Matches 1 - 50 out of 107 1 2 3 >


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US20070165246 Three-dimensional video scanner  
A 3D scanning device comprises: a digital light encoding unit comprising a digital micromirror device for encoding a rapidly changing shape signal onto a light beam directed to an object, a shape...
US20120218562 THREE-DIMENSIONAL SHAPE MEASUREMENT APPARATUS AND THREE-DIMENSIONAL SHAPE MEASUREMENT METHOD  
A three-dimensional shape measurement apparatus is provided that calculates the height of solder accurately. An approximation surface of a wiring pattern is prepared for an inspection block prior...
US20080106746 Depth-varying light fields for three dimensional sensing  
A method for mapping includes projecting onto an object a pattern of multiple spots having respective positions and shapes, such that the positions of the spots in the pattern are uncorrelated,...
US20110013198 DIMENSIONAL PROBE AND METHODS OF USE  
Disclosed is a surface sensing apparatus, one embodiment having a source of coherent radiation capable of out-putting wavelength emissions to create a first illumination state to illuminate a...
US20100085577 Vorrichtung und Verfahren zur Steigerung der Mess-Genauigkeit digitaler 3D-Geometriemesssysteme  
The resolution of an optical measurement system for measuring a surface of an object, wherein a measurement light strip is captured on a surface of an object by means of a matrix sensor with a...
US20130155416 DEVICE FOR MEASURING THREE DIMENSIONAL SHAPE  
A device for measuring three dimensional shape is configured to perform one of a first imaging operation as imaging processing of a single operation among a multiplicity of imaging operations...
US20080192262 High Resolution Optical Microscopy Featuring Fluorescence Transient Measurement  
According to the invention, an excitation layer is focused into a sample and switched on suddenly in order to improve the microscopic resolution; the history of the resulting fluorescence...
US20080170238 Three-dimensional shape measuring device, and portable measuring device  
A three-dimensional shape measuring device for measuring a three-dimensional shape of a measurement object using a light section method includes: a slit beam generator for generating a slit beam...
US20120120414 METHOD OF INSPECTING BOARD  
A method of establishing a tip location of a terminal includes establishing a virtual tip line by measuring a height of a board, on which a component having a terminal and a body is mounted, and...
US20140198320 THREE-DIMENSIONAL PROFILE MEASUREMENT APPARATUS AND METHOD USING AMPLITUDE SIZE OF PROJECTION GRID  
Disclosed are a three-dimensional profile measurement apparatus and method using the amplitude size of a projection grid wherein a periodic pattern of the projection grid is projected onto an...
US20150253123 SPATIALLY SELF-SIMILAR PATTERNED ILLUMINATION FOR DEPTH IMAGING  
Methods, systems, and devices involving patterned radiation are provided in accordance with various embodiments. Some embodiments include a device for projecting pattern radiation. Some...
US20090225329 Phase-Shift Analysis System and Method  
A system for determining an object distance z includes a plurality of light emitters. A group of at least one of the plurality of light emitters includes an emitter group, and the pattern...
US20150253130 DEVICE FOR GENERATING AN OPTICAL DOT PATTERN  
A device for capturing a three-dimensional object is presented, which allows, on one hand, a sufficiently large number of projected pixels and a high image quality of the projected pixels, and...
US20140198319 DEVICE FOR GENERATING AN OPTICAL DOT PATTERN  
A device for capturing a three-dimensional object is presented, which allows, on one hand, a sufficiently large number of projected pixels and a high image quality of the projected pixels, and...
US20120105869 THREE DIMENSIONAL INSPECTION AND METROLOGY BASED ON SHORT PULSES OF LIGHT  
A system and a method may be provided. The system may include an illumination module arranged to illuminate an object by short pulses of light that form at least one spot on the object; a...
US20120038934 DIFFRACTIVE OPTICAL ELEMENT AND MEASURING DEVICE  
To provide a diffractive optical element and a measuring device capable of generating light spots of dispersive type. The problem is resolved by providing a diffractive optical element having...
US20080117438 SYSTEM AND METHOD FOR OBJECT INSPECTION USING RELIEF DETERMINATION  
Phase profilometry inspection system has a pattern projection assembly, a detection assembly imaging a plurality of first light intensity patterns on the object and determining a first height of...
