Matches 1 - 27 out of 27


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US20120026506 SYSTEM FOR IN VITRO ANALYSIS OF FLUID DYNAMICS ON CONTACT LENSES VIA PHASE SHIFTING INTERFEROMETRY  
A system and method for analyzing the dynamics of fluid layers on contact lenses utilizes phase shifting interferometry to quickly and accurately model the time-evolution of the fluid layers. The...
US20100027028 Oblique incidence interferometer  
An oblique incidence interferometer has favorable measurement accuracy while achieving miniaturization. The oblique incidence interferometer includes a light source that emits coherent light; a...
US20110135145 ABERRATION MEASUREMENT METHOD AND SYSTEM INCLUDING INTERFEROMETER AND SIGNAL PROCESSING UNIT  
An aberration measurement system includes an interferometer that includes a polarization adjuster configured to adjust a polarization plane of coherent light, and a phase shifter configured to...
US20100309476 LINEAR-CARRIER PHASE-MASK INTERFEROMETER  
A phase-difference sensor measures the spatially resolved difference in phase between orthogonally polarized reference and test wavefronts. The sensor is constructed as a linear-carrier phase-mask...
US20090213386 Apparatus and method for measuring surface topography of an object  
An apparatus for measuring surface topography of an object includes an optical arrangement capable of directing a first light beam at a surface of the object, providing a second light beam...
US20120026507 INTERFEROMETRIC SYSTEM WITH REDUCED VIBRATION SENSITIVITY AND RELATED METHOD  
A source module (12) generates mutually orthogonally polarized beams of light as emanating from two spatially separated point sources (Sv, Sw) for use in a phase shifting interferometer.
US20090219499 SURFACE SHAPE MEASURING APPARATUS, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD  
A surface shape measuring apparatus includes an illumination system and a light receiving system. The illumination system splits wide-band light from a light source into measurement light and...
US20060146341 Interferometric system with reduced vibration sensitivity and realated method  
A source module (12) generates mutually orthogonally polarized beams of light as emanating from two spatially separated point sources (Sv, Sw) for use in a phase shifting interferometer.
US20150241201 GRAZING INCIDENCE INTERFEROMETER  
A grazing incidence interferometer is configured to measure a profile of a target surface using a measurement beam radiated on the target surface in a direction oblique to a normal line of the...
US20120105859 Optical Measuring Apparatuses  
An optical measuring apparatus may include a light source, linear polarizer, polarized beam splitter, quarter wave plate, objective lens, and/or light receiver. The polarized beam splitter may be...
US20100165290 USER-PROPOSED ENTRY FIELD(S) FOR CUSTOMIZED DATA ANALYSIS/PRESENTATION  
One embodiment of the present invention is a method to not limit the device's manipulation of the data to that of the manufacturer, but to allow greater freedom for customization by the individual...
US20090128827 INTERFEROMETER UTILIZING POLARIZATION SCANNING  
In one aspect, the disclosure features methods that include using a microscope to direct light to a test object and to direct the light reflected from the test object to a detector, where the...
US20070182969 Method for approximating an influence of an optical system on the state of polarization of optical radiation  
A method for approximating an influence of an optical system on the state of polarization of optical radiation comprises the steps of providing incoming optical radiation for the optical system in...
US20070035743 Apparatus, methods and storage medium for performing polarization-based quadrature demodulation in optical coherence tomography  
Apparatus, method and storage medium which can provide at least one first electro-magnetic radiation to a sample and at least one second electromagnetic radiation to a reference, such that the...
US20150015893 Optical Inspection Apparatus and Method Thereof  
An object of the present invention is to provide an optical inspection apparatus that suppresses an influence of quantum noise and obtains superior defect detection performance even when an amount...
US20140043617 MEASUREMENT APPARATUS AND MEASUREMENT METHOD  
The present invention provides a measurement apparatus which measures a shape of a test object, including a detection unit configured to detect interference light between reference light from a...
US20100265515 MEASUREMENT METHOD, MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE FABRICATION METHOD  
A measurement method of measuring a wavefront aberration of an optical system to be measured, comprising a first measurement step of measuring wavefronts of the optical system to be measured with...
US20080007734 System and method for providing Jones matrix-based analysis to determine non-depolarizing polarization parameters using polarization-sensitive optical coherence tomography  
Arrangement, system and method for a polarization effect for a interferometric signal received from sample in an optical coherence tomography (“OCT”) system are provided. In particular, an...
US20170016711 INSTANTANEOUS PHASE-SHIFT INTERFEROMETER  
An instantaneous phase-shift interferometer uses a light source having a coherence length shorter than a difference in optical path length between the light reflected from a reference surface and...
US20160363440 Polarization-based coherent gradient sensing systems and methods  
Polarization-based coherent gradient-sensing systems and methods for measuring at least one surface-shape property of a specularly reflective surface are disclosed. The method includes: reflecting...
US20160054195 SYSTEM AND METHODS FOR MEASURING OPHTHALMIC LENS  
The system and methods are made to apply interferometry to ophthalmic applications. The system makes use of a low-coherence interferometer to obtain a plurality of measurements of a contacts lens....
US20140320865 APPARATUS FOR DETECTING A 3D STRUCTURE OF AN OBJECT  
An apparatus for detecting a 3D structure of an object. The apparatus has first and second laser emitters which generate laser radiation having first and second wavelengths, respectively, the...
US20140285814 METHOD FOR DETERMINING ROUGHNESS DATA AND/OR TOPOGRAPHY DATA OF SURFACES IN MATERIAL MICROSCOPY  
A method for determining roughness data and/or topography data of surfaces in material microscopy, particularly from flat samples, based on a shearing polarization interferometrical sequence with...
US20140233016 METHOD AND SYSTEM FOR MEASURING PATTERNED SUBSTRATES  
A system and method of measuring feature depth using a common path auto-correlation low coherence interferometer including a light source having an output directed toward a first beam splitter,...
US20110292402 INTERFERENCE MEASUREMENT APPARATUS AND METHOD FOR MEASURING INTERFERENCE  
An embodiment of the present invention realizes an interference measurement apparatus which can obtain an interference image to be used for obtaining three-dimensional information of a subject...
US20110286003 OPTICAL IMAGE MEASURING DEVICE  
An optical image measuring device includes: an optical system that generates and detects interference light; an image forming part that forms a tomographic image based on the detection; an...
US20110122418 APPARATUS FOR DETERMINING A HEIGHT MAP OF A SURFACE THROUGH BOTH INTERFEROMETRIC AND NON-INTERFEROMETRIC MEASUREMENTS  
The invention relates to an apparatus and a method for determining a height map of a surface of an object. The apparatus can include positioning means for the object, a light source, an optical...

Matches 1 - 27 out of 27