plurality of detectors. An incident beam of substantially...
US20090213993 METHODS AND APPARATUS FOR THE IDENTIFICATION OF MOLECULAR AND CRYSTALLINE MATERIALS BY THE DOPPLER BROADENING OF NUCLEAR STATES BOUND IN MOLECULES, CRYSTALS AND MIXTURES USING NUCLEAR RESONANCE FLUORESCENCE  
The broadening of the lines in NRF from an isotope that is part of a material may be due to several causes: the temperature of the material, the molecular structure of the material and the...
US20110150181 APPARATUS AND METHODS FOR DETECTOR SCATTER RECOVERY FOR NUCLEAR MEDICINE IMAGING SYSTEMS  
Apparatus and methods for detector scatter recovery for positron emission tomography systems are provided. One method includes identifying detected gamma events in different detector units of a...
US20130039460 METHODS AND SYSTEMS FOR DETERMINING A CRITICAL DIMENSION AND OVERLAY OF A SPECIMEN  
Methods and systems for monitoring semiconductor fabrication processes are provided. A system may include a stage configured to support a specimen and coupled to a measurement device. The...
US20130101091 Sealed Detector Array for the Collection of Both Wide Angle and Small Angle X-Ray Scattering  
A detector system for capturing and resolving WAXS and SAXS beams is provided along with a device for determining structural information of a material incorporating said detector system and a...
US20140064453 INTEGRATED BACKSCATTER X-RAY SYSTEM  
The different advantageous embodiments provide a method and apparatus. The apparatus comprises a moveable platform, a housing connected to the moveable platform, a power supply located inside of...
US20110261929 ADAPTIVE SCANNING IN AN IMAGING SYSTEM  
An object within a region is exposed to a first beam of penetrating radiation. The first beam of penetrating radiation is sensed on a side opposite the region from a source of the first beam. An...
US20150117610 METHODS AND APPARATUS FOR MEASURING SEMICONDUCTOR DEVICE OVERLAY USING X-RAY METROLOGY  
Disclosed are apparatus and methods for determining overlay error in a semiconductor target. For illumination x-rays having at least one angle of incidence (AOI), a correlation model is obtained,...

Matches 1 - 50 out of 91 1 2 >