US20100171963 APPARATUS FOR MEASUREMENT OF THREE-DIMENSIONAL SHAPE  
A 3D shape measuring apparatus is disclosed, which is capable of simultaneously obtaining interference fringes of the lowest point and the highest point, by comprising a reflection path controller...
US20120204614 METHOD FOR MEASURING SHEET MATERIAL FLATNESS AND METHOD FOR PRODUCING STEEL SHEET USING SAID MEASURING METHOD  
A method for measuring flatness of a sheet material in which a light and dark pattern composed by a light portion and a dark portion is projected onto a surface of the sheet material running in a...
US20090161090 Systems and Methods for Measuring the Shape and Location of an object  
A system for determining the shape of an object and/or a distance of the object from the system includes a first plurality of light source, a second plurality of light sources, and a detector or...
US20100238408 METHOD AND APPARATUS FOR DETERMINING DYNAMIC DEFORMATION CHARACTERISTICS OF AN OBJECT  
Apparatus and methods for measuring a dynamic deformation characteristic of a deformable target surface during a deformation interval. The measurement principles may be applied to a large variety...
US20070091322 Optical information verifying device  
The optical information verification apparatus includes an image pickup section picking up an image of optical information recorded on a display medium, a measuring section measuring a record...
US20080123109 PROJECTOR AND THREE-DIMENSIONAL INPUT APPARATUS USING THE SAME  
An apparatus is disclosed for projecting patterned electromagnetic waves onto an object. This apparatus includes: an electromagnetic-wave source; a modulating element allowing at least part of an...
US20150160002 SYSTEMS AND METHODS FOR PERFORMING MACHINE VISION USING DIFFUSE STRUCTURED LIGHT  
Systems for performing machine vision using diffuse structured light comprising: a linear diffuser having an axis of diffusion; a light source that projects an illumination pattern through the...
US20090040532 Three-dimensional shape measuring method and apparatus for the same  
A three-dimensional shape measuring apparatus includes a line laser light source (1) and an image capturing device (2). A three-dimensional shape measuring method and apparatus is characterized by...
US20090141287 Surface-distortion Measuring Device and Method  
A surface-distortion measuring device and a surface-distortion measuring method can quantitatively, rapidly, and highly accurately measure and evaluate surface-distortion distribution at all of...
US20090002631 SYSTEM AND METHOD FOR MEASURING CORNEAL TOPOGRAPHY  
A system measures a corneal topography of an eye. The system includes a group of first light sources arranged around a central axis, the group being separated from the axis by a radial distance...
US20100328649 MEASUREMENT SYSTEM AND MEASUREMENT PROCESSING METHOD  
This invention is directed to extract the scattering characteristic of a measurement target together when measuring the surface shape in a measurement system, which measures the surface shape of a...
US20100099984 MEASURING ARRANGEMENT AND METHOD FOR THE THREE-DIMENSIONAL MEASUREMENT OF AN OBJECT  
A measuring arrangement and a method for the three-dimensional measurement of at least part of an object includes a light source with a continuous spectrum, a device for generating a multifocal...
US20080302974 OPTICAL AUTO FOCUSING SYSTEM AND METHOD FOR ELECTRON BEAM INSPECTION TOOL  
A method and system for inspecting a semiconductor wafer. The method includes providing an illumination flux through a pattern plate and a lens to a surface of a specimen to project a pattern onto...
US20120236317 THREE-DIMENSIONAL DISTANCE MEASUREMENT APPARATUS, THREE-DIMENSIONAL DISTANCE MEASUREMENT METHOD, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM  
A three-dimensional distance measurement apparatus comprising: a distance information calculation unit configured to calculate distance information of a measurement object based on a captured...
US20100036393 METHODS, SYSTEMS AND DEVICES FOR THREEDIMENSIONAL INPUT, AND CONTROL METHODS AND SYSTEMS BASED THEREON  
A Robotic control system has a wand, which emits multiple narrow beams of light, which fall on a light sensor array, or with a camera, a surface, defining the wand's changing position and attitude...
US20120307260 HYBRID SYSTEM  
A system and method is provided for imaging an article within a field of view, projecting an illumination field onto the article within field of view, and selectively projecting illumination...
US20080186512 Apparatus and Method for Measuring Curvature Using Multiple Beams  
There is provided a curvature measuring apparatus and method using multiple beams. m×n multiple beams generated by an m×n laser diode (LD) array or an m×n vertical cavity surface emitting laser...
US20150049331 METHOD AND DEVICE FOR ANALYSING PHASE DISTRIBUTION OF FRINGE IMAGE USING HIGH-DIMENSIONAL INTENSITY INFORMATION, AND PROGRAM FOR THE SAME  
A fringe image phase distribution analysis technique that performs one-dimensional discrete Fourier transform using temporal intensity information or spatial intensity information to calculate the...
US20150138565 CALIBRATION METHOD AND SHAPE MEASURING APPARATUS  
A calibration method includes acquiring a captured image of a lattice fringe by providing a reference gauge having a reference surface whose height from a reference plane changes in a first...
US20150055140 DEVICE AND METHOD FOR DETERMINING SIZING INFORMATION FOR CUSTOM MASK DESIGN OF A FACIAL MASK  
The present invention relates to a mask sizing device (10) for determining sizing information for custom mask design of a facial mask, wherein the mask sizing device (10) comprises an image...
US20130314696 Transmission of Affine-Invariant Spatial Mask for Active Depth Sensing  
A method operational on a transmitter device is provided for projecting a composite code mask. A composite code mask on a tangible medium is obtained, where the composite code mask includes a code...
US20100177319 OPTICAL IMAGING OF PHYSICAL OBJECTS  
A method for combining shape data from multiple views in a common co-ordinate system to define the 3-D shape and/or colour of an object, the method comprising: projecting one or more optical...
US20100302551 SHAPE MEASURING DEVICE  
When a shape of an end face of a disc-shaped measurement target is to be measured on the basis of its projection image, a shape measuring device in which a non-parallel light component is not...
US20130286408 OPTICAL BASE PLATE ALIGNMENT  
Alignment of two surfaces of two objects in a manufacturing process is achieved by determining a best fit orientation of the two objects with respect to each other using captured images reflected...
US20090002719 SYSTEM AND METHOD FOR SCANNING AND MEASURING POINTS OF AN OBJECT  
A method for scanning and measuring points of an object is provided. The method includes: (a) selecting a measuring start point and a measuring end point from an image of the object; (b)...
US20110188054 INTEGRATED PHOTONICS MODULE FOR OPTICAL PROJECTION  
Optical apparatus includes a semiconductor substrate and an edge-emitting radiation source, mounted on a surface of the substrate so as to emit optical radiation along an axis that is parallel to...
US20130100460 APPARATUS FOR MEASURING WARPAGE CHARACTERISTIC OF SPECIMEN  
There is provided an apparatus for measuring a warpage characteristic of a specimen, the apparatus including: a light irradiating unit irradiating light toward the specimen; alight transmitting...
US20120293808 SYSTEM AND METHOD FOR NON-CONTACT METROLOGY OF SURFACES  
A non-contact metrology system utilizes a display that can be programmed with a plurality of targets. The display targets shine on a specular surface and the reflected targets are detected by an...
US20120281240 Error Compensation in Three-Dimensional Mapping  
A method for forming a three-dimensional (3D) map of an object, including illuminating the object from a light source so as to project a pattern onto the object, capturing an image of the pattern...
US20130201489 PROBE ASSEMBLY AND METHODS FOR USE IN INSPECTING A COMPONENT  
A probe tip includes a plurality of light emitters and a control circuit that is coupled to the light emitters. The control circuit is configured to control a projection of a plurality of light...
US20100171964 Method and Apparatus to Provide Corrections for a Radiation-Therapy Beam  
Information is provided regarding a block's sectional contour in a particular plane as corresponds to a radiation-therapy beam. For a point at which block effects are to be assessed, a point is...
US20120105868 MEASUREMENT DEVICE AND MEASUREMENT METHOD  
A measurement device includes a pattern light characteristic setting unit configured to set illumination light having a pattern light characteristic to be projected onto a measurement object, a...
US20150116729 AUTOFOCUS SYSTEM AND METHOD  
Autofocus system (AF) employing, in addition to specified optical units, fringe projection and fringe detection systems (FPS, FDS) and specifically-configured data processing system. AFS is...

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